| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/10/1995 | US5381233 Polarized-light scatterometer for measuring the thickness of a film coated on the partial of a substrate |
| 01/10/1995 | US5381225 Surface-condition inspection apparatus |
| 01/10/1995 | US5379656 Method for positioning a sensor for a web movement control device |
| 01/10/1995 | CA1333848C Device for performing measurements on a transparent object, method of manufacturing a fibre and fibre manufactured by means of said method |
| 01/07/1995 | CA2127477A1 Non-contact measurement of displacement and changes in dimension of elongated objects such as filaments |
| 01/05/1995 | WO1995000871A1 Three-dimensional imaging device |
| 01/05/1995 | WO1995000819A1 Method and apparatus for finding wafer index marks and centers |
| 01/05/1995 | DE4320311C1 Method and device for wheel alignment and chassis alignment of motor cycles |
| 01/05/1995 | DE4311726A1 Arrangement and method for extending the measuring range of Nomarski microscopes |
| 01/04/1995 | EP0632318A1 Belt position sensor |
| 01/04/1995 | EP0632291A2 Method for measuring wear in the lining of a container provided with a pivoted axle and an opening, and a container |
| 01/04/1995 | EP0631671A1 Fiber optic attenuator |
| 01/03/1995 | US5379348 Pattern defects inspection system |
| 01/03/1995 | US5379150 Method of manufacturing a spatial frequency filter for use in a pattern defect detection device |
| 01/03/1995 | US5379112 Process for relative measurement of the center-line of an aperture and the center-line of a cylindrical outline |
| 01/03/1995 | US5379107 Process and apparatus for the measurement of object topographies by means of projected fringe patterns |
| 01/03/1995 | US5379106 Method and apparatus for monitoring and adjusting the position of an article under optical observation |
| 01/03/1995 | US5379105 Roof surface measuring apparatus |
| 01/03/1995 | US5378969 Navigation control system for mobile robot |
| 01/03/1995 | US5378900 Crystal diameter measuring device |
| 01/03/1995 | US5377420 Feeler device, particularly for copying machines |
| 01/03/1995 | CA1333756C Process for the production of a telecentric light beam, device for carrying out this process and process for the production of an hoe |
| 01/03/1995 | CA1333752C Universal interferometric strain gauge |
| 12/28/1994 | EP0631107A1 Method and apparatus for measuring the parallelism of two surfaces |
| 12/28/1994 | EP0631106A2 Apparatus and method for measuring thickness of thin semiconductor multi-layer film |
| 12/28/1994 | EP0631105A2 Reflected light measuring method and reflected light measuring apparatus for a microscopic photometric system |
| 12/28/1994 | EP0630504A1 Apparatus and method for biometric identification |
| 12/28/1994 | EP0630466A1 Enhanced resolution wafer thickness measurement system |
| 12/28/1994 | CN1096874A Method and apparatus for detection of position |
| 12/28/1994 | CN1096873A High-precision large aperture phase-shifting digital planar interferometer |
| 12/27/1994 | US5377282 Optical inspection system utilizing dynamic analog-to-digital thresholding |
| 12/27/1994 | US5377278 Method and apparatus for inspecting a solderless terminal by image processing |
| 12/27/1994 | US5377011 Scanning system for three-dimensional object digitizing |
| 12/27/1994 | US5377009 Alignment method |
| 12/27/1994 | US5377007 Interferometric surface inspection machine designed to support an element on the side to be inspected |
| 12/27/1994 | US5376804 Optical analysis system and positioning apparatus thereof |
| 12/27/1994 | US5376796 Proximity detector for body contouring system of a medical camera |
| 12/27/1994 | US5376215 Apparatus for production of extremely thin SOI film substrate |
| 12/27/1994 | CA2042436C Apparatus for carrying mobile means of inspection in the interior of a tubular body |
| 12/22/1994 | WO1994029774A1 Method and device for spatial calibration of a mobile object such as a sensor or a tool carried by a robot |
| 12/22/1994 | WO1994029762A1 Laser diffraction particle sizing apparatus and method |
| 12/22/1994 | WO1994029697A2 Apparatus and method for regulating the cross-linking density of glass coatings |
| 12/22/1994 | WO1994029681A1 Simultaneous determination of layer thickness and substrate temperature during coating |
| 12/22/1994 | WO1994029671A1 Fiber optic bending and positioning sensor |
| 12/22/1994 | WO1994029670A1 Apparatus for measuring position of moving object |
| 12/22/1994 | WO1994029669A1 Apparatus and method for non-destructive testing of structures |
| 12/22/1994 | DE4319898A1 Device for the non-contact testing and/or measurement of rotationally symmetrical workpieces |
| 12/22/1994 | CA2164306A1 Simultaneous determination of layer thickness and substrate temperature during coating |
| 12/21/1994 | EP0629903A2 Image frame detection |
| 12/21/1994 | EP0629838A2 An apparatus and a method for detecting the position of a laser beam |
| 12/21/1994 | EP0629835A2 Strain measuring instrument |
| 12/21/1994 | EP0629450A2 Powder coating system and powder coating thickness sensor |
| 12/21/1994 | EP0493393B1 Laser-based wheel alignment system |
| 12/21/1994 | CN1096580A Method and apparatus for determing form of reflecting surface |
| 12/21/1994 | CN1027100C Laser scanning pellet diameter measurement appartus and method |
| 12/20/1994 | US5375175 Method and apparatus of measuring line structures with an optical microscope by data clustering and classification |
| 12/20/1994 | US5375071 Means for generating the geometry of a model in two dimensions through the use of artificial vision |
| 12/20/1994 | US5374821 Elastomeric optical fiber sensors and method for detecting and measuring events occurring in elastic materials |
| 12/15/1994 | DE4419476A1 Method and device for determining layer thickness and substrate temperature |
| 12/15/1994 | DE4326144C1 Arrangement for recording and measuring the distance of layers and structures |
| 12/15/1994 | DE4325744C1 Multicoordinate probe |
| 12/14/1994 | EP0628837A1 Method and device for determining the location of a target |
| 12/14/1994 | EP0628787A2 Optical sensing device |
| 12/14/1994 | EP0628159A1 Observing test-piece surfaces by the speckle-shearing process. |
| 12/14/1994 | EP0628153A1 Method and apparatus for observing a gap. |
| 12/14/1994 | EP0543971B1 Process and device for determining the centre-line of a cuvrature |
| 12/14/1994 | EP0470234B1 Contact probes |
| 12/14/1994 | EP0422182B1 A device for measuring the length of a contact surface |
| 12/14/1994 | CN2185422Y Multifunctional autocollimating direct-measuring micro-parallel light tube |
| 12/13/1994 | US5373363 Apparatus for measuring length of article transported on conveyor |
| 12/13/1994 | US5373362 Light source device for measuring shape |
| 12/13/1994 | US5373222 Datuming device for measuring displacements not parallel with a displacement probe's line of travel |
| 12/13/1994 | US5372502 Optical probe and method for the three-dimensional surveying of teeth |
| 12/13/1994 | CA2032178C Paper size detecting apparatus |
| 12/12/1994 | CA2125582A1 Target location device and method thereof |
| 12/08/1994 | WO1994028398A1 Method and device for determining the attenuation function of an object with respect to the transmission of a reference material thickness |
| 12/08/1994 | WO1994028392A1 Apparatus and method for determining the size of particles using light scattering |
| 12/08/1994 | WO1994028377A1 A method and a device for the registration of the movement of a vehicle |
| 12/08/1994 | WO1994028376A1 Apparatus and method of film thickness measurement |
| 12/08/1994 | WO1994028375A1 Method and system for geometry measurement |
| 12/08/1994 | WO1994028373A1 Method of measuring micro-objects and device therefor |
| 12/08/1994 | WO1994027791A1 Attitude control method for visual sensor of industrial robot |
| 12/08/1994 | WO1994027756A1 Angle of bend detector and straight line extractor used therefor, and angle of bend detecting position setting apparatus |
| 12/08/1994 | DE4413758A1 Method and device for examining the topography of surfaces |
| 12/08/1994 | DE4318851A1 Arrangement and method for detecting and measuring surfaces |
| 12/08/1994 | DE4318767A1 Method and device for measuring the layer thickness of thin organic films or organic films |
| 12/08/1994 | DE4318739A1 Interferometer for measuring the topography of test piece (test specimen, test object) surfaces |
| 12/08/1994 | CA2163872A1 A method and a device for the registration of the movement of a vehicle |
| 12/08/1994 | CA2163555A1 Apparatus and method for determining the size of particles using light scattering |
| 12/07/1994 | EP0627702A1 Method and device for reconstruction of 3D images |
| 12/07/1994 | EP0627611A1 Method and device for conformance testing of hybridization balls |
| 12/07/1994 | EP0627610A1 Two-stage detection noncontact positioning apparatus |
| 12/07/1994 | EP0627069A1 Method and apparatus for measuring the shape of a surface of an object. |
| 12/07/1994 | EP0527797B1 Device for determination of the topography of a surface |
| 12/06/1994 | US5371810 Method of determining the interior points of an object in a background |
| 12/06/1994 | US5371596 Optical apparatus components having spectrally overlapping characteristics for measuring semiconductor layer thickness |
| 12/06/1994 | US5371588 Surface profile and material mapper using a driver to displace the sample in X-Y-Z directions |
| 12/06/1994 | US5371582 Thickness/depth measuring apparatus and method for measuring the thickness of a film and the depth of a groove |
| 12/06/1994 | US5371375 Method for obtaining three-dimensional data from multiple parts or devices in a multi-pocketed tray |
| 12/05/1994 | CA2097781A1 Apparatus and method for non-destructive testing of structures |