Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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07/01/1987 | EP0227554A2 Differential plane mirror interferometer |
07/01/1987 | EP0226658A1 Method and arrangement for optically determining surface profiles |
06/30/1987 | US4676645 Optical instrument for measuring displacement |
06/24/1987 | EP0226296A1 Optical component and waveguide assembly |
06/23/1987 | US4674883 Measuring microscope arrangement for measuring thickness and line width of an object |
06/09/1987 | US4671659 Fiber optic displacement sensor |
06/09/1987 | US4671656 Adjustment for reflective surfaces in interferometers |
06/04/1987 | DE3633319A1 Device for reading graduated circles |
06/04/1987 | DE3541891A1 Method for detecting, storing and reproducing geometrical data of objects, in particular of jaw models, and a device for carrying out the method |
05/27/1987 | EP0223414A1 Mounting a component to a substrate |
05/27/1987 | EP0222907A1 A laser based gaging system and method of using same |
05/27/1987 | DE3640340A1 Variable Fabry Perot type interferometer |
05/19/1987 | US4666296 Velocity interferometer with continuously variable sensitivity |
05/05/1987 | US4662750 Angle sensitive interferometer and control method and apparatus |
04/29/1987 | EP0220046A2 Interferometer |
04/23/1987 | WO1987002518A1 Mounting a component to a substrate |
04/23/1987 | WO1987002476A1 Wavelength selection device and method |
04/23/1987 | WO1987002475A1 Radiation deflector assembly |
04/23/1987 | WO1987002474A1 Positioning optical components and waveguides |
04/23/1987 | WO1987002472A1 Movable member-mounting |
04/23/1987 | WO1987002470A1 Fabry-perot interferometer |
04/23/1987 | WO1987002448A1 Ruggedized compact interferometer requiring minimum isolation from mechanical vibrations |
04/22/1987 | EP0219359A1 Fabry-perot interferometer |
04/22/1987 | EP0219358A1 Radiation deflector assembly |
04/22/1987 | EP0219357A1 Wavelength selection device and method |
04/22/1987 | EP0219356A1 Movable member mounting |
04/22/1987 | EP0219127A2 Method of and apparatus for optically measuring displacement |
04/21/1987 | US4659936 Line width measuring device and method |
04/21/1987 | US4659923 Fiber optic interferometer transducer |
04/21/1987 | US4659225 Pattern exposure apparatus with distance measuring system |
04/15/1987 | CN85107529A Edge detecting device in optical measuring instrument |
04/09/1987 | DE3623579A1 Interferometric distance measuring device having a plurality of light frequencies which are varied by means of the Doppler effect |
04/01/1987 | CN86202036U High sensitivity length measurement interferometer |
03/31/1987 | US4653923 Focusing method for interferometer |
03/31/1987 | US4653922 Interferometric thickness analyzer and measuring method |
03/31/1987 | US4653915 Method for reduction of polarization fading in interferometers |
03/25/1987 | EP0215292A2 Method and apparatus for measuring variations in distances |
03/24/1987 | US4652131 Method and apparatus for making a contact-free measurement of the actual position and of the profile of a coarse surface |
03/24/1987 | US4652129 Interferometric detector with fibre-optic sensor |
03/17/1987 | US4650335 Comparison type dimension measuring method and apparatus using a laser beam in a microscope system |
03/12/1987 | WO1987001438A1 A common optical path interferometric gauge |
03/05/1987 | EP0148853A4 Quadature fiber-optic interferometer matrix. |
03/03/1987 | US4647206 Multi-coordinate measuring machine |
03/03/1987 | US4647205 Method and interferometer for the measurement of short distances |
03/03/1987 | US4647196 Surface flaw detection method |
02/19/1987 | DE3528259A1 Method and device for interferometric length measurement using semiconductor lasers as light source |
02/17/1987 | US4643577 Length measuring apparatus based on the dual laser beam interferometer principle |
02/17/1987 | US4643576 Fringe scanning shearing interferometer |
02/12/1987 | DE3527245A1 Method and device for measuring length and position |
02/10/1987 | US4641971 White light interferometer |
02/04/1987 | CN85105776A Distortion field interferometer |
01/27/1987 | US4639139 Optical profiler using improved phase shifting interferometry |
01/24/1987 | CN86104460A Holographic universal material testing machine |
01/20/1987 | US4637725 Self-referencing Mach-Zehnder interferometer |
01/20/1987 | US4637724 Shearing interferometer employing an acousto-optic cell |
01/14/1987 | EP0208276A1 Optical measuring device |
01/14/1987 | EP0101726B1 Optical displacement sensing apparatus |
01/13/1987 | US4636078 Microscopic detection of membrane surface defects through interference patterns |
01/10/1987 | CN85101230A Solid state optical interferometer |
12/30/1986 | US4632552 Cleaved-coupled-cavity-laser-driven system for measuring small signals |
12/10/1986 | CN85205609U Optical projecting cutter-displaying numerically pre-regulator |
12/09/1986 | US4627731 Common optical path interferometric gauge |
12/09/1986 | US4627729 Differential holographic method |
12/09/1986 | US4627728 Compensated Fabry Perot sensor |
12/09/1986 | US4627722 Method and apparatus for optically measuring three-dimensional coordinates |
12/03/1986 | EP0203682A2 Wavelength switched passive interferometric sensor system |
12/02/1986 | US4626103 Method of fabricating integrated circuits in a semiconductor wafer |
11/25/1986 | US4624568 Holographic test method for rotational effects on gears |
11/20/1986 | WO1986006832A1 A laser based gaging system and method of using same |
11/20/1986 | WO1986006831A1 Double-pass optical interferometer |
11/05/1986 | CN85103882A Method of identifying objects |
11/04/1986 | US4621284 Measuring endoscope |
10/29/1986 | EP0199137A1 Method of and apparatus for optically measuring displacement |
10/29/1986 | EP0198955A1 Apparatus for and a method of measuring the width of a line |
10/28/1986 | CA1213155A1 Double-slit interferometer |
10/08/1986 | CN85102930A Optical detector for displacement measuring |
10/01/1986 | CN86200542U Numerical displaying typewriter of ocular micrometer for measuring area and length |
09/23/1986 | US4612797 From a test subject |
09/17/1986 | EP0194942A2 Apparatus to transform a single frequency, linearly polarized laser beam into a beam with two, orthogonally polarized frequencies |
09/17/1986 | EP0194941A2 Heterodyne interferometer system |
09/17/1986 | EP0194940A2 Apparatus to transform a single frequency, linearly polarized laser beam into a high efficiency beam with two, orthogonally polarized frequencies |
09/16/1986 | US4611916 Optical measuring apparatus |
09/16/1986 | US4611915 Absolute distance sensor |
09/10/1986 | EP0194096A2 Cleaved-coupled-cavity-laser-driven system for measuring small signals |
09/10/1986 | EP0193742A2 Wavelength scanning interferometry and interferometer employing laser diode |
09/02/1986 | CA1210608A1 Interferometer spectrophotometer |
08/27/1986 | CN85101015A Compensation device and method for gravity deformation, temperature deformation and micrometeorological variations |
08/19/1986 | US4606640 Method and apparatus for optically testing cylindrical surfaces |
08/19/1986 | US4606638 Distance measuring interferometer and method of use |
08/13/1986 | EP0190184A1 Interferometric sensor. |
08/06/1986 | EP0189482A1 Shape evaluating apparatus |
07/22/1986 | US4601579 High intensity Fourier spectrometer |
07/15/1986 | CA1207549A2 Fiber coupler transducer |
07/09/1986 | CN85100846A Manufacture method of object-image comparator |
07/02/1986 | CN85105775A Instantaneous holocamera employing sequential pulse laser |
06/24/1986 | US4596466 Method for the measurement of lengths and displacements |
06/10/1986 | US4594003 Interferometric wavefront measurement |
06/04/1986 | EP0183416A2 Photometer for use with a microscope |
05/07/1986 | EP0179935A1 Interferometric thickness analyzer and measuring method |
05/06/1986 | US4586515 Device for measuring the position and/or motion of a body part |