| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 04/05/1995 | EP0646768A2 Confocal optical microscope and length measuring device using this microscope |
| 04/05/1995 | EP0646767A2 Interferometric distance measuring apparatus |
| 04/05/1995 | EP0646050A1 Line cleaning system and measurement |
| 04/04/1995 | US5404226 Process for determining the position of a positioning body in relation to a reference body and device for implementing the process |
| 04/04/1995 | US5404222 Interferametric measuring system with air turbulence compensation |
| 04/04/1995 | US5404163 In-focus detection method and method and apparatus using the same for non contact displacement measurement |
| 04/04/1995 | US5404021 Laser sensor for detecting the extended state of an object in continuous motion |
| 03/30/1995 | WO1995008443A1 Error detection apparatus and method for use with engravers |
| 03/30/1995 | DE4333168A1 Method for monitoring the height of bonding wires |
| 03/30/1995 | DE4332859A1 Position transmitter for registering the position of a light beam |
| 03/30/1995 | CA2133025A1 Process and device for measuring the worn length of a nozzle |
| 03/29/1995 | EP0645608A1 Optical type displacement sensor |
| 03/29/1995 | EP0645601A1 Measuring procedure and device for the evolution of the ablation length of a tube |
| 03/29/1995 | EP0645024A1 Holograms having a standard reference colour |
| 03/29/1995 | EP0645008A1 Endpoint detection technique using signal slope determinations |
| 03/29/1995 | CN1100804A Measurement of transparent container wall thickness |
| 03/29/1995 | CN1100803A Optical grating displacement measuring device with single harmonic output |
| 03/28/1995 | US5402364 Three dimensional measuring apparatus |
| 03/28/1995 | US5402239 Method of measuring orientation flat width of single crystal ingot |
| 03/28/1995 | US5402234 Method of profiling a surface of an object |
| 03/28/1995 | US5402226 Survey apparatus |
| 03/28/1995 | US5402192 Simplified mirror system for contour projector |
| 03/28/1995 | US5401979 Methods for investigating an object by means of a reflectable radiation beam and devices suitable for carrying out the methods having an image sensor rigidly interconnected with an optical detector |
| 03/28/1995 | US5401954 Product ripeness discrimination system and method therefor with area measurement |
| 03/23/1995 | DE4433126A1 Self-calibrating wheel aligning device and method therefor |
| 03/23/1995 | DE4332153A1 Method and device for measuring, in particular for the spatial measurement of objects |
| 03/23/1995 | DE4332022A1 Method and device for the contactless detection of the angular position of an object, in particular when measuring elongated objects |
| 03/22/1995 | EP0644533A1 Artifact, method, and apparatus for clock signal generation for computer memory disks |
| 03/22/1995 | EP0644532A1 Artifact, arm, method and apparatus for measuring position of the read/write arms of computer memory disks during servo-track writing |
| 03/22/1995 | EP0644411A1 Procedure and apparatus for the absolute measurement of the geometrical or optical structure of an optical component |
| 03/22/1995 | EP0644399A2 A method of measuring film thicknesses |
| 03/22/1995 | EP0643566A1 Checkered placido apparatus and method |
| 03/22/1995 | CN1100477A Apparatus and methods for measurement and classification of generalized neplike entities in fiber samples |
| 03/21/1995 | US5400386 Angle detecting device and optical apparatus, such as exposure apparatus, employing the same |
| 03/21/1995 | US5400380 Dynamic alloy correction gauge |
| 03/21/1995 | US5400145 Mark position detecting method and device for aligner and aligner having the device |
| 03/21/1995 | US5400144 Method and apparatus for remote detection and thickness measurement of ice or liquid layer |
| 03/21/1995 | US5400133 Alignment method and apparatus for optical imaging systems |
| 03/21/1995 | US5400132 Rectification of a laser pointing device |
| 03/21/1995 | US5399870 Position detecting method and apparatus for laser sensor |
| 03/21/1995 | US5399854 Embedded optical sensor capable of strain and temperature measurement using a single diffraction grating |
| 03/21/1995 | US5399016 Device and method for continuously and non-destructively monitoring variation in the thickness of shaped sections |
| 03/18/1995 | CA2129721A1 Self-calibrating wheel alignment apparatus and method |
| 03/16/1995 | WO1995007488A1 Scanning beam laser microscope with wide range of magnification |
| 03/16/1995 | WO1995004975A3 Automatic garment inspection and measurement system |
| 03/16/1995 | DE4330988A1 Method and device for setting broaches and the like |
| 03/16/1995 | DE4312310A1 Object-recognition device |
| 03/15/1995 | EP0643293A1 Pattern defect inspection method and apparatus |
| 03/15/1995 | EP0643282A1 Optical device for measuring transversal offset |
| 03/15/1995 | EP0585333B1 Interferometric measuring device in integrated optics |
| 03/15/1995 | CN1027921C Tubing and wire stock diameter in-line measurement by laser method |
| 03/14/1995 | US5398113 Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
| 03/14/1995 | US5397004 Method to identify objects and a device to implement such a method |
| 03/09/1995 | WO1995006851A1 Gear shape measurement system |
| 03/09/1995 | DE4402787A1 Device for measuring the angle of swing deflection for crane operation free of swing deflection |
| 03/09/1995 | DE4401263C1 Surface profile measuring device |
| 03/09/1995 | DE4329976A1 Method for measuring the travel (lift) of a valve and setting a valve |
| 03/08/1995 | EP0642014A1 Glass container inspection machine |
| 03/08/1995 | EP0642013A1 System for detecting defects in articles |
| 03/08/1995 | EP0641993A2 Shape measuring apparatus |
| 03/08/1995 | EP0641992A2 Apparatus systems and methods for measuring defects in semiconductor processing |
| 03/08/1995 | EP0641599A1 Method and device for measuring the volume of liquids |
| 03/08/1995 | EP0530236B1 Process and device for monitoring and controlling etching operations |
| 03/08/1995 | EP0502012B1 A stacking method and equipment for measuring the timber volume and other dimensions of a stack of logs |
| 03/08/1995 | CN2191412Y Automatic detector for laser signal |
| 03/07/1995 | US5396332 Apparatus and method for measuring the thickness of a semiconductor wafer |
| 03/07/1995 | US5396331 Method for executing three-dimensional measurement utilizing correctively computing the absolute positions of CCD cameras when image data vary |
| 03/07/1995 | US5396080 Thin film thickness monitoring with the intensity of reflected light measured at at least two discrete monitoring wavelengths |
| 03/07/1995 | US5396079 Fiber optic detector and depth sensor and method for doing same |
| 03/07/1995 | US5394752 Method for determing shear direction using liquid crystal coatings |
| 03/02/1995 | WO1995006231A1 Automatic level and plumb tool |
| 03/02/1995 | WO1995005903A1 Hot bottle inspection apparatus and method |
| 03/02/1995 | DE4430813A1 Device and method for measuring the driving height of a vehicle |
| 03/02/1995 | DE4430198A1 Device and method for investigating the performance of a phase-shift reticle |
| 03/01/1995 | EP0641020A2 Multiple-scan method for wafer particle analysis |
| 03/01/1995 | EP0640824A1 Fibre optic damage detection system |
| 03/01/1995 | EP0640206A1 Optical receiver for area location system |
| 03/01/1995 | CA2130788A1 Vehicle ride height measurement apparatus and method |
| 02/28/1995 | US5394483 Method and apparatus for determining visually perceptible differences between images |
| 02/28/1995 | US5394480 Apparatus for moving/presenting physical textile entities |
| 02/28/1995 | US5394246 Bonding wire inspection apparatus and method |
| 02/28/1995 | US5394245 Process and apparatus for measuring pretilt angle of liquid crystals |
| 02/28/1995 | US5394200 Automatic keratometric measuring method and device for implementing said method |
| 02/28/1995 | US5394183 For measuring x and y coordinates of a surface |
| 02/28/1995 | US5394085 Rolling probe for the continuous measuring of the thickness of layers or strips |
| 02/28/1995 | US5393624 Thickness of resist film coated on semiconductor wafer is accurately measured and set |
| 02/28/1995 | US5393370 Method of making a SOI film having a more uniform thickness in a SOI substrate |
| 02/23/1995 | WO1995005575A1 System and method for testing yarn altering devices |
| 02/23/1995 | DE4332254C1 Using a spacing sensor (separation sensor) for computer tomographs |
| 02/23/1995 | DE4327712A1 Sensor arrangement and method for measuring characteristics of the surface layer of a metallic target |
| 02/22/1995 | EP0639753A2 A method of measuring a thickness of a multilayered sample |
| 02/22/1995 | EP0639293A1 Device for indexing magazine compartments and wafer-shaped objects in the compartments |
| 02/22/1995 | EP0639259A1 Apparatus for detecting relative movement |
| 02/22/1995 | CN2190279Y Workpiece shape measuring apparatus |
| 02/22/1995 | CN1099129A Searching unit for three dimensional measurement |
| 02/22/1995 | CN1099128A External difference interference measuring absolute distance system using dual-wavelength laser |
| 02/21/1995 | US5392361 Method and apparatus for detecting position of a mark |
| 02/21/1995 | US5392359 Apparatus for inspecting appearance of cylindrical objects |
| 02/21/1995 | US5392222 Locating a field of view in which selected IC conductors are unobscured |
| 02/21/1995 | US5392173 Method and apparatus for controlling a small spacing between a magnetic head and a magnetic recording medium |