Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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02/10/1987 | CA1217862A Off-highway vehicle systems simulator and control panel testing |
02/10/1987 | CA1217848A Proving safe operation system for automatic train |
02/10/1987 | CA1217817A Measurement device for use in high-voltage gas- insulated switch gears |
02/10/1987 | CA1217816A Brush wear monitor |
02/05/1987 | DE3633804A1 Synthetic double resonant test circuit with simulation of the direct current element |
02/05/1987 | DE3526485A1 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten Circuitry for testing integrated circuit units |
02/04/1987 | EP0210741A2 Digital integrated circuits |
02/04/1987 | CN85205607U Testing electricity screw-driver with lighting |
02/03/1987 | US4641248 Method for determining reliability in electric power system |
02/03/1987 | US4641246 Sampling waveform digitizer for dynamic testing of high speed data conversion components |
02/03/1987 | US4641231 Apparatus and method for failure testing of a control turn-off semiconductor |
02/03/1987 | US4640626 Method and apparatus for localizing weak points within an electrical circuit |
02/03/1987 | US4640002 Method and apparatus for increasing the durability and yield of thin film photovoltaic devices |
02/03/1987 | CA1217573A1 Automatic etch-pit counting system |
01/28/1987 | EP0209982A2 Digital integrated circuits |
01/28/1987 | EP0209769A1 Testing arrangement for an electrical signal-processing unit |
01/28/1987 | EP0209688A1 Circuit for detecting the current flow of a TRIAC |
01/28/1987 | EP0209669A1 A device for checking condensers and coils of motor vehicles |
01/28/1987 | CN86101621A Improved signature analysis device for electronic circuits |
01/28/1987 | CN86101612A Computer assisted fault isolation in circuit board testing |
01/28/1987 | CN85203558U Pocket ttl integrated circuit on-line tester |
01/27/1987 | US4639919 Distributed pattern generator |
01/27/1987 | US4639719 Apparatus for monitoring circuit integrity |
01/27/1987 | US4639664 Apparatus for testing a plurality of integrated circuits in parallel |
01/27/1987 | US4639611 Bridge circuit system |
01/27/1987 | CA1217232A1 Participate register for automatic test systems |
01/24/1987 | CN86103656A Leakage and ground-failure-screening circuit |
01/24/1987 | CN85101959A Testing-measuring system and method for variant electronic device |
01/22/1987 | DE3525609A1 Voltage indicator circuit |
01/21/1987 | EP0209432A1 Electron beam tester for integrated circuits |
01/21/1987 | EP0209364A2 Generator stator winding diagnostic system |
01/21/1987 | EP0209236A1 Electron beam testing of integrated circuits |
01/21/1987 | EP0209144A2 Device for testing and/or treating microcomponents |
01/21/1987 | EP0208977A1 Testing integrated circuits |
01/20/1987 | US4638482 Random logic error detecting system for differential logic networks |
01/20/1987 | US4638481 Method and apparatus for generating sequence of multibit words |
01/20/1987 | US4638455 Function diagnosing system |
01/20/1987 | US4638399 Wrist strap ground monitor |
01/20/1987 | US4638374 Defect detecting apparatus for a rotary recording medium |
01/20/1987 | US4638341 Gated transmission line model structure for characterization of field-effect transistors |
01/20/1987 | US4638247 Integrated circuit for converting a drive signal of three or more voltage levels to two voltage levels |
01/20/1987 | US4638246 Integrated circuit input-output diagnostic system |
01/20/1987 | US4638245 Detection of ground faults in ungrounded DC power supply systems |
01/20/1987 | US4638244 Ground connection monitor |
01/20/1987 | US4638243 Short detector for fusible link array using single reference fuse |
01/20/1987 | US4638237 Battery condition indicator |
01/20/1987 | US4638183 Dynamically selectable polarity latch |
01/20/1987 | CA1216914A1 System for monitoring metal-to-metal contact in rotating machinery |
01/15/1987 | WO1987000292A1 On chip test system for configurable gate arrays |
01/14/1987 | EP0208673A2 Automatic test equipment |
01/14/1987 | EP0208552A2 Acousto-optic system for testing high speed circuits |
01/14/1987 | EP0208049A2 Timing generating device |
01/14/1987 | CN86200405U Fault finder for electronic equipment |
01/14/1987 | CN85205531U Automatic winding temperature rise-measuring unit with microcomputer for electric motor |
01/13/1987 | US4637020 Method and apparatus for monitoring automated testing of electronic circuits |
01/13/1987 | US4636929 Abnormal state detecting circuit of inverter |
01/13/1987 | US4636726 Electronic burn-in system |
01/13/1987 | US4636725 Electronic burn-in system |
01/13/1987 | US4636724 Method and apparatus for examining electrostatic discharge damage to semiconductor devices |
01/13/1987 | US4636721 Method and structure for testing high voltage circuits |
01/13/1987 | US4636716 Device for testing units containing electrical circuits |
01/13/1987 | US4636715 Digital display ohmmeter |
01/13/1987 | CA1216631A1 Domestic electrical tester |
01/13/1987 | CA1216630A1 Method and apparatus for testing of electrical interconnection networks |
01/07/1987 | EP0207922A1 Process and apparatus for the surveillance of beacon lights |
01/07/1987 | EP0207860A2 Method and device for the rapid reflectometric testing of passive components in the VHF range |
01/07/1987 | EP0207249A2 Electrically programmable logic array |
01/07/1987 | EP0207129A1 Test fixture for facilitating the connection of leads of an integrated circuit packeage to test apparatus |
01/07/1987 | CN86201124U Indicator for leakage of electricity |
01/06/1987 | US4635261 On chip test system for configurable gate arrays |
01/06/1987 | US4635259 Method and apparatus for monitoring response signals during automated testing of electronic circuits |
01/06/1987 | US4635256 Formatter for high speed test system |
01/06/1987 | US4634972 Method for measuring low-frequency signal progressions with an electron probe inside integrated circuits |
01/06/1987 | US4634964 Instruments and systems for measuring cable capacitances |
01/06/1987 | US4634963 Method and apparatus for the testing of dielectric materials |
01/06/1987 | US4634955 Malfunction detector for detecting open-circuit condition at DC generator output terminal |
01/06/1987 | CA1216327A1 Battery rating indicator |
01/02/1987 | DE3531120A1 Device for testing and sorting electronic components, especially integrated chips |
01/02/1987 | DE3531119A1 Device for testing and sorting electronic components, especially integrated chips |
12/31/1986 | WO1986007634A1 Cuvette belt faulty seal detector |
12/30/1986 | US4633466 Self testing data processing system with processor independent test program |
12/30/1986 | US4633418 Battery control and fault detection method |
12/30/1986 | US4633241 Method of automated in-place SCR testing |
12/30/1986 | US4633175 Testing method and apparatus for electronic components |
12/30/1986 | US4633167 Tester for electrical joy stick controllers |
12/30/1986 | EP0207054A2 Device with a rechargeable battery |
12/30/1986 | EP0206503A2 Method and apparatus for determining the state of charge of a battery |
12/30/1986 | EP0206488A1 Method and apparatus for measuring electric current |
12/30/1986 | EP0206486A2 Memory test circuit |
12/30/1986 | EP0206287A2 Weighted random pattern testing method |
12/30/1986 | EP0206016A2 Apparatus and method for displaying hole-electron pair distributions induced by electron bombardment |
12/30/1986 | EP0205760A1 Noncontact testing of integrated circuits |
12/30/1986 | EP0205747A1 Device for testing electrical or electronic systems with electromagnetic pulses |
12/30/1986 | EP0086778B1 Battery voltage monitoring and indicating apparatus |
12/23/1986 | US4631724 Semiconductor memory test equipment |
12/23/1986 | US4630936 Electronic timepiece |
12/23/1986 | US4630881 Immediately testable superconductor joint |
12/23/1986 | CA1215790A1 Component verifier |
12/18/1986 | WO1986007502A1 Monitoring state of battery charge |
12/18/1986 | WO1986007493A1 Calibration apparatus for integrated circuits |