Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/1985
01/29/1985US4496905 Testing device for electrically analyzing a high _pressure sodium lighting fixture and lamp
01/29/1985US4496900 Nonlinearity detection using fault-generated second harmonic
01/29/1985US4496250 Thermocouple open circuit detector
01/29/1985CA1181850A1 Method and apparatus for diagnosing oil-filled electric apparatus
01/29/1985CA1181846A1 Scan-out system
01/29/1985CA1181813A1 Current transformer demagnetization circuit
01/29/1985CA1181811A1 Apparatus for testing the linearity of a frequency modulated oscillator
01/29/1985CA1181810A1 Apparatus for testing the linearity of a frequency modulated oscillator
01/23/1985EP0131718A1 Device for detecting a short circuit in the winding of the rotor of an electric machine
01/23/1985EP0131568A1 Electrolysis test station terminal and support
01/22/1985US4495655 Testable optically isolated control circuit
01/22/1985US4495642 Timing analyzer with combination transition and duration trigger
01/22/1985US4495629 CMOS scannable latch
01/22/1985US4495622 System for selecting high-reliability integrated circuits
01/22/1985US4495462 Electronic circuit
01/22/1985US4495459 Surge arrester discharge counting apparatus
01/22/1985US4495421 Optical power supply switching apparatus
01/22/1985CA1181540A1 Scanning-image forming apparatus using photo response signal
01/22/1985CA1181531A1 Interconnect fault detector for lsi logic chips
01/16/1985EP0131375A1 Apparatus for testing integrated circuits
01/16/1985EP0131349A1 Circuit testing utilizing data compression and derivative mode vectors
01/16/1985EP0130982A1 Diagnostic display apparatus.
01/16/1985EP0130974A1 Vlsi chip with integral testing circuit
01/15/1985US4494069 Optical scanning method of testing material defects
01/15/1985US4494066 Method of electrically testing a packaging structure having n interconnected integrated circuit chips
01/09/1985EP0130610A1 System data path stressing
01/09/1985EP0130535A2 Apparatus and method for testing and verifying the timing logic of a cathode ray tube display
01/09/1985EP0130350A1 Buckling beam test probe contactor assembly with spring biased stripper plate
01/08/1985US4493079 Method and system for selectively loading test data into test data storage means of automatic digital test equipment
01/08/1985US4493077 Scan testable integrated circuit
01/08/1985US4493045 Test vector indexing method and apparatus
01/08/1985US4493044 Apparatus and a method of establishing the correct display order of probe channels for a logic analyzer
01/08/1985US4493023 Digital data processing system having unique addressing means and means for identifying and accessing operands
01/08/1985US4492999 Supervisory unit for rotary electrical machinery and apparatus
01/08/1985US4492955 Battery voltage drop alarm device for a battery forklift truck
01/08/1985US4492925 Testing and evaluating circuit for proximity switches in machine control means
01/08/1985CA1180810A1 X-ray system tester
01/02/1985EP0129993A1 Circuit board tester
01/02/1985CA1180467A Real time holographic interferometric testing of hybrid microcircuits
01/02/1985CA1180387A Test system for locating breaks and short circuits in a two-lead line
01/01/1985US4491935 Scan-out system
01/01/1985US4491785 Tracing electrical conductors by high-frequency loading and improved signal detection
01/01/1985US4491782 Apparatus for locating faults in electric cables
01/01/1985US4491781 Patch cord tester
01/01/1985US4491173 Rotatable inspection table
12/1984
12/27/1984EP0129508A1 Examining and testing method of an electric device of the integrated or printed circuit type
12/27/1984EP0129017A2 Method and apparatus for modeling systems of complex circuits
12/27/1984EP0128946A1 High speed testing of complex circuits
12/25/1984US4490673 Testing an integrated circuit containing a tristate driver and a control signal generating network therefor
12/25/1984US4489477 Method for screening laser diodes
12/19/1984EP0128823A1 Method and device for obtaining a fault parameter of an electrical line, using a composite pilot signal
12/19/1984EP0128774A2 High throughput circuit tester and test technique avoiding overdriving damage
12/19/1984EP0128574A2 Electrical load monitoring system and method
12/19/1984EP0128228A1 Method and circuit arrangement for the generation of pulses of arbitrary time relation within directly successive pulse intervals with very high precision and temporal resolution
12/18/1984US4489397 Chain configurable polycellular wafer scale integrated circuit
12/18/1984US4489365 Universal leadless chip carrier mounting pad
12/18/1984US4489312 Selective test circuit for fire detectors
12/18/1984US4489272 Test circuit for turn-on and turn-off delay measurements
12/18/1984US4489247 Integrated injection logic circuit with test pads on injector common line
12/18/1984US4488555 Battery condition warning system for medical implant
12/18/1984CA1179775A1 Apparatus for determining the rotor angle of a synchronous machine
12/18/1984CA1179733A1 Power supply diagnostic system
12/12/1984EP0128107A1 Apparatus and method for automatic inspection of printed circuit boards
12/12/1984EP0127655A1 Integrated circuit mounting apparatus
12/11/1984US4488301 System for analyzing complex signals
12/11/1984US4488299 Computerized versatile and modular test system for electrical circuits
12/11/1984US4488297 For delaying an electrical signal
12/11/1984US4488267 Integrated circuit chips with removable drivers and/or buffers
12/11/1984US4488259 On chip monitor
12/11/1984US4488221 Data processing system
12/11/1984US4488147 Battery jumper cable system
12/11/1984US4487661 Method and device for determining the physical characteristics of a semiconductor material
12/06/1984WO1984004819A1 Method for inspecting and testing an electric device of the printed or integrated circuit type
12/05/1984EP0127015A2 Integrated digital MOS semiconductor circuit
12/04/1984US4486705 Method of testing networks on a wafer having grounding points on its periphery
12/04/1984US4486660 Electron beam testing device for stroboscopic measurement of high-frequency, periodic events
11/1984
11/28/1984EP0126533A1 Test instrument with flexibly connected head
11/28/1984EP0126402A2 Failure-monitor system for an automotive digital control system
11/28/1984EP0126322A1 Testable array logic device
11/28/1984EP0028625B1 Bidirectional integrator
11/27/1984CA1178717A1 Printed circuit board test fixture with compliant platen
11/27/1984CA1178659A1 Vital contact checking circuit
11/22/1984WO1984004486A1 Method and means for joining and sealing of material parts and use of such means in containers
11/21/1984EP0125796A1 System and apparatus for monitoring and control of a bulk electric power delivery system
11/20/1984US4484329 Apparatus for the dynamic in-circuit element-to-element comparison testing of electronic digital circuit elements
11/20/1984US4484140 Battery scanning system
11/20/1984US4484136 Test set for transient protection devices
11/20/1984US4484132 Crack detecting system
11/20/1984US4484131 Cable testing
11/20/1984US4484130 Battery monitoring systems
11/20/1984US4483629 Dynamic testing of electrical conductors
11/14/1984EP0124963A1 Lamp monitoring circuit
11/14/1984EP0124762A1 Circuitry for generating from an input signal a pulse output signal having an adjustable base line and amplitude voltage
11/14/1984EP0124761A1 Device for testing specimens containing electrical circuits
11/13/1984US4483002 Digital device testing apparatus and method
11/13/1984US4482863 Apparatus and method for measuring electronic response of high speed devices and materials
11/13/1984US4482858 Apparatus for and a method of testing detonating systems
11/13/1984US4482852 Motor slip controller for AC motors
11/13/1984US4482031 AC elevator control apparatus
11/13/1984US4481786 Electronic control for a domestic appliance