Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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03/16/2005 | EP1514279A1 Optical device for x-ray applications |
03/16/2005 | EP1514135A1 Differential indication of labeled molecules |
03/16/2005 | EP1514095A1 Methods and apparatus of sample analysis |
03/16/2005 | EP1513449A2 Rotational angiography based hybrid 3-d reconstruction of coronary arterial structure |
03/16/2005 | CN1595291A Image reading apparatus and X-ray imaging apparatus |
03/16/2005 | CN1595162A Use of protein biological chips in detecting biological marks in blood of SARS patients |
03/16/2005 | CN1595126A White spirit counterfeit deterrence verification method |
03/16/2005 | CN1595125A Neutron diffraction enhanced imaging device |
03/16/2005 | CN1595124A X-ray inspection apparatus and x-ray inspection method |
03/16/2005 | CN1593345A Method for controlling modulation of x-ray tube current using a single topogram |
03/16/2005 | CN1593344A Radiation tomography apparatus |
03/16/2005 | CN1593343A Radiation tomographic imaging apparatus and radiation tomographic imaging method, and image producing apparatus |
03/16/2005 | CN1593341A Radiation tomograph apparatus and radiation tomography method thereof |
03/16/2005 | CN1193419C Device for testing defect in semiconductor device and method for using said device |
03/16/2005 | CN1193223C Foreign body testing device using x-ray |
03/16/2005 | CN1193209C Method for setting measured object position in measuring thin layer thickness by X-ray fluorescent light |
03/16/2005 | CN1192746C Operating method of CT machine and CT machine |
03/15/2005 | US6868175 Pattern inspection apparatus, pattern inspection method, and recording medium |
03/15/2005 | US6867606 Multiple directional scans of test structures on semiconductor integrated circuits |
03/10/2005 | WO2005022582A1 A method for measuring diffraction patterns from a transmission electron microscopy to determine crystal structures and a device therefor |
03/10/2005 | WO2005022195A2 Portable imaging system method and apparatus |
03/10/2005 | WO2005022090A2 Target detection improvements using temporal integrations and spatial fusion |
03/10/2005 | WO2005021048A2 Method of irradiating frozen material |
03/10/2005 | WO2004114369A3 Three-dimensional and color sensing |
03/10/2005 | WO2004111624A3 Method and apparatus for implementing xanes analysis |
03/10/2005 | US20050054501 Device and system for measuring the properties of multi-segmented filters and corresponding method |
03/10/2005 | US20050054115 Using focused ion beam to isolate, extract and analyze quality of semiconductor wafers |
03/10/2005 | US20050053197 X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof |
03/10/2005 | US20050053193 X-ray analyzer for analyzing plastics |
03/10/2005 | US20050053191 Radiation tomograph apparatus and radiation tomography method thereof |
03/10/2005 | US20050053189 X-ray CT apparatus and X-ray tube |
03/10/2005 | US20050053188 Radiation tomography apparatus |
03/10/2005 | US20050053187 Radiation tomographic imaging apparatus and radiation tomographic imaging method, and image producing apparatus |
03/10/2005 | US20050053185 CT extremity scanner |
03/10/2005 | US20050053184 Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner |
03/10/2005 | US20050051725 Transmission electron microscope system and method of inspecting a specimen using the same |
03/10/2005 | US20050051724 Electron beam apparatus, a pattern evaluation method and a device manufacturing method using the electron beam apparatus or pattern evaluation method |
03/10/2005 | US20050051723 Examination systems for biological samples |
03/10/2005 | US20050051722 Inspection system, inspection method, and process management method |
03/10/2005 | US20050051721 Sample dimension-measuring method and charged particle beam apparatus |
03/10/2005 | CA2536749A1 An apparatus and a method of visualizing target objects in a fluid-carrying pipe |
03/09/2005 | EP1513023A1 Method of evaluating optical element |
03/09/2005 | EP1512956A2 Method of expetiously using a focused-beam apparatus to extract samples for analysis from workpieces |
03/09/2005 | EP1512376A1 Radiation tomography apparatus and radiation tomography method thereof |
03/09/2005 | EP1512022A1 Material segregation, density, and moisture analyzing apparatus and method |
03/09/2005 | EP1511994A2 Element-specific x-ray fluorescence microscope and method of operation |
03/09/2005 | CN2684191Y X-ray imager with wireless portable thin wedge-shaped probe |
03/09/2005 | CN1591813A Method of expeditiously using a focused-beam apparatus to extract samples for analysis from workpieces |
03/09/2005 | CN1591479A Image buffers and access schedules for image reconstruction systems |
03/09/2005 | CN1590993A Commodity drinking water antifalse detection |
03/09/2005 | CN1590992A Detecting unit for x-ray diffraction measurements |
03/09/2005 | CN1589744A X-ray CT apparatus and X-ray tube |
03/09/2005 | CN1589742A X-ray computer tomography apparatus |
03/09/2005 | CN1589741A X-ray CT apparatus |
03/08/2005 | US6865252 X-ray diagnostic imaging apparatus |
03/08/2005 | US6864488 Charged particle beam exposure method and apparatus |
03/08/2005 | US6864482 Electron beam apparatus |
03/08/2005 | US6864098 Quantitative MALDI-time of flight mass spectrometry of peptides and proteins |
03/08/2005 | US6863987 Titanium resistant to discoloration in atmospheric environment and process of production of same |
03/08/2005 | US6863409 Apparatus for generating parallel beam with high flux |
03/03/2005 | WO2005020268A1 Insulating film measuring device, insulating film measuring method, insulating film evaluating device, insulating film evaluating method, substrate for electric discharge display element, and plasma display panel |
03/03/2005 | WO2005018437A2 X-ray diffraction-based scanning system |
03/03/2005 | WO2005018415A2 X-ray imaging system with automatic image resolution enhancement |
03/03/2005 | WO2004090576A3 System and method for detection of explosives in baggage |
03/03/2005 | WO2004006745A3 System and method for performing tomosynthesis of an object |
03/03/2005 | US20050049478 Image guided radiosurgery method and apparatus using registration of 2D radiographic images with digitally reconstructed radiographs of 3D scan data |
03/03/2005 | US20050049477 Apparatus and method for determining measure of similarity between images |
03/03/2005 | US20050048780 Apparatus for inspecting three dimensional shape of a specimen and method of watching an etching process using the same |
03/03/2005 | US20050047637 Image buffers and access schedules for image reconstruction systems |
03/03/2005 | US20050047545 Non-destructive process for continuously measuring the density profile of panels |
03/03/2005 | US20050047544 Apparatus and method for registering 2D radiographic images with images reconstructed from 3D scan data |
03/03/2005 | US20050047542 Image reconstruction method for divergent beam scanner |
03/03/2005 | US20050047541 X-ray CT apparatus |
03/03/2005 | US20050045822 Charged particle beam apparatus |
03/03/2005 | US20050045821 Testing apparatus using charged particles and device manufacturing method using the testing apparatus |
03/03/2005 | US20050045820 Absorption current image apparatus in electron microscope |
03/03/2005 | US20050045819 An electron microscope magnification standard providing precise calibration in the magnification range 5000x-2000,000x |
03/03/2005 | DE10392337T5 Verfahren zum Herstellen einer orientierten Vorform aus einem Fluoridkristall A method of manufacturing an oriented preform of a fluoride crystal |
03/03/2005 | DE10334395A1 Röntgeneinrichtung X-ray equipment |
03/03/2005 | CA2535121A1 Patient positioning system for radiation therapy system |
03/02/2005 | EP1511066A2 Absorption current image apparatus in electron microscope |
03/02/2005 | EP1511043A1 X-ray optical arrangement for generating monochromatic X-rays |
03/02/2005 | EP1510811A1 Detection of a twodimensional diffraction pattern by rotation of a one dimensional position sensitive detector |
03/02/2005 | EP1509941A2 Low-pressure chamber for scanning electron microscopy in a wet environment |
03/02/2005 | EP1509762A1 Analysis of powder diffraction crystallography data |
03/02/2005 | EP1509761A2 Methods for sem inspection of fluid containing samples |
03/02/2005 | EP1509608A1 Methods of purification of cytochrome p450 proteins and of their crystallizing |
03/02/2005 | EP1135700B1 Fan and pencil beams from a common source for x-ray inspection |
03/02/2005 | CN2682413Y Multichannel signal analyzer |
03/02/2005 | CN1588238A Devie and method for eliminating X-ray no-lens Fourier transformation holographic zero ordor wave |
03/02/2005 | CN1588020A Coal element analytic method and on-line detecting equipment based on spectral library least square method |
03/02/2005 | CN1588019A Short wave length X-ray diffraction measuring device and method |
03/02/2005 | CN1588018A Method for detecting phase factor-beta in X-ray complex refractive index |
03/02/2005 | CN1588017A Portable flash X-ray detector based on network data transmission |
03/02/2005 | CN1588016A Method and its device for detecting tobacco package |
03/02/2005 | CN1587977A In-situ micro area structure analysis and property detection combined system |
03/02/2005 | CN1587955A Device for mounting and operating single linear nano material |
03/02/2005 | CN1587768A Safety valve and water level meter with safety valve |
03/02/2005 | CN1191471C Telemetering remote-reading surface type nucleon moisture density meter |
03/02/2005 | CN1191465C Process of transmission electron microscope specimen preparation for easy damp-affecting denaturization crystal thin film |