Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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04/01/1986 | US4580264 Arrangement for transmitting check characters to connector elements of a tester |
04/01/1986 | US4580137 LSSD-testable D-type edge-trigger-operable latch with overriding set/reset asynchronous control |
04/01/1986 | US4580126 Method of testing analog/digital converter and structure of analog/digital converter suited for the test |
04/01/1986 | US4580091 Continuity tester |
04/01/1986 | US4580082 Method and devices for detecting whether a direct-current motor has slowed-down and a motor equipped with a device of this type |
04/01/1986 | US4580066 Fast scan/set testable latch using two levels of series gating with two current sources |
04/01/1986 | US4579527 Integrated circuit handler heating and singulation apparatus |
03/26/1986 | EP0175182A1 Contactless measurement of electrical properties of wafer shaped materials |
03/26/1986 | EP0175145A2 A system for use in monitoring the state of charge of a nickel-alkaline secondary battery |
03/26/1986 | EP0175085A2 Wafer scale integrated circuit device |
03/25/1986 | US4578767 X-ray system tester |
03/25/1986 | US4578761 Separating an equivalent circuit into components to detect terminating networks |
03/25/1986 | US4578666 Method of comparing data with asynchronous timebases |
03/25/1986 | US4578641 System for measuring carrier lifetime of semiconductor wafers |
03/25/1986 | US4578637 Continuity/leakage tester for electronic circuits |
03/25/1986 | US4578636 Apparatus for identifying wires of multiple wire electrical system |
03/25/1986 | US4578564 Series-connected, skin-current heating pipe including current trouble detector |
03/25/1986 | CA1202392A1 Holder for connecting electrical conductors to contact surfaces on electronic components |
03/19/1986 | EP0174409A1 Formatter for high speed test system |
03/18/1986 | US4577318 Self testing detection system for comparing digital signal transition times |
03/18/1986 | US4577254 Protective relay system |
03/18/1986 | US4577151 Spark monitor device for current collectors |
03/18/1986 | US4577149 Detection of catastrophic failure of dielectric, improper connection, and temperature of a printed circuit assembly via one wire |
03/18/1986 | US4577148 Surge arrester equipped for monitoring functions and method of use |
03/18/1986 | US4577147 Arrangement and method for voltage measurement at a buried test subject |
03/12/1986 | EP0174236A1 Semiconductor integrated circuit device having a test circuit |
03/12/1986 | EP0174224A1 Chip on chip type integrated circuit device |
03/12/1986 | EP0174220A1 System for testing the proper or bad functioning of a circuit of logic components |
03/12/1986 | EP0174075A1 Digital display ohmmeter |
03/12/1986 | EP0173945A2 Integrated circuit device |
03/12/1986 | EP0173850A1 Apparatus for printing and/or displaying faulty polygonal lines in a printed circuit |
03/12/1986 | EP0053665B1 Testing embedded arrays in large scale integrated circuits |
03/11/1986 | US4575711 Alarm terminal device |
03/11/1986 | US4575680 Battery condition indicator and on-off relay circuit |
03/11/1986 | US4575679 Automatic load shed control for spacecraft power system |
03/11/1986 | US4575676 Method and apparatus for radiation testing of electron devices |
03/11/1986 | US4575675 Tester for pulsed IMPATT diode and method of operating same |
03/11/1986 | US4575674 Macrocell array having real time diagnostics |
03/11/1986 | US4575630 Method of mapping areas |
03/11/1986 | CA1201815A1 Reciprocal quiescence design method and apparatus |
03/11/1986 | CA1201771A1 Method and apparatus for monitoring ground faults and isolated electrical systems |
03/10/1986 | CN85103431A Multifunctional on line circuit tester |
03/04/1986 | US4574354 Method and apparatus for time-aligning data |
03/04/1986 | US4574275 Battery charge indicating circuit |
03/04/1986 | US4574266 Electrical load monitoring system and method |
03/04/1986 | US4574236 High frequency test fixture |
03/04/1986 | US4574235 Transmission line connector and contact set assembly for test site |
02/26/1986 | EP0172639A1 Integrated circuit devices |
02/26/1986 | EP0172593A2 Short detector for fusible link array |
02/26/1986 | EP0172470A1 Method and device for the detection and mapping of measuring points corresponding to a signal of a specific shape |
02/25/1986 | US4573152 Switch matrix test and control system |
02/25/1986 | US4573126 Process and device for measuring the state of charge of an electrochemical generator while operating |
02/25/1986 | US4573010 Miniature cell adaptor to accommodate small samples in resistivity cells |
02/25/1986 | US4573008 Method for the contact-free testing of microcircuits or the like with a particle beam probe |
02/25/1986 | US4572987 Lamp monitoring circuit |
02/25/1986 | US4572971 Tri-state driver circuit for automatic test equipment |
02/19/1986 | EP0172132A1 Test adapter |
02/19/1986 | EP0171914A1 Integrated circuit devices |
02/19/1986 | EP0171885A1 Programmable bed-of-nailstest access jigs |
02/19/1986 | EP0171874A2 Linear feedback shift register for circuit design technology validation |
02/19/1986 | EP0171629A1 Autonomy testing device for an emergency lighting unit |
02/19/1986 | EP0171563A1 Circuit for the testing under load of a low-voltage current source |
02/19/1986 | CN85200823U Instrument for measuring the conductivity of dirt coating |
02/18/1986 | US4571724 System for testing digital logic devices |
02/18/1986 | US4571689 Multiple thermocouple testing device |
02/18/1986 | US4571546 Digital random error generator supplying burst error signals of random durations starting at random times |
02/18/1986 | US4571544 Microwave examination of semiconductive shields |
02/18/1986 | US4571542 Method and unit for inspecting printed wiring boards |
02/18/1986 | US4571541 Method for determining charged energy states of semiconductor or insulator materials by using deep level transient spectroscopy, and an apparatus for carrying out the method |
02/18/1986 | US4571533 Storage battery charging and monitoring apparatus |
02/18/1986 | US4571093 Method of testing plastic-packaged semiconductor devices |
02/18/1986 | CA1200889A1 Method of monitoring suitability of a transmission path for transmission of digital data signals, and apparatus for use in carrying out the method |
02/12/1986 | EP0171322A1 Electric device or circuit testing method and apparatus |
02/12/1986 | EP0170879A1 Circuit arrangement for monitoring a thyristor |
02/12/1986 | EP0170878A1 Method and apparatus for testing electronic equipment |
02/11/1986 | US4570262 Programmable universal logic driver |
02/11/1986 | US4570231 Fault finder |
02/11/1986 | US4570180 Method for automatic optical inspection |
02/11/1986 | CA1200582A1 Method of measuring the distance of a fault on a line taking account of distributed capacitances |
02/10/1986 | EP0139638A4 Insulation analyzer and method. |
02/05/1986 | EP0170568A1 Generator of predetermined sequences of combined logic signals |
02/04/1986 | US4568879 Marking apparatus |
02/04/1986 | US4568872 Method of measuring the distance of a fault on a line taking account of distributed capacitances |
02/04/1986 | US4567756 Electronic engine control systems analyzer |
01/29/1986 | CN85200142U Testing board for testing button duration of core of tape recorder |
01/28/1986 | US4567593 Apparatus for verification of a signal transfer in a preselected path in a data processing system |
01/28/1986 | US4567476 Method and circuit for optical and/or acoustic indication of the charge state of a battery or a storage battery |
01/28/1986 | US4567432 On a semiconductor wafer |
01/28/1986 | US4567431 Method for revealing semiconductor surface damage using surface photovoltage (SPV) measurements |
01/28/1986 | US4567430 Semiconductor device for automation of integrated photoarray characterization |
01/28/1986 | US4567428 Detection of catastrophic failure of dielectric, improper connection, and temperature of a printed circuit assembly via one wire |
01/28/1986 | US4566594 Component verifier |
01/28/1986 | US4566325 Hands-on inspection board for printed circuit cards |
01/28/1986 | US4566193 Use of an electronic vernier for evaluation of alignment in semiconductor processing |
01/28/1986 | CA1199970A1 Switching device for the electrical measurement of reactive impedances and a measuring bridge using such a switching device |
01/28/1986 | CA1199969A1 Electrical testing |
01/28/1986 | CA1199964A1 Surge arrester discharge counting apparatus |
01/22/1986 | EP0169125A1 Electrical fence formed by a network of wires conducting an electrical current |
01/22/1986 | EP0168715A1 Circuit arrangement for monitoring a thyristor |
01/22/1986 | EP0168643A2 Device for the inspection of wafers |