Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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06/22/1995 | DE4444593A1 Automatic optical range finder using stereo camera image |
06/22/1995 | DE4405003A1 Electronic appts. for measurement of textiles |
06/22/1995 | CA2136506A1 High resolution high speed film measuring apparatus and method |
06/21/1995 | EP0658758A1 Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control |
06/21/1995 | EP0658499A1 Telescopic conveyor path for conveying and measuring items |
06/21/1995 | EP0503036B1 Optical device for measuring the speed or length of a moved surface |
06/21/1995 | EP0436735B1 Noncontact profile control unit |
06/21/1995 | EP0409875B1 Method and sensor for opto-electronic angle measurements |
06/21/1995 | EP0348524B1 Device for inspecting thickness of synthetic resin container and inspection system therefor |
06/20/1995 | US5426507 Laser-based pipe alignment device and method |
06/20/1995 | US5426504 Optical depth gauge for optically rough surfaces |
06/20/1995 | US5426498 Method and apparatus for real-time speckle interferometry for strain or displacement of an object surface |
06/20/1995 | US5426356 For tracing a surface of a model |
06/20/1995 | US5426309 Method and apparatus for inspecting the depth of the surface of cylindrical objects |
06/20/1995 | US5425839 Method for rapidly etching material on a semiconductor device |
06/20/1995 | US5425523 Apparatus for establishing predetermined positions of one element relative to another |
06/20/1995 | US5425279 Vessel inspection system |
06/15/1995 | WO1995016219A1 Observation instrument orientation detecting system |
06/15/1995 | CA2178624A1 Observation instrument orientation detecting system |
06/14/1995 | EP0657714A2 Method and device for measuring the side profile of a coil |
06/14/1995 | EP0657713A2 Combined interferometer and refractometer |
06/14/1995 | EP0657712A2 Thickness detecting device |
06/14/1995 | EP0657621A1 Method and system for measuring three-dimensional displacement |
06/14/1995 | EP0657260A1 Process for controlling and insuring the quality of moulded building elements |
06/14/1995 | EP0657018A1 Contactless inner coating measuring device and method for cast iron pipes |
06/14/1995 | DE4410603C1 Detecting faults during inspection of masks, LCDs, circuit boards and semiconductor wafers |
06/14/1995 | DE4342107A1 Arrangement for positioning a sensor in a space |
06/14/1995 | CN1103713A Measuring device for a figure |
06/14/1995 | CN1028906C Flexible optical fiber array tactile sensor |
06/13/1995 | US5425066 Method of finding the center of a band-shaped region |
06/13/1995 | US5424952 Vehicle-surroundings monitoring apparatus |
06/13/1995 | US5424930 Measuring-point member for optical measurement |
06/13/1995 | US5424845 Apparatus and method for engraving a gravure printing cylinder |
06/13/1995 | US5424837 Tube diameter measuring apparatus and method |
06/13/1995 | US5424836 Apparatus for contact-free optical measurement of a three-dimensional object |
06/13/1995 | US5424835 High-resolution compact optical sensor for scanning three-dimensional shapes |
06/13/1995 | US5424834 Optical displacement sensor for measurement of shape and coarseness of a target workpiece surface |
06/13/1995 | US5424830 Method and apparatus for determining the facet angles of a gemstone |
06/13/1995 | US5424828 Method for measuring and analyzing interference fringes using a halographic optical element having two patterns for diffracting a laser beam |
06/13/1995 | US5424533 Self illuminating touch activated optical switch |
06/13/1995 | US5424530 Solid image pickup device having dual integrator |
06/13/1995 | US5423514 Alignment assembly for aligning a spring element with a laser beam in a probe microscope |
06/08/1995 | WO1995015539A1 Methods for determining the exterior points of an object in a background |
06/08/1995 | WO1995015479A1 Vehicle alignment system |
06/08/1995 | WO1995010034A3 A method for characterizing polymer molecules or the like |
06/08/1995 | DE4341578A1 Rotation laser for perpendicularity measurement of large components |
06/08/1995 | DE4341098A1 Optical distance and thickness measuring device |
06/08/1995 | CA2153164A1 Methods for determining the exterior points of an object in a background |
06/06/1995 | US5422861 Measuring method and apparatus |
06/06/1995 | US5422724 Multiple-scan method for wafer particle analysis |
06/06/1995 | US5422723 Diffraction gratings for submicron linewidth measurement |
06/06/1995 | US5422703 Reflected light measuring method and reflected light measuring apparatus for a microscopic photometric system |
06/06/1995 | US5421529 Process and device for cleaning sensors of a yarn monitoring system |
06/06/1995 | US5421385 Method and apparatus for processing log for sawmill including end dogging carriage which rotationally repositions log to cutting position determined by computer after non-rotational scanning |
06/06/1995 | US5421095 Procedure for transmission of information in aligning equipment for motor vehicles, and aligning equipment for carrying out the procedure |
06/01/1995 | WO1995014917A1 Instrumented patch for repair of fatigue damaged or sensitive structure |
06/01/1995 | WO1995014905A1 Position measuring devices |
06/01/1995 | DE4339710A1 Opto-electronic displacement measuring apparatus |
06/01/1995 | CA2177162A1 Instrumented patch for repair of fatigue damaged or sensitive structure |
05/31/1995 | EP0655148A1 Method and device for spatial calibration of a mobile object such as a sensor or a tool carried by a robot |
05/31/1995 | EP0655143A1 Validation of optical ranging of a target surface in a cluttered environment. |
05/31/1995 | CN1103161A High precision measuring method and device for laser cavity change displacement and refractive index |
05/30/1995 | US5420803 Enhanced resolution wafer thickness measurement system |
05/30/1995 | US5420802 System and method for testing yarn altering devices |
05/30/1995 | US5420680 Method for measuring refractive index and thickness of film and apparatus therefor |
05/30/1995 | CA2083037C Method and apparatus for determining the image clarity of a surface |
05/26/1995 | WO1995014211A1 Method and apparatus for optical shape measurement of oblong objects |
05/26/1995 | CA2176820A1 Method and apparatus for optical shape measurement of oblong objects |
05/24/1995 | EP0654655A1 Optical achromatic interferometer of the trilateral phase shift type |
05/24/1995 | EP0654651A1 Touch probe |
05/24/1995 | EP0630504A4 Apparatus and method for biometric identification. |
05/24/1995 | EP0615607B1 Optical distance sensor |
05/24/1995 | DE4342212C1 Optical measurement arrangement |
05/24/1995 | CN1028562C Air cushion blockage and rigidity measuring method and device |
05/23/1995 | US5418616 Method and apparatus for optically detecting the dimensions of an object and use of the method |
05/23/1995 | US5418611 Multi-degree-of-freedom geometric error measurement system |
05/18/1995 | WO1995013520A1 Determination of the surface properties of an object |
05/18/1995 | WO1995013519A1 System and method for electronically displaying yarn qualities |
05/18/1995 | DE4441332A1 Illuminating and picture-taking installation for motor vehicle driver |
05/18/1995 | DE4338984A1 Arrangement for automatic shape testing of plates |
05/18/1995 | DE4338907A1 Measurement arrangement for determining thicknesses of films |
05/17/1995 | EP0653607A2 Nanodisplacement producing apparatus |
05/17/1995 | EP0653601A1 System for measuring the roll angle of moving objects |
05/17/1995 | EP0653052A1 Self-exciting optical strain gage. |
05/17/1995 | EP0653049A1 Method of measuring the coating thickness of coated paper, device for carrying out the method and use of the device |
05/17/1995 | EP0653048A1 Process for determining the location of a positioning body in relation to a reference body and device for implementing the process. |
05/17/1995 | EP0511346B1 Alignment control device and uses thereof |
05/17/1995 | EP0510137B1 Opto-electrical measuring process for determining cross-sectional dimensions especially of elongated objects with reference to at least one straight line at the cross-sectional periphery touching it at at least two points, and device for implementing the process |
05/17/1995 | CN1028446C Projective type measuring instrument for measuring clearance of die set and working theory |
05/16/1995 | US5416594 Surface scanner with thin film gauge |
05/16/1995 | US5416593 Method for determining a distortion angle in a textile material and an apparatus for use therein |
05/16/1995 | US5416591 Method of determination of a three-dimensional profile of an object |
05/16/1995 | US5416590 For ascertaining information relating to spatial relationship of surfaces |
05/16/1995 | US5416589 Electro-optical system for gauging surface profile deviations |
05/16/1995 | US5416587 Index interferometric instrument including both a broad band and narrow band source |
05/16/1995 | US5416586 Method of testing aspherical optical surfaces with an interferometer |
05/16/1995 | US5416574 Automated optical measurement apparatus |
05/16/1995 | US5416538 Object-surface-shape measuring apparatus |
05/16/1995 | US5416467 Security system utilizing loosely contained optical fiber |
05/16/1995 | CA2135732A1 System for measuring the roll angle of moving objects |