| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 06/07/1994 | US5319570 Control of large scale topography on silicon wafers |
| 06/07/1994 | US5319567 Non-contact method of obtaining dimensional information about a reference feature of an object |
| 06/07/1994 | US5319445 Hidden change distribution grating and use in 3D moire measurement sensors and CMM applications |
| 06/07/1994 | US5319442 Optical inspection probe |
| 06/07/1994 | US5319435 Method and apparatus for measuring the wavelength of spectrally narrow optical signals |
| 06/07/1994 | US5319399 Optical alignment device |
| 06/07/1994 | US5319387 Apparatus for specifying coordinates of a body in three-dimensional space |
| 06/07/1994 | US5319187 Laser beam receivers and canal building laser devices |
| 06/01/1994 | EP0599807A1 Position detector |
| 06/01/1994 | EP0599806A1 Position detector |
| 06/01/1994 | EP0599350A2 Crystal diameter measuring device |
| 06/01/1994 | EP0599335A2 Cylindrical container inner surface tester |
| 06/01/1994 | EP0599126A1 A method of monitoring and/or dispensing materials onto a substrate |
| 06/01/1994 | EP0563058B1 Method and sensor for the determination of the position of a position-control element relative to a reference body |
| 06/01/1994 | EP0491749B1 Device for absolute two-dimensional position measurement |
| 06/01/1994 | DE4340417A1 Photoelectric position detector for angular position encoding device - comprises annular semiconductor diode onto which beam of light is deflected from semi-transparent mirror |
| 06/01/1994 | DE4306957C1 Semiconductor wafer magazine compartment indexing apparatus - has opto-electronic sensor determining position of both wafer and compartment w.r.t. reference plane having fixed relationship to handling plane |
| 06/01/1994 | CN1087421A Instrument for measuring line length capable of calibrating at any time |
| 05/31/1994 | US5317648 Process for extracting a particular color image of an object and a color processing device therefor |
| 05/31/1994 | US5317386 Optical monitor for measuring a gap between two rollers |
| 05/31/1994 | US5317338 Visual measurement technique and test pattern for aperture offsets in photoplotters |
| 05/31/1994 | US5317142 Automatic focusing apparatus which removes light reflected by a lower surface of a sample |
| 05/26/1994 | WO1994011852A1 Process for detecting and eliminating the shadow of moving objects in a sequence of digital images |
| 05/26/1994 | WO1994011702A1 Noncontact position measurement systems using optical sensors |
| 05/26/1994 | WO1994011701A1 Bending angle detector for bending machine |
| 05/26/1994 | WO1994011700A1 Computerized three dimensional data acquisition apparatus and method |
| 05/26/1994 | WO1994011698A1 Enhanced resolution wafer thickness measurement system |
| 05/26/1994 | DE4340204A1 Displacement sensor using semiconductor laser light source - has thermal insulator between laser light source and optical grating measuring scale |
| 05/26/1994 | DE4239389A1 Optical position-measuring device with fluorescent light guide track - employs stationary LED and flexible light guide for excitation of mobile source of fluorescence measured at each end for comparison |
| 05/26/1994 | DE4239207A1 Measuring three=dimensional structure of wire or helical valve spring - using camera to take sequence of images of component rotating around axis, and combining and evaluating in electronic storage and processing unit |
| 05/26/1994 | DE4238891A1 Video camera system with integral object-distance-measuring device - combines digitised video image with signal from position-sensitive detector of spot produced by subsidiary beam |
| 05/26/1994 | CA2149307A1 Computerized three dimensional data acquisition apparatus and method |
| 05/25/1994 | EP0598709A1 Touch probe |
| 05/25/1994 | EP0598057A1 Method and apparatus for automatic densitometer alignment |
| 05/25/1994 | EP0414829B1 A device for the simultaneous contactless testing of a plurality of points on a test sample and its application |
| 05/25/1994 | EP0343158B1 Range finding by diffraction |
| 05/25/1994 | EP0318566B2 Optical scanning head |
| 05/25/1994 | CN2166414Y Micro-optical space measuring apparatus |
| 05/24/1994 | US5315666 Method and apparatus for measuring lengths on an article |
| 05/24/1994 | US5315374 Three-dimensional measuring apparatus |
| 05/24/1994 | US5315373 Method of measuring a minute displacement |
| 05/24/1994 | US5315371 Device for measuring the position of a filament bundle |
| 05/24/1994 | US5313711 Wheel alignment system |
| 05/24/1994 | CA2041207C Cavity monitoring system |
| 05/24/1994 | CA2029540C Solder joint locator |
| 05/21/1994 | CA2102823A1 Method of monitoring and/or dispensing materials onto a substrate |
| 05/19/1994 | DE4238800A1 Multi-colour printing press printing plate alignment - determining registration information by comparison with optically-measured values of reference printing plate, for aligning of cylinder plates |
| 05/19/1994 | DE4238504A1 Tool measuring method for machine spindle - measuring spindle stock position when tool enters optical measurement plane using laser light barrier |
| 05/18/1994 | EP0597771A1 Optical beam centralisation adjusting device, application to the introduction of the beam in an optical fibre |
| 05/18/1994 | EP0597639A1 Non-contact surface flaw detection |
| 05/18/1994 | EP0597524A2 Method and device for investigating an object by means of a reflectable radiation beam |
| 05/18/1994 | EP0597054A1 Sensor device and position determination process and their use for the control of an insertion robot. |
| 05/17/1994 | US5313272 Method and apparatus for measuring deviation between patterns on a semiconductor wafer |
| 05/17/1994 | US5313260 Photosensitive probes |
| 05/17/1994 | US5313054 Method and device for determining the orientation of a solid |
| 05/17/1994 | US5311977 High resolution parts handling system |
| 05/17/1994 | CA1329644C Register measuring system and process |
| 05/14/1994 | CA2108940A1 Material fault detector |
| 05/11/1994 | WO1994010555A1 Product discrimination system and method therefor |
| 05/11/1994 | WO1994010532A1 Electro-optical system for gauging surface profiles |
| 05/11/1994 | WO1994009697A1 Corneal topography by single-direction shearing of dual orthogonal grating |
| 05/11/1994 | EP0596017A1 Method and apparatus for measuring orange peel and texture in painted surfaces |
| 05/11/1994 | EP0595974A1 Contact-free method for tridimensional measurement of the envelope of an object, particularly a foot, and measuring apparatus for implementing such method. |
| 05/11/1994 | EP0595933A1 Probe for surface measurement |
| 05/11/1994 | EP0595835A1 Step scanning technique for interferometer |
| 05/11/1994 | DE4338223A1 System for precise detection of defects during coating of vehicle body - has travelling robot monitor and sensors for relating travel of body on carrier jig to monitor travel |
| 05/11/1994 | DE4244332C1 Verfahren und Vorrichtung zur Messung von Geometrien technischer Oberflächen Method and device for measurement of geometries of technical surfaces |
| 05/11/1994 | DE4237689A1 Radial-clearance measuring system between tunnelling shield and tubing exterior - uses three measuring sensors on shield with rays inclined rearwards and outwards to inner surfaces of shield and tubing |
| 05/11/1994 | CN2164544Y Machine tool straight line measurer using steel filament microscopic method |
| 05/10/1994 | US5311599 Method and apparatus for optical testing of samples |
| 05/10/1994 | US5311291 Measuring method and device, in particular for measuring cigarettes, using a laser beam |
| 05/10/1994 | US5311288 Method and apparatus for detecting surface deviations from a reference plane |
| 05/10/1994 | US5311287 Direct access storage device with head-disc dynamics monitor |
| 05/10/1994 | US5311286 Apparatus and method for optically measuring a surface |
| 05/10/1994 | US5311285 Measuring method for ellipsometric parameter and ellipsometer |
| 05/10/1994 | US5311284 Method of measuring optical characteristics of thin film and apparatus therefor |
| 05/10/1994 | US5311275 Apparatus and method for detecting particles on a substrate |
| 05/10/1994 | US5310260 Non-contact optical techniques for measuring surface conditions |
| 05/10/1994 | US5309913 Frameless stereotaxy system |
| 05/10/1994 | US5309772 Self-exciting optical strain gage |
| 05/05/1994 | DE4336867A1 Object surface contour measuring device - has projected index reflected from measured surface onto photoelectric transducer |
| 05/05/1994 | DE4334060A1 Determining position parameters of measurement position - detecting displacement of image of scattered laser beam on detectorusing triangulation principle |
| 05/05/1994 | DE4232485A1 Optical angle measurer for vehicle with navigation system - contains frame with stop and support rod for optical arrangement lockable in position on rod when aligned with object |
| 05/04/1994 | EP0595324A1 Automatic real-time calibrator for electromechanical rotogravure stylus |
| 05/04/1994 | EP0595020A2 Process control for submicron linewidth measurement |
| 05/04/1994 | EP0594961A1 Estimation of metal temperature by consumption amount of pouring tube due to immersion in molten metal |
| 05/04/1994 | EP0535171B1 Device for evaluating for a measured quantity obtained on a rotating shaft |
| 05/04/1994 | CN2164018Y 激光扫描曲面测量装置 Laser scanning surface measuring device |
| 05/04/1994 | CN2164017Y 热金属检测器 Hot metal detector |
| 05/04/1994 | CN1086271A Apparatus and method for testing multiple characteristics of single textile sample with automatic feed |
| 05/03/1994 | US5309533 Structure with intrinsic damage control, manufacturing processes and method of use |
| 05/03/1994 | US5309515 Currency note width detector |
| 05/03/1994 | US5309486 Non-contact flaw detection for cylindrical nuclear fuel pellets |
| 05/03/1994 | US5309375 A method for determining a surface topology of a workpiece |
| 05/03/1994 | US5309222 Surface undulation inspection apparatus |
| 05/03/1994 | US5309221 Measurement of fiber diameters with high precision |
| 05/03/1994 | CA1329265C Log measuring apparatus and method |
| 04/28/1994 | WO1994009355A1 Apparatus and method for textile sample testing |
| 04/28/1994 | DE4326704A1 Geometric parameter measurement using optical position detectors - focussing light source on measurement object onto position detectors in camera focus plane and using algorithm for translation and orientation |
| 04/28/1994 | DE4235618A1 Holographic-interferometric pattern recognition method - placing reference body next to measurement object, to allow comparison for control of wavelength of one of two coherent light sources |