Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/1984
08/21/1984US4467279 Temperature compensated resistance test board
08/21/1984US4467275 DC characteristics measuring system
08/21/1984US4467017 A palladium-hydragoen electrode
08/21/1984US4466746 Ebulliometric hot spot detector
08/21/1984CA1173172A1 Data processing system having a uniquely organized memory using object-based information and a unique protection scheme for determining access rights to such information and using unique multilevel microcode techniques
08/21/1984CA1173165A1 Multi-processor automatic test system
08/15/1984EP0115625A1 Process and device for optically and/or acoustically indicating the charge of a battery or an accumulator
08/15/1984EP0115543A1 Function diagnosis system
08/14/1984US4466014 Video test method and apparatus with incremental scan rate capability
08/14/1984US4465995 Method and apparatus for analyzing an analog-to-digital converter with a nonideal digital-to-analog converter
08/14/1984US4465972 Connection arrangement for printed circuit board testing apparatus
08/14/1984US4465971 Circuit for coupling signals to or from a circuit under test
08/14/1984US4465968 Method and apparatus for testing open collector electrical circuit devices
08/14/1984US4464823 Method for eliminating short and latent short circuit current paths in photovoltaic devices
08/14/1984CA1172758A1 Computer based engine analyzer with hardware cylinder counter
08/14/1984CA1172699A1 Method of and apparatus for electrical short testing and the like
08/14/1984CA1172698A1 Testing of integrated circuits
08/14/1984CA1172697A1 Switching equipment for testing apparatus
08/08/1984EP0115135A1 Electrical test fixture for printed circuit boards and the like
08/08/1984EP0114896A1 Function diagnosis system
08/07/1984US4464750 Semiconductor memory device
08/07/1984US4464655 Testcase generator with marker symbols displayed with primary data
08/07/1984US4464628 Relay tester
08/07/1984US4464627 Device for measuring semiconductor characteristics
08/07/1984US4464621 Test device for and method of locating faults in a two-wire line or for switching two-wire lines
08/07/1984US4464571 Opposing field spectrometer for electron beam mensuration technology
08/07/1984CA1172361A1 Logic analyzer for a multiplexed digital bus
08/07/1984CA1172360A1 Multi-speed logic analyzer
08/02/1984WO1984003012A1 A cmos scannable latch
08/02/1984WO1984003001A1 Electrolysis test station terminal and support
07/1984
07/31/1984US4463310 Apparatus for detecting the presence of components on a printed circuit board
07/31/1984US4463309 Method and device for determining the threshold of resistance of an electric or electromagnetic equipment to an external electromagnetic aggression
07/31/1984US4462796 Integrated circuit component handler movement and heating system
07/31/1984US4462155 Pin locator
07/31/1984CA1171909A1 Fault indicator with magnetic test point
07/25/1984EP0113865A1 Semiconductor integrated circuit
07/24/1984US4461569 Concentricity gage
07/24/1984US4461525 Integrated circuit test socket
07/24/1984CA1171462A1 Device for automatically monitoring an independent current supply
07/19/1984WO1984002787A1 Diagnostic display apparatus
07/18/1984EP0113426A1 Method and apparatus for analyzing the information transfer characteristics of a recording medium
07/18/1984EP0113425A1 Method of and apparatus for establishing the characteristics of a prerecorded two-channel audio program
07/18/1984EP0113393A2 A self-clocked signature analyser
07/17/1984US4461000 ROM/PLA Structure and method of testing
07/17/1984US4460999 Memory tester having memory repair analysis under pattern generator control
07/17/1984US4460870 Quiescent voltage sampling battery state of charge meter
07/17/1984US4460868 Fixture for testing semiconductor devices
07/17/1984US4460866 Method for measuring resistances and capacitances of electronic components
07/17/1984CA1171136A1 Calibration system for analog-to-digital conversions
07/11/1984EP0113181A1 Digital random error generator arrangements
07/10/1984US4459695 Fault finding in an industrial installation by means of a computer
07/10/1984US4459693 Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
07/10/1984US4459551 Television receiver and test set voltage analyzer
07/10/1984US4459548 Alternator testing apparatus
07/10/1984US4459547 Method and apparatus for precise measurement of long-term stability of photodetectors
07/10/1984US4459545 Apparatus for detecting a current peak value and a voltage peak value
07/10/1984US4459437 Test system for locating breaks and short circuits in a two-lead line
07/10/1984CA1170752A1 Test set for railway cab signal system
07/05/1984WO1984002580A1 Vlsi chip with integral testing circuit
07/04/1984EP0112774A2 Deskew circuit for automatic test equipment
07/03/1984US4458338 Circuit for checking memory cells of programmable MOS-integrated semiconductor memories
07/03/1984US4458285 Method and device for finding faults on electric lines by the principle of low impedance
07/03/1984US4458198 Fault indicator having a remote test point at which fault occurrence is indicated by change in magnetic state
07/03/1984US4458197 Apparatus and method for automatically testing a multiple node electrical circuit
07/03/1984US4458113 Conductor pair identifier apparatus
06/1984
06/27/1984EP0112242A1 Device for checking the capacity of an array of accumulator cells
06/26/1984US4456880 I-V Curve tracer employing parametric sampling
06/26/1984US4456879 Method and apparatus for determining the doping profile in epitaxial layers of semiconductors
06/26/1984US4456875 Demagnetization circuit for current transformers
06/26/1984US4456874 Analyser for electromotive device
06/21/1984WO1984002412A1 High speed testing of complex circuits
06/20/1984EP0111470A2 Thermal protective device for transformers and inductances
06/20/1984EP0111168A1 Circuit for fault localisation with an arrangement for the remote feeding of electricity consumers
06/20/1984EP0111056A1 Cascoded bistable circuit for level sensitive scan design
06/20/1984EP0111053A2 On-chip monitor
06/19/1984USRE31606 Digital ohmmeter with electrical continuity tester
06/19/1984US4455654 Test apparatus for electronic assemblies employing a microprocessor
06/19/1984US4455524 Battery condition indicator
06/19/1984US4455523 Portable battery powered system
06/19/1984EP0086778A4 Battery voltage monitoring and indicating apparatus.
06/14/1984EP0082147A4 Printed circuit board electronic tester.
06/13/1984EP0110466A1 Device for signalling a specific charge condition of an accumulator battery
06/13/1984EP0110257A2 Circuitry for addressing component groups
06/13/1984EP0096033A4 Insulation analyzer apparatus and method of use.
06/13/1984EP0070861A4 Wafer and method of testing networks thereon.
06/12/1984US4454585 Printed wiring board inspection, work logging and information system
06/12/1984US4454577 Linked data systems
06/12/1984US4454540 Automatic level control circuit
06/12/1984US4454539 In a scanning apparatus
06/12/1984US4454476 Method of and apparatus for synthetic testing of a multi-break circuit breaker
06/12/1984US4454472 Method and apparatus for determining minority carrier diffusion length in semiconductors
06/12/1984US4454468 Switching device for the electrical measurement of reactive impedances and a measuring bridge using such a switching device
06/12/1984US4454413 Apparatus for tracking integrated circuit devices
06/07/1984WO1984002195A1 Integrated circuit mounting apparatus
06/05/1984US4453227 Method and apparatus for transferring a bit pattern field into a memory
06/05/1984US4453181 Scanning-image forming apparatus using photo response signal
06/05/1984US4453159 Self-monitoring heat tracing system
06/05/1984US4453129 Method for measuring the charge state of an accumulator and a device for implementing such method
06/05/1984US4453127 Determination of true electrical channel length of surface FET
06/05/1984US4451970 System and method for eliminating short circuit current paths in photovoltaic devices