| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 06/03/1986 | US4593276 Overcurrent display device |
| 06/03/1986 | US4592138 Method for examining circuit boards |
| 06/03/1986 | CA1205568A1 Miniature circuit processing device and matrix test heads for use therein |
| 05/28/1986 | EP0182488A1 Remote measurement of conditions |
| 05/28/1986 | EP0182388A2 Logic circuit test probe |
| 05/28/1986 | EP0182358A2 Scan control apparatus and method for a data processing apparatus |
| 05/28/1986 | EP0182197A2 Apparatus and method for automatic lead fail detection in electrocardiography |
| 05/27/1986 | US4591392 Forming an ordered array for visual inspection |
| 05/27/1986 | CA1205176A1 Digital random error generator supplying burst error signals of random duration starting at random times |
| 05/27/1986 | CA1205135A1 Continuity detecting apparatus |
| 05/27/1986 | CA1205133A1 Voltage controlled current switch with short circuit protection |
| 05/21/1986 | EP0181775A1 Motor monitor signal analysis system |
| 05/21/1986 | EP0181774A1 Motor monitor synchronisation system |
| 05/21/1986 | EP0181729A1 Apparatus for use in testing circuit boards |
| 05/21/1986 | EP0181619A2 Logic analyzer |
| 05/20/1986 | US4590581 Method and apparatus for modeling systems of complex circuits |
| 05/20/1986 | US4590430 Apparatus for monitoring cell capacity in a storage battery |
| 05/20/1986 | US4590423 For subjecting a test specimen |
| 05/20/1986 | US4590422 Automatic wafer prober having a probe scrub routine |
| 05/20/1986 | US4590369 Method of detecting sensitivities of photomultipliers |
| 05/20/1986 | US4589815 Electronic test head positioner for test systems |
| 05/20/1986 | US4589401 Injector driver fault detect and protection device |
| 05/20/1986 | US4589275 Pipe coating |
| 05/20/1986 | CA1204820A1 Diode failure detecting device in rotary rectifier |
| 05/14/1986 | EP0181011A2 A method and circuit detecting the logic state of internal nodes in sequential logic circuits |
| 05/14/1986 | EP0180780A1 Noncontact dynamic tester for integrated circuits |
| 05/14/1986 | EP0180776A2 Chip-on-chip semiconductor device |
| 05/13/1986 | US4589140 Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the like |
| 05/13/1986 | US4589139 Apparatus for detecting defects in pattern |
| 05/13/1986 | US4589074 Multiple channel power line monitor |
| 05/13/1986 | US4589073 Apparatus for determining prospective short circuit current |
| 05/13/1986 | US4589048 Apparatus for detecting ground fault in variable-voltage variable-frequency power system |
| 05/13/1986 | US4588952 Arc discharge abnormality detecting system |
| 05/13/1986 | US4588950 Test system for VLSI digital circuit and method of testing |
| 05/13/1986 | US4588946 Method for measuring current at a p-n junction |
| 05/13/1986 | US4588945 High throughput circuit tester and test technique avoiding overdriving damage |
| 05/13/1986 | US4588944 Fully scan-set testable embedded edge-triggered dual D and J-K flip-flops through testing as inverter strings |
| 05/13/1986 | US4588907 Integrated digital MOS semiconductor circuit |
| 05/13/1986 | US4588346 Positioner for maintaining an object in a substantially weightless condition |
| 05/13/1986 | CA1204501A1 Method and system for automatically detecting camera picture element failure |
| 05/10/1986 | CN85104809A Test device for wide band integrated circuit |
| 05/09/1986 | WO1986002738A1 Control installation for batteries |
| 05/07/1986 | EP0180501A1 Apparatus for the detection and location of a fault in a cable railway installation |
| 05/07/1986 | EP0180322A1 Partial discharge measuring device |
| 05/07/1986 | EP0180277A1 Nondestructive testing of multilayers ceramic capacitors |
| 05/07/1986 | EP0180072A1 Method for fault-analyse of integrated circuit |
| 05/07/1986 | EP0180013A1 Test probe system |
| 05/06/1986 | US4587481 Arrangement for testing micro interconnections and a method for operating the same |
| 05/06/1986 | US4586830 Combination rotary gas bearing and seal apparatus |
| 05/06/1986 | US4586370 Tester for electric and pneumatic systems of vehicular trailers |
| 05/06/1986 | US4586242 Operations on a semiconductor integrated circuit having two kinds of buffers |
| 04/30/1986 | EP0179438A2 A projection aligner of a lithographic system |
| 04/30/1986 | EP0179403A2 Apparatus for producing thin-film photoelectric transducer |
| 04/29/1986 | US4586181 Test pattern generating apparatus |
| 04/29/1986 | US4586129 Apparatus and method for testing and verifying the timing logic of a cathode ray tube display |
| 04/29/1986 | US4585991 Solid state multiprobe testing apparatus |
| 04/23/1986 | EP0178431A1 Counterfield spectrometer for electron beam measurement |
| 04/23/1986 | EP0178425A1 Method and arrangement for localizing errors within an electrical circuit by means of light beam irradiation |
| 04/23/1986 | EP0178419A2 Dynamically selectable polarity latch |
| 04/23/1986 | EP0178336A1 Vacuum transfer device |
| 04/22/1986 | US4584683 Logic circuit test system |
| 04/22/1986 | US4584642 Logic simulation apparatus |
| 04/22/1986 | US4584555 Fault indicating circuit for a current consuming load connected to an electronic switching device |
| 04/22/1986 | US4584545 Single section circuit breaker having a metering shunt |
| 04/22/1986 | US4584531 Noncontact electrostatic hoop probe for combustion engines |
| 04/22/1986 | US4584526 Combination continuity and live circuit path tester |
| 04/22/1986 | US4584524 Missile control system test apparatus having video signal adapter |
| 04/22/1986 | US4584521 Method of detecting the defects in a dielectric coating at the surface of an electrically conductive underlayer |
| 04/22/1986 | US4584515 Re-regulation circuit for automobile tachometer detection circuit |
| 04/22/1986 | US4583857 Apparatus for automatic optical property testing |
| 04/16/1986 | EP0177722A1 Method and arrangement for determining the weak points within an electrical integrated circuit |
| 04/16/1986 | EP0177717A1 Process for the automatic positioning of a curpuscular probe |
| 04/16/1986 | EP0177495A1 Tracing electrical conductors by high-frequency constant-energy pulse loading |
| 04/16/1986 | EP0086310B1 Semiconductor integrated circuit device with test circuit |
| 04/15/1986 | US4583233 Method of monitoring suitability of a transmission path for transmission of digital data signals, and apparatus for use in carrying out the method |
| 04/15/1986 | US4583223 Testing system |
| 04/15/1986 | US4583179 Semiconductor integrated circuit |
| 04/15/1986 | US4583075 Method and apparatus for analyzing an analog-to-digital converter with a nonideal digital-to-analog converter |
| 04/15/1986 | US4583042 Capacitive circuit board testing system and method using a conductive pliant elastomeric reference plane |
| 04/15/1986 | US4583041 Logic circuit test system |
| 04/15/1986 | US4583040 Testing apparatus for electrical characteristics of sheet-like insulating materials |
| 04/15/1986 | US4583039 Electrical testing device for insulating gloves |
| 04/15/1986 | US4583038 Electrical testing |
| 04/15/1986 | US4583036 Charging system diagnostic device |
| 04/15/1986 | CA1203325A1 Apparatus for measuring carrier lifetimes in a semiconductor wafer |
| 04/10/1986 | WO1986002167A1 Integrated circuit tester and remote pin electronics therefor |
| 04/10/1986 | WO1986002166A1 Automated circuit tester |
| 04/09/1986 | EP0177210A1 Electric circuit testing equipment |
| 04/09/1986 | EP0176854A2 Method and apparatus for improved monitoring and detection of improper device operation |
| 04/09/1986 | EP0176745A1 Device and method to measure lengths in a scanning corpuscular microscope |
| 04/09/1986 | EP0176532A1 Improvement to automatic control benches for groups of conductors |
| 04/08/1986 | US4581740 Transfer circuit for defect inspection of an integrated circuit |
| 04/08/1986 | US4581578 Apparatus for measuring carrier lifetimes of a semiconductor wafer |
| 04/08/1986 | US4581577 Continuity detecting apparatus |
| 04/08/1986 | US4581576 Nondestructive method for profiling imperfection levels in high resistivity semiconductor wafers |
| 04/08/1986 | US4581534 Image display system for a stroboscopic scanning electron microscope |
| 04/02/1986 | EP0175995A1 Arrangement for testing integrated circuits |
| 04/02/1986 | EP0175932A1 Method for determination of optimum parameters for stress screening of electronic components and circuit boards |
| 04/02/1986 | EP0175870A2 Wafer scale integrated circuit device |
| 04/02/1986 | EP0175765A1 Automated keyboard testing |