Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2006
03/08/2006CN1744297A 半导体装置 Semiconductor device
03/08/2006CN1744296A Method for forming isolation layer in semiconductor memory device
03/08/2006CN1744295A Method for preparing nano phase transformation memory unit capable of reducing write-operation current
03/08/2006CN1744294A Multi-needle liftout attachment
03/08/2006CN1744293A Method for manufacturing thin film transistor and its structure
03/08/2006CN1744292A Method for manufacturing polycrystalline silicon film transistor
03/08/2006CN1744291A Uncrystallizing method for avoiding leakage of super shallow junction
03/08/2006CN1744290A Heterojunction bipolar transistor and manufacturing method thereof
03/08/2006CN1744289A Method for improving surface quality of gallium arsenide chip
03/08/2006CN1744288A Method for forming dual oxide layer
03/08/2006CN1744287A Alumina mask in hydride vapour-phase epitaxial growing gallium nitride film and its preparing method
03/08/2006CN1744286A Semiconductor manufacturing method and its structure
03/08/2006CN1744285A 制造系统 Manufacturing System
03/08/2006CN1744284A Laser beam processing apparatus for processing semiconductor wafer,method executed therein, and such semiconductor wafer processed thereby
03/08/2006CN1744283A Manufacturing method of semiconductor device
03/08/2006CN1744282A Method for forming smaller contact hole using T-type pattern
03/08/2006CN1744281A Method for improving source/drain electrode ion doping contour
03/08/2006CN1744280A Method for implanting a cell channel ion of semiconductor device
03/08/2006CN1744279A Method and device for preparing p-type zinc oxide crystal film by doping phosphorus
03/08/2006CN1744278A Silicon chip III-family nitride-base semiconductor growing method
03/08/2006CN1744277A Method for forming holes in semiconcuctor crystal round piece
03/08/2006CN1744276A Method for forming polycrystalline silicon with ruogh surface
03/08/2006CN1743958A Method for correcting exposure metering device by exposure critical energy value
03/08/2006CN1743956A Top anti-reflective coating composition and method for pattern formation of semiconductor device using the same
03/08/2006CN1743930A Method for making organic thin film transistor and method for making liquid crystal display using same
03/08/2006CN1743929A Multiple protective layer method and device for organic thin film transistor
03/08/2006CN1743928A Method for manufacturing up light-emitting type organic LED pixel and its structure
03/08/2006CN1743864A Semiconductor PN node diode device temperature rise measuring method and apparatus
03/08/2006CN1743854A Capacitance comparison measuring method and its circuit
03/08/2006CN1743505A Method for monitoring plasma etching platform after prevention and maintenance process
03/08/2006CN1743504A Method for improving reaction room performance
03/08/2006CN1743501A Method and apparatus for dechucking a substrate
03/08/2006CN1743370A Fluoro-rubber composite, rubber material using the same, and a method of manufacturing a fluoro-rubber molded product
03/08/2006CN1743254A Vacuum interface between a mini-environment box and an equipment
03/08/2006CN1743248A Clean container structure
03/08/2006CN1743245A Sustrate loading casing
03/08/2006CN1244958C Mask defect inspection method and use thereof
03/08/2006CN1244957C Wiring detection method for semiconductor packaged inner
03/08/2006CN1244956C Method for forming pattern
03/08/2006CN1244955C Manufacture of semiconductor device and annealing device
03/08/2006CN1244954C Method for producing thin film semiconductor and method for forming resist pattern thereof
03/08/2006CN1244953C Thin-film transistor array base plate and its manufacturing method
03/08/2006CN1244932C High density semiconductor memory having diagonal bit lines and dual word lines
03/08/2006CN1244896C Electron device
03/08/2006CN1244891C Active matrix display
03/08/2006CN1244890C Electrooptical device, its mfg. method and electronic device
03/08/2006CN1244820C Semiconductor test system based on event
03/08/2006CN1244722C Apparatus for copper plating using electroless plating and electroplating
03/08/2006CN1244719C Semiconductor stripping composition containing 1,3-dicarbonyl compounds
03/08/2006CN1244716C Method for forming silicon containing film by using tri(dimethylamino) silicane atomic shell deposition
03/08/2006CN1244713C Sputtering device utilizing magnetic field to form metal film
03/08/2006CN1244489C Method for manufacturing a housing for a chip having a micromechanical structure
03/08/2006CN1244407C Cleanable manifold for low steam pressure chemical article container
03/07/2006US7010776 Extending the range of lithographic simulation integrals
03/07/2006US7010775 Method for creating mask pattern for circuit fabrication and method for verifying mask pattern for circuit fabrication
03/07/2006US7010766 Parallel design processes for integrated circuits
03/07/2006US7010468 Method and apparatus for slope to threshold conversion for process state monitoring and endpoint detection
03/07/2006US7010451 Dynamic creation and modification of wafer test maps during wafer testing
03/07/2006US7010447 Method for inspecting defect and system therefor
03/07/2006US7010434 Complementary division condition determining method and program and complementary division method
03/07/2006US7010388 Work-piece treatment system having load lock and buffer
03/07/2006US7010381 Versatile system for controlling semiconductor topography
03/07/2006US7010380 Management system, management method and apparatus, and management apparatus control method
03/07/2006US7010374 Method for controlling semiconductor processing apparatus
03/07/2006US7009892 Semiconductor memory device and portable electronic apparatus
03/07/2006US7009888 Low voltage, island-layer-based nonvolatile semiconductor storage device with floating biased memory cell channel
03/07/2006US7009884 Semiconductor storage device, display device and portable electronic equipment
03/07/2006US7009876 MRAM and data writing method therefor
03/07/2006US7009874 Low remanence flux concentrator for MRAM devices
03/07/2006US7009873 Magnetic random access memory
03/07/2006US7009870 Semiconductor integrated circuit apparatus
03/07/2006US7009869 Dynamic memory cell
03/07/2006US7009868 Memory device having a transistor and one resistant element as a storing means and method for driving the memory device
03/07/2006US7009867 Ferroelectric-type nonvolatile semiconductor memory
03/07/2006US7009866 Nonvolatile memory device using serial diode cell
03/07/2006US7009862 Semiconductor device
03/07/2006US7009830 Semiconductor integrated circuit device
03/07/2006US7009811 polymer materials (e.g. polystyrene or PMMA) are formed to selectively bond with the top of the insulator materials; chemical mechanical polishing is performed to remove top portions of the insulators material
03/07/2006US7009772 High transmittance overcoat for microlens arrays in semiconductor color imagers
03/07/2006US7009769 Correction of birefringence in cubic crystalline optical systems
03/07/2006US7009753 Pattern generator
03/07/2006US7009714 Method of dry etching a sample and dry etching system
03/07/2006US7009704 Overlay error detection
03/07/2006US7009696 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool
03/07/2006US7009686 Exposure method
03/07/2006US7009685 Bearing arrangement for reaction mass in a controlled environment
03/07/2006US7009684 Exposure apparatus and exposure method
03/07/2006US7009683 Exposure apparatus
03/07/2006US7009682 Lithographic apparatus and device manufacturing method
03/07/2006US7009681 Exposure apparatus and method, and device fabricating method using the same
03/07/2006US7009666 Back lit cholesteric liquid crystal display
03/07/2006US7009664 Liquid crystal display device with organic protective film which structure connecting around sealing material
03/07/2006US7009445 Charge pump with a constant current input
03/07/2006US7009410 Capacitance detection type sensor and manufacturing method thereof
03/07/2006US7009383 Wafer probe station having environment control enclosure
03/07/2006US7009359 Foam core chuck for the scanning stage of a lithography system
03/07/2006US7009307 Low stress and warpage laminate flip chip BGA package
03/07/2006US7009306 Semiconductor device and method of manufacturing the same, circuit board, together with electronic instrument
03/07/2006US7009298 Low-resistance contact to silicon having a titanium silicide interface and an amorphous titanium carbonitride barrier layer
03/07/2006US7009294 Production process for semiconductor device