Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
07/1987
07/01/1987EP0227554A2 Differential plane mirror interferometer
07/01/1987EP0226658A1 Method and arrangement for optically determining surface profiles
06/1987
06/30/1987US4676645 Optical instrument for measuring displacement
06/24/1987EP0226296A1 Optical component and waveguide assembly
06/23/1987US4674883 Measuring microscope arrangement for measuring thickness and line width of an object
06/09/1987US4671659 Fiber optic displacement sensor
06/09/1987US4671656 Adjustment for reflective surfaces in interferometers
06/04/1987DE3633319A1 Device for reading graduated circles
06/04/1987DE3541891A1 Method for detecting, storing and reproducing geometrical data of objects, in particular of jaw models, and a device for carrying out the method
05/1987
05/27/1987EP0223414A1 Mounting a component to a substrate
05/27/1987EP0222907A1 A laser based gaging system and method of using same
05/27/1987DE3640340A1 Variable Fabry Perot type interferometer
05/19/1987US4666296 Velocity interferometer with continuously variable sensitivity
05/05/1987US4662750 Angle sensitive interferometer and control method and apparatus
04/1987
04/29/1987EP0220046A2 Interferometer
04/23/1987WO1987002518A1 Mounting a component to a substrate
04/23/1987WO1987002476A1 Wavelength selection device and method
04/23/1987WO1987002475A1 Radiation deflector assembly
04/23/1987WO1987002474A1 Positioning optical components and waveguides
04/23/1987WO1987002472A1 Movable member-mounting
04/23/1987WO1987002470A1 Fabry-perot interferometer
04/23/1987WO1987002448A1 Ruggedized compact interferometer requiring minimum isolation from mechanical vibrations
04/22/1987EP0219359A1 Fabry-perot interferometer
04/22/1987EP0219358A1 Radiation deflector assembly
04/22/1987EP0219357A1 Wavelength selection device and method
04/22/1987EP0219356A1 Movable member mounting
04/22/1987EP0219127A2 Method of and apparatus for optically measuring displacement
04/21/1987US4659936 Line width measuring device and method
04/21/1987US4659923 Fiber optic interferometer transducer
04/21/1987US4659225 Pattern exposure apparatus with distance measuring system
04/15/1987CN85107529A Edge detecting device in optical measuring instrument
04/09/1987DE3623579A1 Interferometric distance measuring device having a plurality of light frequencies which are varied by means of the Doppler effect
04/01/1987CN86202036U High sensitivity length measurement interferometer
03/1987
03/31/1987US4653923 Focusing method for interferometer
03/31/1987US4653922 Interferometric thickness analyzer and measuring method
03/31/1987US4653915 Method for reduction of polarization fading in interferometers
03/25/1987EP0215292A2 Method and apparatus for measuring variations in distances
03/24/1987US4652131 Method and apparatus for making a contact-free measurement of the actual position and of the profile of a coarse surface
03/24/1987US4652129 Interferometric detector with fibre-optic sensor
03/17/1987US4650335 Comparison type dimension measuring method and apparatus using a laser beam in a microscope system
03/12/1987WO1987001438A1 A common optical path interferometric gauge
03/05/1987EP0148853A4 Quadature fiber-optic interferometer matrix.
03/03/1987US4647206 Multi-coordinate measuring machine
03/03/1987US4647205 Method and interferometer for the measurement of short distances
03/03/1987US4647196 Surface flaw detection method
02/1987
02/19/1987DE3528259A1 Method and device for interferometric length measurement using semiconductor lasers as light source
02/17/1987US4643577 Length measuring apparatus based on the dual laser beam interferometer principle
02/17/1987US4643576 Fringe scanning shearing interferometer
02/12/1987DE3527245A1 Method and device for measuring length and position
02/10/1987US4641971 White light interferometer
02/04/1987CN85105776A Distortion field interferometer
01/1987
01/27/1987US4639139 Optical profiler using improved phase shifting interferometry
01/24/1987CN86104460A Holographic universal material testing machine
01/20/1987US4637725 Self-referencing Mach-Zehnder interferometer
01/20/1987US4637724 Shearing interferometer employing an acousto-optic cell
01/14/1987EP0208276A1 Optical measuring device
01/14/1987EP0101726B1 Optical displacement sensing apparatus
01/13/1987US4636078 Microscopic detection of membrane surface defects through interference patterns
01/10/1987CN85101230A Solid state optical interferometer
12/1986
12/30/1986US4632552 Cleaved-coupled-cavity-laser-driven system for measuring small signals
12/10/1986CN85205609U Optical projecting cutter-displaying numerically pre-regulator
12/09/1986US4627731 Common optical path interferometric gauge
12/09/1986US4627729 Differential holographic method
12/09/1986US4627728 Compensated Fabry Perot sensor
12/09/1986US4627722 Method and apparatus for optically measuring three-dimensional coordinates
12/03/1986EP0203682A2 Wavelength switched passive interferometric sensor system
12/02/1986US4626103 Method of fabricating integrated circuits in a semiconductor wafer
11/1986
11/25/1986US4624568 Holographic test method for rotational effects on gears
11/20/1986WO1986006832A1 A laser based gaging system and method of using same
11/20/1986WO1986006831A1 Double-pass optical interferometer
11/05/1986CN85103882A Method of identifying objects
11/04/1986US4621284 Measuring endoscope
10/1986
10/29/1986EP0199137A1 Method of and apparatus for optically measuring displacement
10/29/1986EP0198955A1 Apparatus for and a method of measuring the width of a line
10/28/1986CA1213155A1 Double-slit interferometer
10/08/1986CN85102930A Optical detector for displacement measuring
10/01/1986CN86200542U Numerical displaying typewriter of ocular micrometer for measuring area and length
09/1986
09/23/1986US4612797 From a test subject
09/17/1986EP0194942A2 Apparatus to transform a single frequency, linearly polarized laser beam into a beam with two, orthogonally polarized frequencies
09/17/1986EP0194941A2 Heterodyne interferometer system
09/17/1986EP0194940A2 Apparatus to transform a single frequency, linearly polarized laser beam into a high efficiency beam with two, orthogonally polarized frequencies
09/16/1986US4611916 Optical measuring apparatus
09/16/1986US4611915 Absolute distance sensor
09/10/1986EP0194096A2 Cleaved-coupled-cavity-laser-driven system for measuring small signals
09/10/1986EP0193742A2 Wavelength scanning interferometry and interferometer employing laser diode
09/02/1986CA1210608A1 Interferometer spectrophotometer
08/1986
08/27/1986CN85101015A Compensation device and method for gravity deformation, temperature deformation and micrometeorological variations
08/19/1986US4606640 Method and apparatus for optically testing cylindrical surfaces
08/19/1986US4606638 Distance measuring interferometer and method of use
08/13/1986EP0190184A1 Interferometric sensor.
08/06/1986EP0189482A1 Shape evaluating apparatus
07/1986
07/22/1986US4601579 High intensity Fourier spectrometer
07/15/1986CA1207549A2 Fiber coupler transducer
07/09/1986CN85100846A Manufacture method of object-image comparator
07/02/1986CN85105775A Instantaneous holocamera employing sequential pulse laser
06/1986
06/24/1986US4596466 Method for the measurement of lengths and displacements
06/10/1986US4594003 Interferometric wavefront measurement
06/04/1986EP0183416A2 Photometer for use with a microscope
05/1986
05/07/1986EP0179935A1 Interferometric thickness analyzer and measuring method
05/06/1986US4586515 Device for measuring the position and/or motion of a body part