| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
|---|
| 01/25/2007 | WO2005114096A3 Methods and systems for determining optical properties using low-coherence interference signals |
| 01/25/2007 | WO2005069997A3 Enhanced detection of acousto-photonic emissions in optically turbid media using a photo-refractive crystal-based detection system |
| 01/25/2007 | US20070019209 Condition assessment system for a structure including a semiconductor material |
| 01/25/2007 | US20070019208 Optical tomography apparatus |
| 01/25/2007 | US20070019203 Phase shift interferometer |
| 01/25/2007 | US20070019202 Method and apparatus for reducing crosstalk interference in an inline fabry-perot sensor array |
| 01/25/2007 | US20070019201 Method and apparatus for providing polarization insensitive signal processing for interferometric sensors |
| 01/25/2007 | US20070018096 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 01/25/2007 | US20070018082 Photo-detection device and method |
| 01/25/2007 | DE102005042733B3 Interferometric method e.g. for recording of separation and form and optical coherence tomography (OCT), involves having multi-wavelength source or tunable source and imaging on receiver by focusing systems |
| 01/25/2007 | DE102005040749B3 Method for the interferometric measurement of an optical property of a test region of a blank made from a transparent material comprises completely covering the test region with a film made from an immersion fluid |
| 01/24/2007 | EP1746384A2 Phase shift interferometer |
| 01/24/2007 | EP1745352A1 Relative movement sensor |
| 01/24/2007 | EP1745351A1 An optical input device and method of measuring relative movement of an object and an optical input device |
| 01/24/2007 | EP1595108A4 Longitudinal differential interferometric confocal microscopy |
| 01/24/2007 | EP1595107A4 Method and apparatus for dark field interferometric confocal microscopy |
| 01/24/2007 | CN1296774C Method for manufacturing photoetching device and component |
| 01/23/2007 | US7167325 Flexured athermalized pseudokinematic mount |
| 01/23/2007 | US7167311 Polarizing beamsplitter |
| 01/23/2007 | US7167249 High efficiency spectral imager |
| 01/23/2007 | US7165850 Phase-compensated cube corner in laser interferometry |
| 01/18/2007 | WO2007008788A2 Common-path frequency-domain optical coherence reflectometer and optical coherence tomography device |
| 01/18/2007 | WO2007008615A2 Control system and apparatus for use with ultra-fast laser |
| 01/18/2007 | WO2007008265A2 Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry |
| 01/18/2007 | WO2006130797A3 Spectral encoding heterodyne interferometry techniques for imaging |
| 01/18/2007 | WO2006117406A3 Identifying a gemstone |
| 01/18/2007 | US20070013918 Optical measuring system and optical measuring method |
| 01/18/2007 | US20070013917 Measuring apparatus |
| 01/18/2007 | US20070013914 Crystalline optical fiber sensors for harsh environments |
| 01/18/2007 | US20070013913 Spectral metrology for high repetition rate gas discharge laser |
| 01/17/2007 | EP1744119A1 Swept-source optical coherence tomography |
| 01/17/2007 | EP1743138A2 Beam profile complex reflectance system and method for thin film and critical dimension measurements |
| 01/17/2007 | EP1595106A4 Transverse differential interferometric confocal microscopy |
| 01/17/2007 | CN2859463Y Angle template tree-measuring instrument reformed by forest compass |
| 01/17/2007 | CN1295893C Controller for fiber optic tunable filter and associated methods |
| 01/16/2007 | US7165233 Test ket layout for precisely monitoring 3-foil lens aberration effects |
| 01/16/2007 | US7164481 Coefficient of linear expansion measuring apparatus and coefficient of linear expansion measuring method |
| 01/16/2007 | US7164480 Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy |
| 01/16/2007 | US7164479 Optical displacement sensor |
| 01/16/2007 | US7164478 Apparatus and methods for stabilization and control of fiber devices and fiber devices including the same |
| 01/16/2007 | US7164471 Electronic imaging apparatus and microscope apparatus using the same |
| 01/16/2007 | US7164470 Depth of field enhancement for optical comparator |
| 01/11/2007 | WO2007003288A1 Fourier domain optical coherence tomography employing a swept multi-wavelength laser and a multi-channel receiver |
| 01/11/2007 | WO2006102058A3 Apparatus and method for frequency-domain optical coherence tomography |
| 01/11/2007 | US20070009197 Fiber optic sensor system |
| 01/11/2007 | US20070008549 Technologies for measuring thickness of an optical disc |
| 01/11/2007 | US20070008548 Reflector, optical element, interferometer system, stage device, exposure apparatus, and device fabricating method |
| 01/11/2007 | US20070008546 Optical sensing devices with SPR sensors based on differential phase interrogation and measuring method using the same |
| 01/11/2007 | US20070008545 Common path frequency domain optical coherence reflectometer and common path frequency domain optical coherence tomography device |
| 01/11/2007 | US20070008544 Fiber-optic seismic sensor |
| 01/10/2007 | CN1294403C Interferometer |
| 01/10/2007 | CN1294402C Light source output stabilization method |
| 01/10/2007 | CN1294401C 干涉测量装置 Interferometric measurement device |
| 01/09/2007 | US7161728 Area array modulation and lead reduction in interferometric modulators |
| 01/09/2007 | US7161684 Apparatus for optical system coherence testing |
| 01/09/2007 | US7161683 Polarization-dependent grating interferometer for measuring optical profile depth and spectral properties of a sample |
| 01/09/2007 | US7161682 Method and device for optical navigation |
| 01/09/2007 | US7161681 Aberration measuring apparatus comprising wavelength calibration and stabilization |
| 01/09/2007 | US7161679 Interferometer spectrometer with reduced alignment sensitivity |
| 01/09/2007 | CA2368320C Instrument for measuring physical property of sample |
| 01/04/2007 | WO2007001379A2 Coherent photothermal interferometric spectroscopy system and method for chemical sensing |
| 01/04/2007 | WO2007001308A2 Laser and environmental monitoring system |
| 01/04/2007 | WO2007001017A1 Reflective member, optical member, interferometer system, stage device, exposure device, and device manufacturing method |
| 01/04/2007 | US20070002332 System and methods for wavefront measurement |
| 01/04/2007 | US20070002329 Laser probing system for integrated circuits |
| 01/04/2007 | US20070002328 Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system |
| 01/04/2007 | US20070002327 Fourier domain optical coherence tomography employing a swept multi-wavelength laser and a multi-channel receiver |
| 01/04/2007 | US20070002312 Methods for reducing spherical aberration effects in photolithography |
| 01/04/2007 | US20070002311 Method of performing resist process calibration/optimization and DOE optimization for providing OPE matching between different lithography systems |
| 01/04/2007 | DE10351142B4 Vorrichtungen und Verfahren zur Messung von thermisch induzierten Oberflächendeformationen Devices and methods for the measurement of thermally induced deformations surface |
| 01/04/2007 | DE102005062180B3 Infrared ellipsometer has interferometer and sample holder with preceding polariser serving as interferometer beam splitter |
| 01/04/2007 | DE102005031216A1 Electronic component surface shape recording procedure uses white light interferometer with in pixel processing using incoherent demodulation |
| 01/03/2007 | EP1739471A1 Dual technology (confocal and intererometric) optical profilometer for the inspection and three-dimensional measurement of surfaces |
| 01/03/2007 | EP1739388A1 Method for manufacturing a biosensor element and for testing the same |
| 01/03/2007 | EP1290485B1 Method for measuring surface topography in a quantitative and optical manner |
| 01/02/2007 | US7158914 Precision surface measurement |
| 01/02/2007 | US7158238 System and method for calibrating a spatial light modulator array using shearing interferometry |
| 01/02/2007 | US7158237 Interferometric measuring device and projection exposure installation comprising such measuring device |
| 01/02/2007 | US7158236 Heterodyne laser interferometer for measuring wafer stage translation |
| 01/02/2007 | US7158235 System and method for inspection using white light interferometry |
| 01/02/2007 | US7158234 Optical scanning observation apparatus |
| 01/02/2007 | US7158228 Holographic imaging spectrometer |
| 01/02/2007 | US7158222 Method and device for evaluating spectacle lens or mold for molding spectacle lens, and method and system for manufacturing spectacle lens |
| 01/02/2007 | US7157917 Sensor cable having easily changeable entire length and allowing accurate and high speed signal transmission even when entire length is made longer, and amplifier-separated type sensor with the cable |
| 12/28/2006 | WO2006086034A3 Miniature fourier transform spectrophotometer |
| 12/28/2006 | US20060290944 Method and apparatus for photoacoustic measurements |
| 12/28/2006 | US20060290942 Free-form optical surface measuring apparatus and method |
| 12/28/2006 | US20060290941 Polarization control for quantum key distribution systems |
| 12/28/2006 | US20060290939 Method and apparatus for full phase interferometry |
| 12/28/2006 | US20060290938 Array and method for the spectrally resolving detection of a sample |
| 12/28/2006 | US20060290937 Wavelength monitor |
| 12/28/2006 | DE102006007411A1 Polarization control system for heterodyne interferometry has controller that generates control signals to control degrees of polarization control of polarization state modulator (PSM) in response to amplitude signal from amplitude detector |
| 12/28/2006 | DE102005056705B3 Clamping device e.g. for optical measurement arrangement, has source of light for sending rays of light and sample element which partly reflects light rays |
| 12/28/2006 | DE102005040661B3 Coordinates measuring device e.g. for determining position of moveable table, has measuring mirror installed at table with reflector surface of mirror stands parallel to direction of table |
| 12/27/2006 | EP1735607A1 Interferometric system for use of a special lenses |
| 12/27/2006 | EP1735587A1 Interferometric measuring device comprising an adaptation device for adapting the light intensity |
| 12/27/2006 | EP1606575A4 Leaky guided-wave modes used in interferometric confocal microscopy to measure properties of trenches |
| 12/27/2006 | EP1092123B1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
| 12/27/2006 | CN1884964A Nano pitch templet and preparation method thereof |
| 12/27/2006 | CN1292272C Method for constructing feedback delay of optical fiber line and full optical fiber white light interference system made thereof |