| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 08/29/2002 | US20020118372 Method and device for testing a cutting-edge geometry of a rotatably drivable tool |
| 08/29/2002 | US20020118369 Assembling arrays of small particles using an atomic force microscope to define ferroelectric domains |
| 08/29/2002 | US20020118352 Fast gate scanning three-dimensional laser radar apparatus |
| 08/29/2002 | US20020118274 Three-dimensional measuring method and system |
| 08/29/2002 | US20020118114 Sensor for automatic doors |
| 08/29/2002 | US20020118113 Object detection sensor |
| 08/29/2002 | US20020117608 Fiber bragg grating strain sensor with arc configuration |
| 08/29/2002 | DE10128334A1 Verfahren und Vorrichtung zur gleichzeitigen Beleuchtung von Objekten für die Interferometrische Speckle Shearografie mit verschiedenen Sensitivitätsvektroren aus unabhängig voneinander eingesetzten Strahlquellen Method and apparatus for simultaneous illumination of objects for interferometric speckle shearography with different Sensitivitätsvektroren of used independently beam sources |
| 08/29/2002 | DE10108139A1 Verfahren zur Vermessung und/oder Bearbeitung eines Werkstücks Method for measuring and / or machining of a workpiece |
| 08/29/2002 | DE10106699A1 Berührungssensor und Vorrichtung zum Schutz eines hervorstehenden Bauteils Touch sensor and device for protecting a protruding member |
| 08/29/2002 | CA2438715A1 Method for measuring and/or machining a workpiece |
| 08/28/2002 | EP1235067A1 Process and apparatus for real-time determination of a solid sample composition as a function of the depth within the sample |
| 08/28/2002 | EP1235054A2 Reflection scale and displacement measurement apparatus using the same |
| 08/28/2002 | EP1235049A2 Method and arrangement for imaging and measuring of microscopic three-dimensional structures |
| 08/28/2002 | EP1234193A1 Measurement of the wear of the fireproof lining of a metallurgical vessel |
| 08/28/2002 | EP1234161A2 Fiber bragg grating sensor |
| 08/28/2002 | EP1234159A1 An optical position detector |
| 08/28/2002 | EP1234158A1 Distortion detector |
| 08/28/2002 | EP1218691A4 Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system |
| 08/28/2002 | EP1206676A4 Optical sub-pixel parts inspection system |
| 08/28/2002 | EP0880755B1 Increased depth of field for photography |
| 08/28/2002 | CN1366607A Method and device for imaging liquid-filled container |
| 08/28/2002 | CN1089891C Three-dimensional shape measuring apparatus |
| 08/28/2002 | CN1089890C Instrument for multistage measurement of basementrock's deformation |
| 08/27/2002 | US6442503 Process and apparatus for measuring the volume of an object |
| 08/27/2002 | US6442416 Determination of the position and orientation of at least one object in space |
| 08/27/2002 | US6441911 Measuring instrument and method for measuring patterns on substrates of various thicknesses |
| 08/27/2002 | US6441910 System for measuring structures of an object |
| 08/27/2002 | US6441909 Pattern projection measurement grating |
| 08/27/2002 | US6441908 Profiling of a component having reduced sensitivity to anomalous off-axis reflections |
| 08/27/2002 | US6441907 High accuracy ring laser interferometer using an external cavity ring laser |
| 08/27/2002 | US6441905 Sheet thickness and swell measurement method and apparatus therefor |
| 08/27/2002 | US6441894 Optical autofocus for use with microtiter plates |
| 08/27/2002 | US6441887 Measuring method and device |
| 08/27/2002 | US6441378 Magnetic energy filter |
| 08/27/2002 | US6441367 Control systems and methods for diffuse illumination |
| 08/27/2002 | US6440760 Method of measuring etched state of semiconductor wafer using optical impedence measurement |
| 08/27/2002 | US6438856 Apparatus for fine positioning of a component, and coordinate measuring machine having an apparatus for fine positioning of a component |
| 08/27/2002 | US6438855 Portable wheel alignment system for motorcycles |
| 08/27/2002 | US6438822 Apparatus for positioning board-support pin |
| 08/22/2002 | WO2002065106A1 Web inspection method and device |
| 08/22/2002 | WO2002065053A1 Method for measuring gap of liquid crystal cell |
| 08/22/2002 | WO2002065052A1 Size measuring method and device |
| 08/22/2002 | WO2000028278A9 Electronics assembly apparatus with height sensing sensor |
| 08/22/2002 | US20020115304 Manufacturing method for a field-effect transistor, manufacturing method for a semiconductor device, and apparatus therefor |
| 08/22/2002 | US20020114494 Method and measuring arrangement for measuring paper |
| 08/22/2002 | US20020113975 Method and measuring arrangement for measuring paper surface |
| 08/22/2002 | US20020113973 Method of detecting posture of object and apparatus using the same |
| 08/22/2002 | US20020113971 Method for measuring characteristics, especially the temperature of a multi-layer material while the layers are being built up |
| 08/22/2002 | US20020113970 Integrated alignment and calibration of optical system |
| 08/22/2002 | US20020113964 Particle size distribution measuring apparatus |
| 08/22/2002 | US20020113959 Method and apparatus for inspecting resist pattern |
| 08/22/2002 | US20020113946 Image input apparatus |
| 08/22/2002 | US20020113943 System and method for automatically adjusting a lens power through gaze tracking |
| 08/22/2002 | US20020113878 Camera calibration device and method, and computer system |
| 08/22/2002 | US20020113864 A sterocamera for digital photogrammetry |
| 08/22/2002 | US20020113234 Method and system for inspecting electronic circuit pattern |
| 08/22/2002 | US20020113218 Method and apparatus for positioning substrate and the like |
| 08/22/2002 | US20020112911 Device for side impact detection for a motor vehicle |
| 08/22/2002 | DE10203851A1 Messvorrichtung Measuring device |
| 08/22/2002 | DE10163441A1 Optischer Sensor Optical sensor |
| 08/22/2002 | DE10108240A1 Verfahren und Anordnung zur Abbildung und Vermessung mikroskopischer dreidimensionaler Strukturen Method and apparatus for imaging and measuring microscopic three-dimensional structures |
| 08/22/2002 | DE10108204A1 Verfahren zum dreidimensionalen optischen Vermessen von Messobjekten A method for three-dimensional optical measurement of measurement objects |
| 08/22/2002 | DE10105822A1 Verfahren und Vorrichtung zur Bestimmung der Kontur einer Ausnehmung in einem Materialstück Method and device for determining the contour of a recess in a piece of material |
| 08/22/2002 | DE10103870A1 Verfahren zur Bilderkennung bei Kraftfahrzeugen A method for image recognition in motor vehicles |
| 08/21/2002 | EP1233515A2 Touch sensor and device for protecting a projecting part |
| 08/21/2002 | EP1233247A1 Evaluating alignment of two bodies ( belt pulleys ) with respect to each other with convex or half reflecting reflector |
| 08/21/2002 | EP1232480A2 Image processing apparatus |
| 08/21/2002 | EP1232384A1 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 08/21/2002 | EP1232377A1 Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object |
| 08/21/2002 | EP0801725B1 Photodetector having an integrated function for elimination of the effects of stray light |
| 08/21/2002 | CN2506977Y Background light eliminating device for semiconductor laser monitoring instrument |
| 08/21/2002 | CN2506976Y Micro outline measuring instrument |
| 08/21/2002 | CN1089284C Method and apparatus for monitoring and positioing beam or jet for operating workpiece |
| 08/20/2002 | US6438507 Data processing method and processing device |
| 08/20/2002 | US6438438 Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices |
| 08/20/2002 | US6438272 Method and apparatus for three dimensional surface contouring using a digital video projection system |
| 08/20/2002 | US6437868 In-situ automated contactless thickness measurement for wafer thinning |
| 08/20/2002 | US6437867 Performing selected optical measurements with optical coherence domain reflectometry |
| 08/20/2002 | US6437864 Stage positioning device |
| 08/20/2002 | US6437862 Defect inspection apparatus |
| 08/20/2002 | US6437860 Method and apparatus for angle measurement or to define angular location of an object |
| 08/20/2002 | US6437859 Device for detecting optical position |
| 08/20/2002 | US6437853 Three-dimensional image capturing device |
| 08/20/2002 | US6437357 Glass inspection system including bright field and dark field illumination |
| 08/20/2002 | US6437355 Apparatus for judging whether bump height is proper or not |
| 08/20/2002 | US6437333 Holding apparatus, transferring apparatus, image taking system, and image taking method |
| 08/20/2002 | US6437324 Timing ruler or timing disk and process for its manufacture |
| 08/20/2002 | US6437317 Method and apparatus for inspecting cigarette heads |
| 08/20/2002 | US6435008 Apparatus and method for determining porosity |
| 08/20/2002 | US6434847 Methods and apparatus for determining the location of a shaft within a vessel |
| 08/20/2002 | US6434841 Pulley alignment tool |
| 08/20/2002 | CA2232534C Method and apparatus for determining the alignment of motor vehicle wheels |
| 08/15/2002 | WO2002063368A1 Scanning near-field optical microscope |
| 08/15/2002 | WO2002063246A1 Light-emitting/receiving combined unit and displacement sensor using the same |
| 08/15/2002 | WO2002063241A1 Three-dimensional coordinate measuring method, three-dimensional coordinate measuring apparatus, and method for building large-sized structure |
| 08/15/2002 | WO2002063240A1 Method and apparatus for mapping system calibration |
| 08/15/2002 | WO2002063239A2 Method and apparatus for mapping system calibration |
| 08/15/2002 | WO2002063236A2 Method and device for determining the contour of a recess in a piece of material |
| 08/15/2002 | WO2002042754A3 Measurement of surface defects |