Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2008
04/01/2008US7351300 Peeling method and method of manufacturing semiconductor device
04/01/2008US7351293 Method and device for rotating a wafer
04/01/2008US7351292 Assembly for processing substrates
04/01/2008US7351291 Semiconductor processing system
04/01/2008US7351286 One hundred millimeter single crystal silicon carbide wafer
04/01/2008US7351282 Cutting method and apparatus for ingot, wafer, and manufacturing method of solar cell
04/01/2008US7351131 Method for manufacturing semiconductor device and polishing apparatus
04/01/2008US7350720 Active material emitting device
04/01/2008US7350686 Method for supplying solder
04/01/2008US7350684 Apparatus and method for forming bump
04/01/2008US7350544 Station for controlling and purging a mini-environment
04/01/2008US7350476 Method and apparatus to determine consumable part condition
04/01/2008US7350446 Wafer dividing apparatus
04/01/2008US7350316 Meniscus proximity system for cleaning semiconductor substrate surfaces
04/01/2008US7350315 Edge wheel dry manifold
04/01/2008US7350293 Low profile ball-grid array package for high power
04/01/2008CA2346042C A method and apparatus for performing wavelength-conversion using phosphors with light emitting diodes
04/01/2008CA2177276C Method for fabricating self-assembling microstructures
03/2008
03/27/2008WO2008036963A2 Feram manufacture using gas cluster ion beam
03/27/2008WO2008036915A1 Mask position detection
03/27/2008WO2008036849A2 Particle trap / filter for recirculating a dilution gas in a plasma enhanced chemical vapor deposition system
03/27/2008WO2008036837A2 Release strategies for making transferable semiconductor structures, devices and device components
03/27/2008WO2008036810A2 Bi-layer capping of low-k dielectric films
03/27/2008WO2008036806A2 Method for forming a pre-metal dielectric layer using an energy beam treatment
03/27/2008WO2008036722A2 Locking feature and method for manufacturing transfer molded ic packages
03/27/2008WO2008036681A1 Active regions with compatible dielectric layers
03/27/2008WO2008036603A1 Trench gate fet with self-aligned features
03/27/2008WO2008036552A2 Array of non-volatile memory cells with floating gates formed of spacers in substrate trenches
03/27/2008WO2008036521A1 System with dual laser for separation of bonded wafers, each laser emitting a laser beam with a predetermined wavelength
03/27/2008WO2008036496A1 Method for double patterning a developable anti-reflective coating
03/27/2008WO2008036385A1 Dielectric spacers for metal interconnects and method to form the same
03/27/2008WO2008036256A1 Aspect ratio trapping for mixed signal applications
03/27/2008WO2008036208A2 Wafer level chip package and a method of fabricating thereof
03/27/2008WO2008036115A1 Novel structure and method for metal integration
03/27/2008WO2008036047A1 Triple well transmit-receive switch transistor
03/27/2008WO2008035961A2 Device for electrochemically depositing a material on a plateshaped substrate
03/27/2008WO2008035822A1 Semiconductor devices and manufacturing method thereof
03/27/2008WO2008035820A1 Silicone resin composition and method for forming trench isolation
03/27/2008WO2008035819A2 Electronic component mounting structure
03/27/2008WO2008035786A1 Semiconductor device and semiconductor device manufacturing method
03/27/2008WO2008035679A1 Laser processing method and laser processing apparatus
03/27/2008WO2008035678A1 Plasma cleaning process and plasma cvd method
03/27/2008WO2008035676A1 Method for forming resist pattern
03/27/2008WO2008035672A1 Method for manufacturing transparent cured film using positive-working photosensitive resin layer for half exposure
03/27/2008WO2008035641A1 Composition for formation of resist protection film, and method for formation of resist pattern using the same
03/27/2008WO2008035640A1 Composition for formation of resist protection film, and method for formation of resist pattern using the same
03/27/2008WO2008035632A1 PROCESS FOR PRODUCING GaN SINGLE-CRYSTAL, GaN THIN-FILM TEMPLATE SUBSTRATE AND GaN SINGLE-CRYSTAL GROWING APPARATUS
03/27/2008WO2008035620A1 Material for formation of protective film, method for formation of photoresist pattern, and solution for washing/removal of protective film
03/27/2008WO2008035613A1 Resin sealing device
03/27/2008WO2008035610A1 Laser processing method
03/27/2008WO2008035598A1 Complementary mis semiconductor device
03/27/2008WO2008035581A1 Ultrasonic cleaning apparatus
03/27/2008WO2008035552A1 Heat treatment apparatus
03/27/2008WO2008035536A1 Semiconductor chip, semiconductor mounting module, mobile communication device, and process for producing semiconductor chip
03/27/2008WO2008035532A1 Switching device and testing apparatus
03/27/2008WO2008035530A1 Cutting method and epitaxial wafer manufacturing method
03/27/2008WO2008035529A1 Cutting method
03/27/2008WO2008035513A1 Cutting method
03/27/2008WO2008035508A1 Component for processing apparatus, processing apparatus, method for manufacturing component for processing apparatus, and method for manufacturing processing apparatus
03/27/2008WO2008035490A1 Semiconductor device and method for manufacturing same
03/27/2008WO2008035468A1 THIN NANODIAMOND FILM HAVING n-TYPE CONDUCTIVITY AND PROCESS FOR PRODUCING THE SAME
03/27/2008WO2008035403A1 Field-effect transistor
03/27/2008WO2008035395A1 Feeding structure of electrostatic chuck, method for producing the same, and method for regenerating feeding structure of electrostatic chuck
03/27/2008WO2008035270A2 Method of manufacturing a vertical contact in a semiconductor substrate
03/27/2008WO2008035261A1 Electronic device and method for making the same
03/27/2008WO2008035134A1 Semiconductor device and method of forming a semiconductor device
03/27/2008WO2008034823A1 Method of producing precision vertical and horizontal layers in a vertical semiconductor structure
03/27/2008WO2008034744A1 Method and device for wetting the bumps of a semiconductor chip with soldering flux
03/27/2008WO2008034404A1 Method for producing a zncdo semiconductor material
03/27/2008WO2008034343A1 Method of online predicting apparatus maintenance
03/27/2008WO2008009105B1 Thin film transistor array having test circuitry
03/27/2008WO2008008977A3 Nanocrystalline materials for electronic applications
03/27/2008WO2008008738A3 Variable lot size load port
03/27/2008WO2008005916A3 Method for making planar nanowire surround gate mosfet
03/27/2008WO2008005092A3 Silicon carbide switching devices including p-type channels and methods of forming the same
03/27/2008WO2008005087A3 A nano imprint technique with increased flexibility with respect to alignment and feature shaping
03/27/2008WO2007148072A3 Ic germanium insulator substrate and method of manufacture of ic substrate
03/27/2008WO2007144371A3 Semiconductor optoelectronic device with polymer layers
03/27/2008WO2007142852A3 Producing soi structure using ion shower
03/27/2008WO2007140425A9 Process chamber for dielectric gapfill
03/27/2008WO2007137729A3 Method for the production of a semiconductor array comprising an insulation structure, semiconductor array, and use thereof
03/27/2008WO2007130151A3 Soi active layer with different surface orientation
03/27/2008WO2007083654A8 Process for producing siliceous film and substrate with siliceous film produced thereby
03/27/2008US20080077269 Method and system for managing wafer processing
03/27/2008US20080076849 Polybenzoxazole precursor, photosensitive resin composition using the same, and manufacturing method of semiconductor device
03/27/2008US20080076690 Non-hermetic encapsulant removal for module rework
03/27/2008US20080076336 Surface plate protecting device in CMP apparatus
03/27/2008US20080076335 Polishing apparatus and polishing method
03/27/2008US20080076330 Chemical mechanical polishing with napped poromeric
03/27/2008US20080076269 Process for Forming Thin Film and System for Forming Thin Film
03/27/2008US20080076268 Fluorine plasma treatment of high-k gate stack for defect passivation
03/27/2008US20080076267 Manufacturing Method of Semiconductor Device and Laser Processing Apparatus
03/27/2008US20080076266 Method for forming insulation film having high density
03/27/2008US20080076265 Process for wafer thinning
03/27/2008US20080076264 Film formation apparatus for semiconductor process and method for using the same
03/27/2008US20080076263 Method of reducing electron beam damage on post W-CMP wafers
03/27/2008US20080076262 Method and system for treating a dielectric film
03/27/2008US20080076261 Method of manufacturing semiconductor device, apparatus of manufacturing semiconductor device and semiconductor device
03/27/2008US20080076260 Separation-material composition for photo-resist and manufacturing method of semiconductor device
03/27/2008US20080076259 Plasma Etching Method