Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/1995
11/28/1995CA2106267C Device for optimally positioning cants for further processing
11/23/1995WO1995031694A1 Improved phase shifting interferometer and method for surface topography measurement
11/23/1995WO1992017770A3 Dimensional inspection process of medical ampules
11/23/1995DE4417872A1 Optische Digitalisierung von Körperteilen Optical digitization of body parts
11/22/1995EP0683379A1 System for making 3-D measurements of the surfaces of large objects
11/22/1995EP0682991A2 Automatic machine for sorting, respectively classifying small products from pharmaceutical and candy industry according to shape and colour
11/22/1995EP0682771A1 Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms
11/22/1995EP0670997A4 Surface pit and mound detection and discrimination system and method.
11/22/1995EP0540702B1 Opto-electronic sensor arrangement and process for determining the rotation speed and relative position of rotating devices
11/21/1995US5469262 Dimension-measuring apparatus
11/21/1995US5469259 Inspection interferometer with scanning autofocus, and phase angle control features
11/21/1995US5469253 Apparatus and method for testing multiple characteristics of single textile sample with automatic feed
11/21/1995US5469249 For determining distance between the probe and a workpiece
11/21/1995US5468580 Condition optimization method for measuring overlay accuracy of pattern
11/21/1995US5467634 Method and apparatus for calibrating three-dimensional space for machine vision applications
11/20/1995CA2123942A1 Measuring device for vehicle body repair
11/16/1995WO1995030890A1 Fluorescence method for determining properties of a polymer coating or film
11/16/1995WO1995030498A1 System and method for automatically feeding, inspecting and diverting tablets for continuous filling of tablet containers
11/16/1995WO1995030367A1 Optical alignment device
11/16/1995DE4434233A1 Contactless three=dimensional measurement
11/16/1995DE4416786A1 Calibration of interferometer for testing surface profile of cylindrical sample
11/16/1995DE4416441A1 Opto-electronic measurement of dimensional stability of components
11/16/1995CA2189680A1 System and method for automatically feeding, inspecting and diverting tablets for continuous filling of tablet containers
11/15/1995EP0682230A2 Apparatus for measuring displacement for object using diffraction grating
11/15/1995EP0682226A2 Device to test the state of a surface
11/15/1995EP0681722A1 Methods for determining the exterior points of an object in a background
11/15/1995EP0681681A1 Active multipoint fiber laser sensor
11/14/1995US5467194 Method and device for photoelectric identification of a material web
11/14/1995US5467193 Target device and use thereof for aligning light beams utilizing cross-hair light beams
11/14/1995US5467192 Improvements in or relating to surface curvature measurement
11/14/1995US5467191 Optical metrology apparatus
11/14/1995US5467184 Method of large deformation measurement using speckle interferometry
11/14/1995US5466945 Apparatus for detecting proper positioning of objects in a holder
11/14/1995US5465821 Sheet discriminating apparatus
11/14/1995US5465493 Pipe alignment apparatus and method using green light
11/09/1995WO1995030204A1 Method and apparatus for ball bond inspection system
11/09/1995DE4416108A1 Object surface contactless measurement appts.
11/09/1995DE4415834A1 Optical range and spatial coordinate measurement device for construction and surveying
11/09/1995DE4415582A1 Optical distance measurement of inner walls for e.g. measuring pipe wall strength
11/09/1995DE4415419A1 Precision position measurement appts. for robotic container high-lift truck
11/09/1995DE4408291A1 Automated optical weld seam testing
11/08/1995EP0681230A1 Navigation system
11/08/1995EP0681159A1 Position measuring device with temperature compensation
11/08/1995EP0680599A1 Position measuring devices
11/08/1995EP0680565A1 Hydraulic system with pump and load
11/08/1995EP0680272A1 Process and device for determining the topography of a reflecting surface.
11/08/1995EP0564535B1 Determination of the relative position of measurement points
11/08/1995CN2212187Y Needle hole tracing detector
11/08/1995CN1111350A Glass container inspection machine
11/07/1995US5465214 Method of measuring the shape and/or the planarity of a running material, and device for its implementation
11/07/1995US5465154 Optical monitoring of growth and etch rate of materials
11/07/1995US5465153 For gauging surface geometry of a test object
11/07/1995US5465152 Method for coplanarity inspection of package or substrate warpage for ball grid arrays, column arrays, and similar structures
11/07/1995US5465148 Apparatus and method for detecting the relative positional deviation between two diffraction gratings
11/07/1995US5465147 Method and apparatus for acquiring images using a ccd detector array and no transverse scanner
11/07/1995US5465145 Semiconductor wafer inspection apparatus
11/07/1995US5465144 Remote tracking system for moving picture cameras and method
11/02/1995WO1995029396A1 Methods and apparatus for determining a first parameter(s) of an object
11/02/1995WO1995029378A1 System for measuring wheel angles and chassis units positions of a vehicle
11/02/1995EP0680019A2 Image processing method and apparatus
11/02/1995EP0680014A2 Image processing method and apparatus
11/02/1995EP0679880A2 Structure monitoring system using optical fibres
11/02/1995EP0679870A2 Optical displacement sensor
11/02/1995EP0679869A2 Distance measuring device
11/02/1995EP0679865A1 Device and method for the geometrical control of wheeled vehicles
11/02/1995EP0679864A1 Confocal optical apparatus
11/02/1995EP0679510A1 Method and device for fabricating a screener
11/02/1995EP0679244A1 Computerized three dimensional data acquisition apparatus and method
11/02/1995EP0679243A1 Method and apparatus for measuring of distances
11/02/1995CA2189048A1 Methods and apparatus for determining a first parameter(s) of an object
10/1995
10/31/1995US5463697 Apparatus for detecting an edge of an image
10/31/1995US5463464 Electro-optical system for gauging surface profile deviations using infrared radiation
10/31/1995US5463463 Optical motion sensor
10/31/1995US5463430 Examination apparatus for examining an object having a spheroidal reflective surface
10/31/1995US5463228 Apparatus for the detection of a fluid phase boundary in a transparent measuring tube and for the automatic exact metering of an amount of liquid
10/31/1995US5463227 Method for obtaining three-dimensional data from multiple parts or devices in a multi-pocketed tray
10/31/1995US5463221 Electron beam measuring apparatus
10/31/1995US5463215 Device for aligning the axis of a light beam with the axis of an optical fiber
10/31/1995US5461927 Optical fiber strain sensor for measuring maximum strain
10/31/1995US5461926 Single-ended optical fiber strain sensor for measuring maximum strain
10/31/1995US5461793 Self centering pipe axis laser guide
10/26/1995WO1995028807A1 Three-dimensional phenotypic measuring system for animals
10/26/1995WO1995017986A3 Base curve bender
10/26/1995DE4413745A1 Monitoring object surfaces
10/26/1995CA2187527A1 Three-dimensional phenotypic measuring system for animals
10/25/1995EP0678832A2 Generation of depth image through interpolation and extrapolation of intermediate images derived from stereo image pair using disparsity vector fields
10/25/1995EP0678729A1 Thickness measuring procedure
10/25/1995EP0678189A1 Determination of the surface properties of an object
10/25/1995EP0678188A1 Interferometric cylinder sizing and velocimetry device
10/25/1995EP0617815B1 Automatic object recognition process and device
10/24/1995US5461480 Parts recognizing device for mounting machine
10/24/1995US5461478 Method and apparatus for measuring three-dimensional position and orientation of an object using light projection
10/24/1995US5461472 Method and apparatus for measuring the parallelism of two surfaces
10/24/1995US5461228 Optical inspection of container dimensional parameters using a telecentric lens
10/24/1995US5461007 Process for polishing and analyzing a layer over a patterned semiconductor substrate
10/24/1995US5459939 Apparatus and method for measuring width of micro gap
10/24/1995US5459932 Automatic level and plumb tool
10/19/1995WO1995027918A2 Method of determining measurement-point position data and device for measuring the magnification of an optical beam path
10/19/1995WO1995027917A1 Method of determining the position of a feature on an object relative to a surgical microscope and a device for carrying out the method
10/19/1995WO1995027883A1 Automated end tally system