Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
04/1994
04/27/1994EP0594206A2 Method of making a SOI film having a more uniform thickness in a SOI substrate
04/27/1994EP0594146A2 System and method for automatic optical inspection
04/27/1994EP0593935A1 Registering device for a sheet-fed printing press, and registering method
04/27/1994EP0593835A1 Scanning near-field optical microscope
04/27/1994CN2163367Y Mine light angle measurer
04/27/1994CN1086011A Sealed type optical grid line displacement sensor
04/26/1994US5307368 Laser apparatus for simultaneously generating mutually perpendicular planes
04/26/1994US5307294 Automated end tally system
04/26/1994US5307153 Three-dimensional measuring apparatus
04/26/1994US5307152 Moire inspection system
04/26/1994US5307151 Method and apparatus for three-dimensional optical measurement of object surfaces
04/26/1994US5307150 Apparatus for automatically taking a reading of the shape and/or the profile of the inner contour of a frame rim of glasses
04/26/1994US5307097 Corneal topography system including single-direction shearing of holograph grating in orthogonal directions
04/26/1994US5305895 Method and device for measuring a dimension of a body, and use of said method
04/26/1994CA1328913C Process for determining and reconstituting special coordinates of each point of a set of points characterizing a tridimensional surface, and process for producing a tridimensionalimage of said surface from these coordinates
04/21/1994DE4335266A1 Four sensor vehicle wheel alignment system - has sensors for each wheel in optical communication with each other and generating redundant signal groups
04/21/1994DE4235104A1 Road condition detecting unit identifying state of road surface lying before moving motor vehicle - uses two adjustable light transmitting and receiving systems at different angles of elevation and supplying evaluation circuit correlating receiver signals
04/20/1994EP0593210A2 Track width error inspector apparatus
04/20/1994EP0593183A2 Video/cad image comparator system
04/20/1994EP0593067A1 Procedure and device for the determination of the orientation and position of objects with laserbeams
04/20/1994EP0593066A1 Device to calibrate measuring-unities to determine toe-in-, camber- and flack of vehicle wheels in a driving-rack
04/20/1994EP0592997A2 Methods and apparatus for measuring tissue section thickness
04/20/1994EP0592631A1 Phase detection deflectometer-type optical device having a large measuring range
04/20/1994EP0447531B1 Process and device for the three-dimensional optical measurement, especially of teeth in patients' buccal cavities
04/20/1994CN1085655A Thin film thickness monitoring and control
04/19/1994US5305294 Magneto-optical recording/reproducing system having an electromagnetic actuator
04/19/1994US5305092 Apparatus for obtaining three-dimensional volume data of an object
04/19/1994US5305091 Optical coordinate measuring system for large objects
04/19/1994US5305080 Apparatus for inspecting surface of a face plate for a cathode ray tube
04/19/1994US5304924 Edge detector
04/19/1994US5304795 High resolution observation apparatus with photon scanning microscope
04/17/1994CA2108395A1 Methods and apparatus for measuring tissue section thickness
04/17/1994CA2106146A1 Video-cad comparator system
04/15/1994CA2080557A1 Sensitive interferometric parallel thermal-wave imager
04/14/1994WO1994008205A1 Method of measuring the coordinates of workpieces
04/14/1994DE4233843A1 Filling bottles or similar containers with liquid - involves measuring bottle shape or related dimension to eliminate shrinkage errors
04/12/1994US5303034 Robotics targeting system
04/12/1994US5302833 Rotational orientation sensor for laser alignment control system
04/12/1994US5302821 Encoder using a birefringent element and a system including the same
04/07/1994DE4233399A1 Force microscope with cantilevered point and deflection photodetector - is based on measurement of astigmatism in compact sensor head revolvable into path of optical microscope
04/07/1994DE4233384A1 Measuring profile section, esp. width and height - evaluating profile section contours from detected light reflected during successive illuminations
04/07/1994DE4233336A1 Focussing error detection using Michelson interferometer - evaluating periodic frequency or phase of interference pattern formed at detector by two reflected sub-beams
04/06/1994EP0590163A1 Length or angle measuring device
04/06/1994EP0590162A1 Linear or angular measuring device
04/06/1994CN2160887Y Intelligent raster measurer
04/06/1994CN1084967A Grain diameter directly measuring method and device
04/05/1994US5301011 Method of and apparatus for ascertaining the diameters of rod-shaped articles
04/05/1994US5301005 Method and apparatus for determining the position of a retroreflective element
04/05/1994US5301003 Three-dimensional displacement measurement apparatus and method with vertical displacement measurement compensation
04/05/1994US5300787 Method for setting a sensor which detects the edge of a moving web of material in a contact-free manner
04/05/1994US5300347 Embossed facial tissue
03/1994
03/31/1994WO1994007124A1 Extraction of spatially varying dielectric function from ellipsometric data
03/31/1994WO1994007110A1 Optical endpoint determination during the processing of material layers
03/31/1994WO1994006616A1 Device and process for controlling the bead size in the glazing rolls
03/31/1994DE4327250A1 Workpiece optical coordinates measuring system - using video camera coupled to monitor for visual examination of mechanically scanned workpiece surface
03/31/1994DE4242189C1 Verfahren und Vorrichtung zum Aufnehmen eines Entfernungsbildes Method and apparatus for recording a distance image
03/31/1994DE4232606A1 Detecting three=dimensional structures of internal surface of negative forms for making prostheses for human joints - scanning interior surfaces with axially displaced laser light and deriving machining control signals from detection of reflected light
03/31/1994DE4232529A1 Measuring transversely transported cut logs - detecting light reflected from logs and measuring time intervals between signals associated with leading and trailing edges
03/31/1994DE4232036A1 Positioning error detection system for electronic component terminals - uses evaluation of electrical signal representing shadow when component is moved relative to focussed light beam
03/30/1994EP0589750A1 3D graphics data process for patch generation, segmentation and selection of the set of points representing surfaces or curves
03/30/1994EP0589528A2 Test tube diameter measuring apparatus
03/30/1994EP0589477A2 Rotation information detection apparatus
03/30/1994EP0589448A1 An occupant condition determining apparatus
03/30/1994EP0588815A1 Road image sequence analysis device and method for obstacle detection
03/30/1994EP0357695B1 Optical apparatus for use with interferometric measuring devices
03/30/1994CN2160101Y Optical coded shift sensor
03/29/1994US5299270 Method and apparatus for simultaneous matching of displaced image blocks to a reference
03/29/1994US5299268 Method for detecting the locations of light-reflective metallization on a substrate
03/29/1994US5299049 Beam shifting device
03/29/1994US5298987 Method for investigating ground structure of pavement
03/29/1994US5298977 Visual inspection method for part mounted on printed circuit board
03/29/1994US5298976 Method and apparatus for measuring surface distances from a reference plane
03/29/1994US5298975 Combined scanning force microscope and optical metrology tool
03/29/1994US5298974 Apparatus for determining the surface topography of an article
03/29/1994US5298971 Lateral shear interferometer for testing aspheric surfaces
03/29/1994US5298966 Measurement system
03/29/1994US5298718 Optical element manufacturing method and a wafer
03/24/1994DE4231578A1 Deformation measurement on, e.g. tyre with diffusive surface - involves computerised processing of stepwise phase-shifted image sequence of deformed surface w.r.t. stored image
03/23/1994EP0588585A1 Detecting points of origin of position sensors
03/23/1994EP0588355A1 Process for control of the melt level during single crystal pulling
03/22/1994US5296916 Mask alignment system for components with extremely sensitive surfaces
03/22/1994US5296914 Electro-optical measurement and focusing apparatus
03/22/1994US5296705 Imaging system with integrated measuring of the wear of its optical elements working in transmission mode and optronic imaging equipment comprising an imaging system such as this
03/17/1994WO1994006041A1 Optical waveguide device and optical instrument using the same
03/17/1994WO1994006032A1 A system for determining the interior structure of a glowing vessel
03/17/1994WO1994005970A1 Spatial positioning system
03/17/1994WO1994005969A1 Method and apparatus for determining the alignment of motor vehicle wheels
03/17/1994WO1994005968A1 Hidden change distribution grating and use in 3d moire measurement sensors and cmm applications
03/17/1994WO1994005966A1 Interferometric probe for distance measurement
03/17/1994DE4330406A1 Measuring appts. for elongated objects, esp. tree trunks on conveyor - has pivotable feeder with rest position taken up while object undergoes measurement within three-sided frame
03/17/1994DE4230725A1 Test equipment for roundness of discs rolling down inclined plane - allows passage of single disc past acutely angled linear image sensor long enough for scan of complete circumference
03/17/1994DE4229349A1 Measurement of light reflection, transmission, and dispersion qualities of web materials - by measuring the amt. of fleck beam reflected from the material
03/17/1994CA2143838A1 Spatial positioning systems
03/16/1994EP0587328A2 An image processing system
03/16/1994EP0586902A1 Contactless measurement device of thickness and/or thermal properties of foils and thin surface layers
03/16/1994EP0586901A1 Contactless measurement device for thickness and/or thermal properties of foils and thin surface layers
03/16/1994EP0586857A1 Vehicle lane position detection system
03/16/1994EP0586804A2 Laser apparatus
03/16/1994EP0586795A1 Procedure and device for the contactless determination of the roughness of surface of objects
03/16/1994EP0586454A1 Positional measurement.