| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/06/1990 | US4899105 Method of testing electrical characteristics of LCD with probe device |
| 02/06/1990 | US4899099 Flex dot wafer probe |
| 01/31/1990 | EP0353156A1 Input circuit of the on or off type for a programmable automatic device |
| 01/31/1990 | EP0353027A2 Programmable time advance |
| 01/31/1990 | EP0352940A2 Method of measuring specific contact resistivity of self-aligned contacts in integrated circuits |
| 01/31/1990 | EP0352929A1 Connector system for printed circuit board test facility |
| 01/31/1990 | EP0352910A2 Finding faults in circuit boards |
| 01/31/1990 | EP0352659A2 Circuit for determining shorts in a load in series with a FET |
| 01/31/1990 | CN2052125U Multifunctional test pencil for vehicle |
| 01/30/1990 | US4897842 Integrated circuit signature analyzer for testing digital circuitry |
| 01/30/1990 | US4897838 Semiconductor integrated circuit device subjected to scan-testing of internal logic function |
| 01/30/1990 | US4897837 Test circuit having selective by pass arrangement for test data |
| 01/30/1990 | US4897836 Programmable connection path circuit |
| 01/30/1990 | US4897794 Impulse coil tester |
| 01/30/1990 | US4897754 Switching apparatus |
| 01/30/1990 | US4897607 Method and device for detecting and localizing faults in electrical installations |
| 01/30/1990 | US4897606 Method and apparatus for undesired ground path detection in a single-point grounded electrical system |
| 01/30/1990 | US4897598 Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards |
| 01/30/1990 | US4897584 Device and method for detecting the coil temperature of a direct-current motor, especially a brushless direct-current motor |
| 01/30/1990 | US4897044 Battery jumper cable |
| 01/30/1990 | CA1265247A1 Method and device for detecting and localizing faults in electrical installations |
| 01/25/1990 | WO1990000849A1 A real-time signal processing circuit |
| 01/25/1990 | DE3923937A1 Diagnoseeinrichtung fuer ein kraftfahrzeug Diagnostic device for a motor vehicle |
| 01/24/1990 | EP0352001A2 Fixture latching mechanism |
| 01/24/1990 | EP0351911A1 Method and device for testing multiple power supply connections of an integrated circuit on a printed-circuit board |
| 01/24/1990 | EP0351900A2 Logic analyser with configurable multi-levels |
| 01/24/1990 | EP0351559A1 Device for the detection of internal faults in a high-voltage capacitor battery |
| 01/24/1990 | CN2051548U Integrated variable type multifunctional screw driver |
| 01/23/1990 | US4896296 Programmable logic device configurable input/output cell |
| 01/23/1990 | US4896271 Method and apparatus for measuring jitter in a periodic signal |
| 01/23/1990 | US4896118 Variable gain current-to-voltage amplifier with gain independent test mode operation |
| 01/23/1990 | US4896117 Method of and apparatus for tracing faults in electrical conductors |
| 01/23/1990 | US4896114 Cable fault detector |
| 01/23/1990 | US4896109 Photoconductive circuit element reflectometer |
| 01/23/1990 | US4896108 Test circuit for measuring specific contact resistivity of self-aligned contacts in integrated circuits |
| 01/23/1990 | US4896107 Test pin for an adapter for connecting test contacts on the grid of a printed circuit board testing device with test points of a test-piece on and/or off the grid |
| 01/23/1990 | US4896095 Apparatus and method for determining frequency response of a system under test |
| 01/23/1990 | US4896055 Semiconductor integrated circuit technology for eliminating circuits or arrays having abnormal operating characteristics |
| 01/23/1990 | US4896054 Optional single or double clocked latch |
| 01/23/1990 | US4895033 Sample holder for use in the grinding or polishing of samples |
| 01/23/1990 | CA1264868A1 Semiconductor defect monitor for diagnosing processing-induced defects |
| 01/18/1990 | DE3914584A1 Method for detecting rapidly occurring processes in integrated circuits with the use of a scanning laser microscope with OBIC stage |
| 01/18/1990 | DE3823911A1 Method and device for determining the deviation of the energy of a particle probe from the neutral point energy |
| 01/17/1990 | EP0351174A2 Board alignment system |
| 01/17/1990 | EP0350943A2 Semiconductor integrated circuit including output buffer |
| 01/17/1990 | EP0350888A2 Signature compression circuit |
| 01/17/1990 | EP0350576A2 IC connection/disconnection mechanism and method for carrying out the connection/disconnection |
| 01/17/1990 | CN2051356U Electronic megger |
| 01/17/1990 | CN2051355U Pocket voltage withstand test instrument |
| 01/17/1990 | CN2051354U Measuring and trouble telemetering and warning box for transformer |
| 01/17/1990 | CN2051149U Multifunction electrician screwdriver |
| 01/16/1990 | US4894830 LSI chip with scanning circuitry for generating reversals along activated logical paths |
| 01/16/1990 | US4894829 Comprehensive design and maintenance environment for test program sets |
| 01/16/1990 | US4894800 Reconfigurable register bit-slice for self-test |
| 01/16/1990 | US4894744 Information handling and control systems, and methods of testing the condition of electrical loads in such systems |
| 01/16/1990 | US4894648 Information handling and control systems, and methods of testing the condition of electrical loads in such systems |
| 01/16/1990 | US4894611 System for measuring characteristics of electron emitting sources |
| 01/16/1990 | US4894606 System for measuring misregistration of printed circuit board layers |
| 01/16/1990 | US4894605 Method and on-chip apparatus for continuity testing |
| 01/16/1990 | US4893914 Test station |
| 01/11/1990 | WO1990000255A1 Process and device for testing an accumulator system |
| 01/10/1990 | EP0350184A2 Pulse train interruption sensing circuit |
| 01/10/1990 | EP0350123A1 Appliance for characterising semiconductor samples by high-resolution electroluminescence at a low temperature |
| 01/10/1990 | EP0349930A2 Switch with pre-alarm means |
| 01/10/1990 | EP0349638A1 Dc motor operated valve remote monitoring system |
| 01/10/1990 | CN2050982U Multifunctional electronic electric-tester |
| 01/10/1990 | CN2050981U Analogue circuit breaker |
| 01/09/1990 | US4893311 CMOS implementation of a built-in self test input generator (BISTIG) |
| 01/09/1990 | US4893086 For testing electric motor armature windings |
| 01/09/1990 | US4893074 Electronic device testing system |
| 01/09/1990 | US4893073 Electric circuit board current sensor |
| 01/09/1990 | US4893072 Apparatus for testing an integrated circuit device |
| 01/03/1990 | EP0349042A2 System for the automated testing of integrated circuits |
| 01/03/1990 | EP0348839A1 Method and apparatus for automatically testing an accumulator containing at least one cell in an uninterrupted power plant |
| 01/03/1990 | CN1038523A Improvement of circuit for cable core wires identifier |
| 01/02/1990 | US4891811 Efficient address test for large memories |
| 01/02/1990 | US4891743 Power supply controller |
| 01/02/1990 | US4891597 Synchronous detection and location of insulation defects |
| 01/02/1990 | US4891585 Multiple lead probe for integrated circuits in wafer form |
| 01/02/1990 | US4891584 Apparatus for making surface photovoltage measurements of a semiconductor |
| 01/02/1990 | US4891583 Inspection mechanism for chip type circuit element |
| 01/02/1990 | US4891582 Optical apparatus and method for photocarrier diffusion length measurement |
| 01/02/1990 | US4891580 Electro-optic measurements of voltage waveforms on electrical conductors |
| 01/02/1990 | US4891579 Voltage detector |
| 01/02/1990 | US4891578 Device for the electrical function testing of wiring matrices, particularly of printed circuit boards |
| 01/02/1990 | US4891577 Of a semiconductor device |
| 12/28/1989 | WO1989012862A1 Test arrangement for producing test data for testing microprocessors |
| 12/28/1989 | EP0269676A4 Universal programmable counter/timer and address register module. |
| 12/28/1989 | DE3821230A1 Testanordnung zur erzeugung von testmustern fuer den test von mikroprozessoren Test arrangement for the generation of test patterns for the test of microprocessors |
| 12/27/1989 | EP0348112A2 Electronic counter tester |
| 12/27/1989 | EP0348108A1 Thyratron test circuit |
| 12/27/1989 | EP0347908A2 Test facilitating circuit of logic circuit |
| 12/27/1989 | EP0347906A2 Self-diagnostic circuit for logic circuit block |
| 12/27/1989 | CN2050173U Electric breakdown diagnosis instrument |
| 12/27/1989 | CN2050172U Test pencil distinguishing alternating current and direct current low potential |
| 12/27/1989 | CN2050171U Music induction test pencil |
| 12/27/1989 | CA1264088A1 Generator stator winding diagnostic system |
| 12/26/1989 | US4890270 Method and apparatus for measuring the speed of an integrated circuit device |
| 12/26/1989 | US4890183 Device for detecting cutoff and short circuit defects in at least one electrical circuit portion |
| 12/26/1989 | US4890058 Arrangement for measuring the slip of electric induction motors |