Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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05/11/2010 | US7713854 Gate dielectric layers and methods of fabricating gate dielectric layers |
05/11/2010 | US7713853 Method for manufacturing electronic devices integrated in a semiconductor substrate and corresponding devices |
05/11/2010 | US7713852 Methods for forming field effect transistors and EPI-substrate |
05/11/2010 | US7713851 Method of manufacturing silicon epitaxial wafer |
05/11/2010 | US7713850 Method for forming a structure provided with at least one zone of one or several semiconductor nanocrystals localised with precision |
05/11/2010 | US7713849 Metallic nanowire arrays and methods for making and using same |
05/11/2010 | US7713848 Method for re-crystallization of layer structures by means of zone melting, a device for this purpose and use thereof |
05/11/2010 | US7713847 Method for forming AlGaN crystal layer |
05/11/2010 | US7713846 Process applied to semiconductor |
05/11/2010 | US7713845 Laser processing method for wafer |
05/11/2010 | US7713844 Nitride semiconductor substrate, and method for working nitride semiconductor substrate |
05/11/2010 | US7713843 Method for fabricating optical semiconductor device |
05/11/2010 | US7713842 Method for producing bonded wafer |
05/11/2010 | US7713841 Methods for thinning semiconductor substrates that employ support structures formed on the substrates |
05/11/2010 | US7713840 Electronic components produced by a method of separating two layers of material from one another |
05/11/2010 | US7713839 Diamond substrate formation for electronic assemblies |
05/11/2010 | US7713838 SOI wafer and its manufacturing method |
05/11/2010 | US7713837 Low temperature fusion bonding with high surface energy using a wet chemical treatment |
05/11/2010 | US7713836 Method for forming conductive layer and substrate having the same, and method for manufacturing semiconductor device |
05/11/2010 | US7713835 Thermally decomposable spin-on bonding compositions for temporary wafer bonding |
05/11/2010 | US7713834 Method of forming isolation regions for integrated circuits |
05/11/2010 | US7713833 Method for manufacturing semiconductor device |
05/11/2010 | US7713832 Semiconductor device and method of fabricating the same |
05/11/2010 | US7713831 Method for fabricating capacitor in semiconductor device |
05/11/2010 | US7713829 Incorporation of carbon in silicon/silicon germanium epitaxial layer to enhance yield for Si-Ge bipolar technology |
05/11/2010 | US7713828 Semiconductor device and method of forming the same |
05/11/2010 | US7713827 Method for manufacturing semiconductor device |
05/11/2010 | US7713826 Method of manufacturing semiconductor device |
05/11/2010 | US7713825 LDMOS transistor double diffused region formation process |
05/11/2010 | US7713824 Small feature integrated circuit fabrication |
05/11/2010 | US7713823 Semiconductor device with vertical channel transistor and method for fabricating the same |
05/11/2010 | US7713821 Thin silicon-on-insulator high voltage auxiliary gated transistor |
05/11/2010 | US7713820 Method for manufacturing non-volatile memory |
05/11/2010 | US7713819 Semiconductor device manufacturing method and semiconductor integrated circuit device |
05/11/2010 | US7713818 Double patterning method |
05/11/2010 | US7713817 Methods of forming semiconductor structures |
05/11/2010 | US7713816 Semiconductor device and method for fabricating the same |
05/11/2010 | US7713815 Semiconductor device including a vertical decoupling capacitor |
05/11/2010 | US7713814 Hybrid orientation substrate compatible deep trench capacitor embedded DRAM |
05/11/2010 | US7713813 Methods of forming capacitors |
05/11/2010 | US7713812 Method for manufacturing semiconductor thin film |
05/11/2010 | US7713811 Multiple doping level bipolar junctions transistors and method for forming |
05/11/2010 | US7713810 Method for fabricating a layer arrangement, layer arrangement and memory arrangement |
05/11/2010 | US7713809 Image sensor for reduced dark current |
05/11/2010 | US7713808 CMOS image sensor and method for fabricating the same |
05/11/2010 | US7713807 High-performance CMOS SOI devices on hybrid crystal-oriented substrates |
05/11/2010 | US7713806 Structures and methods for manufacturing of dislocation free stressed channels in bulk silicon and SOI MOS devices by gate stress engineering with SiGe and/or Si:C |
05/11/2010 | US7713805 Method of manufacturing silicon carbide semiconductor device |
05/11/2010 | US7713804 Method of forming an oxide isolated metal silicon-gate JFET |
05/11/2010 | US7713803 Mechanism for forming a remote delta doping layer of a quantum well structure |
05/11/2010 | US7713802 Method of sulfuration treatment for a strained InAlAs/InGaAs metamorphic high electron mobility transistor |
05/11/2010 | US7713801 Method of making a semiconductor structure utilizing spacer removal and semiconductor structure |
05/11/2010 | US7713800 Semiconductor device and manufacturing method thereof |
05/11/2010 | US7713799 Method of forming pattern having step difference and method of making thin film transistor and liquid crystal display using the same |
05/11/2010 | US7713798 Thin film transistor substrate having nickel-silicide layer |
05/11/2010 | US7713797 Pixel structure and manufacturing method thereof |
05/11/2010 | US7713795 Flash memory device with single-poly structure and method for manufacturing the same |
05/11/2010 | US7713794 Manufacturing method of a semiconductor device |
05/11/2010 | US7713793 Fuse of semiconductor device and method for manufacturing the same |
05/11/2010 | US7713792 Fuse structure including monocrystalline semiconductor material layer and gap |
05/11/2010 | US7713791 Panel and semiconductor device having a composite plate with semiconductor chips |
05/11/2010 | US7713790 Method and system of tape automated bonding |
05/11/2010 | US7713789 Semiconductor device with a high thermal dissipation efficiency |
05/11/2010 | US7713788 Method of manufacturing semiconductor package using redistribution substrate |
05/11/2010 | US7713786 Etching/bonding chamber for encapsulated devices and method of use |
05/11/2010 | US7713785 Surface mountable direct chip attach device and method including integral integrated circuit |
05/11/2010 | US7713784 Thin quad flat package with no leads (QFN) fabrication methods |
05/11/2010 | US7713783 Electronic component package, electronic component using the package, and method for manufacturing electronic component package |
05/11/2010 | US7713782 Fusible I/O interconnection systems and methods for flip-chip packaging involving substrate-mounted stud-bumps |
05/11/2010 | US7713780 Method of multi-processing object using polygon mirror |
05/11/2010 | US7713778 Nanostructured casting of organic and bio-polymers in porous silicon templates |
05/11/2010 | US7713777 Method for manufacturing image sensor |
05/11/2010 | US7713776 Method of making a light emitting diode |
05/11/2010 | US7713774 Method of manufacturing image sensor |
05/11/2010 | US7713773 Contact layers for thin film solar cells employing group IBIIIAVIA compound absorbers |
05/11/2010 | US7713772 Micromechanical flow sensor with tensile coating |
05/11/2010 | US7713771 Pressure sensor |
05/11/2010 | US7713769 Method for fabricating light emitting diode structure having irregular serrations |
05/11/2010 | US7713768 Anti-reflective film and production method thereof, and stamper for producing anti-reflective film and production method thereof |
05/11/2010 | US7713767 Method of making circuitized substrate with internal optical pathway using photolithography |
05/11/2010 | US7713765 Optical semiconductor device and method for manufacturing the same |
05/11/2010 | US7713764 Method for manufacturing semiconductor device including testing dedicated pad and probe card testing |
05/11/2010 | US7713763 Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions |
05/11/2010 | US7713762 Testing the quality of lift-off processes in wafer fabrication |
05/11/2010 | US7713761 Doping apparatus, doping method, and method for fabricating thin film transistor |
05/11/2010 | US7713760 Process system health index and method of using the same |
05/11/2010 | US7713759 Method for producing an imaging device |
05/11/2010 | US7713758 Method and apparatus for optimizing a gate channel |
05/11/2010 | US7713757 Method for measuring dopant concentration during plasma ion implantation |
05/11/2010 | US7713756 Apparatus and method for plasma etching |
05/11/2010 | US7713755 Field angle sensor fabricated using reactive ion etching |
05/11/2010 | US7713754 Method of forming an amorphous ferroelectric memory device |
05/11/2010 | US7713753 Dual-level self-assembled patterning method and apparatus fabricated using the method |
05/11/2010 | US7713685 Exposure system and pattern formation method |
05/11/2010 | US7713665 Lithographic apparatus and patterning device |
05/11/2010 | US7713663 provides mask blank capable of suppressing deformation of transfer mask when transfer mask is mounted on substrate holding member of an exposure device, suppressing lowering of the positional accuracy of transfer pattern to minimum, and suppressing the lowering of focus accuracy to minimum |
05/11/2010 | US7713582 film is allowed to grow on a substrate by subjecting to alternative surface reaction of vapor phase reacting materials, the faster the adsorption of the raw material gases to the substrate surface is, the shorter the time required for forming a film becomes, and the productivity is enhanced |
05/11/2010 | US7713578 includes bank forming step of forming banks in predetermined pattern on substrate, disposing first liquid droplets made of a function liquid between banks to form pattern, disposing second liquid droplets made of function liquid on said first pattern, and drying step |
05/11/2010 | US7713431 Plasma processing method |
05/11/2010 | US7713404 in situ detecting the sample surface for surface films and gas bubbles during the etching process; making semiconductor devices; monitor the sample during fill, and the etched well, measuring by digital optic imaging |