| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 08/15/2002 | WO2002014840A3 Database interpolation method for optical measurement of diffractive microstructures |
| 08/15/2002 | WO2001055763A3 Optical element |
| 08/15/2002 | WO2001038827A9 Fiber bragg grating sensor |
| 08/15/2002 | WO2001031570A9 Tracking motion of a writing instrument |
| 08/15/2002 | WO2001024235A9 Methods and apparatuses for trench depth detection and control |
| 08/15/2002 | US20020110271 Visual inspection method and visual inspection apparatus |
| 08/15/2002 | US20020110269 Web inspection method and device |
| 08/15/2002 | US20020109851 Frequency transform phase shifting interferometry |
| 08/15/2002 | US20020109850 Exposure apparatus including interferometer system |
| 08/15/2002 | US20020109849 Laser-based measuring apparatus and method |
| 08/15/2002 | US20020109843 Method and system for registering fiducials employing backlighting techniques |
| 08/15/2002 | US20020109833 Apparatus for and method of calculating lens distortion factor, and computer readable storage medium having lens distortion factor calculation program recorded thereon |
| 08/15/2002 | US20020109705 System and method for preparing an image corrected for the presence of a gravity induced distortion |
| 08/15/2002 | US20020109505 Device for testing a material that changes shape when an electric and/or magnetic field is applied |
| 08/15/2002 | US20020109111 Optical detection and measurement system |
| 08/15/2002 | US20020109077 Contact sensor, and apparatus for protecting a protruding component |
| 08/14/2002 | EP1231688A2 Method for manufacturing spark plug and apparatus for carrying out the same |
| 08/14/2002 | EP1231460A2 A lens meter for measuring properties of a spectacle lens or a contact lens |
| 08/14/2002 | EP1231451A1 Gripping device to a pneumatic-tyred wheel for measuring and recording vehicle convergence |
| 08/14/2002 | EP1230620A1 Aircraft identification and docking guidance systems |
| 08/14/2002 | EP1229847A1 Method and device for the determination of reduction parameters for the subsequent reduction of a fractured bone |
| 08/14/2002 | EP1105037B1 Apparatus and method for measuring vision defects of a human eye |
| 08/14/2002 | EP0886489B1 Method for the contactless determination of dimensions of a human body and evaluation of the dimensions determined, and device for determining the dimensions and further processing them |
| 08/14/2002 | EP0839313B1 Digital endoscope with thermal compensation |
| 08/14/2002 | DE10106160A1 Erfassungsvorrichtung und Erfassungsverfahren zum digitalen Erfassen eines dreidimensionalen Objektes Detection device and detection method for digitally capturing a three-dimensional object |
| 08/14/2002 | CN1364403A Inspection device for components |
| 08/14/2002 | CN1364230A 三维光扫描 Three-dimensional optical scanning |
| 08/14/2002 | CN1364134A Workpiece inspection apparatus and method |
| 08/14/2002 | CN1363826A Individual element photoelectric measuring device for pane object |
| 08/13/2002 | US6434442 Three-dimensional shape data processing device, carved plate and carving device |
| 08/13/2002 | US6434332 Distance-measuring device, distance-measuring method and camera using the same |
| 08/13/2002 | US6434257 Size recognition system with method for determining price of a commodity |
| 08/13/2002 | US6433878 Method and apparatus for the determination of mask rules using scatterometry |
| 08/13/2002 | US6433877 Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface |
| 08/13/2002 | US6433875 Measuring device for measuring the accuracy of the position and track of a moving machine element |
| 08/13/2002 | US6433874 Electronic shearography apparatus for producing animation of shearogram images |
| 08/13/2002 | US6433871 Method of using scatterometry measurements to determine and control gate electrode profiles |
| 08/13/2002 | US6433860 Light wave rangefinder |
| 08/13/2002 | US6433857 Optical traingulation displacement sensor using a diffraction grating |
| 08/13/2002 | US6433353 Method and apparatus for inspecting surface irregularities of transparent plate |
| 08/13/2002 | US6432800 Inspection of defects on the circumference of semiconductor wafers |
| 08/13/2002 | US6431990 System and method for measuring a golfer's ball striking parameters |
| 08/13/2002 | US6430833 Measuring probe with diaphragms and modules |
| 08/13/2002 | CA2118110C Apparatus for detecting relative movement |
| 08/13/2002 | CA2065631C Optic sensor designed to supply information representative of the state of a surface |
| 08/08/2002 | WO2002061684A2 System and method for the measurement of the relative position of an object with respect to a point of reference |
| 08/08/2002 | WO2002061401A1 Method for characterising or controlling the production of a thin-layered component using optical methods |
| 08/08/2002 | WO2002061370A1 Method for image recognition in motor vehicles |
| 08/08/2002 | WO2002061368A2 Method and apparatus for determining a three dimensional image of a moving object by means of light |
| 08/08/2002 | WO2002019687A3 Accurately aligning images in digital imaging systems by matching points in the images |
| 08/08/2002 | WO2002012821A3 Two piece alignment head |
| 08/08/2002 | WO2001054068A3 Method and system for detecting defects on a printed circuit board |
| 08/08/2002 | US20020107659 Orientation and position sensor |
| 08/08/2002 | US20020105657 High speed laser micrometer |
| 08/08/2002 | US20020105656 Systems and methods for high-accuracy displacement determination in a correlation based position transducer |
| 08/08/2002 | US20020105655 Method and system for high speed measuring of microscopic targets |
| 08/08/2002 | US20020105654 Optically-based system for processing banknotes based on security feature emissions |
| 08/08/2002 | US20020105646 Systems for measuring periodic structures |
| 08/08/2002 | US20020105639 Calibration artifact and method of using the same |
| 08/08/2002 | US20020105636 Defect inspection apparatus and defect inspection method |
| 08/08/2002 | US20020104957 Method of measuring the movement of an input device |
| 08/08/2002 | DE10104684A1 Schichtdickenmeßverfahren an einem Werkstück Schichtdickenmeßverfahren on a workpiece |
| 08/08/2002 | DE10102115A1 Halter für einen auf einer Aufnahmeplatte befestigten Gegenstand Holder for an object mounted on a mounting plate |
| 08/08/2002 | CA2433885A1 System and method for the measurement of the relative position of an object with respect to a point of reference |
| 08/07/2002 | EP1229349A2 Led illumination device for a scannerless range imaging system |
| 08/07/2002 | EP1229303A2 Calibration artifact and method of using the same |
| 08/07/2002 | EP1228344A1 Method and device for evaluating the tolerance in bearings or joints consisting of coupled components |
| 08/07/2002 | EP1227944A2 Measuring device and sensor for contactlessly measuring tire forces |
| 08/07/2002 | EP1227914A1 A device and a method for determining coordinates and orientation |
| 08/07/2002 | EP1227750A2 Optical tracking device |
| 08/07/2002 | EP0983483B1 Interferometric measuring device |
| 08/07/2002 | EP0974038B1 Measuring device and method for contactless determination of the 3-dimensional form of a peripheral groove in a spectacle frame |
| 08/07/2002 | EP0700505B1 Interferometric flying height measuring device |
| 08/07/2002 | CN1363036A Superfine indentation tester |
| 08/07/2002 | CN1362612A Measuring apparatus |
| 08/07/2002 | CN1362610A Apparatus and method for measuring film thickness of unsintered ceramic wafer |
| 08/07/2002 | CN1088854C Reticle |
| 08/07/2002 | CN1088833C Embedded optical sensor capable of strain and temperature measurement using single diffraction grating |
| 08/07/2002 | CN1088830C Atomic raster measuring method having 0.01 nano resolution ratio |
| 08/06/2002 | US6430257 Method and apparatus for determining the position of an elongated object relative the surface of an obstructing body by means of electromagnetic radiation |
| 08/06/2002 | US6429943 Critical dimension analysis with simultaneous multiple angle of incidence measurements |
| 08/06/2002 | US6429931 Method and apparatus for article inspection including speckle reduction |
| 08/06/2002 | US6428171 Height measuring apparatus |
| 08/06/2002 | US6427780 Communication system for surveying instrument |
| 08/01/2002 | WO2002060232A1 Improved laser align sensor for positioning components |
| 08/01/2002 | WO2002059545A1 Three-dimensional surface profile imaging method and apparatus using single spectral light condition |
| 08/01/2002 | WO2002059544A1 Optical projection measuring device |
| 08/01/2002 | WO2002040938A3 Height scanning interferometry method and apparatus including phase gap analysis |
| 08/01/2002 | WO2001027557A9 Real-time interferometric deformation analysis |
| 08/01/2002 | US20020103617 Position and orientation determining method and apparatus and storage medium |
| 08/01/2002 | US20020102898 Method for manufacturing spark plug and apparatus for carrying out the same |
| 08/01/2002 | US20020102743 Apparatus and method for visually identifying micro-forces with a palette of cantilever array blocks |
| 08/01/2002 | US20020102016 Image processing method and device |
| 08/01/2002 | US20020101596 Semiconductor wafer position detecting system, semiconductor device fabricating facility of using the same, and wafer position detecting method thereof |
| 08/01/2002 | US20020101595 Device and method for inspecting cam profiles |
| 08/01/2002 | US20020101594 Measurement apparatus |
| 08/01/2002 | US20020101591 Vacuum measurement device |
| 08/01/2002 | US20020101585 Apparatus for rapidly measuring angle-dependent diffraction effects on finely patterned surfaces |
| 08/01/2002 | US20020101583 Light source for inspection of planographic printing plate and inspection system using the same |
| 08/01/2002 | US20020101581 Optical axis adjustment method, and storage medium recorded with a program that executes said adjustment method |