| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 04/03/1996 | EP0662215A4 Extraction of spatially varying dielectric function from ellipsometric data. |
| 04/02/1996 | US5504720 Fiber optic planar hydrophone |
| 04/02/1996 | US5504695 Apparatus for measuring paint film thickness based on dynamic levelling property of wet paint film surface |
| 04/02/1996 | US5504570 Distance measuring equipment |
| 04/02/1996 | US5504303 For measuring and ablating the surface of a hard material |
| 04/02/1996 | US5503707 Method and apparatus for process endpoint prediction based on actual thickness measurements |
| 03/28/1996 | WO1996009743A2 Method of imaging a component and a component mount machine for this method |
| 03/28/1996 | WO1996009609A1 Method and apparatus for image plane modulation pattern recognition |
| 03/28/1996 | WO1996009520A1 Diode laser co-linear and intersecting light beam generator |
| 03/28/1996 | WO1996009519A1 Phase shifting device |
| 03/28/1996 | WO1996009518A1 Washboard measuring apparatus |
| 03/28/1996 | DE4447117C1 Colour-coded three-dimensional image recognition by, e.g. CCD camera |
| 03/28/1996 | CA2200446A1 Method and apparatus for image plane modulation pattern recognition |
| 03/27/1996 | EP0702780A1 Fiber optic bending and positioning sensor |
| 03/27/1996 | EP0546002B1 Camera chip for a camera detecting and evaluating point phenomena |
| 03/27/1996 | CN2223480Y Laser alignment testing instrument |
| 03/27/1996 | CN2223479Y Photoelectric measuring instrument for tilt angle |
| 03/27/1996 | CN1119269A Optical inspection of container dimensional parameters |
| 03/26/1996 | US5502657 Three-dimensional measuring method and system |
| 03/26/1996 | US5502566 Method and apparatus for absolute optical measurement of entire surfaces of flats |
| 03/26/1996 | US5502565 Method and apparatus for measuring the flying height of a magnetic head above a disk surface at three wavelengths |
| 03/26/1996 | US5502564 Substrate thickness measurement using oblique incidence multispectral interferometry |
| 03/26/1996 | US5502001 Method of forming light beam and method of fabricating semiconductor integrated circuits |
| 03/21/1996 | WO1996008702A1 Photodetector having an integrated function for elimination of the effects of stray light |
| 03/21/1996 | WO1996008693A1 Movement and position mesuring device and method |
| 03/21/1996 | WO1996008691A1 Method for the correlation of three dimensional measurements obtained by image capturing units and system for carrying out said method |
| 03/21/1996 | WO1995027918A3 Method of determining measurement-point position data and device for measuring the magnification of an optical beam path |
| 03/21/1996 | DE19506642C1 Optical workpiece surface contour measuring system |
| 03/20/1996 | EP0702206A2 Substrate thickness measurement using oblique incidence multispectral interferometry |
| 03/20/1996 | EP0702204A2 A method of evaluating silicon wafers |
| 03/20/1996 | EP0701707A1 Laser diffraction particle sizing apparatus and method |
| 03/20/1996 | EP0701686A1 Simultaneous determination of layer thickness and substrate temperature during coating |
| 03/20/1996 | EP0701685A1 A method and a device for the registration of the movement of a vehicle |
| 03/20/1996 | EP0701684A1 Apparatus and method of film thickness measurement |
| 03/19/1996 | US5500737 Method for measuring the contour of a surface |
| 03/19/1996 | US5500734 Photoelectric position measuring system with integral optical circuit having phase shifted interference gratings |
| 03/19/1996 | US5500728 Photoelectric distance sensor |
| 03/19/1996 | US5499733 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
| 03/14/1996 | WO1996007946A1 Microscopic electromagnetic radiation transmitter or detector |
| 03/14/1996 | WO1996007891A1 Apparatus and method for binocular measurement system |
| 03/14/1996 | WO1996007869A1 Calibration frame |
| 03/14/1996 | DE4432313A1 Surface topography examination appts. using strip triangulation for e.g. automatic optical on=line quality control |
| 03/14/1996 | DE19533109A1 Entfernungsmeßgerät A distance |
| 03/14/1996 | DE19533104A1 Entfernungsmeßgerät A distance |
| 03/14/1996 | CA2199409A1 Calibration frame |
| 03/13/1996 | EP0701104A2 Laser sheet triangulation method and device for on-line measurement of moving profiles |
| 03/13/1996 | EP0701103A2 Optical interference based thickness measuring apparatus |
| 03/13/1996 | EP0701102A1 Scanning near-field optic/atomic-force microscope with observing function in liquid |
| 03/13/1996 | EP0700516A1 Method and device for determining the attenuation function of an object with respect to the transmission of a reference material thickness |
| 03/13/1996 | EP0700511A1 Apparatus and method for determining the size of particles using light scattering |
| 03/13/1996 | EP0700506A1 Method for geometry measurement |
| 03/13/1996 | EP0700505A1 Interferometric flying height measuring device |
| 03/13/1996 | EP0700269A1 System for locating relative positions of objects |
| 03/13/1996 | EP0523205B1 Rolling or roller casting installation with measuring device for adjusting a roller gap and process of operating it |
| 03/13/1996 | CN1118483A Three dimentional shaped data processing method |
| 03/12/1996 | US5499098 Optical position detecting unit and optical coordinate input unit utilizing a sub-portion of a M-sequence pattern |
| 03/12/1996 | US5499096 Optical instrument and measurement for measuring displacement of scale using different order diffraction of a diffraction grating |
| 03/12/1996 | US5499094 Apparatus and method for measuring the length and width of a spot of light utilizing two different masks |
| 03/12/1996 | US5498878 Method and apparatus for detecting positional deviation by using diffraction gratings with a compensation delay determining unit |
| 03/12/1996 | US5498870 Rotation information detection apparatus |
| 03/12/1996 | CA2061285C Rotational orientation sensor for laser alignment control system |
| 03/07/1996 | WO1996007144A1 System and method of registration of three-dimensional data sets |
| 03/07/1996 | WO1996007076A1 Integral field lens illumination for video inspection |
| 03/07/1996 | DE4446243C1 Rotation angle measurement device e.g. for mounting on electric motors for speed control and regulation purposes |
| 03/07/1996 | DE4431442A1 System for topographical measurement of sample test piece |
| 03/07/1996 | DE4431059A1 Tool measuring method for esp. machining tool bit in setting-up machine |
| 03/07/1996 | DE4430731A1 Deformation measuring method for esp. loading frame of test machine |
| 03/07/1996 | DE19529899A1 Measuring birefringence of filament yarns |
| 03/07/1996 | CA2198492A1 System and method of registration of three-dimensional data sets |
| 03/06/1996 | EP0699925A2 Optical type displacement detecting apparatus |
| 03/06/1996 | EP0699890A1 An apparatus for measuring the contour of a surface |
| 03/06/1996 | EP0699889A2 Gap distance measuring apparatus and method |
| 03/06/1996 | EP0571591B1 Process and device for cleaning the sensor surfaces of a thread monitoring system |
| 03/06/1996 | CN1118208A Error detection apparatus and method for engravers |
| 03/06/1996 | CN1118063A Probe position measurement apparatus |
| 02/29/1996 | WO1996006325A1 Scanning arrangement and method |
| 02/29/1996 | WO1996006324A1 Method and interference microscope for imaging an object, with the aim of achieving a resolution beyond the diffraction limit |
| 02/29/1996 | WO1996006264A1 Method and apparatus for steering a drill head |
| 02/29/1996 | DE19527268A1 Coordinate measuring unit for workpiece undergoing industrial machining |
| 02/29/1996 | CA2198124A1 Scanning arrangement and method |
| 02/28/1996 | EP0698857A2 Pattern recognition |
| 02/28/1996 | EP0698812A2 Method for alignment of manufacturing semiconductor apparatus |
| 02/28/1996 | EP0698776A2 Optical inspection of container finish dimensional parameters |
| 02/28/1996 | EP0648324A4 Method and apparatus of stud array upstand setting. |
| 02/28/1996 | CN1117421A Laser working apparatus and laser working method |
| 02/27/1996 | US5495330 Container inspection machine having sequentially accessed computer alignment gages |
| 02/27/1996 | US5493861 Hydraulic system with pump and load |
| 02/22/1996 | WO1996005478A1 An inspection device for measuring a geometric dimension of a part |
| 02/22/1996 | WO1996005477A1 High precision semiconductor component alignment systems |
| 02/22/1996 | WO1996004839A1 Processing of keratoscopic images using local spatial phase |
| 02/22/1996 | DE4429416A1 Verfahren und Interferenzmikroskop zum Mikroskopieren eines Objektes zur Erzielung einer Auflösung jenseits der Beugungsgrenze (Superauflösung) Method and interference microscope for microscopy of an object to achieve a resolution beyond the diffraction limit (Super Resolution) |
| 02/22/1996 | DE19500817C1 Edge position measurement method for light-dark structure |
| 02/21/1996 | CN1117131A Combined interferometer and refractometer |
| 02/20/1996 | US5493403 Method and apparatus for the alignment of a substrate |
| 02/20/1996 | US5493401 Method of measuring film thicknesses |
| 02/20/1996 | US5493400 Arrangement for projecting a test pattern onto a surface to be investigated |
| 02/20/1996 | US5493399 Position measuring system with compensation for variable distance between light source and index disk |
| 02/20/1996 | US5493398 Device for observing test-piece surfaces by the speckle-shearing-method for the measurement of deformations |
| 02/20/1996 | US5493397 Multi-coordinate measuring system using a cross grating to create a plurality of diffraction beams emanating from two or more coordinate directions |
| 02/20/1996 | US5493220 Magneto-optic Kerr effect stress sensing system |