Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
07/2002
07/17/2002CN1358996A Method and apparatus for phase contrasting microscope measured surface by transmission type different interference
07/17/2002CN1358983A Angle changeable double reflection mirror dynamic liquid film thickness measuring instrument
07/16/2002US6421629 Three-dimensional shape measurement method and apparatus and computer program product
07/16/2002US6421623 Method for inspecting the liquid discharge condition of liquid jet head, and apparatus for inspecting liquid discharge condition
07/16/2002US6421164 Interferometeric imaging with a grating based phase control optical delay line
07/16/2002US6421132 Method and apparatus for rapid range imaging
07/16/2002US6421124 Position detecting system and device manufacturing method using the same
07/16/2002US6421114 Three-dimensional information measuring apparatus
07/16/2002US6420723 Position sensing device having a single photosensing element and dual light source
07/16/2002US6420697 Steering angle sensor
07/16/2002US6419360 Scanner
07/16/2002US6418629 Rotating angle measuring device and method for rotary object
07/11/2002WO2002054849A1 A method and an apparatus for measuring positions of contact elements of an electronic component
07/11/2002WO2002054480A1 Lighting system used in apparatus for inspecting surface mounted chip
07/11/2002WO2002054132A2 System for automatically adjusting a lens power through gaze tracking
07/11/2002WO2002054109A1 Method for detecting emission timing, emission timing detector and distance measuring apparatus
07/11/2002WO2002011183B1 Shape accuracy improvement using a novel calibration approach
07/11/2002WO2000067951A9 Optical endpoint detection during chemical mechanical planarization
07/11/2002US20020091466 Mobile robot and course adjusting method thereof
07/11/2002US20020090743 Method of measuring meso-scale structures on wafers
07/11/2002US20020090128 Hardware configuration for parallel data processing without cross communication
07/11/2002US20020090115 Image processing method and contactless image input apparatus utilizing the method
07/11/2002US20020089677 Apparatus for monitoring intentional or unavoidable layer depositions and method
07/11/2002US20020089676 Method and apparatus for in-situ monitoring of thickness during chemical -mechanical polishing
07/11/2002US20020089675 Three-dimensional input device
07/11/2002US20020089674 Method and apparatus for locating a football on a field of play
07/11/2002US20020089673 3-D measurements of improved accuracy
07/11/2002US20020089672 Method and apparatus for measuring gap, and method and apparatus for measuring shape and method for manufacturing liquid crystal device
07/11/2002US20020089661 System for determining the dynamic orientation a vehicle wheel plane
07/11/2002US20020089583 Three-dimensional visual inspection method of semiconductor packages and apparatus using single camera
07/11/2002US20020089340 Method for measuring reticle leveling in stepper
07/11/2002US20020088973 Semiconductor chip including a reference element having reference coordinates
07/11/2002US20020088931 Topological and motion measuring tool
07/11/2002US20020088928 Method and apparatus for measuring gap, method and apparatus for measuring shape and method for manufacturing liquid crystal device
07/11/2002US20020088921 High-precision displacement measurement device and method using unit displacement sensor based on confocal theory
07/11/2002US20020088919 Light probe microscope
07/11/2002US20020088269 Method and apparatus for measuring the size of drops of a viscous material dispensed from a dispensing system
07/11/2002US20020088128 Portable wheel alignment system for motorcycles
07/11/2002DE19931676C2 Verfahren zum Vermessen von Werkstücken und Bearbeitungsstation A method for measuring workpieces and processing station
07/11/2002DE10163849A1 Assembly to track a moving textile yarn, and the like, has a dividing wall between the yarn passage and the light passage to the reference sensor, to give a clear light path and prevent dust from entering it
07/11/2002DE10065121A1 Verfahren zur Verbesserung der Genauigkeit von optischen 3D-Messverfahren A method for improving the accuracy of optical 3D measurement method
07/11/2002DE10065120A1 Verfahren zur Bestimmung der Abweichung des Pixelortes der Pixel mindestens einer Bildaufnahmematrix von der Sollposition Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position
07/11/2002DE10065070A1 Device for determining location/position of an ultrasound transmitter surface for an ultrasound head in a room in relation to a human thorax has a camera, a 3D measuring head rigidly fixed on the ultrasound head and a calibrating head
07/10/2002EP1221642A2 Lane recognition system for vehicle
07/10/2002EP1221583A1 Method of measuring the thickness of an ultra-thin oxide layer
07/10/2002EP1221076A1 Micropositioning system
07/10/2002EP1221043A1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
07/10/2002EP1221039A1 Method of measuring the geometry of grooves in an elongated element
07/10/2002EP1221018A1 Device for geometric determination of poorly accessible hollows in one workpiece
07/10/2002CN1358266A Device for determining wheel and/or axle geometry in motor vehicles
07/10/2002CN1357745A In-situ substrate thickness measuring system and method
07/10/2002CN1357744A Single-beam laser collimation/alignment measurement technology
07/10/2002CN1087513C Displacement self-sensing helium-neon laser system and its embodiment method
07/09/2002US6418243 Apparatus and method for providing high fidelity reconstruction of an observed sample
07/09/2002US6417929 Optical measurement of lithographic power bias of minimum features
07/09/2002US6417928 Reflectance method for evaluating the surface characteristics of opaque materials
07/09/2002US6417927 Method and apparatus for accurately compensating both long and short term fluctuations in the refractive index of air in an interferometer
07/09/2002US6417921 Apparatus for analyzing multi-layer thin film stacks on semiconductors
07/09/2002US6417916 Method and apparatus for examining test pieces
07/09/2002US6417841 Information extraction apparatus and method
07/09/2002US6417507 Modulated fibre bragg grating strain gauge assembly for absolute gauging of strain
07/09/2002US6415522 Vehicle for measuring the geometric condition of a railway track
07/04/2002WO2002052351A1 Method of measuring overlay
07/04/2002WO2002052242A2 Method and apparatus for crack and fracture detection utilizing bragg gratings
07/04/2002WO2002052223A1 Fibre-optical strain gauge and method for the production of said strain gauge
07/04/2002US20020087253 Method for detecting road slope and system for controlling vehicle speed using the method
07/04/2002US20020085747 Image processing apparatus and method, image capturing apparatus, and information provision medium
07/04/2002US20020085611 Optical alignment apparatus with a beam splitter
07/04/2002US20020085214 Measurement technique for ultra-thin oxides
07/04/2002US20020085213 Ball motion measuring apparatus
07/04/2002US20020085211 Apparatus and method for determining the active dopant profile in a semiconductor wafer
07/04/2002US20020085193 Surveying apparatus
07/04/2002US20020085184 Exposure apparatus and pressure correction method
07/04/2002US20020085093 Lumber grading system
07/04/2002US20020084418 Pseudo-randomized infrared blurring array
07/04/2002US20020084260 Laser welding method and laser welding apparatus
07/04/2002DE10162216A1 Verfahren zur Analyse eines getrennte Bereiche aufweisenden Überlagerungs-Streifenbildes A method for analyzing a separate regions having overlay streak image
07/04/2002DE10113306A1 Detection and classification of objects on a conveyor belt, etc. to control further actions such as filling, emptying or picking up, uses two viewing systems so that re-calibration is not required if ambient conditions change
07/04/2002DE10064289A1 Contactless measurement of the surface profile of objects using an optical triangulation method in which different scales are used for vertical and horizontal axes of the object image to improve measurement accuracy
07/04/2002DE10063786A1 Vorrichtung und Verfahren zum Vermessen eines Gegenstandes Apparatus and method for measuring an object
07/04/2002DE10063293A1 Multi-channel inspection of moving surfaces involves synchronizing two radiation sources with image generation frequency of image acquisition device to alternately illuminate surface
07/04/2002DE10062254A1 Verfahren und Vorrichtung zum Charakterisieren einer Oberfläche und Verfahren und Vorrichtung zur Ermittlung einer Formanomalie einer Oberfläche Method and apparatus for characterizing a surface, and method and device for determining a shape anomaly of a surface
07/04/2002CA2432923A1 Method and apparatus for crack and fracture detection utilizing bragg gratings
07/04/2002CA2348363A1 Lumber grading system
07/03/2002EP1220596A1 A method and an apparatus for measuring positions of contact elements of an electronic component
07/03/2002EP1219925A2 Surveying apparatus
07/03/2002EP1219922A2 Procedure to improve the exactness of optical 3D-measuring
07/03/2002EP1219921A2 Procedure to determine the deviation of the desired pixel position of the pixels of at least one image dissector matrix
07/03/2002EP1219528A2 Steering angle sensor
07/03/2002EP1219420A1 Device for scanning register marks in a multicolour printing machine
07/03/2002EP1219380A2 Laser welding method and laser welding apparatus
07/03/2002EP1219259A1 System for locating relative positions of objects
07/03/2002EP1218936A2 Methods and apparatuses for trench depth detection and control
07/03/2002EP1218809A1 Method and device for detecting the position of a vehicle in a given area
07/03/2002EP1218692A1 Cmos-compatible three-dimensional image sensor ic
07/03/2002EP1218691A1 Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
07/03/2002EP1218690A1 Method for detecting the spatial position of a tracking mirror and mirror arrangement for carrying out said method
07/03/2002EP1218689A1 Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source
07/03/2002EP1218688A2 Method and apparatus for three dimensional inspection of electronic components
07/03/2002EP1090267A4 Inspection system and method for leads of semiconductor devices