Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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08/30/1994 | US5343294 Method for analyzing periodic brightness patterns |
08/30/1994 | US5343293 Ellipsometer |
08/30/1994 | US5343290 Surface particle detection using heterodyne interferometer |
08/30/1994 | US5343049 Optical method for determining relative positions of two pieces and device for its implementation |
08/30/1994 | US5343035 Strain sensor comprising a strain sensitive, two-mode optical |
08/30/1994 | US5341702 Apparatus for calibration of an angular displacement |
08/30/1994 | CA1331692C Means for projecting patterns of light |
08/25/1994 | DE4402414A1 Measuring with the aid of a pattern |
08/25/1994 | DE4332848A1 Sensor for determining inclinations, angles or horizontality |
08/25/1994 | DE4305559A1 Arrangement and method for detecting the contours of objects |
08/25/1994 | DE4305458A1 Phase modulated interferometer, e.g. for length measurement |
08/25/1994 | DE4305329A1 Determination of the dimensions of an object |
08/25/1994 | DE4302688C1 Method for testing the dimensional stability of a container mouth |
08/24/1994 | EP0612185A1 Optical scanning apparatus |
08/24/1994 | EP0612043A2 Sheet Discriminating apparatus |
08/24/1994 | EP0611948A1 System for measuring the wheel base of an automobile frame and the transverse and longitudinal offsets of its steered wheels |
08/24/1994 | EP0611947A2 System for measuring the characteristic attitude angles of the wheels of an automobile frame, and relative measurement means |
08/24/1994 | EP0611946A1 Minute step height measuring method and apparatus therefor |
08/24/1994 | EP0611608A1 Method and device for scanning and checking of tracks applied to a substrate |
08/24/1994 | EP0611329A1 Multiple coat measurement and control |
08/23/1994 | US5341212 Wave front interferometer |
08/23/1994 | US5341211 Apparatus for making absolute two-demensional position measurements |
08/23/1994 | US5341205 Method for characterization of optical waveguide devices using partial coherence interferometry |
08/23/1994 | US5341204 Shearing optical element for interferometric analysis system |
08/23/1994 | US5341183 Method for controlling projection of optical layup template |
08/23/1994 | US5340994 Method for inspecting the length of a flexible thin object having binarizing and thinning steps |
08/23/1994 | US5340060 Rendezvous docking optical sensor system |
08/20/1994 | CA2114298A1 Optical scanning apparatus |
08/18/1994 | WO1994018788A1 Imaging apparatus and method for determining range from focus and focus information |
08/18/1994 | WO1994018524A1 Photogrammetric camera, in particular for photogrammetric measurements of technical objects |
08/18/1994 | WO1994018523A1 Method and apparatus for the rapid acquisition of data in coherence scanning interferometry |
08/18/1994 | WO1994018521A1 Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
08/18/1994 | DE4316984A1 Method and a device for automatically determining the tread depth of vehicle tyres |
08/18/1994 | DE4304815A1 Optical sensor |
08/18/1994 | DE4304388A1 Device and method for determining the circumferential profile of elongated bodies |
08/18/1994 | CA2155529A1 Imaging apparatus and method for determining range from focus and focus information |
08/17/1994 | EP0611181A1 Three-dimensional picture reconstruction process of evolving object |
08/17/1994 | EP0611160A2 Classifying and sorting crystalline objects |
08/17/1994 | EP0610956A2 Container inner surface tester |
08/17/1994 | EP0610833A1 Support for a measuring scale |
08/17/1994 | EP0610199A1 Instrument for detecting the presence of a body and rolling mill provided with such an instrument. |
08/17/1994 | EP0610198A1 An optoelectronic measuring scale. |
08/17/1994 | EP0502162B1 Moire distance measurements using a grating printed on or attached to a surface |
08/17/1994 | CN2174686Y Determining instrument for phosphor powder thickness and luminous emittance of fluoresent tube |
08/16/1994 | US5339260 Apparatus for checking size of a work |
08/16/1994 | US5339154 Method and apparatus for optical measurement of objects |
08/16/1994 | US5339152 Holographic inspection system with integral stress inducer |
08/16/1994 | US5338928 System and method for controlling deformation of a structure having a phase shift detector |
08/16/1994 | US5338361 Coating sensor having radiation source and receiver which detects beam emerging from coated substrate in separate wavelength bands to produce signals corresponding to amounts of various components and substrate |
08/11/1994 | DE4303193A1 Apparatus for the multidimensional testing of mechanical components |
08/10/1994 | EP0609419A1 Interferometric probe for distance measurement |
08/10/1994 | EP0563221A4 Method and apparatus for automatic optical inspection |
08/10/1994 | CN1090642A Machine for video inspection of glass containers ith intersecting light beams |
08/09/1994 | US5337150 Apparatus and method for performing thin film layer thickness metrology using a correlation reflectometer |
08/09/1994 | US5337149 Computerized three dimensional data acquisition apparatus and method |
08/09/1994 | US5337145 Two component straightness interferometer apparatus for measuring movements of parts of a machine |
08/09/1994 | US5337144 Etch rate monitor using collimated light and method of using same |
08/09/1994 | US5337140 Optical detecting system wtih self-correction |
08/09/1994 | US5337137 Height sensor and air spring device incorporating the same |
08/09/1994 | US5336898 Method and device for automatically determining the dimensions of printing cylinders having a diameter counter |
08/09/1994 | US5335420 Wheel alignment system |
08/09/1994 | CA2031885C Apparatus for the threedimensional inspection of hollow bodies |
08/04/1994 | WO1994017395A1 Process and device for inspecting the surface of a plurality of small objects |
08/04/1994 | WO1994017366A1 Active multipoint fiber laser sensor |
08/04/1994 | WO1994016611A1 Process and device for determining the topography of a reflecting surface |
08/04/1994 | DE4322173C1 Scanning system for scanning surface of cavity esp. bore using light beam |
08/04/1994 | DE4302434A1 Determining relative position between two structural parts |
08/04/1994 | DE4302400A1 Determining contact angle at interface between liquid and solid media |
08/03/1994 | EP0608758A1 Plural coördinate measuring device |
08/03/1994 | EP0608634A2 Surface shape measurement device |
08/03/1994 | EP0608538A1 Method for monitoring hermetically-coated fibers |
08/03/1994 | EP0608448A1 Method and apparatus for determining position |
08/03/1994 | EP0502930B1 Process and arrangement for optoelectronic measurement of objects |
08/03/1994 | CN1025578C Closed loop positioner |
08/02/1994 | US5335288 Apparatus and method for biometric identification |
08/02/1994 | US5335066 Measuring method for ellipsometric parameter and ellipsometer |
08/02/1994 | US5335057 Measuring geometry of optical fibre coatings with transverse incident beams |
08/02/1994 | US5334918 Method of controlling a coordinate positioning machine for measurement of a workpiece |
08/02/1994 | US5333388 Probes |
08/02/1994 | US5333386 Method of measuring the effective instantaneous position of a slide-mounted probe element or tool |
07/30/1994 | CA2111011A1 Method for monitoring hermetically-coated fibers |
07/28/1994 | DE4401541A1 Determining topology of reflecting surface of eye cornea |
07/28/1994 | DE4301538A1 Method and arrangement for contactless three-dimensional measurement, in particular for measuring denture models |
07/27/1994 | EP0607596A2 Angle measuring method and apparatus |
07/27/1994 | EP0607348A1 Apparatus and method for aligning capillary column and detection optics |
07/27/1994 | EP0607303A1 Method and system for point by point measurement of spatial coordinates. |
07/27/1994 | CN1090037A Holographic focus-tracing optical contact-tag micrometer |
07/26/1994 | US5333053 Apparatus for measuring straightness |
07/26/1994 | US5333052 Method and apparatus for automatic optical inspection |
07/26/1994 | US5333049 Apparatus and method for interferometrically measuring the thickness of thin films using full aperture irradiation |
07/26/1994 | US5333048 Polarizing interferometric displacement measuring arrangement |
07/21/1994 | WO1994016402A1 Method of determining the interior points of an object in a background |
07/21/1994 | WO1994016290A1 Web curl measurement system |
07/21/1994 | WO1994016289A1 Method and apparatus for measuring of distances |
07/21/1994 | DE4401020A1 Method for checking profile dimensions of elongate products |
07/21/1994 | DE4316236C1 Workpiece contact point coordinates measuring method |
07/21/1994 | DE4308753C1 Verfahren und Einrichtung zur bildgestützten Lageerkennung Method and apparatus for image-based location recognition |
07/21/1994 | CA2130917A1 Method of determining the interior points of an object in a background |
07/20/1994 | WO1994017362A1 Non-destructive inspection method for mechanical behaviour of article with load, its judgement method and apparatus |
07/20/1994 | EP0606849A2 Surface inspecting apparatus |