H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2006
10/25/2006	CN1851888A Round-grade packing integrated-circuit method
10/25/2006	CN1851887A Method for processing patch diode
10/25/2006	CN1851886A Method for making thin-film transistor
10/25/2006	CN1851885A Washing method after wet etching and method for forming thin-film transistor using same
10/25/2006	CN1851884A Method of manufacturing flash memory device
10/25/2006	CN1851883A Method for forming inclined conductive layer
10/25/2006	CN1851882A Grating etching technology avoiding micro-channel phenomenon
10/25/2006	CN1851881A Semiconductor etching apparatus
10/25/2006	CN1851880A Polysilicon etching technology capable of preventing device from plasma damage
10/25/2006	CN1851879A Packing device of inductive coupling plasma coil
10/25/2006	CN1851878A Etching technology for reducing plasma damage
10/25/2006	CN1851877A Plasma cleaning method for removing silicon chip surface particle after etching process
10/25/2006	CN1851876A Adsorption stripping process for removing exposed zone polymer
10/25/2006	CN1851875A Gate etching process
10/25/2006	CN1851874A Polycrystalline silicon gate grid etching process for reducing particle generation
10/25/2006	CN1851873A Silicon gate etching process capable of avoiding microtrench phenomenon
10/25/2006	CN1851872A Polycrystalline silicon pulse etching process for improving anisotropy
10/25/2006	CN1851871A Polycrystalline silicon etching process capable of removing residual gas
10/25/2006	CN1851870A Method for reducing etching uniformity influence by dry cleaning process
10/25/2006	CN1851869A Particle-removing process before semiconductor etching
10/25/2006	CN1851868A Method of manufacture semiconductor device
10/25/2006	CN1851867A Ion injection uniformity control system and control method
10/25/2006	CN1851866A Method for preparing room temperature ferromagnetic semiconductor Co dopped TiO2 film
10/25/2006	CN1851865A Bare crystal and its manufacturing method
10/25/2006	CN1851864A Silicon chip unloading process
10/25/2006	CN1851863A Pneumatic type platform cover-opening mechanism
10/25/2006	CN1851862A Platform cover-opening mechanism
10/25/2006	CN1851861A Vacuum chamber gas-filling system
10/25/2006	CN1851860A Bottom electrode assembly for semiconductor device
10/25/2006	CN1851859A Silicon chip process test method
10/25/2006	CN1851858A Gas injection and diffusion system
10/25/2006	CN1851857A Silicon-chip separating process
10/25/2006	CN1851856A Reaction chamber for semiconductor treatment
10/25/2006	CN1851855A Plasma etching device exhaustring
10/25/2006	CN1851854A Lower-extraction type etching device
10/25/2006	CN1851853A Device and method for reducing thin-film type capacitance vacuum gauge zero-point drift
10/25/2006	CN1851852A Plasma etching device
10/25/2006	CN1851851A Quartz cover positioning protection device
10/25/2006	CN1851850A Silicon chip unloading process
10/25/2006	CN1851849A Silicon chip unloading process for reducing plasma damage
10/25/2006	CN1851848A Plasma reaction chamber temperature control system on-line fault detecting device and method
10/25/2006	CN1851845A Plasma treating coil
10/25/2006	CN1851844A ICP coil capable of adjusting local coupling strength
10/25/2006	CN1851721A Reliability estimating method for gallium arsenide one-chip microwave integrated circuit
10/25/2006	CN1851596A Mass flow controller on-line correction method
10/25/2006	CN1851593A Equipment alarm and interlocking treatment method
10/25/2006	CN1851587A Semiconductor manufacture equipment control system and method
10/25/2006	CN1851586A Automatic treating device and method for semiconductor manufacture process event
10/25/2006	CN1851585A Method for treating semiconductor processing data
10/25/2006	CN1851580A Method for controlling molecular pump for semiconductor etching device
10/25/2006	CN1851558A Overload buffer protection device
10/25/2006	CN1851556A Adjusting method for long mask exposure focusing plane correction
10/25/2006	CN1851547A Transflective liquid crystal display and manufacturing method of the same
10/25/2006	CN1851476A Interface and semiconductor testing apparatus using same
10/25/2006	CN1851420A Method for measuring electronic-temperature in plasma
10/25/2006	CN1851249A Semiconductor device and temperature detection method using the same
10/25/2006	CN1851053A Shielding plate for enhancing flow field uniformity
10/25/2006	CN1851052A Control method for removing residual gas for etching process
10/25/2006	CN1851051A Method for controlling chip temperature in reaction chamber for semiconductor etching process
10/25/2006	CN1851050A Granule control method for polycrystalline silicon etching process
10/25/2006	CN1850477A Resin molding apparatus
10/25/2006	CN1850362A Washing method for washing polymer film adhered on illinium oxide part surface
10/25/2006	CN1850361A Washing method for removing polymer film adhered on quartz pant surface
10/25/2006	CN1850360A Washing method for removing polymer film adhered on surface of anode alumimium-oxide part
10/25/2006	CN1850350A Air-intaking device for increasing intake evenness
10/25/2006	CN1850349A Air-intake nozzle
10/25/2006	CN1850348A Gas nozzle with function of increasing air-flow distribution evenness
10/25/2006	CN1850347A Air-intaking nozzle with adjustable air-supplying evenness
10/25/2006	CN1850346A Double-zone nozzle
10/25/2006	CN1282396C Carbon electric wire heating body sealing heater and fluid heater using tue same heater
10/25/2006	CN1282257C Device with nitrides system heterogenous structure and its manufacturing method
10/25/2006	CN1282256C Semiconductor device
10/25/2006	CN1282255C Semiconductor device and its producing method
10/25/2006	CN1282254C MOSFET and its manufacture
10/25/2006	CN1282253C Semiconductor device with small bag and its mfg.
10/25/2006	CN1282252C 电子电路 Electronic circuit
10/25/2006	CN1282250C Semiconductor storage apparatus
10/25/2006	CN1282249C Fast storage unit, manufacturing method of fast storage unit and its operation method
10/25/2006	CN1282248C Improved memory unit contact part
10/25/2006	CN1282247C 半导体器件及其制造方法 Semiconductor device and manufacturing method thereof
10/25/2006	CN1282246C High-power RF integrated circuit capable of blocking parasitic loss current and its mfg. method
10/25/2006	CN1282245C Semiconductor chip with partial embedded decoupling capacitance
10/25/2006	CN1282243C Semiconductor device with copper wirings
10/25/2006	CN1282242C Chip ratio package and manufacturing method thereof
10/25/2006	CN1282241C 半导体装置 Semiconductor device
10/25/2006	CN1282239C High density reluctance random access memory unit and manufacture method thereof
10/25/2006	CN1282238C Semiconductor producing process
10/25/2006	CN1282237C Method for making double inserted open structure
10/25/2006	CN1282236C Test element for tunnelling oxidl layer of flash memory and method thereof
10/25/2006	CN1282235C Observer for semiconductor element
10/25/2006	CN1282234C Method for mfg. low-resistance transistor element
10/25/2006	CN1282233C Double-grid field effect transistor and manufacturing method thereof
10/25/2006	CN1282232C Laser irradiation apparatus and laser irradiation method
10/25/2006	CN1282231C Systemic impurity process for vertical pulling silicon sheet
10/25/2006	CN1282230C Method for mfg. semiconductor device, and semiconductor device
10/25/2006	CN1282229C Method for removing silicon nitride layer
10/25/2006	CN1282228C Method and device for cutting non-metal substrate
10/25/2006	CN1282227C Wafer dividing method using cleavage
10/25/2006	CN1282226C Cerium oxide abrasive and method of abrading substrates
10/25/2006	CN1282225C Method for increasing crystal circlr cleaning efficiercy and improving process qualification rate

1 ... 3243 3244 3245 3246 3247 3248 3249 3250 3251 3252 3253 3254 3255 3256 3257 3258 3259 3260 3261 3262 3263 ... 6590