| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 05/11/1995 | WO1995012809A1 Illumination and imaging arrangement |
| 05/11/1995 | WO1995012803A1 Wayside monitoring of the angle-of-attack of railway vehicle wheelsets |
| 05/11/1995 | DE4436500A1 Optical projection grating |
| 05/10/1995 | EP0652415A1 A device for measuring the thickness of thin films |
| 05/10/1995 | EP0652414A1 Scanning near-field optic/atomic force microscope |
| 05/10/1995 | EP0497942B1 Device for the contactless determination of the position of plumb lines |
| 05/10/1995 | CN1028383C Device and method for measuring large-scale workpiece inner-outer diameter with laser high-precision |
| 05/09/1995 | US5414779 Image frame detection |
| 05/09/1995 | US5414647 Non-contact method and system for building CAD models by integrating high density data scans |
| 05/09/1995 | US5414646 Digital optical micrometer |
| 05/09/1995 | US5414555 Method for the manufacture of a three-mirror optical system and the optical system resulting therefrom |
| 05/09/1995 | US5414520 Process and device for detecting impurities in a textile test material |
| 05/09/1995 | US5414517 Method and apparatus for measuring the shape of glossy objects |
| 05/09/1995 | US5414515 Surface position detecting device |
| 05/09/1995 | US5414512 Method and apparatus for viewing a shearographic image |
| 05/09/1995 | US5414458 Semiconductor device lead inspection system |
| 05/09/1995 | US5414269 Circuit for detecting a paper at a desired position along a paper feed path with a one shot multivibrator actuating circuit |
| 05/09/1995 | US5414268 Light scanner with interlaced camera fields and parallel light beams |
| 05/09/1995 | US5413941 Optical end point detection methods in semiconductor planarizing polishing processes |
| 05/04/1995 | WO1995012107A1 Method and apparatus for precision inspection of articles |
| 05/04/1995 | DE4335121A1 Automatic area feedback in optical 3D digitisers |
| 05/03/1995 | EP0651232A1 Rotary encoder |
| 05/03/1995 | EP0651231A1 Procedure and device to measure the thickness of printed matter, like papers, magazines and parts thereof |
| 05/03/1995 | EP0650839A2 Method and system for measuring drop-volume in ink-jet printers |
| 05/03/1995 | CN2196290Y Work piece angle and length measuring apparatus |
| 05/03/1995 | CN1102254A Method for distinguishing interference fringe order in beam-splitting interference type optical interval measurement |
| 05/02/1995 | US5412477 Apparatus for measuring bend amount of IC leads |
| 05/02/1995 | US5412476 Drill bit position sensor |
| 05/02/1995 | US5412473 Multiple angle spectroscopic analyzer utilizing interferometric and ellipsometric devices |
| 05/02/1995 | US5412420 Three-dimensional phenotypic measuring system for animals |
| 05/02/1995 | US5412220 Optical scanning device for lumber |
| 05/02/1995 | US5412203 Cylindrical container inner surface tester |
| 04/30/1995 | CA2118481A1 Process and device for measuring the thickness of printing products, such as newspapers, periodicals and parts thereof |
| 04/27/1995 | WO1995011519A1 Grid array inspection system and method |
| 04/27/1995 | WO1995011446A1 Method and apparatus for measuring the curvature of wafers |
| 04/27/1995 | DE4411798A1 Device for controlling and measuring the reflection angle in optical devices by using positively driven elements and linear positioning instrument |
| 04/26/1995 | EP0650319A1 An electronic parts data recorder and a mounter employing the recorder |
| 04/26/1995 | EP0650030A2 Apparatus for and method of evaluating multilayer thin films |
| 04/26/1995 | EP0650029A2 Atomic force microscope with optional replaceable fluid cell |
| 04/26/1995 | EP0649525A1 Apparatus for the detection of surface defects |
| 04/26/1995 | EP0649513A1 System and method for monitoring and controlling the width of a product |
| 04/26/1995 | CN2195752Y Laser-measured height instrument |
| 04/25/1995 | US5410411 Method of and apparatus for forming multi-layer film |
| 04/25/1995 | US5410410 Non-contact type measuring device for measuring three-dimensional shape using optical probe |
| 04/25/1995 | US5410408 Optical arrangement for performing null testing of aspheric surfaces including reflective/diffractive optics |
| 04/25/1995 | US5410407 Large aperture mirror testing apparatus and method |
| 04/25/1995 | US5410406 Method and apparatus for nondestructive inspection utilizing phase integration and recording of induced vibrating nodal patterns |
| 04/25/1995 | US5410401 Methods and apparatus for mechanically and electronically correcting presentation of entities in a fluid flow |
| 04/25/1995 | US5410398 Automatic boresight compensation device |
| 04/25/1995 | US5410346 System for monitoring condition outside vehicle using imaged picture by a plurality of television cameras |
| 04/25/1995 | US5410157 Book dimension detector |
| 04/20/1995 | DE4343810C1 Photoelectric measuring head |
| 04/20/1995 | DE4342830C1 Device for producing strip-like light patterns |
| 04/20/1995 | DE4339715C1 Method for measuring the position of an object |
| 04/20/1995 | DE4326371A1 Multi-dimensional position data entry system for computers |
| 04/19/1995 | EP0649170A2 Semiconductor wafer inspection apparatus |
| 04/19/1995 | EP0649001A1 Procedure to measure the form and/or evenness of a moving material and device for its execution |
| 04/19/1995 | EP0649000A1 Measuring-device to control buildings, fields etc. |
| 04/19/1995 | EP0648358A1 Further methods and apparatus for control of lathes and other machine tools |
| 04/19/1995 | EP0648324A1 Method and apparatus of stud array upstand setting |
| 04/19/1995 | CN1101713A Device for measurement of strain |
| 04/18/1995 | US5408538 Method of and apparatus for inspecting the minimum annular width of a land on a printed circuit board |
| 04/18/1995 | US5408537 Mounted connector pin test using image processing |
| 04/18/1995 | US5408325 Apparatus for measuring the profile of a moving object |
| 04/18/1995 | US5408324 Distance measuring method and apparatus that compares signals from plural photocells |
| 04/18/1995 | US5408323 Position fixing apparatus with radiation sensor |
| 04/18/1995 | US5408322 Self aligning in-situ ellipsometer and method of using for process monitoring |
| 04/18/1995 | US5408320 Workpiece having alignment marks for positioning a pattern at a different pitch to be formed thereon, and method for fabricating the same |
| 04/18/1995 | US5408318 Wide range straightness measuring stem using a polarized multiplexed interferometer and centered shift measurement of beam polarization components |
| 04/18/1995 | US5408309 Apparatus and method for inspecting elliplicity and eccentricity of optical fiber preforms |
| 04/18/1995 | US5408308 Method for monitoring hermetically-coated fibers |
| 04/18/1995 | US5408096 Instrument for a centrifugal separator for detecting the presence of a body and rolling mill provided with such an instrument |
| 04/18/1995 | US5406833 Atomic force microscope |
| 04/18/1995 | CA2032951C Ophthalmic diagnostic apparatus and method |
| 04/13/1995 | WO1995010034A2 A method for characterizing polymer molecules or the like |
| 04/13/1995 | WO1995010023A1 Non-destructive inspection method for mechanical behaviour of article |
| 04/13/1995 | WO1995009698A1 Device for recognizing and/or sorting fruits or vegetables, and related method and utilization |
| 04/13/1995 | DE4433233A1 Method for position finding for an apparatus for three-dimensional measurement |
| 04/13/1995 | CA2172844A1 Device for recognizing and/or sorting fruits or vegetables, and related method and utilization |
| 04/12/1995 | EP0647835A2 Displacement detecting system |
| 04/12/1995 | EP0647834A2 Displacement detecting apparatus |
| 04/12/1995 | EP0647829A1 Process and device for the geometrical control of a vehicle |
| 04/12/1995 | EP0647828A2 Cofocal optical systems for thickness measurements of patterned wafers |
| 04/12/1995 | EP0647827A2 Film thickness measurement of structures containing a scattering surface |
| 04/12/1995 | EP0647310A1 Method of an apparatus for interferometrically inspecting a surface of an object. |
| 04/12/1995 | EP0571425B1 Processes for determining the position of a positioning body in relation to a reference body and devices for implementing the processes |
| 04/12/1995 | CN2194504Y Electronic digital-display dam vertical line coordinatograph |
| 04/11/1995 | US5406478 Method for reconstructing three-dimensional images of a changing object |
| 04/11/1995 | US5406372 QFP lead quality inspection system and method |
| 04/11/1995 | US5406342 System for determining the topography of a curved surface |
| 04/11/1995 | US5406082 Surface inspection and characterization system and process |
| 04/06/1995 | WO1995009358A1 Inspection system with in-lens, off-axis illuminator |
| 04/06/1995 | WO1995009346A1 Confocal optical apparatus |
| 04/06/1995 | WO1995009345A1 Apparatus for measuring the dimensions of large objects |
| 04/06/1995 | WO1995009344A1 A scale pattern arrangement |
| 04/06/1995 | WO1995009343A1 Interferometric method and apparatus to measure surface topography |
| 04/06/1995 | DE4337049C1 Use of a device for calibrating strain gauge devices on material-testing machines |
| 04/06/1995 | DE4209260C2 Einrichtung zur Längenmessung Means for measuring length |
| 04/05/1995 | EP0646770A1 Non-destructive inspection method for mechanical behaviour of article with load, its judgement method and apparatus |
| 04/05/1995 | EP0646769A1 Displacement measurement apparatus |