| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/23/1985 | US4513318 Programmable video test pattern generator for display systems |
| 04/23/1985 | CA1186054A1 System for analyzing complex signals |
| 04/23/1985 | CA1186019A1 Method and apparatus for remote indication of faults in coaxial cable r-f transmission systems |
| 04/17/1985 | EP0137754A2 Series-connected, skin-current heating pipe including current trouble detector |
| 04/17/1985 | EP0137165A1 Optional single or double clocked latch |
| 04/16/1985 | US4511978 Device for determining a parameter signal for a voltage-fed load |
| 04/16/1985 | US4511967 Simultaneous load and verify of a device control store from a support processor via a scan loop |
| 04/16/1985 | US4511846 Deskewing time-critical signals in automatic test equipment |
| 04/16/1985 | US4511838 Method for determining the point of zero zeta potential of semiconductor |
| 04/16/1985 | US4510806 Gauging method and apparatus for components having leads |
| 04/16/1985 | US4510674 System for eliminating short circuit current paths in photovoltaic devices |
| 04/16/1985 | CA1185698A1 Method and means for diagnostic testing of ccd memories |
| 04/11/1985 | WO1985001581A1 Method and device for detecting and evaluating the clamping of the bars into the stator notches of a large alternating current rotating machine under load |
| 04/11/1985 | EP0090859A4 Keyboard actuator. |
| 04/10/1985 | EP0136609A1 Process for localizing time critical facts in the interior of a sequential electronic circuit |
| 04/10/1985 | EP0136591A1 Method of measuring low frequency signal shapes inside integrated circuits with an electron probe |
| 04/10/1985 | EP0136461A1 Level sensitive scan design testable latch circuit apparatus |
| 04/10/1985 | EP0053130B1 Ripple detector for automative alternator battery charging systems |
| 04/09/1985 | US4510603 Testing system for reliable access times in ROM semiconductor memories |
| 04/09/1985 | US4510572 Signature analysis system for testing digital circuits |
| 04/09/1985 | US4510446 Test coupons for determining the registration of subsurface layers in a multilayer printed circuit board |
| 04/09/1985 | US4510445 Miniature circuit processing devices and matrix test heads for use therein |
| 04/09/1985 | US4510435 Apparatus for electrically testing multi-core cables |
| 04/09/1985 | CA1185319A1 Method and apparatus for charging a battery |
| 04/03/1985 | EP0136207A1 Test period generator for automatic test equipment |
| 04/03/1985 | EP0136206A1 Method and apparatus for monitoring automated testing of electronic circuits |
| 04/03/1985 | EP0136205A1 Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
| 04/03/1985 | EP0136204A2 Control of signal timing apparatus in automatic test systems using minimal memory |
| 04/03/1985 | EP0136203A1 Apparatus for dynamically controlling the timing of signals in automatic test systems |
| 04/03/1985 | EP0135869A1 Process and arrangement for measuring an electric signal arising in a circuit |
| 04/03/1985 | EP0135868A1 Method to include and display signals inside integrated circuits taking into account their slope, and device for carrying out such a method |
| 04/03/1985 | EP0135864A2 System and method for automatically testing integrated circuit memory arrays on different memory array testers |
| 04/03/1985 | EP0120087A4 Noncontact electrostatic hoop probe for combustion engines. |
| 04/02/1985 | US4509102 Voltage controlled current switch with short circuit protection |
| 04/02/1985 | US4509012 Method for determining the characteristic behavior of a metal-insulator-semiconductor device in a deep depletion mode |
| 04/02/1985 | US4509008 Method of concurrently testing each of a plurality of interconnected integrated circuit chips |
| 04/02/1985 | US4508453 Pattern detection system |
| 03/26/1985 | US4507761 Functional command for semiconductor memory |
| 03/26/1985 | US4507605 Method and apparatus for electrical and optical inspection and testing of unpopulated printed circuit boards and other like items |
| 03/26/1985 | US4507576 Method and apparatus for synthesizing a drive signal for active IC testing including slew rate adjustment |
| 03/26/1985 | US4507544 Burn-in clock monitor |
| 03/26/1985 | US4507334 Surface preparation for determining diffusion length by the surface photovoltage method |
| 03/26/1985 | CA1184599A1 Method and apparatus for testing a battery |
| 03/19/1985 | US4506363 Programmable logic array in ECL technology |
| 03/19/1985 | US4506332 Facility for monitoring the level of a radio-frequency signal |
| 03/19/1985 | US4506259 Digital fault monitor for conductive heaters |
| 03/19/1985 | US4506255 Operation test circuit for fire detectors |
| 03/19/1985 | US4506213 Electronic device handler |
| 03/19/1985 | US4506212 Method and apparatus for testing integrated circuits using AC test input and comparison of resulting frequency spectrum outputs |
| 03/19/1985 | US4506210 Method for identifying cable conductors using two signals at different frequencies |
| 03/14/1985 | WO1985001113A1 Electronic device handler |
| 03/13/1985 | EP0134187A2 Measuring arrangement for detecting partial discharge within metal-shielded, pressure gas-isolated high-voltage commutator arrangements |
| 03/12/1985 | US4504921 Multi-channel test system using optical waveguide modulators |
| 03/12/1985 | US4504789 Equipment for testing electrical devices such as solenoids |
| 03/12/1985 | US4504784 Method of electrically testing a packaging structure having N interconnected integrated circuit chips |
| 03/12/1985 | US4504783 Test fixture for providing electrical access to each I/O pin of a VLSI chip having a large number of I/O pins |
| 03/12/1985 | US4504782 Detection of catastrophic failure of dielectric, improper connection, and temperature of a printed circuit assembly via one wire |
| 03/12/1985 | CA1183899A1 Ground fault detector apparatus |
| 03/12/1985 | CA1183898A1 Fault indicator having increased sensitivity to fault currents |
| 03/06/1985 | EP0133748A1 Method for detecting and obtaining information about changes in variables |
| 03/05/1985 | US4503537 Parallel path self-testing system |
| 03/05/1985 | US4503526 Device for water inflow detection inside a seismic streamer |
| 03/05/1985 | US4503390 Switchless voltage, continuity and polarity indicator |
| 03/05/1985 | US4503387 A.C. Testing of logic arrays |
| 03/05/1985 | US4503386 Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks |
| 03/05/1985 | US4502329 Method for checking insulative condition of insulated windings used in electrical appliances |
| 03/05/1985 | US4502320 Method and apparatus for diagnosing oil-filled electric apparatus |
| 03/05/1985 | CA1183336A1 Method and means for controlling the manufacture of windings for inductive apparatus |
| 02/26/1985 | US4502127 Test system memory architecture for passing parameters and testing dynamic components |
| 02/26/1985 | US4502005 Method and apparatus for determining the angle between the air-gap flux vector and the stator current vector of an asynchronous machine fed from an intermediate current-link frequency converter |
| 02/26/1985 | CA1183215A1 Automated monitoring device for a plurality of warning lights |
| 02/26/1985 | CA1183213A1 Current reset fault indicator having magnetic core cable attachment assembly |
| 02/26/1985 | CA1183212A1 Fault indicator with bidirectional indicator winding |
| 02/26/1985 | CA1183211A1 Apparatus and method for locating faults in cables |
| 02/26/1985 | CA1183209A1 Telephone cable splicers test set and method of testing |
| 02/20/1985 | EP0133215A1 Circuit for DC testing of logic circuits |
| 02/19/1985 | US4500993 In-circuit digital tester for testing microprocessor boards |
| 02/19/1985 | US4500836 Automatic wafer prober with programmable tester interface |
| 02/19/1985 | US4500834 Apparatus and method for locating the position of a fault occurring in an electric power transmission system with respect to a monitoring point |
| 02/19/1985 | CA1182934A1 Test device for locating faults in a two-wire line or for switching two-wire lines |
| 02/13/1985 | EP0133006A2 Safe operation proving of electronic circuits |
| 02/13/1985 | EP0037414B1 Method and apparatus for testing survival radios |
| 02/12/1985 | US4499581 Self testing system for reproduction machine |
| 02/12/1985 | US4499579 Programmable logic array with dynamic test capability in the unprogrammed state |
| 02/12/1985 | US4499424 For measuring the state-of-charge of an open-cell lead/acid battery |
| 02/12/1985 | US4499419 Methods and apparatus for assessing the quality of logic signals |
| 02/12/1985 | US4499417 Determining location of faults in power transmission lines |
| 02/12/1985 | US4498716 Data monitoring connector for testing transmission links |
| 02/12/1985 | US4498479 Electrocardiograph (ECG) electrode testing system |
| 02/12/1985 | US4498232 Automatic insertion and removal device for components |
| 02/05/1985 | USRE31828 In-circuit digital tester |
| 02/05/1985 | US4498196 Testable optically isolated control circuit |
| 02/05/1985 | US4498132 Data processing system using object-based information and a protection scheme for determining access rights to such information and using multilevel microcode techniques |
| 02/05/1985 | US4498131 Data processing system having addressing mechanisms for processing object-based information and a protection scheme for determining access rights to such information |
| 02/05/1985 | US4498047 Integrated circuit mounting apparatus |
| 02/05/1985 | US4498046 Room temperature cryogenic test interface |
| 02/05/1985 | US4498042 Mat testing apparatus |
| 01/29/1985 | US4497056 IC Tester |
| 01/29/1985 | US4496941 For supplying current to a load |
| 01/29/1985 | US4496939 Power indicator apparatus for a DC to DC flyback converter |