Patents for G01Q 20 - Monitoring the movement or position of the probe (1,663)
04/1993
04/27/1993US5206702 Technique for canceling the effect of external vibration on an atomic force microscope
04/14/1993EP0536827A1 Combined scanning force microscope and optical metrology tool
04/13/1993US5202879 Information recording medium, and information recording and/or reproducing method and apparatus
04/13/1993US5202004 Determining contour of surface
04/07/1993EP0535611A1 High resolution observation apparatus with photon scanning tunneling microscope
04/04/1993CA2079752A1 High resolution observation apparatus with photon scanning microscope
03/1993
03/09/1993US5192866 Sample-moving automatic analyzing apparatus
03/03/1993EP0529846A1 Scanning probe microscope
03/02/1993US5189906 Compact atomic force microscope
02/1993
02/17/1993EP0527448A2 Scanning tunnelling/atomic force microscope combined with optical microscope
02/16/1993US5187367 Cantilever type probe, scanning tunneling microscope and information processing device equipped with said probe
01/1993
01/13/1993EP0407460A4 An integrated mass storage device
12/1992
12/15/1992US5171987 Combined magnetic sector mass spectrometer and time-of-flight mass spectrometer
12/02/1992EP0516380A2 Micro-displacement element for a scanning tunneling microscope
11/1992
11/26/1992WO1992020842A1 Methods of fabricating integrated, aligned tunneling tip pairs
11/24/1992US5166516 Scanning probe microscope with slant detection and compensation
11/19/1992EP0513790A2 Information processing apparatus
11/17/1992US5164791 Minute displacement detector using optical interferometry
10/1992
10/28/1992EP0510895A2 Information processor
10/21/1992EP0509856A1 Scanning probe type microscope combined with an optical microscope
10/21/1992EP0509716A1 Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit
10/20/1992US5157251 Scanning force microscope having aligning and adjusting means
10/13/1992US5155715 Reproducing apparatus
10/13/1992CA1308574C Atomic force sensor head
09/1992
09/08/1992US5144833 Atomic force microscopy
09/01/1992US5144128 Surface microscope and surface microscopy
08/1992
08/25/1992US5141319 Displacement detection device with adjacent semiconductor diode lasers
08/13/1992DE4203410A1 Lithography device for wafer structuring - has wafer support table, SXM base with reference structure, and jibs, each with STM sensor
08/11/1992US5138159 Scanning tunneling microscope
08/11/1992US5138158 Surface analysis method and apparatus
08/05/1992EP0497288A2 Probe scanning system
08/04/1992CA1305872C Micromechanical atomic force sensor head
07/1992
07/23/1992WO1992012398A1 Piezoresistive cantilever for atomic force microscopy
07/14/1992US5130554 Two-dimensional scanning device for detecting position between two relatively movable objects
07/14/1992US5129132 Method of making an integrated scanning tunneling microscope
04/1992
04/15/1992EP0480136A1 Atomic force microscopy
04/02/1992DE4107605C1 Sensor for atomic force raster microscope - has opto-electronic distance measurer for ascertaining movement of probe tip at distal end of extendable arm
02/1992
02/26/1992EP0472342A2 Micro-displacement type information detection probe device and microscope and information processing device by use thereof
02/19/1992EP0471511A2 Cantilever type probe and information processing device equipped with said probe
02/18/1992US5089708 Vacuum system comprising an evacuatable housing, an object holder and an object carrier which is detachably coupled thereto
02/17/1992CA2049197C Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof
01/1992
01/21/1992US5083022 Scanning tunneling microscope
12/1991
12/31/1991US5076026 Microscopic grinding method and microscopic grinding device
10/1991
10/23/1991EP0452851A1 Information recording/reproducing apparatus
10/16/1991CN1014359B Test method for lcd elements
10/02/1991EP0449221A2 Scanning probe microscope
10/01/1991US5053995 Tunnel current data storage apparatus having separate lever bodies
09/1991
09/25/1991EP0448331A2 Mass spectrometry systems
09/10/1991US5047633 Imaging apparatus and method
08/1991
08/21/1991EP0442536A2 Atomic force sensor head for measuring the properties of a data store
08/14/1991EP0441311A2 Surface microscope apparatus
08/07/1991EP0440268A2 Atomic force sensor head with interferometric measurement of the properties of a data store
08/07/1991EP0439534A1 Photon scanning tunneling microscopy.
06/1991
06/26/1991EP0433604A2 Electrical probe incorporating scanning proximity microscope
06/25/1991US5025658 Compact atomic force microscope
06/18/1991US5025147 Laser light
06/12/1991EP0431553A2 Microscopic grinding method and microscopic grinding device
05/1991
05/28/1991US5018865 Photon scanning tunneling microscopy
05/21/1991US5017266 Piezoelectric transducer
05/21/1991US5017010 High sensitivity position sensor and method
04/1991
04/30/1991CA1283733C Direct access storage unit
04/24/1991EP0423877A1 Vacuum system comprising an evacuatable housing, an object holder and an object carrier which is detachably coupled thereto
04/17/1991EP0422548A2 Atomic force microscope
04/10/1991EP0421355A2 Scanning tunneling microscope
04/10/1991EP0421354A2 Scanning tunneling microscope
02/1991
02/12/1991US4992728 Electrical probe incorporating scanning proximity microscope
02/12/1991US4992659 Near-field lorentz force microscopy
01/1991
01/30/1991EP0410131A1 Near-field Lorentz force microscopy
01/22/1991US4987367 Method and apparatus for predicting deterioration of a member constituting a part of equipment
01/22/1991US4987303 Micro-displacement detector device, piezo-actuator provided with the micro-displacement detector device and scanning probe microscope provided with the piezo-actuator
01/16/1991EP0407835A2 Atomic force microscope
01/16/1991EP0407460A1 An integrated mass storage device.
01/02/1991EP0404799A1 Integrated scanning tunneling microscope.
11/1990
11/22/1990EP0398334A1 Position detecting apparatus
11/22/1990EP0398085A1 High sensitivity position-sensing method
11/22/1990EP0397799A1 A piezoelectric motion transducer and an integrated scanning tunneling microscope using the same.
11/14/1990EP0397416A1 Imaging apparatus and method
11/08/1990CA2016002A1 Imaging apparatus and method
10/1990
10/31/1990EP0394962A2 Atomic force microscope
10/31/1990EP0394668A1 Apertureless near field optical microscopy
10/16/1990USRE33387 Atomic force microscope and method for imaging surfaces with atomic resolution
10/10/1990EP0391429A2 Micro-displacement detector device, piezo-actuator provided with the micro-displacement detector device and scanning probe microscope provided with the piezo-actuator
09/1990
09/04/1990US4954770 Spin-polarization detector
09/04/1990US4954704 Method to increase the speed of a scanning probe microscope
08/1990
08/08/1990EP0381113A2 Tunnel current data storage apparatus having separate lever bodies
08/07/1990US4947034 Apertureless near field optical microscope
07/1990
07/18/1990EP0378444A2 Reproducing apparatus
06/1990
06/12/1990CA1270132A1 Method and atomic force microscope for imaging surfaces with atomic resolution
05/1990
05/10/1990DE3929735A1 Finely controlling point of scanning tunnelling microscope - exerting electrostatic forces on metallised oxide diaphragm deflected vertically by tensions in two directions
05/08/1990US4924091 Scanning ion conductance microscope
05/03/1990WO1990004753A1 Photon scanning tunneling microscopy
04/1990
04/17/1990US4918309 Method for investigating surfaces at nanometer and picosecond resolution and laser-sampled scanning tunneling microscope for performing said method
04/03/1990US4914293 Microscope apparatus
04/03/1990US4912822 Method of making an integrated scanning tunneling microscope
03/1990
03/06/1990US4906840 Integrated scanning tunneling microscope
01/1990
01/17/1990EP0350874A2 Surface analysis method and apparatus
12/1989
12/26/1989US4889988 Feedback control for scanning tunnel microscopes
11/1989
11/28/1989US4883959 Scanning surface microscope using a micro-balance device for holding a probe-tip
11/02/1989DE3812684A1 Method for fast scanning of uneven surfaces with the scanning tunnel microscope
10/1989
10/17/1989US4874946 Method and apparatus for analyzing the internal chemistry and compositional variations of materials and devices
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