Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/1995
08/01/1995US5437242 Process and apparatus for controlling the melt level while pulling single crystals
07/1995
07/29/1995CA2114510A1 Inspection method using area of interest (aoi) analysis
07/27/1995WO1995020140A1 Optical motion sensor
07/27/1995WO1995020139A1 Grating-grating interferometric alignment system
07/27/1995DE4401978A1 Non-destructive test appts. using optical and holographic-interferometric techniques
07/27/1995CA2180941A1 Grating-grating interferometric alignment system
07/26/1995EP0664666A1 Method and mounting device for mounting components at specific positions
07/26/1995EP0664446A2 Inspection system and method for cross-sectional imaging
07/26/1995EP0664436A2 Device and method for the measuring of wheel angles
07/26/1995EP0664271A1 Anticollision device and method for mobiles on common rails
07/26/1995EP0467984B1 A plant for track-based detection of the wheel profile of train wheels
07/25/1995US5436979 Process for detecting and mapping dirt on the surface of a photographic element
07/25/1995US5436727 Distance measuring method and apparatus
07/25/1995US5436726 Flaw highlighting light panel and booth for automobile body repair
07/25/1995US5436725 Cofocal optical system for thickness measurements of patterned wafers
07/25/1995US5436721 Wafer tilt gauge
07/25/1995US5436720 Acousto-optical laser discriminator
07/25/1995US5436541 Rain detector
07/25/1995US5436462 Video contour measurement system employing moire interferometry having a beat frequency pattern
07/20/1995WO1995019542A1 Process and device for measuring eccentric rotary components
07/20/1995WO1995019541A1 An interferometric measuring system
07/20/1995DE4401238A1 Verfahren und Vorrichtung zur Vermessung von exzentrischen Teilen eines Meßobjekts Method and device for measurement of eccentric parts of a measured object
07/20/1995CA2180718A1 Process and device for measuring eccentric rotary components
07/19/1995EP0663458A1 Deposition film, method of measuring shape of deposition film, method of controlling manufacturing processes, manufacturing method, shape measuring apparatus and apparatus for controlling manufacturing processes
07/19/1995EP0663265A1 In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing
07/19/1995EP0663069A1 Inspection machine
07/19/1995EP0506966B1 Non-contact copy control device
07/18/1995US5434956 Method and apparatus for printing an image in a specified positional relationship with a preprinted registration mark
07/18/1995US5434802 Method of detecting the inclination of an IC
07/18/1995US5434671 Birefringent member cell gap measurement method and instrument
07/18/1995US5434669 Measuring interferometric endoscope having a laser radiation source
07/18/1995US5434430 Drop size detect circuit
07/18/1995US5434428 Length measurement system along UV-shaped conveyor using data from object sensors
07/18/1995US5434425 Optical position detecting apparatus
07/18/1995US5434406 Hemispheric matrixsized imaging optical system
07/18/1995US5433651 In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing
07/18/1995US5433649 Blade position detection apparatus
07/13/1995WO1995018952A1 Process for measuring the roughness of a material surface
07/13/1995WO1995018951A1 Inspection interferometer with scanning feature
07/13/1995DE4400288A1 Measurement of offset distance of overhead conductor of railway system
07/12/1995EP0662603A1 Length measuring system
07/12/1995EP0662600A1 Apparatus for measuring position of moving object
07/12/1995EP0662215A1 Extraction of spatially varying dielectric function from ellipsometric data
07/12/1995EP0662211A1 Process and assembly for measuring an article's dimensions
07/12/1995EP0662036A1 Device and process for controlling the bead size in the glazing rolls.
07/12/1995EP0615608B1 Roller for measuring the surface flatness of a strip produced in a continuous process
07/12/1995CN1105121A Super fine surface roughness non-contact type optical interference measuring method
07/11/1995US5432606 Interferometer for the measurement of surface profile which introduces a spatial carrier by tilting the reference mirror
07/11/1995US5432605 Interferometric cylinder sizing and velocimetry device
07/11/1995US5432596 Lens measurement apparatus providing measurements of multiple lens characteristics
07/11/1995US5432595 Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison
07/11/1995US5432330 Two-stage detection noncontact positioning apparatus having a first light detector with a central slit
07/11/1995US5430954 Measuring calliper
07/06/1995WO1995018353A1 Method and apparatus for monitoring thin films
07/06/1995WO1995017986A2 Base curve bender
07/06/1995DE4445464A1 Scanning apparatus for determining spatial co-ordinates
07/06/1995DE4426355A1 Optical system for determining spatial position of object
07/06/1995DE4344998A1 Measuring lateral direction errors of esp. gun barrel swivelable in elevation
07/06/1995DE4341894C1 Verfahren zur Qualitätssicherung bzw. zur Qualitätsüberwachung von aus Beton hergestellten Produkten Procedures for quality assurance and quality control of manufactured concrete products
07/06/1995CA2286988A1 Base curve bender
07/05/1995EP0661614A2 System for detecting position of mobile robot and controlling the same
07/05/1995EP0661534A1 Apparatus and method for regulating the cross-linking density of glass coatings
07/05/1995EP0661518A2 Method for positioning a measuring device emitting and receiving optical radiation for measuring wear in the lining of a container
07/05/1995EP0661517A1 Position transducer of the teat of the udder of a four-legged animal, particularly of a cow
07/05/1995CN2202913Y Facula diameter measurer
07/04/1995US5430665 Apparatus and method for measuring length of moving elongated object
07/04/1995US5430549 Laser positioning device producing multiple parallel laser beams
07/04/1995US5430548 Method and apparatus for pattern detection
07/04/1995US5430547 Non-contacting position detecting apparatus
07/04/1995US5430546 Optical device for measuring relative position of or angle between two objects
07/04/1995US5430539 Method and arrangement for checking alignment of body axes for parallelism
07/04/1995US5430301 Apparatus and methods for measurement and classification of generalized neplike entities in fiber samples
07/04/1995US5429161 Apparatus for optimum positioning of cants for resawing
06/1995
06/29/1995WO1995017646A1 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings
06/29/1995WO1995017644A1 Contour measurement system
06/29/1995DE4445864A1 Insulation thickness measuring system for semiconductor wafer
06/29/1995DE4445552A1 Optically-scanning displacement detector for contour measurement
06/29/1995DE4344767A1 Dimension measuring device for rotationally symmetrical objects
06/28/1995EP0660265A2 Device for testing an image of a test object
06/28/1995EP0660098A2 Visual inspection method and apparatus for contact lenses
06/28/1995EP0660079A2 Three-dimensional measuring apparatus
06/28/1995EP0660078A1 Apparatus for the generation of fringe-like light patterns
06/28/1995EP0660077A2 Method of determining thickness of a coating
06/28/1995EP0660076A2 Method and apparatus for measuring film thickness in multilayer thin film stack
06/28/1995EP0660075A2 High resolution high speed film measuring apparatus and method
06/28/1995EP0660074A2 Photoelectric measuring head
06/28/1995EP0659265A1 Spatial positioning system
06/28/1995CN1104329A Apparatus and method for detecting out appearance of electronic elements
06/27/1995US5428449 Cross-sectional area measuring machine
06/27/1995US5428448 Method and apparatus for non-contact digitazation of frames and lenses
06/27/1995US5428446 Measurement instrument with interferometer and method
06/27/1995US5428445 Interferential position measuring device
06/27/1995US5428444 Real time interferometric comparator
06/27/1995US5428442 Inspection system with in-lens, off-axis illuminator
06/27/1995US5428217 Annular photodiode for use in an optical rotary encoder
06/27/1995US5427878 Semiconductor wafer processing with across-wafer critical dimension monitoring using optical endpoint detection
06/27/1995US5427052 Method and apparatus for production of extremely thin SOI film substrate
06/22/1995WO1995016907A1 Surface photothermic testing device
06/22/1995WO1995016626A1 Telescopic belt conveyor for transporting and measuring part-load traffic
06/22/1995WO1995016543A1 Method and device for adjusting reamers and similar equipment