Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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08/01/1995 | US5437242 Process and apparatus for controlling the melt level while pulling single crystals |
07/29/1995 | CA2114510A1 Inspection method using area of interest (aoi) analysis |
07/27/1995 | WO1995020140A1 Optical motion sensor |
07/27/1995 | WO1995020139A1 Grating-grating interferometric alignment system |
07/27/1995 | DE4401978A1 Non-destructive test appts. using optical and holographic-interferometric techniques |
07/27/1995 | CA2180941A1 Grating-grating interferometric alignment system |
07/26/1995 | EP0664666A1 Method and mounting device for mounting components at specific positions |
07/26/1995 | EP0664446A2 Inspection system and method for cross-sectional imaging |
07/26/1995 | EP0664436A2 Device and method for the measuring of wheel angles |
07/26/1995 | EP0664271A1 Anticollision device and method for mobiles on common rails |
07/26/1995 | EP0467984B1 A plant for track-based detection of the wheel profile of train wheels |
07/25/1995 | US5436979 Process for detecting and mapping dirt on the surface of a photographic element |
07/25/1995 | US5436727 Distance measuring method and apparatus |
07/25/1995 | US5436726 Flaw highlighting light panel and booth for automobile body repair |
07/25/1995 | US5436725 Cofocal optical system for thickness measurements of patterned wafers |
07/25/1995 | US5436721 Wafer tilt gauge |
07/25/1995 | US5436720 Acousto-optical laser discriminator |
07/25/1995 | US5436541 Rain detector |
07/25/1995 | US5436462 Video contour measurement system employing moire interferometry having a beat frequency pattern |
07/20/1995 | WO1995019542A1 Process and device for measuring eccentric rotary components |
07/20/1995 | WO1995019541A1 An interferometric measuring system |
07/20/1995 | DE4401238A1 Verfahren und Vorrichtung zur Vermessung von exzentrischen Teilen eines Meßobjekts Method and device for measurement of eccentric parts of a measured object |
07/20/1995 | CA2180718A1 Process and device for measuring eccentric rotary components |
07/19/1995 | EP0663458A1 Deposition film, method of measuring shape of deposition film, method of controlling manufacturing processes, manufacturing method, shape measuring apparatus and apparatus for controlling manufacturing processes |
07/19/1995 | EP0663265A1 In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
07/19/1995 | EP0663069A1 Inspection machine |
07/19/1995 | EP0506966B1 Non-contact copy control device |
07/18/1995 | US5434956 Method and apparatus for printing an image in a specified positional relationship with a preprinted registration mark |
07/18/1995 | US5434802 Method of detecting the inclination of an IC |
07/18/1995 | US5434671 Birefringent member cell gap measurement method and instrument |
07/18/1995 | US5434669 Measuring interferometric endoscope having a laser radiation source |
07/18/1995 | US5434430 Drop size detect circuit |
07/18/1995 | US5434428 Length measurement system along UV-shaped conveyor using data from object sensors |
07/18/1995 | US5434425 Optical position detecting apparatus |
07/18/1995 | US5434406 Hemispheric matrixsized imaging optical system |
07/18/1995 | US5433651 In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
07/18/1995 | US5433649 Blade position detection apparatus |
07/13/1995 | WO1995018952A1 Process for measuring the roughness of a material surface |
07/13/1995 | WO1995018951A1 Inspection interferometer with scanning feature |
07/13/1995 | DE4400288A1 Measurement of offset distance of overhead conductor of railway system |
07/12/1995 | EP0662603A1 Length measuring system |
07/12/1995 | EP0662600A1 Apparatus for measuring position of moving object |
07/12/1995 | EP0662215A1 Extraction of spatially varying dielectric function from ellipsometric data |
07/12/1995 | EP0662211A1 Process and assembly for measuring an article's dimensions |
07/12/1995 | EP0662036A1 Device and process for controlling the bead size in the glazing rolls. |
07/12/1995 | EP0615608B1 Roller for measuring the surface flatness of a strip produced in a continuous process |
07/12/1995 | CN1105121A Super fine surface roughness non-contact type optical interference measuring method |
07/11/1995 | US5432606 Interferometer for the measurement of surface profile which introduces a spatial carrier by tilting the reference mirror |
07/11/1995 | US5432605 Interferometric cylinder sizing and velocimetry device |
07/11/1995 | US5432596 Lens measurement apparatus providing measurements of multiple lens characteristics |
07/11/1995 | US5432595 Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison |
07/11/1995 | US5432330 Two-stage detection noncontact positioning apparatus having a first light detector with a central slit |
07/11/1995 | US5430954 Measuring calliper |
07/06/1995 | WO1995018353A1 Method and apparatus for monitoring thin films |
07/06/1995 | WO1995017986A2 Base curve bender |
07/06/1995 | DE4445464A1 Scanning apparatus for determining spatial co-ordinates |
07/06/1995 | DE4426355A1 Optical system for determining spatial position of object |
07/06/1995 | DE4344998A1 Measuring lateral direction errors of esp. gun barrel swivelable in elevation |
07/06/1995 | DE4341894C1 Verfahren zur Qualitätssicherung bzw. zur Qualitätsüberwachung von aus Beton hergestellten Produkten Procedures for quality assurance and quality control of manufactured concrete products |
07/06/1995 | CA2286988A1 Base curve bender |
07/05/1995 | EP0661614A2 System for detecting position of mobile robot and controlling the same |
07/05/1995 | EP0661534A1 Apparatus and method for regulating the cross-linking density of glass coatings |
07/05/1995 | EP0661518A2 Method for positioning a measuring device emitting and receiving optical radiation for measuring wear in the lining of a container |
07/05/1995 | EP0661517A1 Position transducer of the teat of the udder of a four-legged animal, particularly of a cow |
07/05/1995 | CN2202913Y Facula diameter measurer |
07/04/1995 | US5430665 Apparatus and method for measuring length of moving elongated object |
07/04/1995 | US5430549 Laser positioning device producing multiple parallel laser beams |
07/04/1995 | US5430548 Method and apparatus for pattern detection |
07/04/1995 | US5430547 Non-contacting position detecting apparatus |
07/04/1995 | US5430546 Optical device for measuring relative position of or angle between two objects |
07/04/1995 | US5430539 Method and arrangement for checking alignment of body axes for parallelism |
07/04/1995 | US5430301 Apparatus and methods for measurement and classification of generalized neplike entities in fiber samples |
07/04/1995 | US5429161 Apparatus for optimum positioning of cants for resawing |
06/29/1995 | WO1995017646A1 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
06/29/1995 | WO1995017644A1 Contour measurement system |
06/29/1995 | DE4445864A1 Insulation thickness measuring system for semiconductor wafer |
06/29/1995 | DE4445552A1 Optically-scanning displacement detector for contour measurement |
06/29/1995 | DE4344767A1 Dimension measuring device for rotationally symmetrical objects |
06/28/1995 | EP0660265A2 Device for testing an image of a test object |
06/28/1995 | EP0660098A2 Visual inspection method and apparatus for contact lenses |
06/28/1995 | EP0660079A2 Three-dimensional measuring apparatus |
06/28/1995 | EP0660078A1 Apparatus for the generation of fringe-like light patterns |
06/28/1995 | EP0660077A2 Method of determining thickness of a coating |
06/28/1995 | EP0660076A2 Method and apparatus for measuring film thickness in multilayer thin film stack |
06/28/1995 | EP0660075A2 High resolution high speed film measuring apparatus and method |
06/28/1995 | EP0660074A2 Photoelectric measuring head |
06/28/1995 | EP0659265A1 Spatial positioning system |
06/28/1995 | CN1104329A Apparatus and method for detecting out appearance of electronic elements |
06/27/1995 | US5428449 Cross-sectional area measuring machine |
06/27/1995 | US5428448 Method and apparatus for non-contact digitazation of frames and lenses |
06/27/1995 | US5428446 Measurement instrument with interferometer and method |
06/27/1995 | US5428445 Interferential position measuring device |
06/27/1995 | US5428444 Real time interferometric comparator |
06/27/1995 | US5428442 Inspection system with in-lens, off-axis illuminator |
06/27/1995 | US5428217 Annular photodiode for use in an optical rotary encoder |
06/27/1995 | US5427878 Semiconductor wafer processing with across-wafer critical dimension monitoring using optical endpoint detection |
06/27/1995 | US5427052 Method and apparatus for production of extremely thin SOI film substrate |
06/22/1995 | WO1995016907A1 Surface photothermic testing device |
06/22/1995 | WO1995016626A1 Telescopic belt conveyor for transporting and measuring part-load traffic |
06/22/1995 | WO1995016543A1 Method and device for adjusting reamers and similar equipment |