Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2005
02/16/2005CN1189952C Light emitting diode and semiconductor laser
02/16/2005CN1189947C Semiconductor device and mfg. method thereof
02/16/2005CN1189944C Manufacture of capacitor in DRAM
02/16/2005CN1189943C Monoelectron memory device composed of quantum points and making method thereof
02/16/2005CN1189940C Blocking circuit for IC
02/16/2005CN1189939C Semiconductor device and making method
02/16/2005CN1189938C Wire solder free semiconductor device and package method thereof
02/16/2005CN1189936C Adhesive film for semiconductor, leadframe using the same, semiconductor device and its manufacturing method
02/16/2005CN1189935C Method for locally forming silicide metal layer
02/16/2005CN1189934C Semiconductor device containing porous insulative material and mfg. method thereof
02/16/2005CN1189933C Vertical semiconductor variable resistor device and its making process
02/16/2005CN1189931C Method and apparatus for detecting endpoint of photoresist stripping
02/16/2005CN1189930C Weld interface with mechanical strengthened and its method
02/16/2005CN1189929C Electronic element mounting body and its producing method and electronic apparatus using it
02/16/2005CN1189928C Semiconductor heat treatment process and equipment, and semiconductor by said process heat treatment
02/16/2005CN1189927C Dielectric film forming material, delectric film method of forming delectric film and semiconductor device
02/16/2005CN1189926C Thin semiconductor chip and its manufacturing method
02/16/2005CN1189925C Wet treating device
02/16/2005CN1189924C System for controlling instant-compensuted grinded curved surface
02/16/2005CN1189923C Structure of grid medium with high dielectric and its preparation method
02/16/2005CN1189922C Manufacture of integrated self-aligned metal silicide gate of enbedded DRAM
02/16/2005CN1189921C Ion implanter and ion implanting method using the same
02/16/2005CN1189920C Method for producing group III nitride compound semiconductor and group III nitride compound semiconductor device
02/16/2005CN1189919C Method of manufacturing group-III nitride compound semiconductor
02/16/2005CN1189918C Chip protection equipment
02/16/2005CN1189917C Wafer atmospheric transport module having controlled mini-environment and mfg method thereof
02/16/2005CN1189916C Chip transfer device
02/16/2005CN1189891C Examination method integrated circuit
02/16/2005CN1189852C Drive circuit and display apparatus comprising same
02/16/2005CN1189794C Improved pattern generator
02/16/2005CN1189792C Photoresist composition and its structure and forming method
02/16/2005CN1189756C Inspection apparatus and sensor
02/16/2005CN1189739C Holder mechanism
02/16/2005CN1189595C Reduced impedance chamber
02/15/2005US6857107 LSI layout method and apparatus for cell arrangement in which timing is prioritized
02/15/2005US6857093 Semiconductor integrated circuit device capable of self-testing internal power supply currents provided to internal circuits integrated on chip
02/15/2005US6856863 Method and apparatus for automatic calibration of robots
02/15/2005US6856858 Shared sensors for detecting substrate position/presence
02/15/2005US6856849 Method for adjusting rapid thermal processing (RTP) recipe setpoints based on wafer electrical test (WET) parameters
02/15/2005US6856762 Light irradiation type thermal processing apparatus
02/15/2005US6856630 Beam homogenizer, laser irradiation apparatus, semiconductor device, and method of fabricating the semiconductor device
02/15/2005US6856565 Thin film magnetic memory device conducting read operation by a self-reference method
02/15/2005US6856562 Test structure for measuring a junction resistance in a DRAM memory cell array
02/15/2005US6856559 Semiconductor memory device
02/15/2005US6856552 Semiconductor memory and method of driving the same
02/15/2005US6856550 Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data
02/15/2005US6856545 Fast program to program verify method
02/15/2005US6856542 Programmable logic device circuit and method of fabricating same
02/15/2005US6856539 Thin film magnetic memory device including memory cells having a magnetic tunnel junction
02/15/2005US6856538 Thin film magnetic memory device suppressing internal magnetic noises
02/15/2005US6856537 Thin film magnetic memory device having dummy cell
02/15/2005US6856534 Ferroelectric memory with wide operating voltage and multi-bit storage per cell
02/15/2005US6856533 Method of modulating threshold voltage of a mask ROM
02/15/2005US6856519 Inverter controller
02/15/2005US6856501 Capacitor having copper electrodes and diffusion barrier layers
02/15/2005US6856408 Line profile asymmetry measurement using scatterometry
02/15/2005US6856404 Scanning exposure method and apparatus, and device manufacturing method using the same
02/15/2005US6856402 Interferometer with dynamic beam steering element
02/15/2005US6856385 Spatial averaging technique for ellipsometry and reflectometry
02/15/2005US6856379 Polarizer and microlithography projection system with a polarizer
02/15/2005US6856377 Relay image optical system, and illuminating optical device and exposure system provided with the optical system
02/15/2005US6856376 Lithographic apparatus, apparatus cleaning method, device manufacturing method and device manufactured thereby
02/15/2005US6856369 Electrode substrate for liquid crystal display panel, method of fabricating the electrode substrate, and liquid crystal display panel
02/15/2005US6856360 Electrooptical device, method of manufacturing the same, and electronic equipment
02/15/2005US6856235 Methods for manufacturing resistors using a sacrificial layer
02/15/2005US6856228 Integrated inductor
02/15/2005US6856226 Integrated transformer
02/15/2005US6856225 Photolithographically-patterned out-of-plane coil structures and method of making
02/15/2005US6856170 Clock signal transmission circuit
02/15/2005US6856154 Test board for testing IC package and tester calibration method using the same
02/15/2005US6856153 Low-current pogo probe card
02/15/2005US6856123 Semiconductor device provided with regulator circuit having reduced layout area and improved phase margin
02/15/2005US6856078 Lamp filament design
02/15/2005US6856031 SRAM cell with well contacts and P+ diffusion crossing to ground or N+ diffusion crossing to VDD
02/15/2005US6856030 Semiconductor latches and SRAM devices
02/15/2005US6856028 Alleviating stress developing in a solder joint of the external electrodes of the circuit board.
02/15/2005US6856026 Semiconductor chip, wiring board and manufacturing process thereof as well as semiconductor device
02/15/2005US6856025 Chip and wafer integration process using vertical connections
02/15/2005US6856024 Semiconductor device with wiring embedded in trenches and vias
02/15/2005US6856023 Semiconductor device and method of manufacturing semiconductor device
02/15/2005US6856021 Aluminum metal conductors formed on a side of a main face of a substrate and suppresses the precipitation of copper
02/15/2005US6856020 Semiconductor device and method for fabricating the same
02/15/2005US6856019 Semiconductor integrated circuit device
02/15/2005US6856018 Semiconductor device and method of manufacture thereof
02/15/2005US6856017 Device having resin package and method of producing the same
02/15/2005US6856015 Semiconductor package with heat sink
02/15/2005US6856011 Semiconductor chip package and method of fabricating same
02/15/2005US6856006 Encapsulation method and leadframe for leadless semiconductor packages
02/15/2005US6856005 Semiconductor device having a nitride-based hetero-structure and method of manufacturing the same
02/15/2005US6856002 Graded GexSe100-x concentration in PCRAM
02/15/2005US6856001 Trench isolation for semiconductor devices
02/15/2005US6856000 Reduce 1/f noise in NPN transistors without degrading the properties of PNP transistors in integrated circuit technologies
02/15/2005US6855999 Schottky diode having a shallow trench contact structure for preventing junction leakage
02/15/2005US6855997 Mask, exposure method, line width measuring method, and method for manufacturing semiconductor devices
02/15/2005US6855996 Electronic device substrate structure and electronic device
02/15/2005US6855994 Multiple-thickness gate oxide formed by oxygen implantation
02/15/2005US6855993 Semiconductor devices and methods for fabricating the same
02/15/2005US6855992 Structure and method for fabricating configurable transistor devices utilizing the formation of a compliant substrate for materials used to form the same
02/15/2005US6855991 Semiconductor device having a doped lattice matching layer and a method of manufacture therefor
02/15/2005US6855990 Strained-channel multiple-gate transistor