H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2006
10/25/2006	CN1282224C Method for forming a semiconductor device
10/25/2006	CN1282223C Manufacturing method of grid electrode dielectric layer
10/25/2006	CN1282222C Manufacturing method of semiconductor device
10/25/2006	CN1282221C Ion implantation machine
10/25/2006	CN1282220C P-type conductive indium-doped tin oxide film
10/25/2006	CN1282219C Pattern forming method and method for manufacturing seniconductor applying said method
10/25/2006	CN1282218C Structure of superposition mark and method for forming same
10/25/2006	CN1282217C Process waterway system
10/25/2006	CN1282197C Magnetic random-access storage device and reading method thereof
10/25/2006	CN1282040C Exposure method and exposure device
10/25/2006	CN1282039C Lithographic apparatus, device manufacturing method, and method of manufacturing an optical element
10/25/2006	CN1282038C Projection lithography method using a phase shifting aperture
10/25/2006	CN1282033C Pattern formation method and exposure device
10/25/2006	CN1282032C Exposure control for phase shifting photolithographic masks
10/25/2006	CN1282026C Display device
10/25/2006	CN1282021C Liquid crystal display device and its manufacturing method
10/25/2006	CN1281969C Magnetoresistive element and magnetoresistive magnetic head, magnetic recording apparatus and magnetoresistive memory device using same
10/25/2006	CN1281968C Electronic component characteristic measuring device
10/25/2006	CN1281966C Probe sheet, probe card, semiconductor detector device
10/25/2006	CN1281866C Service life forcasting system of wshirler, service life forcasting method of whirler and manufacturing device with whirler
10/25/2006	CN1281781C 溅射方法 Sputtering method
10/24/2006	US7127694 Computer implemented design system, a computer implemented design method, a reticle set, and an integrated circuit
10/24/2006	US7127693 Device for creating timing constraints
10/24/2006	US7127385 Delay time estimation method and recording medium storing estimation program
10/24/2006	US7127367 Tailored temperature uniformity
10/24/2006	US7127365 Method for identifying a defective die site
10/24/2006	US7127314 Fabrication monitoring system
10/24/2006	US7127311 Exposure apparatus and device manufacturing method
10/24/2006	US7127133 Monolithically integrated optic triplexer and method for making same
10/24/2006	US7126972 Nitride based semiconductor laser diode device with a bar mask
10/24/2006	US7126872 Semiconductor integrated circuit
10/24/2006	US7126859 Semiconductor integrated circuit that handles the input/output of a signal with an external circuit
10/24/2006	US7126845 Memory device capable of performing high speed reading while realizing redundancy replacement
10/24/2006	US7126843 Semiconductor memory device using magnetoresistive effect
10/24/2006	US7126841 Non-volatile memory with a single transistor and resistive memory element
10/24/2006	US7126836 Semiconductor device, system device using it, and manufacturing method of a semiconductor device
10/24/2006	US7126835 Semiconductor memory device
10/24/2006	US7126808 Wafer platen equipped with electrostatic clamp, wafer backside gas cooling, and high voltage operation capability for plasma doping
10/24/2006	US7126766 Optical stop apparatus and exposure apparatus having the same
10/24/2006	US7126765 Objective with fluoride crystal lenses
10/24/2006	US7126757 Illumination apparatus, exposure apparatus using the same, and device fabricating method
10/24/2006	US7126700 Parametric optimization of optical metrology model
10/24/2006	US7126689 Exposure method, exposure apparatus, and method for producing device
10/24/2006	US7126673 Illumination optical system and exposure apparatus having the same
10/24/2006	US7126671 Lithographic apparatus and device manufacturing method
10/24/2006	US7126670 Position measurement technique
10/24/2006	US7126667 Exposure apparatus and method
10/24/2006	US7126666 Lithographic apparatus, device manufacturing method and device manufactured thereby
10/24/2006	US7126661 In-plane switching display device having common electrode overlapping channel forming region, and double gate TFT
10/24/2006	US7126593 Drive circuit including a plurality of transistors characteristics of which are made to differ from one another, and a display apparatus including the drive circuit
10/24/2006	US7126357 Method for inspecting a wafer and apparatus for inspecting a wafer
10/24/2006	US7126350 Electrostatic capacitance detection device
10/24/2006	US7126346 Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuits
10/24/2006	US7126232 Defect repair apparatus for an electronic device
10/24/2006	US7126231 Mask-making member and its production method, mask and its making method, exposure process, and fabrication method of semiconductor device
10/24/2006	US7126229 Wire-bonding method and semiconductor package using the same
10/24/2006	US7126227 Wiring substrate, semiconductor device, semiconductor module, electronic equipment, method for designing wiring substrate, method for manufacturing semiconductor device, and method for manufacturing semiconductor module
10/24/2006	US7126226 Semiconductor device and semiconductor chip for use therein
10/24/2006	US7126225 Apparatus and method for manufacturing a semiconductor wafer with reduced delamination and peeling
10/24/2006	US7126223 Semiconductor device formed with an air gap using etch back of inter layer dielectric (ILD)
10/24/2006	US7126222 Semiconductor device
10/24/2006	US7126216 Two part mold for wafer scale caps
10/24/2006	US7126214 Reconfigurable processor module comprising hybrid stacked integrated circuit die elements
10/24/2006	US7126212 Three dimensional device integration method and integrated device
10/24/2006	US7126211 Circuit carrier
10/24/2006	US7126209 Lead frame, resin-encapsulated semiconductor device, and method of producing the same
10/24/2006	US7126208 Composition for forming porous film, porous film and method for forming the same, interlevel insulator film, and semiconductor device
10/24/2006	US7126206 Distributed capacitor array
10/24/2006	US7126205 Devices having improved capacitance and methods of their fabrication
10/24/2006	US7126203 Semiconductor device having a capacitance device
10/24/2006	US7126200 Integrated circuits with contemporaneously formed array electrodes and logic interconnects
10/24/2006	US7126198 Protruding spacers for self-aligned contacts
10/24/2006	US7126197 Power MOSFET and methods of making same
10/24/2006	US7126195 Method for forming a metallization layer
10/24/2006	US7126194 Method for removing impurities of a semiconductor wafer, semiconductor wafer assembly, and semiconductor device
10/24/2006	US7126193 Metal-oxide-semiconductor device with enhanced source electrode
10/24/2006	US7126192 Transistor with reduced gate-to-source capacitance and method therefor
10/24/2006	US7126191 Double-diffused semiconductor device
10/24/2006	US7126190 Self-aligned gate and method
10/24/2006	US7126189 Method for fabricating semiconductor device
10/24/2006	US7126188 Vertical split gate memory cell and manufacturing method thereof
10/24/2006	US7126187 Semiconductor device and a method of producing the same
10/24/2006	US7126184 Nonvolatile semiconductor memory device and a method of the same
10/24/2006	US7126183 Programmable array logic or memory with p-channel devices and asymmetrical tunnel barriers
10/24/2006	US7126181 Capacitor constructions
10/24/2006	US7126180 Semiconductor device including a capacitor having improved structural stability and enhanced capacitance, and method of manufacturing the semiconductor device
10/24/2006	US7126179 Memory cell intermediate structure
10/24/2006	US7126178 Semiconductor device and its manufacturing method
10/24/2006	US7126177 Semiconductor memory device, semiconductor device, and method for production thereof
10/24/2006	US7126176 Memory cell
10/24/2006	US7126174 Semiconductor device and method of manufacturing the same
10/24/2006	US7126171 Bipolar transistor
10/24/2006	US7126170 MISFET for reducing leakage current
10/24/2006	US7126165 Light emitting device assembly
10/24/2006	US7126164 Wafer-level moat structures
10/24/2006	US7126161 Semiconductor device having El layer and sealing material
10/24/2006	US7126159 Plural leds mounted within a central cutout of a surrounding circular reflective electrode
10/24/2006	US7126157 Active matrix substrate, method of making the substrate, and display device
10/24/2006	US7126156 Thin film transistor display device with integral control circuitry
10/24/2006	US7126154 Test structure for a single-sided buried strap DRAM memory cell array

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