| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/25/1985 | US4525763 Apparatus and method to protect motors and to protect motor life |
| 06/25/1985 | US4525699 Electronic monitoring system with malfunction indicator |
| 06/25/1985 | US4525667 System for observing a plurality of digital signals |
| 06/25/1985 | US4525665 Device for detecting/determining the position of a ground fault |
| 06/25/1985 | US4525664 Electronic fuse tester |
| 06/19/1985 | EP0145605A2 Analog signal verification circuit |
| 06/19/1985 | EP0145194A1 Automatic test equipment |
| 06/19/1985 | EP0144680A1 IC device and a system for testing the same |
| 06/19/1985 | EP0144496A1 Method and apparatus for testing for wiring fault in a network |
| 06/18/1985 | US4524321 Method and apparatus for testing cable wire connected to terminals at a remote location |
| 06/18/1985 | US4524320 Conductor identifying probe and voltage supply device |
| 06/18/1985 | CA1189191A1 Algorithmic word generator |
| 06/18/1985 | CA1189146A1 Monitoring system for an lc filter circuit in an ac power network |
| 06/18/1985 | CA1189145A1 Monitoring system for the capacitor batteries of a three-phase filter circuit |
| 06/18/1985 | CA1189144A1 Monitoring system for a capacitor battery in an ac voltage network |
| 06/12/1985 | EP0144180A1 Adjustable system for skew comparison of digital signals |
| 06/12/1985 | EP0144078A2 Method and arrangement using the scan-path technique to test a circuit |
| 06/11/1985 | US4523312 IC tester |
| 06/11/1985 | US4523231 Method and system for automatically detecting camera picture element failure |
| 06/11/1985 | US4523145 Apparatus for the automated handling and testing of electronic modules |
| 06/11/1985 | US4523143 Digital logic level comparator particularly for digital test systems |
| 06/11/1985 | US4523141 Pipe coating |
| 06/05/1985 | EP0143677A1 Apparatus for indentifying and indicating the type of electric battery within the range of a given brand |
| 06/05/1985 | EP0143623A2 Automatic test equipment |
| 06/05/1985 | EP0143516A2 Multimode scan apparatus |
| 06/04/1985 | US4521885 Diagnostic display apparatus |
| 06/04/1985 | US4521769 Device for detecting the failure of a sensor |
| 06/04/1985 | US4521735 Battery voltage level detecting apparatus |
| 05/29/1985 | EP0143039A1 Electronic components array manufacturing process |
| 05/29/1985 | EP0142776A2 Self-monitoring system for detecting error at output port during cold start of microprocessor system |
| 05/29/1985 | EP0142557A1 Method and means for joining and sealing of material parts and use of such means in containers. |
| 05/28/1985 | US4520448 Method of characterizing reliability in bipolar semiconductor devices |
| 05/28/1985 | US4520416 Programmable power supply |
| 05/28/1985 | US4520353 State of charge indicator |
| 05/28/1985 | US4520313 Semiconductor testing and apparatus therefor |
| 05/28/1985 | US4520312 Method for determining the integrity of passivant coverage over rectifying junctions in semiconductor devices |
| 05/28/1985 | US4520309 System for testing the malfunctioning or correct operation of a circuit with logic components |
| 05/28/1985 | US4520307 High-voltage tire testing apparatus |
| 05/28/1985 | CA1187939A1 Method and system for testing and sorting batteries |
| 05/28/1985 | CA1187938A1 Method and device for the determination of the physical properties of a solid state material |
| 05/23/1985 | WO1985002263A1 Adjustable system for skew comparison of digital signals |
| 05/22/1985 | EP0142412A1 Device for the transformation of the appearance probability of logic vectors and for the generation of time-variable probability vector sequences |
| 05/22/1985 | EP0142366A1 Test system for integrated circuit and method of testing |
| 05/22/1985 | EP0142119A1 Arrangement for adapting the contact grid spacing in a printed circuit testing device |
| 05/21/1985 | US4519078 LSI self-test method |
| 05/21/1985 | US4519035 Branched-spiral wafer-scale integrated circuit |
| 05/21/1985 | US4518962 Device for transmitting measurement data from a rotating body |
| 05/21/1985 | US4518915 Test device for expendable bathythermograph set (XBT) |
| 05/21/1985 | US4518911 Cable test apparatus |
| 05/21/1985 | US4518910 Buckling beam twist probe contactor assembly with spring biased stripper plate |
| 05/21/1985 | US4517839 Off-highway vehicle systems simulator and control panel testing |
| 05/21/1985 | CA1187587A1 Facility for monitoring the level of a radio- frequency signal |
| 05/21/1985 | CA1187555A1 Protective relaying methods and apparatus |
| 05/21/1985 | CA1187553A1 Remote current detector |
| 05/15/1985 | EP0141747A1 Adaptor for automatic testing equipment and method |
| 05/15/1985 | EP0141681A2 Test input multiplexing circuit |
| 05/15/1985 | EP0141562A2 Method and apparatus for generating a sequence of multibit words |
| 05/15/1985 | EP0141305A2 Holding and touching device for an electrical connector |
| 05/15/1985 | EP0141050A1 Electrical testing device for a vehicle combination instrument |
| 05/14/1985 | US4517672 Method and arrangement for an operational check of a programmable logic array |
| 05/14/1985 | US4517661 Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit |
| 05/14/1985 | US4517642 Digital computer system having unique means of referring to operands and ability to execute a plurality of internal languages |
| 05/14/1985 | US4517517 Nickel-cadmium battery conditioner and tester apparatus |
| 05/14/1985 | US4517512 Integrated circuit test apparatus test head |
| 05/14/1985 | US4517511 Current probe signal processing circuit employing sample and hold technique to locate circuit faults |
| 05/14/1985 | US4517510 Apparatus for testing the insulation of electric wire or cable |
| 05/08/1985 | EP0140206A1 Method and circuit for oscillation prevention during testing of integrated circuit logic chips |
| 05/08/1985 | EP0140205A2 Method and apparatus for fault testing a clock distribution network of a processor |
| 05/08/1985 | EP0140080A1 Testing process and testing device for inspecting assembled electric drives with a low drive speed |
| 05/08/1985 | EP0140057A2 Method and device for signal transmission |
| 05/08/1985 | EP0139795A2 System and method for eliminating short circuit current paths in photovoltaic devices |
| 05/08/1985 | EP0139695A1 Device for detecting variations in thickness of lubricating film of wires |
| 05/08/1985 | EP0139638A1 Insulation analyzer and method. |
| 05/07/1985 | US4516076 Fault detection arrangement for relay switching system |
| 05/07/1985 | US4516071 Split-cross-bridge resistor for testing for proper fabrication of integrated circuits |
| 05/07/1985 | US4516069 Electrolysis test station terminal and support |
| 05/07/1985 | US4516068 Tire defect tester |
| 05/07/1985 | US4516022 Detection of light-producing events |
| 05/07/1985 | CA1186790A2 Test set for railway cab signal system |
| 05/07/1985 | CA1186781A1 Method of controlling a set point |
| 05/07/1985 | CA1186738A1 Water-compensated open fault locator |
| 05/07/1985 | CA1186737A1 Automatic level control circuit |
| 05/07/1985 | CA1186736A1 Automatic level control circuitry |
| 05/07/1985 | CA1186526A1 Ebulliometric hot spot detector |
| 05/02/1985 | EP0139516A2 Test generation system for digital circuits |
| 05/02/1985 | EP0139123A1 Protective relay system |
| 05/02/1985 | EP0049267B1 Faultindicating circuit for an automotive alternator battery charging system |
| 04/30/1985 | US4514845 Method and apparatus for bus fault location |
| 04/30/1985 | US4514786 Integrated-circuit support device employed in a system for selecting high-reliability integrated circuits |
| 04/30/1985 | US4514695 Pocket battery tester |
| 04/30/1985 | US4514694 Quiescent battery testing method and apparatus |
| 04/30/1985 | US4514682 Secondary electron spectrometer for measuring voltages on a sample utilizing an electron probe |
| 04/30/1985 | US4514436 Methods of highlighting pinholes in a surface layer of an article |
| 04/25/1985 | WO1985001813A1 Device for transforming the occurrence probability of logic vectors and for the generation of vector sequences with time variable probabilities |
| 04/24/1985 | EP0138744A2 Method of interrupting a three-phase system in case of short circuit |
| 04/24/1985 | EP0138610A2 Electron detector |
| 04/24/1985 | EP0138157A1 Static leonard apparatus |
| 04/23/1985 | US4513418 Simultaneous self-testing system |
| 04/23/1985 | US4513395 Apparatus and method for acquiring multiple groups of data signals from a synchronous logic system |
| 04/23/1985 | US4513368 Digital data processing system having object-based logical memory addressing and self-structuring modular memory |