Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
06/1995
06/22/1995DE4444593A1 Automatic optical range finder using stereo camera image
06/22/1995DE4405003A1 Electronic appts. for measurement of textiles
06/22/1995CA2136506A1 High resolution high speed film measuring apparatus and method
06/21/1995EP0658758A1 Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control
06/21/1995EP0658499A1 Telescopic conveyor path for conveying and measuring items
06/21/1995EP0503036B1 Optical device for measuring the speed or length of a moved surface
06/21/1995EP0436735B1 Noncontact profile control unit
06/21/1995EP0409875B1 Method and sensor for opto-electronic angle measurements
06/21/1995EP0348524B1 Device for inspecting thickness of synthetic resin container and inspection system therefor
06/20/1995US5426507 Laser-based pipe alignment device and method
06/20/1995US5426504 Optical depth gauge for optically rough surfaces
06/20/1995US5426498 Method and apparatus for real-time speckle interferometry for strain or displacement of an object surface
06/20/1995US5426356 For tracing a surface of a model
06/20/1995US5426309 Method and apparatus for inspecting the depth of the surface of cylindrical objects
06/20/1995US5425839 Method for rapidly etching material on a semiconductor device
06/20/1995US5425523 Apparatus for establishing predetermined positions of one element relative to another
06/20/1995US5425279 Vessel inspection system
06/15/1995WO1995016219A1 Observation instrument orientation detecting system
06/15/1995CA2178624A1 Observation instrument orientation detecting system
06/14/1995EP0657714A2 Method and device for measuring the side profile of a coil
06/14/1995EP0657713A2 Combined interferometer and refractometer
06/14/1995EP0657712A2 Thickness detecting device
06/14/1995EP0657621A1 Method and system for measuring three-dimensional displacement
06/14/1995EP0657260A1 Process for controlling and insuring the quality of moulded building elements
06/14/1995EP0657018A1 Contactless inner coating measuring device and method for cast iron pipes
06/14/1995DE4410603C1 Detecting faults during inspection of masks, LCDs, circuit boards and semiconductor wafers
06/14/1995DE4342107A1 Arrangement for positioning a sensor in a space
06/14/1995CN1103713A Measuring device for a figure
06/14/1995CN1028906C Flexible optical fiber array tactile sensor
06/13/1995US5425066 Method of finding the center of a band-shaped region
06/13/1995US5424952 Vehicle-surroundings monitoring apparatus
06/13/1995US5424930 Measuring-point member for optical measurement
06/13/1995US5424845 Apparatus and method for engraving a gravure printing cylinder
06/13/1995US5424837 Tube diameter measuring apparatus and method
06/13/1995US5424836 Apparatus for contact-free optical measurement of a three-dimensional object
06/13/1995US5424835 High-resolution compact optical sensor for scanning three-dimensional shapes
06/13/1995US5424834 Optical displacement sensor for measurement of shape and coarseness of a target workpiece surface
06/13/1995US5424830 Method and apparatus for determining the facet angles of a gemstone
06/13/1995US5424828 Method for measuring and analyzing interference fringes using a halographic optical element having two patterns for diffracting a laser beam
06/13/1995US5424533 Self illuminating touch activated optical switch
06/13/1995US5424530 Solid image pickup device having dual integrator
06/13/1995US5423514 Alignment assembly for aligning a spring element with a laser beam in a probe microscope
06/08/1995WO1995015539A1 Methods for determining the exterior points of an object in a background
06/08/1995WO1995015479A1 Vehicle alignment system
06/08/1995WO1995010034A3 A method for characterizing polymer molecules or the like
06/08/1995DE4341578A1 Rotation laser for perpendicularity measurement of large components
06/08/1995DE4341098A1 Optical distance and thickness measuring device
06/08/1995CA2153164A1 Methods for determining the exterior points of an object in a background
06/06/1995US5422861 Measuring method and apparatus
06/06/1995US5422724 Multiple-scan method for wafer particle analysis
06/06/1995US5422723 Diffraction gratings for submicron linewidth measurement
06/06/1995US5422703 Reflected light measuring method and reflected light measuring apparatus for a microscopic photometric system
06/06/1995US5421529 Process and device for cleaning sensors of a yarn monitoring system
06/06/1995US5421385 Method and apparatus for processing log for sawmill including end dogging carriage which rotationally repositions log to cutting position determined by computer after non-rotational scanning
06/06/1995US5421095 Procedure for transmission of information in aligning equipment for motor vehicles, and aligning equipment for carrying out the procedure
06/01/1995WO1995014917A1 Instrumented patch for repair of fatigue damaged or sensitive structure
06/01/1995WO1995014905A1 Position measuring devices
06/01/1995DE4339710A1 Opto-electronic displacement measuring apparatus
06/01/1995CA2177162A1 Instrumented patch for repair of fatigue damaged or sensitive structure
05/1995
05/31/1995EP0655148A1 Method and device for spatial calibration of a mobile object such as a sensor or a tool carried by a robot
05/31/1995EP0655143A1 Validation of optical ranging of a target surface in a cluttered environment.
05/31/1995CN1103161A High precision measuring method and device for laser cavity change displacement and refractive index
05/30/1995US5420803 Enhanced resolution wafer thickness measurement system
05/30/1995US5420802 System and method for testing yarn altering devices
05/30/1995US5420680 Method for measuring refractive index and thickness of film and apparatus therefor
05/30/1995CA2083037C Method and apparatus for determining the image clarity of a surface
05/26/1995WO1995014211A1 Method and apparatus for optical shape measurement of oblong objects
05/26/1995CA2176820A1 Method and apparatus for optical shape measurement of oblong objects
05/24/1995EP0654655A1 Optical achromatic interferometer of the trilateral phase shift type
05/24/1995EP0654651A1 Touch probe
05/24/1995EP0630504A4 Apparatus and method for biometric identification.
05/24/1995EP0615607B1 Optical distance sensor
05/24/1995DE4342212C1 Optical measurement arrangement
05/24/1995CN1028562C Air cushion blockage and rigidity measuring method and device
05/23/1995US5418616 Method and apparatus for optically detecting the dimensions of an object and use of the method
05/23/1995US5418611 Multi-degree-of-freedom geometric error measurement system
05/18/1995WO1995013520A1 Determination of the surface properties of an object
05/18/1995WO1995013519A1 System and method for electronically displaying yarn qualities
05/18/1995DE4441332A1 Illuminating and picture-taking installation for motor vehicle driver
05/18/1995DE4338984A1 Arrangement for automatic shape testing of plates
05/18/1995DE4338907A1 Measurement arrangement for determining thicknesses of films
05/17/1995EP0653607A2 Nanodisplacement producing apparatus
05/17/1995EP0653601A1 System for measuring the roll angle of moving objects
05/17/1995EP0653052A1 Self-exciting optical strain gage.
05/17/1995EP0653049A1 Method of measuring the coating thickness of coated paper, device for carrying out the method and use of the device
05/17/1995EP0653048A1 Process for determining the location of a positioning body in relation to a reference body and device for implementing the process.
05/17/1995EP0511346B1 Alignment control device and uses thereof
05/17/1995EP0510137B1 Opto-electrical measuring process for determining cross-sectional dimensions especially of elongated objects with reference to at least one straight line at the cross-sectional periphery touching it at at least two points, and device for implementing the process
05/17/1995CN1028446C Projective type measuring instrument for measuring clearance of die set and working theory
05/16/1995US5416594 Surface scanner with thin film gauge
05/16/1995US5416593 Method for determining a distortion angle in a textile material and an apparatus for use therein
05/16/1995US5416591 Method of determination of a three-dimensional profile of an object
05/16/1995US5416590 For ascertaining information relating to spatial relationship of surfaces
05/16/1995US5416589 Electro-optical system for gauging surface profile deviations
05/16/1995US5416587 Index interferometric instrument including both a broad band and narrow band source
05/16/1995US5416586 Method of testing aspherical optical surfaces with an interferometer
05/16/1995US5416574 Automated optical measurement apparatus
05/16/1995US5416538 Object-surface-shape measuring apparatus
05/16/1995US5416467 Security system utilizing loosely contained optical fiber
05/16/1995CA2135732A1 System for measuring the roll angle of moving objects