| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 04/27/2005 | EP1526376A1 Method and apparatus for determining a basis weight and/or a chemical composition of a conveyed material specimen |
| 04/27/2005 | EP1525593A2 Soller slit using low density materials |
| 04/27/2005 | EP1525458A2 Flow method and apparatus for screening chemicals using micro x-ray fluorescence |
| 04/27/2005 | EP1525450A2 Method and apparatus for multiple labeling detection and evaluation of a plurality of particles |
| 04/27/2005 | EP1183526B1 Device and method for analyzing atomic and/or molecular elements by means of wavelength dispersive x-ray spectrometric devices |
| 04/27/2005 | CN1611065A 3D stereoscopic X-ray system with two different target track |
| 04/27/2005 | CN1610280A Radiographer support system |
| 04/27/2005 | CN1609602A Titanium alloy thick plate welding seam X-ray double-wall single-shadow transillumination detecting method |
| 04/27/2005 | CN1609206A Crystal structure of oxidosqualene cyclase |
| 04/27/2005 | CN1199043C Apparatus and method for gamma-ray determination of bulk density of samples |
| 04/27/2005 | CN1199042C Radiation testing system and method |
| 04/26/2005 | US6885727 Apparatus and method for measuring thickness and composition of multi-layered sample |
| 04/26/2005 | US6885726 Fluorescent X-ray analysis apparatus |
| 04/26/2005 | US6885724 Radiographic tomosynthesis image acquisition utilizing asymmetric geometry |
| 04/26/2005 | US6885019 Sample positioning system to improve edge measurements |
| 04/26/2005 | US6885000 Method and apparatus to correct for stage motion in E-beam inspection |
| 04/21/2005 | WO2005036148A1 Printed circuit board inspection system combining x-ray inspection and visual inspection |
| 04/21/2005 | WO2005036147A1 Fan-beam coherent-scatter computed tomography |
| 04/21/2005 | WO2005035399A2 A mobile cargo container scanning crane |
| 04/21/2005 | WO2005034756A1 Asymmetric csct |
| 04/21/2005 | WO2004103512A3 Method and system for electrokinetic, preparative sample separation in high-surface-area separation channels with non-convex cross sections |
| 04/21/2005 | WO2004102627A3 Method and apparatus for radiation image erasure |
| 04/21/2005 | WO2004061388A3 Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum |
| 04/21/2005 | US20050086275 Apparatus and method for suppressing insignificant variations in measured sample composition data, including data measured from dynamically changing samples using x-ray analysis techniques |
| 04/21/2005 | US20050086026 Spectroscopy instrument using broadband modulation and statistical estimation techniques to account for component artifacts |
| 04/21/2005 | US20050086023 Systems and methods for predicting the bending stiffness of wood products |
| 04/21/2005 | US20050086017 Methods for operating mass spectrometry (MS) instrument systems |
| 04/21/2005 | US20050084357 Trailer system for radiation imaging |
| 04/21/2005 | US20050084173 Laminograph deshadowing |
| 04/21/2005 | US20050084066 X-ray diffractometer and method of correcting measurement position thereof |
| 04/21/2005 | US20050084065 X-ray analysis apparatus |
| 04/21/2005 | US20050084064 X-ray grading apparatus and process |
| 04/21/2005 | US20050084063 Method and device for determining the type of fluid in a fluid mass in an object |
| 04/21/2005 | US20050084061 X-ray CT apparatus and X-ray CT imaging method |
| 04/21/2005 | US20050084060 Systems and methods for functional imaging using contrast-enhanced multiple-energy computed tomography |
| 04/21/2005 | US20050082478 Sample measurement method and measurement sample base material |
| 04/21/2005 | US20050082477 Lattice strain measuring system and method |
| 04/20/2005 | EP1524516A1 X-ray diffractometer and method of correcting measurement position thereof |
| 04/20/2005 | EP1524515A1 X-ray analysis apparatus |
| 04/20/2005 | EP1523938A1 Radiation tomographic apparatus |
| 04/20/2005 | CN2694266Y Automatic forming high temperature electrothermal sample smelting furnace used for sample preparation of X-ray fluorescence analysis |
| 04/20/2005 | CN1607386A Radiant ray angle adjustable inspection system for container goods/vehicle |
| 04/20/2005 | CN1607135A Trailer of trailer system used in radiation imaging |
| 04/20/2005 | CN1607122A Trailer system used in radiation imaging |
| 04/20/2005 | CN1198151C Environmental radon measuring method and measuring instrument |
| 04/19/2005 | US6882739 Method and apparatus for rapid grain size analysis of polycrystalline materials |
| 04/19/2005 | US6882701 X-ray fluorescence system and method |
| 04/19/2005 | US6881956 Method and apparatus for scanning semiconductor wafers using a scanning electron microscope |
| 04/19/2005 | US6881955 Metrology process for enhancing image contrast |
| 04/19/2005 | US6881954 Scanning probe microscope and method of measurement |
| 04/19/2005 | US6881595 Method of and apparatus for testing the quality of printed circuits |
| 04/14/2005 | WO2005033683A1 Electron spectroscope with emission induced by a monochromatic electron beam |
| 04/14/2005 | WO2005018415A3 X-ray imaging system with automatic image resolution enhancement |
| 04/14/2005 | WO2004043740A3 X-ray backscatter mobile inspection van |
| 04/14/2005 | US20050078863 Radiation image photographic system and radiation image detecting-processing apparatus |
| 04/14/2005 | US20050078791 Methods and systems for smoothing |
| 04/14/2005 | US20050078790 X-ray crystal orientation measuring method and X-ray crystal orientation measuring apparatus |
| 04/14/2005 | US20050078786 High speed materials sorting using x-ray fluorescence |
| 04/14/2005 | US20050078785 Radiation image pick-up device, radiation image pick-up method and program |
| 04/14/2005 | US20050078784 Scanning-based detection of ionizing radiation |
| 04/14/2005 | US20050077472 Irradiation system having cybernetic parameter acquisition system |
| 04/14/2005 | US20050077471 Bulk material analyser and method of assembly |
| 04/14/2005 | US20050077468 System and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forces |
| 04/14/2005 | US20050077467 Methods to improve resolution of cross sectioned features created using an ion beam |
| 04/14/2005 | US20050077459 Radiation phantom |
| 04/14/2005 | US20050076725 Method and apparatus of vibration isolation, in particular for electron beam metrology tools |
| 04/14/2005 | DE10342499A1 Portioning or slicing food e.g. cheese or meats to defined weights, passes x-ray beam through food along its feed path to determine feed displacement for slicing |
| 04/14/2005 | DE102004046747A1 Photoemissions-Elektronen-Mikroskopie und Messverfahren unter Verwendung der Mikroskopie Photoemission electron microscopy and measurement method using the microscopy |
| 04/14/2005 | DE102004043859A1 Verfahren zur Steuerung der Modulation des Röntgenröhrenstroms unter Verwendung eines einzigen Topogramms A method of controlling the modulation of the X-ray tube current using a single topogram |
| 04/13/2005 | EP1522959A1 Determining parameters of a sample by X-ray scattering applying a genetic algorithm with integrated gradient method |
| 04/13/2005 | EP1522958A1 Determining parameters of a sample by X-ray scattering applying an extended genetic algorithm with truncated use of the mutation operator |
| 04/13/2005 | EP1522847A1 Analytical method for determining crystallographic phases of a sample |
| 04/13/2005 | EP1521969A2 Quantitative analysis via isotopically differentitated derivatization |
| 04/13/2005 | EP1521947A2 Scatter spectra method for x-ray fluorescent analysis with optical components |
| 04/13/2005 | CN1605886A Geminate transistors type PMOS radiation dose meter with difference output |
| 04/13/2005 | CN1605860A Radiographic inspection compensation method |
| 04/12/2005 | US6879656 Method and apparatus for deriving motion information from projection data |
| 04/12/2005 | US6879425 Device for determining and/or monitoring the density and/or the level of a filling material in a container |
| 04/12/2005 | US6879392 Method and apparatus for inspecting defects |
| 04/12/2005 | US6878937 Prism array for electron beam inspection and defect review |
| 04/12/2005 | US6878936 Applications operating with beams of charged particles |
| 04/12/2005 | US6878934 Method and device for observing a specimen in a field of view of an electron |
| 04/12/2005 | US6878509 Halation-prevention filter, image analysis device equipped with said halation-prevention filter, and diffraction pattern intensity analysis method and diffraction pattern intensity correction program that use said halation-prevention filter |
| 04/07/2005 | WO2005031329A1 In-situ x-ray diffraction system using sources and detectors at fixed angular positions |
| 04/07/2005 | WO2004095060A3 X-ray imaging technique |
| 04/07/2005 | US20050074097 Method of determining parameters of a sample by X-ray scattering applying an extended genetic algorithm with truncated use of the mutation operator |
| 04/07/2005 | US20050074092 Digital x-ray camera for quality evaluation three-dimensional topographic reconstruction of single crystals |
| 04/07/2005 | US20050074090 Method of determining parameters of a sample by X-ray scattering applying an extended genetic algorithm including a movement operator |
| 04/07/2005 | US20050074089 Analytical method for determination of crystallographic phases of a sample |
| 04/07/2005 | US20050074088 X-ray inspection apparatus and X-ray inspection method |
| 04/07/2005 | US20050074085 Methods and apparatus for dynamical helical scanned image production |
| 04/07/2005 | US20050074084 Methods, apparatus, and computer readable mediums for performing perfusion studies |
| 04/07/2005 | US20050072930 Scintillator arrays for radiation detectors and methods of manufacture |
| 04/07/2005 | US20050072920 Electron microscope |
| 04/07/2005 | US20050072919 Technique for monitoring the state of metal lines in microstructures |
| 04/07/2005 | DE10341541A1 Vorrichtung zur Erkennung der Relativ-Position eines Röntgenstrahlers und eines Bildempfängers Device for detecting the relative position of an X-ray source and an image receiver |
| 04/07/2005 | DE102004017804A1 Bildpuffer und Zigriffszeitpläne für Bildrekonstruktionspläne Frame buffer and Zigriffszeitpläne for image reconstruction plans |
| 04/06/2005 | EP1520260A1 Imaging apparatus and method |
| 04/06/2005 | EP1520186A1 A multi-layered radiation converter |
| 04/06/2005 | EP1520167A1 Methods and systems for inspecting aircraft fuselage frames |