Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
03/1994
03/16/1994EP0586428A1 Apparatus for measuring the profile of a moving object.
03/16/1994EP0447475B1 Optoelectronic sensing device
03/16/1994CN1024046C Laser test carriage for road crankle and settlement
03/16/1994CA2105635A1 Thin film thickness monitoring and control
03/15/1994US5295073 Device for checking the position of various points of a vehicle
03/15/1994US5294804 Cantilever displacement detection apparatus
03/15/1994US5294289 Illuminating the surface with coherent radiation filtered to block a second frequency being twice the first frequency
03/15/1994US5293687 Wheel manufacturing method
03/10/1994DE4230108A1 Moire system for inclined surface contour measurement - projecting light beam through first asymmetric grating to form light pattern on object surface, imaging onto shadow grating having same grating constant and detecting intensity with camera to evaluate distribution
03/09/1994EP0586288A1 Method and device for measuring the vibrations of operating turbine blades
03/09/1994EP0585893A1 Procedure and device for very precise distance measurement of surfaces
03/09/1994EP0585839A2 Process control for submicron linewidth measurement
03/09/1994EP0585759A1 Process for detecting and mapping dirt on the surface of a photographic element
03/09/1994EP0585622A2 Method for length or angle measurement devices
03/09/1994EP0585463A1 Method of adjusting optical axis for laser robot
03/09/1994EP0585382A1 Transmissive system for characterizing materials containing photo-reactive constituents
03/09/1994EP0585333A1 Interferometric measuring device in integrated optics.
03/08/1994US5293428 Optical apparatus for use in image recognition
03/08/1994US5293427 Eye position detecting system and method therefor
03/08/1994US5293324 Method and apparatus for inspecting solder portions using fuzzy inference
03/08/1994US5293220 Method for inspecting stripped condition of electric wire
03/08/1994US5293218 Interferometric JFTOT tube deposit measuring device
03/08/1994US5293216 Sensor for semiconductor device manufacturing process control
03/08/1994US5293215 Device for interferometric detection of surface structures
03/08/1994US5293214 Apparatus and method for performing thin film layer thickness metrology by deforming a thin film layer into a reflective condenser
03/08/1994US5293047 Method and an apparatus for detecting indices of paper based on a replaceable intermediate or average threshold value
03/08/1994US5291900 Instrument for measuring the length of infants
03/08/1994US5291775 Scanning force microscope with integrated optics and cantilever mount
03/08/1994US5291661 Peephole for built-in lighting fixture aiming device
03/03/1994WO1994004942A1 Validation of optical ranging of a target surface in a cluttered environment
03/03/1994DE4228870A1 Determination of geometry of thin, optically transparent layers e.g of mask or semiconductor wafer - simulating via computer model and using proportional relationship of intensity of reflection spectrum of thickness measurement at certain wavelength with integral of intensity distribution of densitometry measurement
03/02/1994EP0584673A1 Measurement of transparent container wall thickness
03/02/1994EP0584637A2 Method and apparatus for recognizing meandering in printed matter test system and method and apparatus for correcting image pickup position in this system
03/02/1994EP0584321A1 Process and device for detecting impurities in a textile test sample
03/01/1994US5291415 Method to determine tool paths for thinning and correcting errors in thickness profiles of films
03/01/1994US5291279 Fatigue testing apparatus and method
03/01/1994US5291273 Non-contact diameter measuring method and apparatus
03/01/1994US5291272 Method and apparatus for measuring dimensional variables of threaded pipe
03/01/1994US5291271 Measurement of transparent container wall thickness
03/01/1994US5291270 Method and arrangement for detecting edges and bores of a workpiece with an optical probe head
03/01/1994US5291269 Apparatus and method for performing thin film layer thickness metrology on a thin film layer having shape deformations and local slope variations
03/01/1994US5291264 Method and apparatus for the optical measurement of an angle between positions of components relative to each other
03/01/1994US5291131 Apparatus for measuring elongation of a circulating chain
03/01/1994US5291026 Method for measuring eccentricity
03/01/1994US5291025 In-line non-contact wafer boat inspection apparatus
03/01/1994US5291024 Method for determining the position and shape of a yarn fed to a textile machine
02/1994
02/24/1994DE4321261A1 Optical shape testing system e.g. for diameter of rotationally-symmetric screw - feeds separated components along inclined path to accelerate components under gravity and tests in free-flight path between flash lamp and high-resolution light-barrier-type camera
02/23/1994EP0308466B1 Distance measuring device
02/22/1994US5289267 Electro-optical system for gauging surface profile deviations
02/22/1994US5289266 Noncontact, on-line determination of phosphate layer thickness and composition of a phosphate coated surface
02/22/1994US5289265 Method and apparatus for measuring a coating state
02/22/1994US5289264 Method and apparatus for ascertaining the absolute coordinates of an object
02/22/1994US5289261 Device for measuring a three-dimensional shape of an elongate member
02/22/1994US5289260 Pattern defect detection device and a spatial frequency filter used therein
02/22/1994US5289256 Integrated-optics expansion interferometer in an extension-metrological neutral environment
02/22/1994US5289007 Sheet break detector apparatus
02/22/1994US5288995 Electrical measurement apparatus using heterodyne phase conversion techniques
02/22/1994US5288991 Optical system for rapid inspection of via location
02/22/1994US5287629 Machine stand, particularly for so-called coordinate measuring machines, and a method for constructing the stand
02/22/1994US5287627 Automatic plumb and level tool with acoustic measuring capability
02/17/1994WO1994003783A1 Self-exciting optical strain gage
02/17/1994WO1994003775A1 Process for determining the location of a positioning body in relation to a reference body and device for implementing the process
02/17/1994WO1994003774A1 Devices and methods for detection of an analyte based upon light interference
02/17/1994CA2141324A1 Devices and methods for detection of an analyte based upon light interference
02/16/1994EP0583112A1 Near field scanning optical microscope and applications thereof
02/16/1994EP0583092A1 Inspection of cylindrical objects
02/16/1994EP0582751A1 Photographic development apparatus
02/16/1994EP0531289B1 System of imaging, cataloging, and overlaying feet and footwear
02/16/1994CN2156476Y Electronic light measuring device
02/16/1994CN1082193A Process and device for detecting impurities in a textile test material
02/15/1994US5286980 Product discrimination system and method therefor
02/15/1994US5286968 Method and device for multichannel analog detection
02/13/1994CA2090660A1 Vehicle lane position detection system
02/09/1994EP0582116A1 Method for determining the position of light wave guides and device for carrying out the method
02/09/1994EP0581990A1 Wheel alignment measuring apparatus
02/09/1994EP0581871A1 Method and apparatus for optical imaging and measurement
02/08/1994US5285516 Fused fiber optic attenuator having axially overlapping fiber end portions
02/08/1994US5285397 Coordinate-measuring machine for non-contact measurement of objects
02/08/1994US5285252 Optical method and optical device for distance measurement and their application to the relative positioning of parts
02/08/1994US5284076 Device for the non-circular machining of workpieces
02/08/1994CA1326774C Method and apparatus for active vision image enhancement
02/03/1994WO1994002806A1 Method of measuring the coating thickness of coated paper, device for carrying out the method and use of the device
02/03/1994DE4241372C1 Camera for photogrammetric evaluation of object - uses artificial light source providing monochromatic light for imaging reference markings onto object image surface
02/03/1994DE4235824A1 Verfahren zur Messung der Strichdicke beim Streichen von Papier, Vorrichtung zur Durchführung des Verfahrens und Verwendung der Vorrichtung A method of measuring the stroke thickness in coating paper, apparatus for performing the method and using the apparatus
02/03/1994DE4225270A1 Verfahren zur Lagebestimmung eines Positionierkörpers relativ zu einem Bezugskörper und Vorrichtung zur Durchführung des Verfahrens A method for determining the position of a positioning body relative to a reference body and means for carrying out the method
02/02/1994EP0581217A1 Near field scanning optical microscope
02/02/1994EP0456819B1 Device for photogrammetrically surveying an object
02/02/1994CN2155006Y 纸厚检测装置 Paper thickness detecting device
02/01/1994US5283630 Error correcting method for measuring object surface using three-dimension measuring apparatus
02/01/1994US5283629 Method for assessing a vertex radius of curvature
02/01/1994US5283628 Method for measuring diameters of non-circular fibers
02/01/1994US5283598 Illumination of the cornea for profilometry
02/01/1994CA2019782C Measuring a gap between a tube and a float
02/01/1994CA1326593C Device for measuring the deflection of elongate components
01/1994
01/31/1994CA2086664A1 Light scatter estimation method with range scanner and device
01/31/1994CA2075070A1 Range scanner motion estimation method and device
01/29/1994CA2101386A1 Fine surface observing apparatus
01/27/1994DE4323546A1 Wound bobbin test appts. requiring no manual checking - has laser beam directed across bobbin surface with reflection to detect projecting yarn ends etc.
01/27/1994DE4236413C1 Test assembly for thickening in yarns or wires - has structured light beam across moving material for evaluation without effect of oscillation, etc.
01/26/1994EP0580126A2 Method and device for the automatic size determination of printing cylinders