Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2005
09/28/2005EP1580248A1 Polishing composition and polishing method
09/28/2005EP1580247A1 Polishing composition and polishing method
09/28/2005EP1580243A1 Polishing composition and polishing method
09/28/2005EP1579956A2 Polishing apparatus and polishing method
09/28/2005EP1579511A1 Method for roughening a surface of a body, and optoelectronic component
09/28/2005EP1579509A1 Group iii nitride based flip-chip integrated circuit and method for fabricating
09/28/2005EP1579508A2 Memory architecture with series grouped memory cells
09/28/2005EP1579507A1 Multilayer capacitor with multiple plates per layer
09/28/2005EP1579504A1 Method of producing semiconductor elements using a test structure
09/28/2005EP1579503A2 Semiconductor device power interconnect striping
09/28/2005EP1579500A1 Methods for performing substrate imprinting using thermoset resin varnishes and products formed therefrom
09/28/2005EP1579499A1 Method of self-assembling electronic circuitry and circuits formed thereby
09/28/2005EP1579498A1 Method of manufacturing a semiconductor device and semiconductor device obtained by means of such a method
09/28/2005EP1579497A2 Method for forming a semiconductor device and structure thereof
09/28/2005EP1579496A2 Electronic device and method of manufacturing same
09/28/2005EP1579495A2 Method for fabrication of semiconductor device
09/28/2005EP1579494A1 N-channel pull-up element logic circuit
09/28/2005EP1579493A1 Method of fabricating a tft device formed by printing
09/28/2005EP1579492A1 Thin film transistor, method for producing a thin film transistor and electronic device having such a transistor
09/28/2005EP1579491A1 Method and apparatus for planarization of a material by growing a sacrificial film with customized thickness profile
09/28/2005EP1579490A1 Method for low temperature growth of inorganic materials from solution using catalyzed growth and re-growth
09/28/2005EP1579489A1 Method and apparatus for monitoring a material processing system
09/28/2005EP1579488A1 Method of manufacturing a semiconductor device and semiconductor device obtained with such a method
09/28/2005EP1579487A2 Method of manufacturing a semiconductor device
09/28/2005EP1579486A1 Gallium nitride crystal, homoepitaxial gallium-nitride-based devices and method for producing same
09/28/2005EP1579485A2 Method of forming a thick strained silicon layer and semiconductor structures incorporating a thick strained silicon layer
09/28/2005EP1579483A2 System and method for expanding a pulse width
09/28/2005EP1579482A2 Method and apparatus for planarizing a semiconductor wafer
09/28/2005EP1579481A2 An ion implantation device and a method of semiconductor manufacturing by the implantation of boron hydride cluster ions
09/28/2005EP1579470A2 Method and apparatus for monitoring a plasma in a material processing system
09/28/2005EP1579458A2 Nonvolatile memory array using unified cell structure in divided-well allowing write operation with no disturb
09/28/2005EP1579368A2 Method and apparatus for monitoring a material processing system
09/28/2005EP1579273A2 System and method for aerial image sensing
09/28/2005EP1579029A2 Method and apparatus for electroless deposition with temperature-controlled chuck
09/28/2005EP1579019A2 High purity nickel/vanadium sputtering components; and methods of making sputtering components
09/28/2005EP1578858A2 Carbon nanotubes
09/28/2005EP1578686A2 An integrated structure and method for fabricating the same
09/28/2005EP1578685A2 Method of forming semiconductor devices through epitaxy
09/28/2005EP1578559A1 Bonding material and bonding method
09/28/2005EP1573780A3 Bubbler for substrate processing
09/28/2005EP1501961A4 High pressure processing chamber for multiple semiconductor substrates
09/28/2005EP1488286A4 Ph buffered compositions for cleaning semiconductor substrates
09/28/2005EP1360552B1 Fabrication of structures of metal/semiconductor compound by x-ray/euv projection lithography
09/28/2005EP1355759B1 Bonding tool with polymer coating
09/28/2005EP1309420B1 Soldering method for mounting electric components
09/28/2005EP1303789A4 T-butyl cinnamate polymers and their use in photoresist compositions
09/28/2005EP1216106A4 Improved apparatus and method for growth of a thin film
09/28/2005EP1169613B1 Characterizing and correcting cyclic errors in distance measuring and dispersion interferometry
09/28/2005EP1145288B1 Wafer processing system
09/28/2005EP1062667B1 Method to write/read mram arrays
09/28/2005EP1042807B1 Semiconductor device
09/28/2005EP0972305B1 Process for fabricating a diffused emitter bipolar transistor
09/28/2005EP0886894B1 Contact carriers for populating substrates with spring contacts
09/28/2005CN2729901Y Appearance test device of double-row direct insertion type package chip
09/28/2005CN1675976A Mounting machine and controller for the mounting machine
09/28/2005CN1675968A Method for forming bump on electrode pad with use of double-layered film
09/28/2005CN1675967A An electronic product, a body and a method of manufacturing
09/28/2005CN1675779A Method of manufacturing fine T-shaped electrode
09/28/2005CN1675778A Insulated gate field effect transistor having passivated Schottky barriers to the channel
09/28/2005CN1675777A Self-aligned vertical gate semiconductor device
09/28/2005CN1675776A Method of making a vertical gate semiconductor device
09/28/2005CN1675775A Semiconductor device having Schottky junction electrode
09/28/2005CN1675774A Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions
09/28/2005CN1675773A Method for generating a structure on a substrate
09/28/2005CN1675772A 场效应晶体管 FET
09/28/2005CN1675770A NROM memory cell, memory array, related devices and methods
09/28/2005CN1675769A Ferroelectric device and method of manufacturing such a device
09/28/2005CN1675767A Buried digit line stack and process for making same
09/28/2005CN1675759A Method for forming a dual gate oxide device using a metal oxide and resulting device
09/28/2005CN1675758A Method for manufacturing SOI wafer
09/28/2005CN1675757A Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method
09/28/2005CN1675754A Method of microelectrode connection and connected structure of use thereof
09/28/2005CN1675753A Method and apparatus for completely or partly covering at least one electronic component with a compound
09/28/2005CN1675752A Transistor structure including a metal silicide gate and channel implants and method of manufacturing the same
09/28/2005CN1675751A 薄膜晶体管 The thin film transistor
09/28/2005CN1675750A Sidewall smoothing in high aspect ratio/deep etching using a discrete gas switching method
09/28/2005CN1675749A Method for selectively removing material from the surface of a substrate, masking material for a wafer and wafer provided with a masking material
09/28/2005CN1675748A Cluster type asher equipment used for manufacture of semiconductor device
09/28/2005CN1675747A Ferroelectric memory, semiconductor device, production method for ferroelectric memory, and production method for semiconductor device
09/28/2005CN1675746A Defect reduction in semiconductor materials
09/28/2005CN1675745A Method for fabricating semiconductor wafer
09/28/2005CN1675744A Optical path improvement, focus length change compensation, and stray light reduction for temperature measurement system of RTP tool
09/28/2005CN1675743A Shared sensors for detecting substrate position/presence
09/28/2005CN1675742A Transfer chamber for vacuum processing system
09/28/2005CN1675737A Plasma processor with electrode simultaneously responsive to plural frequencies
09/28/2005CN1675603A Method for processing data based on the data context
09/28/2005CN1675591A Method for aligning a substrate on a stage
09/28/2005CN1675590A Photosensitive composition for interlayer dielectric and method of forming patterned interlayer dielectric
09/28/2005CN1675518A Process endpoint detection method using broadband reflectometry
09/28/2005CN1675517A Method for controlling a recess etch process
09/28/2005CN1675516A Method for in-situ monitoring of patterned substrate processing using reflectometry
09/28/2005CN1675406A Methods and apparatus for in situ substrate temperature monitoring by electromagnetic radiation emission
09/28/2005CN1675402A Vapor deposition of tungsten nitride
09/28/2005CN1675401A Substrate processing apparatus and related systems and methods
09/28/2005CN1675331A CMP abrasive and substrate polishing method
09/28/2005CN1675327A Process for reducing dishing and erosion during chemical mechanical planarization
09/28/2005CN1675264A Photoresists, fluorinated polymers and processes for 157 nm microlithography
09/28/2005CN1675263A Photoresists, fluoropolymers and processes for 157 nm microlithography
09/28/2005CN1675262A Fluorinated polymers useful as photoresists, and processes for microlithography
09/28/2005CN1675127A Etch stop control for MEMS device formation