| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/26/1994 | EP0579846A1 Optical device |
| 01/26/1994 | EP0579746A1 Scanning laser measurement system |
| 01/26/1994 | EP0579707A1 Methods of and apparatus for measurement using acousto-optic devices |
| 01/26/1994 | CN2154460Y Emergency measuring device of mini-machinery system materical |
| 01/26/1994 | CN2154459Y Straight shift sensor for rolling grating |
| 01/26/1994 | CN1081250A Method and apparatus for detecting surface roughness |
| 01/26/1994 | CN1081249A Optical measurement and apparatus for sharpness of cutting tool |
| 01/25/1994 | US5282151 Submicron diameter particle detection utilizing high density array |
| 01/25/1994 | US5282016 Optical alignment by use of arrays of reflective or diffractive optical elements and detectors |
| 01/25/1994 | US5282015 Methods and means for full-surface interferometric testing of grazing incidence mirrors |
| 01/25/1994 | US5281819 Apparatus for nondestructively determining coating thickness on a metal object and associated method |
| 01/25/1994 | US5281807 Optical sensor head with sloped, convergent optical systems and beam diaphragm |
| 01/20/1994 | WO1994001737A1 System and method for monitoring and controlling the width of a product |
| 01/20/1994 | DE4223244A1 Measuring cross=sectional area in automatic assembly machine - passing body through multiple light barriers and integrating signal function of shadow over distance travelled |
| 01/19/1994 | EP0578816A1 Method of inspecting articles |
| 01/19/1994 | EP0487681B1 Method for measurement of angular displacement |
| 01/19/1994 | EP0349553B1 Position sensing method and apparatus |
| 01/19/1994 | CN2153772Y 位移测量计数器 Displacement measurement counter |
| 01/18/1994 | US5280542 XYZ coordinates measuring system |
| 01/18/1994 | US5280530 Method and apparatus for tracking a moving object |
| 01/18/1994 | US5280436 Method for measuring three-dimensional position of object to be captured and method for capturing the object |
| 01/18/1994 | US5280340 Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
| 01/18/1994 | US5280336 Automated radius measurement apparatus |
| 01/18/1994 | US5280333 Apparatus and a method for testing documents |
| 01/18/1994 | US5280179 Method and apparatus utilizing an orientation code for automatically guiding a robot |
| 01/18/1994 | US5280171 Process and apparatus for the non-contacting detection of edges of objects |
| 01/18/1994 | US5280170 Machine for inspecting the shape of a container having a two dimensional camera for viewing the shadow of the projection of the container |
| 01/18/1994 | US5279044 Measuring device for determining an absolute position of a movable element and scale graduation element suitable for use in such a measuring device |
| 01/18/1994 | US5279038 Device for measuring the angular position of a component which is rotatably displaceable relative to a fixed component, especially of a telescope mounting in relation to its supporting structure |
| 01/13/1994 | DE4238003C1 Building construction measuring instrument transmitting measurements to ground level - uses sliding carriage supporting measuring laser directed upwards and display device directed downwards |
| 01/13/1994 | DE4222659A1 Optical scanner for range finder for obstruction warning esp. for driverless transport system - has fixed and coaxial emitters and receiver, and rotating optical system located in mirrored box and consisting of lenses and inclined mirrors which focus received beam on axis where receiver is located |
| 01/12/1994 | EP0577950A1 Method for inspecting the volume of plastic bottles and device for carrying out this method |
| 01/12/1994 | EP0440766B1 Edge sensor |
| 01/11/1994 | US5278934 Throughput maximizing systems for substantially unimodal throughput profiles |
| 01/11/1994 | US5278635 Surface defect detection apparatus |
| 01/11/1994 | US5278634 High precision component alignment sensor system |
| 01/11/1994 | US5278633 Optical contour detector and methods for making and using |
| 01/11/1994 | US5278632 Multi-axis optical projector |
| 01/11/1994 | US5277747 Extraction of spatially varying dielectric function from ellipsometric data |
| 01/11/1994 | US5276970 Codestrip in a large-format image-related device |
| 01/11/1994 | CA1325906C Fiber optic imaging system for on-line monitoring |
| 01/08/1994 | CA2099959A1 Method for the inspection of the volume of a plastic bottle and bottle inspection machine for performing the method |
| 01/06/1994 | WO1994000734A1 Method and apparatus of stud array upstand setting |
| 01/06/1994 | WO1994000733A1 Method of an apparatus for interferometrically inspecting a surface of an object |
| 01/06/1994 | CA2137678A1 Method and apparatus of stud array upstand setting |
| 01/05/1994 | EP0577514A1 Apparatus for the precision measurement of internal tube diameter over a long distance |
| 01/05/1994 | EP0577399A2 Apparatus and method for performing thin film layer thickness metrology on a thin film layer having shape deformations and local slope variations |
| 01/05/1994 | EP0577128A1 Method for mounting components and an apparatus therefor |
| 01/05/1994 | EP0577085A2 Method and apparatus for determining visually perceptible differences between images |
| 01/05/1994 | EP0577080A1 Inspection method of inclination of an IC-package |
| 01/05/1994 | EP0576843A2 A method and apparatus for orienting a camera |
| 01/05/1994 | EP0576636A1 Method and device for measuring the degree of bending in a glass sheet |
| 01/05/1994 | EP0576610A1 Measuring method and apparatus |
| 01/05/1994 | EP0576587A1 Throughput maximizing systems for substantially unimodal throughput profiles |
| 01/05/1994 | EP0528915B1 Method and apparatus for determining the image clarity of a surface |
| 01/05/1994 | DE4221989A1 Three-axis laser interferometer for measurement of relative positions of both measurement spindles of two-arm coordinate measurement machine in region of overlap - fixes body of defined shape for carrier for reflectors on one spindle and combines remaining optical components of interferometer are with probe located on other spindle. |
| 01/05/1994 | DE4221031A1 System for contactless continuous measurement of substrate thickness - has laser generating diffused light from substrate sensed by CCD camera under positional control of eddy current sensor and piezo-actuator |
| 01/05/1994 | DE4220501A1 Optical thickness measurement during mfr. of strip material - using triangulation by measuring distance to material from head above and below material, directing reference line onto head and detecting with PSD or CCD line sensor, and determining position of head for position compensation. |
| 01/05/1994 | CN2152200Y Measuring mechanism for combined laser guide screw measuring instrument |
| 01/05/1994 | CN1080394A Lattice parameter measuring method and instrument |
| 01/04/1994 | US5276546 Three dimensional scanning system |
| 01/04/1994 | US5276504 Linear backlighting system and method |
| 01/04/1994 | US5276497 For measuring the deviation from a specific position of a mirror surface |
| 01/04/1994 | US5276323 Optical movement detector detecting a position of an optical gravity center |
| 01/04/1994 | CA1325854C Computer input device using an orientation sensor |
| 12/29/1993 | EP0386115B1 Calibration system for coordinate measuring machine |
| 12/29/1993 | CN2151441Y Holographic laser probe |
| 12/29/1993 | CN2151440Y Laser aligner for front wheel |
| 12/29/1993 | CN2151439Y Pachometer for lubricating film |
| 12/29/1993 | CN2151438Y Length adjustable bar with ball head |
| 12/29/1993 | CN2151437Y Digital raster micrometer |
| 12/28/1993 | USRE34489 Atomic force microscope with optional replaceable fluid cell |
| 12/28/1993 | US5274563 Noncontact tracing control system |
| 12/28/1993 | US5274433 Laser-based wheel alignment system |
| 12/28/1993 | US5274244 Method and apparatus for detecting bark and for determining the degree of barking on wood and chips |
| 12/28/1993 | CA1325680C Hot kiln alignment system |
| 12/23/1993 | WO1993025941A1 Holograms having a standard reference colour |
| 12/23/1993 | WO1993025893A1 Endpoint detection technique using signal slope determinations |
| 12/23/1993 | DE4221530A1 Device for reflecting an optical beam - has rotatable polygonal disc with mirror facets |
| 12/23/1993 | DE4220023A1 Integrated photoreceiver for position detection of edge structure - produces unambiguous coincidence signal, independent of light intensity, by division of circular surface |
| 12/22/1993 | EP0575095A1 Full aperture grazing incidence interferometry |
| 12/22/1993 | EP0575030A2 Laser positioning device |
| 12/22/1993 | EP0574840A2 Apparatus for measuring the protrusion of an end of an optical fiber terminated in a connector |
| 12/22/1993 | EP0574838A1 Method and device for measuring the electron density distribution of an electron beam |
| 12/22/1993 | EP0574603A1 Apparatus for measuring the curvature of round wood |
| 12/22/1993 | EP0513009B1 Arrangement for the lateral positioning of a recording substrate in a printing or copying device |
| 12/21/1993 | US5272761 Method and apparatus for inspecting line width on printed board |
| 12/21/1993 | US5272649 Video method and apparatus for measuring and controlling dimensional stability |
| 12/21/1993 | US5272517 Height measurement apparatus using laser light beam |
| 12/21/1993 | US5272330 Optical system |
| 12/21/1993 | US5271796 Method and apparatus for detecting defect on semiconductor substrate surface |
| 12/21/1993 | US5271345 Device for optically scanning the material being sewn in a sewing machine |
| 12/21/1993 | US5271284 Lap splice width monitor |
| 12/16/1993 | DE4219300A1 Contactless three=dimensional edge location esp. for dynamic focussing - evaluating signals from photoelectric image sensors, which receive object images via beam splitter along different path lengths to obtain height information. |
| 12/15/1993 | EP0573968A1 Inspection method of inclination of an IC |
| 12/15/1993 | EP0573950A2 Apparatus for the angular resolving optical inspection of a sample |
| 12/15/1993 | EP0573661A1 Method and apparatus for measuring three-dimensional position and posture of object |
| 12/15/1993 | EP0539571A4 Dynamic shearing interferometer |
| 12/14/1993 | US5271078 Device for coupling and/or decoupling beams of light, with an integrated optical component |
| 12/14/1993 | US5270796 Apparatus for inspecting a phase shift mask |