Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/1995
09/06/1995CN1107967A Light valve type displacement sensor with high performance
09/05/1995US5448662 Apparatus for coupling an optical fiber to a structure at a desired angle
09/05/1995US5448364 Particle detection system with reflective line-to-spot collector
09/05/1995US5448362 Non-contact measurement of displacement and changes in dimension of elongated objects such as filaments
09/05/1995US5448361 Electro-optical micrometer
09/05/1995US5448360 Three-dimensional image measuring device
09/05/1995US5448359 Optical distance sensor
09/05/1995US5448358 Optical apparatus and displacement-information measuring apparatus using the same
09/05/1995US5448356 Detecting device using a semiconductor light source emitting at least one laser beam in at least one predetermined direction
09/05/1995US5448352 Method and apparatus for the nondestructive testing of vessels made of composite material wound on a metallic liner by means of holographic interferometry
09/05/1995US5448350 Surface state inspection apparatus and exposure apparatus including the same
09/05/1995US5448079 Reflective pattern with coded beginning and end formed on the surface of a sheet handling cylinder for detecting the presence and position of the sheet
09/05/1995US5447075 Self-exciting optical strain gage
08/1995
08/31/1995WO1995023346A1 Method and apparatus for optimizing sub-pixel resolution in a triangulation based distance measuring device
08/31/1995WO1995023345A1 Triangulation position detection method and apparatus
08/31/1995WO1995023325A1 Multi-axis wheel transducer with angular position detector
08/31/1995WO1995023093A1 Machine for labelling objects
08/31/1995WO1995022925A1 Device and method for mapping objects
08/31/1995CA2184108A1 Device and method for mapping objects
08/30/1995EP0669519A2 Position measuring device
08/30/1995EP0669518A2 Device to generate position dependant signals
08/30/1995EP0669515A2 Light scanner with interlaced camera fields and parallel light beams
08/30/1995EP0669034A1 Process for detecting and eliminating the shadow of moving objects in a sequence of digital images.
08/30/1995EP0610374B1 Process for measuring the inclination of boundary areas in an optical system
08/30/1995EP0590036B1 Time-multiplexed multi-zone rangefinder
08/30/1995CN1107577A Image dissection method and apparatus by photon tunnel scan
08/29/1995US5446801 Recognizing methods of circular holes
08/29/1995US5446549 Method and apparatus for noncontact surface contour measurement
08/29/1995US5446548 Patient positioning and monitoring system
08/29/1995US5446547 Combination of motorized and piezoelectric translation for long-range vertical scanning interferometry
08/29/1995US5446546 Laser interferometric single piece force transducer
08/29/1995US5446545 Method of and apparatus for calibrating machines including a measuring probe and a measuring apparatus
08/24/1995WO1995022804A1 Method of producing and detecting high-contrast images of the surface topography of objects and a compact system for carrying out the same
08/24/1995WO1995022740A1 Method for measuring the thickness of a transparent material
08/24/1995DE4434505A1 Image processing system for inspection of workpiece
08/24/1995DE4424565C1 Microstructure depth measurement method banknote, credit card verification
08/24/1995DE4405865A1 CCD sensor measuring system for autonomous robot control
08/24/1995DE4405450A1 Surface interferometric test for opaque or transparent objects
08/24/1995DE19510075A1 Contactless system for determining spatial orientation of object
08/24/1995CA2183567A1 Method of producing and detecting high-contrast images of the surface topography of objects and a compact system for carrying out the same
08/24/1995CA2160802A1 Method for measuring the thickness of a transparent material
08/23/1995EP0564486B1 Laser position indicator for valve stem
08/23/1995EP0531354B1 Process for the measurement of the thickness and refractive index of a thin film on a substrate, and a device for carrying out the process
08/22/1995US5444799 Image processing apparatus and method of strain correction in such an image processing apparatus
08/22/1995US5444758 Beam position detecting device
08/22/1995US5444537 Method for shape detection and apparatus therefor
08/22/1995US5444536 Apparatus for measuring the curvature of a profile, such as an edge of a turbine blade
08/22/1995US5444529 Method of inspecting particles on semiconductor devices
08/22/1995US5444505 Method for controlling projection of optical layup template
08/22/1995US5444245 Method of automatically setting coordinate conversion factor
08/22/1995US5444234 Position transmitter for acquiring the position of a light beam
08/22/1995US5443537 Method of balancing and aligning wheels on trucks
08/22/1995CA1336786C Contour measurement using time based triangulation methods
08/17/1995WO1995022091A1 Method for achieving a specific temperature behaviour of adjusting elements operating in dependence on temperature, and an adjusting element operating in dependence on temperature
08/17/1995WO1995022044A1 Process for the absolute measurement of the ultimate tensile strength of fibres
08/17/1995WO1995022040A1 Process and device for the optical examination of a surface
08/17/1995WO1995021765A1 An optical tracker system
08/17/1995DE4404663A1 Optical measurement of distance separating two parallel measurement surfaces of object
08/17/1995DE4404328A1 Verfahren zum Erreichen eines spezifischen Temperaturverhaltens von temperaturabhängig arbeitenden Verstellorganen und temperaturabhängig arbeitendes Verstellorgan A method for achieving a specific temperature behavior of adjusting elements working depending on the temperature and temperature-dependent working adjusting
08/17/1995DE4404154A1 Verfahren und Vorrichtung zum optischen Untersuchen einer Oberfläche A method and apparatus for optically inspecting a surface
08/17/1995CA2182566A1 An optical tracker system
08/16/1995EP0666979A1 Product discrimination system and method therefor
08/16/1995EP0659265A4 Spatial positioning system.
08/15/1995US5442573 Laser thickness gauge
08/15/1995US5442572 Method and system for comparing free-form geometries using high density point data models
08/15/1995US5442448 Device for the laterally resolved investigation of a laterally heterogeneous ultrathin object layer
08/15/1995US5442444 Apparatus for human topography
08/15/1995US5442189 Apparatus for inspecting defects and foreign substances having a spot illuminated focusing system
08/15/1995US5442166 Linear absolute position sensor
08/10/1995WO1995021376A1 Device for imaging a three-dimensional object
08/10/1995WO1995021375A1 System, apparatus and method for on-line determination of quality characteristics of pieces of meat, and arrangement for illumination of pieces of meat
08/10/1995WO1995021367A1 Apparatus for inspecting deformation of pipe
08/10/1995DE4404792A1 Absolute interferometric determn. method of accuracy of cylindrical surface
08/10/1995DE19502595A1 Vehicle wheel alignment appts.
08/09/1995EP0666337A1 Method and apparatus for measuring the deposition rate of opaque films
08/09/1995EP0461254B1 Composite color illumination method and band light illumination in a double-focus detector utilizing chromatic aberration
08/08/1995US5440398 Error detection apparatus and method for use with engravers
08/08/1995US5440396 Video comparator system
08/08/1995US5440395 Shroud contact wear sensor in a turbo machine
08/08/1995US5440394 Length-measuring device and exposure apparatus
08/08/1995US5440393 Process and device for measuring the dimensions of a space, in particular a buccal cavity
08/08/1995US5440392 Method and system for point by point measurement of spatial coordinates
08/08/1995US5440383 Phase detection deflectometer-type optical device having a large measuring range
08/08/1995US5440141 Method of measuring a thickness of a multilayered sample using ultraviolet light and light with wavelengths longer than ultraviolet
08/08/1995US5440140 Method and arrangement for determining an at least approximately circular contacting surface using incoherent light and a film waveguide
08/08/1995US5440122 Surface analyzing and processing apparatus
08/08/1995US5438879 Method for measuring surface shear stress magnitude and direction using liquid crystal coatings
08/08/1995CA1336532C Probe motion guiding device, position sensing apparatus and position sensing method
08/03/1995WO1995020771A1 Method and apparatus for remote detection and thickness measurement of solid or liquid layer
08/03/1995DE4417315C1 Interferometric three=dimensional image recognition appts.
08/02/1995EP0665576A2 Wafer diameter/sectional shape measuring machine
08/02/1995EP0610199B1 Instrument for detecting the presence of a body
08/01/1995US5438525 System and method for the detection of defects of a coating
08/01/1995US5438422 Error detection apparatus and method for use with engravers
08/01/1995US5438417 Electro-optical system for gauging surface profile deviations
08/01/1995US5438415 Ellipsometer and method of controlling coating thickness therewith
08/01/1995US5438413 Process for measuring overlay misregistration during semiconductor wafer fabrication
08/01/1995US5438412 Phase conjugate interferometer for testing paraboloidal mirror surfaces
08/01/1995US5438404 Gyroscopic system for boresighting equipment by optically acquiring and transferring parallel and non-parallel lines
08/01/1995US5437702 Hot bottle inspection apparatus and method
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