Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
04/2010
04/08/2010WO2010039231A1 Cmos device comprising nmos transistors and pmos transistors having increased strain-inducing sources and closely spaced metal silicide regions
04/08/2010WO2010039208A2 Guard ring structures and method of fabricating thereof
04/08/2010WO2010039207A2 Semiconductor structure with an electric field stop layer for improved edge termination capability
04/08/2010WO2010038990A2 Nitrogen-oxide gas sensor
04/08/2010WO2010038989A2 Nitrogen-oxide gas sensor
04/08/2010WO2010038987A2 Nitrogen-oxide gas sensor with long signal stability
04/08/2010WO2010038888A1 Silicon oxynitride film and process for production thereof, computer-readable storage medium, and plasma cvd device
04/08/2010WO2010038887A1 Silicon dioxide film and process for production thereof, computer-readable storage medium, and plasma cvd device
04/08/2010WO2010038886A1 Method for depositing silicon nitride film, computer-readable storage medium, and plasma cvd device
04/08/2010WO2010038885A1 Silicon nitride film and process for production thereof, computer-readable storage medium, and plasma cvd device
04/08/2010WO2010038820A1 Display device
04/08/2010WO2010038819A1 Display device
04/08/2010WO2010038788A1 Current control element and method for manufacturing the current control element
04/08/2010WO2010038654A1 Method and apparatus for forming silicon oxide film
04/08/2010WO2010038600A1 Semiconductor device
04/08/2010WO2010038570A1 Functional layer manufacturing method, functional layer and electronic device
04/08/2010WO2010038566A1 Thin film transistor and method for manufacturing same
04/08/2010WO2010038547A1 Silicon carbide semiconductor device
04/08/2010WO2010038511A1 Display panel and display device using the same
04/08/2010WO2010038464A1 Semiconductor substrate, electronic device and method for manufacturing semiconductor substrate
04/08/2010WO2010038463A1 Semiconductor substrate, electronic device and method for manufacturing semiconductor substrate
04/08/2010WO2010038461A1 Semiconductor substrate, electronic device and method for manufacturing semiconductor substrate
04/08/2010WO2010038460A1 Semiconductor substrate, electronic device and method for manufacturing semiconductor substrate
04/08/2010WO2010038426A1 Arrangement constitution of floating gate type nonvolatile memory
04/08/2010WO2010038419A1 Semiconductor device, method for manufacturing same and display device
04/08/2010WO2010038174A1 Robust high aspect ratio semiconductor device
04/08/2010WO2010038150A1 Semiconductor device
04/08/2010WO2010037577A1 Dislocation engineering using a scanned laser
04/08/2010WO2010037522A1 A transistor with embedded si/ge material having enhanced across-substrate uniformity
04/08/2010WO2010014355A3 Varactors with enhanced tuning ranges
04/08/2010WO2010014251A3 Transistor with embedded si/ge material having enhanced boron confinement
04/08/2010US20100087057 Semiconductor device and method of fabricating the same
04/08/2010US20100085813 Method of driving a semiconductor memory device and a semiconductor memory device
04/08/2010US20100085805 Magnetic random access memory (mram) utilizing magnetic flip-flop structures
04/08/2010US20100085803 Electronic devices utilizing spin torque transfer to flip magnetic orientation
04/08/2010US20100085678 EPR Pair Generation
04/08/2010US20100085532 Display device and manufacturing method of the same
04/08/2010US20100085525 Thin film transistor substrate, liquid crystal panel and liquid crystal display device using the same
04/08/2010US20100085455 Imaging apparatus and method of driving solid-state imaging device
04/08/2010US20100084746 Process for producing laminated substrate and laminated substrate
04/08/2010US20100084745 Nitride semiconductor substrate
04/08/2010US20100084744 Thermal processing of substrates with pre- and post-spike temperature control
04/08/2010US20100084743 Method for reducing crystal defect of simox wafer and simox wafer
04/08/2010US20100084742 Method for manufacturing semiconductor epitaxial crystal substrate
04/08/2010US20100084741 Integrated Circuit
04/08/2010US20100084740 Capacitor with zirconium oxide and method for fabricating the same
04/08/2010US20100084739 Semiconductor device and method of manufacturing the same
04/08/2010US20100084737 Tunable Semiconductor Component Provided with a Current Barrier
04/08/2010US20100084736 Soi substrate contact with extended silicide area
04/08/2010US20100084735 Semiconductor assembly and method for forming seal ring
04/08/2010US20100084733 Isolation layer of semiconductor device and manufacturing method thereof
04/08/2010US20100084731 Image sensor and method for fabricating the same
04/08/2010US20100084725 Magnetic memory with asymmetric energy barrier
04/08/2010US20100084724 Memory cell with stress-induced anisotropy
04/08/2010US20100084723 Mems structure and method of manufacturing the same
04/08/2010US20100084722 Method for manufacturing a micromechanical chip and a component having a chip of this type
04/08/2010US20100084721 Micro-Electromechanical System Microstructure
04/08/2010US20100084720 Gate in semiconductor device and method of fabricating the same
04/08/2010US20100084719 transistor performance with metal gate
04/08/2010US20100084718 Advanced metal gate method and device
04/08/2010US20100084717 Semiconductor device
04/08/2010US20100084715 Photo alignment mark for a gate last process
04/08/2010US20100084711 Electrostatic discharge projection semiconductor device and method for manufacturing the same
04/08/2010US20100084710 Capacitor-Less Dynamic Random Access Memory (DRAM) Devices
04/08/2010US20100084709 Semiconductor device and method for manufacturing same
04/08/2010US20100084708 Semiconductor device and method of manufacturing the same
04/08/2010US20100084707 Polysilicon control etch-back indicator
04/08/2010US20100084706 Power Semiconductor Devices and Methods of Manufacture
04/08/2010US20100084705 Semiconductor devices having reduced gate-drain capacitance and methods for the fabrication thereof
04/08/2010US20100084704 Devices Containing Permanent Charge
04/08/2010US20100084703 Semiconductor memory device including a stacked gate having a charge storage layer and a control gate, and method of manufacturing the same
04/08/2010US20100084701 Semiconductor device and a method of manufacturing the same
04/08/2010US20100084700 EEPROM and Method for Manufacturing EEPROM
04/08/2010US20100084699 Flotox-type eeprom and method for manufacturing the same
04/08/2010US20100084697 Novel capacitors and capacitor-like devices
04/08/2010US20100084696 Ferroelectric memory device
04/08/2010US20100084693 Method of Forming a Semiconductor Device and Semiconductor Device Thereof
04/08/2010US20100084692 Image sensor with low crosstalk and high red sensitivity
04/08/2010US20100084691 Semiconductor component with stress-absorbing semiconductor layer, and associated fabrication method
04/08/2010US20100084688 Enhancement-mode nitride transistor
04/08/2010US20100084687 Aluminum gallium nitride/gallium nitride high electron mobility transistors
04/08/2010US20100084686 Assymetric hetero-doped high-voltage mosfet (ah2mos)
04/08/2010US20100084685 Semiconductor device and manufacturing method thereof
04/08/2010US20100084684 Insulated gate bipolar transistor
04/08/2010US20100084664 Zinc sulfide substrates for group iii-nitride epitaxy and group iii-nitride devices
04/08/2010US20100084663 Silicon Carbide Zener Diode
04/08/2010US20100084662 Semiconductor structure processing using multiple laser beam spots overlapping lengthwise on a structure
04/08/2010US20100084660 Semiconductor Structures
04/08/2010US20100084655 Field effect transistor and process for production thereof
04/08/2010US20100084654 Display device
04/08/2010US20100084653 Display device
04/08/2010US20100084650 Display device
04/08/2010US20100084649 Oxide thin film transistor and method of fabricating the same
04/08/2010US20100084648 Light-emitting apparatus and production method thereof
04/08/2010US20100084643 Thin film transistor, method for manufacturing thin film transistor, and electronic apparatus
04/08/2010US20100084633 Spin transistor using double carrier supply layer structure
04/08/2010US20100084632 Nanostructure insulated junction field effect transistor
04/08/2010US20100084631 Phase-controlled field effect transistor device and method for manufacturing thereof
04/08/2010US20100084629 Quantum dot-metal oxide complex, method of preparing the same, and light-emitting device comprising the same
04/08/2010US20100084628 Branched nanowire and method for fabrication of the same
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