Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/1986
01/21/1986US4566104 Testing digital electronic circuits
01/21/1986US4565998 Diode failure detecting device in rotary rectifier
01/21/1986US4565966 Method and apparatus for testing of electrical interconnection networks
01/21/1986CA1199685A1 Shift register latch
01/16/1986WO1986000418A1 Device for controlling the charge state of rechargeable batteries
01/16/1986WO1986000417A1 Electrical continuity testing
01/15/1986EP0168346A1 Apparatus for measuring the resistance of conducting wires
01/14/1986US4564943 System path stressing
01/14/1986US4564942 Trouble shooting system for electric vehicle
01/14/1986US4564916 Diagnosing speed sensor defect of an automotive vehicle electronic control system
01/14/1986US4564808 Direct determination of quantum efficiency of semiconducting films
01/14/1986US4564807 Method of judging carrier lifetime in semiconductor devices
01/14/1986US4564802 Test device for fuses and batteries
01/14/1986US4563995 Method of and circuit for analyzing output signals from a sensor installed in an internal combustion engine
01/14/1986CA1199395A1 Electronic instrument with multiple interchangeable operating modes
01/08/1986EP0167047A2 Latch circuit
01/08/1986EP0166912A1 Method for electrically testing microwirings using particle probes
01/08/1986EP0166815A1 Method and device for the spectral analysis of a signal at a measuring point
01/08/1986EP0166814A1 Method and device for detecting and displaying a measuring point which carries a voltage of at least one certain frequency
01/07/1986US4563675 System for monitoring metal-to-metal contact in rotating machinery
01/07/1986US4563649 Cathode ray tube tracking tester and method of testing
01/07/1986US4563642 Apparatus for nondestructively measuring characteristics of a semiconductor wafer with a junction
01/07/1986US4563636 Connection verification between circuit board and circuit tester
01/07/1986US4563633 Apparatus for sensing openings in sheet
01/07/1986EP0104169A4 Automatic circuit identifier.
01/03/1986WO1986000173A1 A connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine
01/02/1986EP0166575A2 System for testing functional electronic circuits
01/02/1986EP0166448A2 IC test equipment
01/02/1986EP0166409A2 IC test equipment
12/1985
12/31/1985US4562401 Circuit arrangement and method for fault locating in conjunction with equipment for the trunk feeding of electrical loads
12/31/1985US4562390 Insulation resistance measurement in static leonard apparatus
12/31/1985US4561541 Carrier system for photovoltaic cells
12/31/1985CA1198827A1 Test vector indexing method and apparatus
12/31/1985CA1198775A1 Self-test method and apparatus
12/31/1985CA1198774A1 Go/no go margin test circuit for semiconductor memory
12/31/1985CA1198772A1 Diagnostic display apparatus
12/27/1985EP0165865A2 Method and apparatus for testing integrated circuits
12/27/1985EP0165813A2 Testing station
12/27/1985EP0165803A2 A system and an apparatus for locating a grounding fault on electric power equipment
12/24/1985US4560937 Battery state of charge metering method and apparatus
12/24/1985US4560922 Method for determining the direction of the origin of a disturbance affecting an element of an electrical energy transfer network
12/18/1985EP0165109A1 Process and device for testing dielectric materials, especially condensers
12/18/1985EP0164890A1 Battery-powered computing apparatus including a battery charge level indicating arrangement
12/18/1985EP0164838A1 Event location using a locating member containing discrete impedances
12/18/1985EP0164722A1 Automatic test system
12/18/1985EP0164711A2 Method for detection and location of a fault point on a power transmission line and device for carrying out the method
12/18/1985EP0164570A2 Wiring harness conduction testing apparatus
12/18/1985EP0164563A1 Method of making flat component assemblies
12/17/1985US4559636 Time-measuring adapter for logic analyzer
12/17/1985US4559491 Method and device for locating a fault point on a three-phase power transmission line
12/17/1985CA1198225A1 Photoluminescence method of testing double heterostructure wafers
12/11/1985EP0164209A1 Integrated circuit testing arrangements
12/11/1985EP0163921A1 Measurement data processing device
12/11/1985EP0163845A1 Diagnostic protection circuit and method
12/11/1985EP0163822A2 A storage battery
12/10/1985US4558422 Digital signal sampling system with two unrelated sampling timebases
12/10/1985US4558408 Manual crate controller
12/10/1985US4558309 Ground tether continuity monitor
12/10/1985US4558281 Battery state of charge evaluator
12/10/1985US4558273 Apparatus for the inspection of electrodeposited electrically insulating coatings
12/10/1985US4558232 Level detector circuit for microcomputer devices
12/10/1985US4557141 Method for diagnosing faults in electronic fuel control systems
12/10/1985US4557043 Component lead processing apparatus
12/04/1985EP0163414A1 Integrated circuit test socket
12/04/1985EP0163273A2 Logic analyzer
12/04/1985EP0163267A2 Logic analyzer
12/03/1985US4556947 Bi-directional switching circuit
12/03/1985US4556946 Ground detection arrangement for A.C. generator
12/03/1985US4556840 Method for testing electronic assemblies
12/03/1985US4556269 Holder for electronic components
11/1985
11/27/1985EP0162522A2 Apparatus and method for measuring the coil resistance and the connection resistance between the winding and commutator bars in electric motors
11/27/1985EP0162418A2 Semiconductor memory test equipment
11/27/1985EP0162207A1 Testing method and tester for electrical devices
11/27/1985EP0162148A1 Method for detecting the relationship of the needle coordinates of a needle contact field to the addresses of the contact needles of a wiring test automatic machine
11/26/1985US4555783 Method of computerized in-circuit testing of electrical components and the like with automatic spurious signal suppression
11/26/1985US4555663 Test pattern generating apparatus
11/26/1985US4555052 Lead wire bond attempt detection
11/26/1985CA1197323A2 Apparatus for the dynamic in-circuit testing of electronic digital circuit elements
11/26/1985CA1197322A2 Apparatus for the dynamic in-circuit testing of electronic digital circuit elements
11/26/1985CA1197281A1 Apparatus and method for checking for electrical frit breakdown in kinescopes
11/21/1985EP0161639A2 Self contained array timing
11/21/1985EP0161615A2 Method and device for defining the flux vector of a rotating field machine
11/21/1985EP0161398A1 Device for indicating the fully charged condition of an electrical accumulator
11/19/1985US4554664 Static memory cell with dynamic scan test latch
11/19/1985US4554663 Device and apparatus for testing electronic equipment and particularly television equipment
11/19/1985US4554636 Apparatus for testing circuits within a system
11/19/1985US4554536 Logic timing diagram display apparatus
11/19/1985US4554507 Arrangement for testing the operability of a semiconductive device
11/19/1985US4554455 Potential analyzer
11/19/1985CA1196958A1 Logic analyzer having search and comparison capabilities
11/13/1985EP0160789A2 Test pattern generator
11/13/1985EP0160781A1 Measuring and detecting printed circuit wiring defects
11/12/1985US4553225 Method of testing IC memories
11/12/1985US4553100 Counter-address memory for multi-channel timing signals
11/12/1985US4553092 Apparatus and method for temperature estimation of overhead conductors
11/12/1985US4553090 Method and apparatus for testing a logic circuit using parallel to serial and serial to parallel conversion
11/12/1985US4553088 Wiring pair reversal detector
11/12/1985US4553085 Coaxial cable tester device
11/12/1985US4553081 Portable battery powered system
11/12/1985US4553049 Oscillation prevention during testing of integrated circuit logic chips