Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/1985
09/03/1985US4539520 Remote current detector
09/03/1985US4539517 Method for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs
09/03/1985US4539499 Device for detection of contact between rotor and stator
09/03/1985US4539477 Method and apparatus for suppressing disturbances in the measurement of signals with a particle probe
09/03/1985US4538923 Test circuit for watch LSI
09/03/1985US4538771 Apparatus for testing the integrity of an electrical coil as it is wound
09/03/1985US4538419 Refrigeration unit controls
08/1985
08/28/1985EP0152535A2 Method and apparatus for encoding an information storage medium with audio test signals
08/27/1985US4538106 Output transistor driver diagnostic system
08/27/1985US4538103 Time domain reflectometer apparatus for identifying the location of cable defects
08/27/1985US4537488 Camera system
08/27/1985US4537059 Automatic brushing machine
08/27/1985CA1192684A1 Ac elevator control apparatus
08/27/1985CA1192599A1 Directive diagnostics
08/21/1985EP0152094A2 Multiple clock pulse generator
08/21/1985EP0151875A2 Gate circuit device
08/21/1985EP0151720A1 Electron-beam method for testing semiconductor structures
08/21/1985EP0151694A2 Logic circuit with built-in self-test function
08/21/1985EP0151653A1 Series-parallel/parallel-series device for variable bit length configuration
08/20/1985US4536881 Integrated logic circuit adapted to performance tests
08/20/1985US4536757 Device for signalling a specific charge condition of an accumulator battery
08/20/1985US4536705 Probe search test light and continuity tester
08/20/1985US4536704 Apparatus for identifying defective substation capacitors
08/20/1985US4536703 Method and apparatus for testing cable wire connected to terminals at a remote location
08/20/1985US4535536 Method of assembling adaptor for automatic testing equipment
08/15/1985WO1985003589A1 Test device for intrusion warning device
08/13/1985US4535467 Switch logic for shift register latch pair
08/13/1985US4535325 Low charge detector
08/13/1985US4535321 Method and system for monitoring faults in electrical circuits
08/13/1985US4535307 Microwave circuit device package
08/13/1985US4534605 Symmetrical, single point drive for contacts of an integrated circuit tester
08/13/1985CA1191904A1 Method of detecting ground faults in a network for distribution of electric power and a device for carrying out the method
08/13/1985CA1191903A1 Leakage current detecting structure
08/13/1985CA1191902A1 Device for the detection of water entering a seismic flute
08/13/1985CA1191719A1 Apparatus and method of measuring temperature of energised a.c. windings
08/07/1985EP0150622A2 Electromagnetic monitoring of elongate conductors, particularly pipes or cables
08/07/1985EP0150325A2 Delay unit for producing a delayed output signal
08/06/1985US4534049 Fluorescent X-ray film thickness gauge
08/06/1985US4534030 Self-clocked signature analyzer
08/06/1985US4534028 Random testing using scan path technique
08/06/1985US4534008 Programmable logic array
08/06/1985US4533870 Method for testing multi-section photo-sensitive detectors
08/06/1985US4533869 Field test instrument for horizontal output circuits
08/06/1985US4533864 Test instrument with flexibly connected head
08/06/1985US4533837 Keyboard-equipped apparatus such as an electronic calculator with battery throw means for enabling a power supply circuit
08/06/1985US4533192 Integrated circuit test socket
08/06/1985CA1191640A1 Test device for locating faults in a two-lead line
08/06/1985CA1191558A1 On chip monitor
08/06/1985CA1191553A1 Test system for locating short circuits and open circuits in a two-lead line
08/06/1985CA1191552A1 Digital tester local memory data storage system
07/1985
07/31/1985EP0149849A2 Pattern detecting apparatus
07/30/1985US4532586 Digital data processing system with tripartite description-based addressing multi-level microcode control, and multi-level stacks
07/30/1985US4532442 Noise reduction in electronic measuring circuits
07/30/1985US4532423 IC Tester using an electron beam capable of easily setting a probe card unit for wafers & packaged IC's to be tested
07/30/1985US4531909 Handling system for IC device
07/30/1985CA1191203A1 Non-grounding checking system
07/30/1985CA1191202A1 Apparatus for the inspection of electrodeposited electrically insulating coatings
07/30/1985CA1191201A1 Automotive battery test apparatus
07/24/1985EP0149095A2 Method for examining signal level-dependent properties of transmission apparatuses especially of signal level-dependent attenuation distorsions of CODEC's for PCM circuis, and device for the application of said method
07/24/1985EP0149048A1 Method and apparatus for testing semiconductor devices
07/18/1985WO1985003149A1 Programmable digital signal testing system
07/17/1985EP0148759A2 Programmable digital signal testing system
07/17/1985EP0148674A1 Device and process for the localization of faults in cables
07/17/1985EP0148403A2 Linear feedback shift register
07/16/1985US4529929 Method of detecting ground faults in a network for distribution of electric power and a device for carrying out the method
07/10/1985EP0147921A1 Method and apparatus for determining the electrostatic breakdown voltage of semiconductor devices
07/10/1985EP0147822A2 Device for detecting partial discharges
07/10/1985EP0147587A2 Imaging defects in a semiconductor body
07/09/1985US4528505 On chip voltage monitor and method for using same
07/09/1985US4528504 Pulsed linear integrated circuit tester
07/09/1985US4528503 Method and apparatus for I-V data acquisition from solar cells
07/09/1985US4528500 Apparatus and method for testing circuit boards
07/09/1985US4528497 Method and apparatus for monitoring ground faults in isolated electrical systems
07/09/1985US4528427 Test system and device for locating short circuits and open circuits in a two-lead line
07/09/1985US4527942 Electronic test head positioner for test systems
07/09/1985US4527907 Method and apparatus for measuring the settling time of an analog signal
07/09/1985US4527419 Sensor for underground duct probe
07/03/1985EP0147245A2 Arrangement and process for continuity control of printed circuits
07/03/1985EP0146782A2 Adaptation device for the establishment of a removable electrical connection between contact elements
07/03/1985EP0146661A1 Electrical-diagnosis method for a defect cell in a chain of cells of a shift register
07/03/1985EP0146645A1 Testing and diagnostic device for a digital calculator
07/02/1985US4527272 Signature analysis using random probing and signature memory
07/02/1985US4527254 Dynamic random access memory having separated VDD pads for improved burn-in
07/02/1985US4527249 Simulator system for logic design validation
07/02/1985US4527234 Emulator device including a semiconductor substrate having the emulated device embodied in the same semiconductor substrate
07/02/1985US4527230 Method of controlling a set point
07/02/1985US4527126 AC parametric circuit having adjustable delay lock loop
07/02/1985US4527119 High speed, low mass, movable probe and/or instrument positioner, tool and like items suitable for use in a controlled environment chamber
07/02/1985US4527118 Testing device for indicating an electric voltage and its polarity and for continuity testing
07/02/1985US4527115 Configurable logic gate array
06/1985
06/26/1985EP0146425A1 System and method for the remote identfication of phases in a multiphase transmission or electric-energy distribution system
06/26/1985EP0146377A1 Battery testing circuit
06/26/1985EP0146175A1 Device for localizing a signal-reflecting point on a transmission line
06/26/1985EP0146093A2 Apparatus and method for measuring the state of charge of a battery
06/26/1985EP0146037A2 Method for manufacturing a coaxial line rigid probe interposer
06/26/1985EP0145930A1 Supporting unit for a printed circuit testing device, especially for ceramic circuit boards
06/26/1985EP0145866A2 Test and maintenance system and method for a data processing system
06/26/1985EP0145830A1 Contact spring assembly for a computer-controlled printed circuit board testing device
06/26/1985EP0145725A1 Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the like.
06/25/1985US4525780 Data processing system having a memory using object-based information and a protection scheme for determining access rights to such information