Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
08/2007
08/23/2007WO2007093385A1 Optical surface sensor
08/23/2007WO2007061591A3 Optical fiber interferometer with relaxed loop tolerance and qkd system using same
08/23/2007US20070195329 Holographically compensated, self-referenced interferometer
08/23/2007US20070195328 Wavelength measurement method based on combination of two signals in quadrature
08/23/2007US20070195311 Device and method for non-contact scanning of contact lens and contact lens mold geometry
08/23/2007DE102006037967B3 Michelson interferometer has beam splitter divides ray of light, coming from radiation source in two partial beam, which are guided mirror-symmetrical to straight line parallel to rotation axis
08/23/2007DE102006023887B3 Transmitted-light microscopy method involves sequentially separating the pictures in light dispersion direction with poly-chromatic source of light to time point or with wavelength-variable source of light
08/23/2007DE102006006302A1 Impact measuring device e.g. optical microphone, has semiconductor-laser diode that is arranged in proximity to optical lens and sends light beam, diaphragm that reflects part of light beam and photodiode that detects part of reflected beam
08/23/2007CA2641943A1 Wavefront analysis method involving multilateral interferometry with frequency difference
08/22/2007EP1819270A2 Polarization-sensitive optical coherence tomography
08/22/2007CN101023338A Interferometric system with reference surfaces with a mirrored zone
08/22/2007CN101023320A Interferometer comprising a mirror assembly for measuring an object to be measured
08/22/2007CN101023319A Optical measuring device for measuring several surfaces of a measuring object
08/22/2007CN101023318A Phase-resolved measurement for frequency-shifting interferometry
08/22/2007CN101021408A 显微镜装置 Microscope
08/21/2007US7259866 Semiconductor fabricating apparatus with function of determining etching processing state
08/21/2007US7259865 Process control monitors for interferometric modulators
08/21/2007US7259862 Low-coherence interferometry optical sensor using a single wedge polarization readout interferometer
08/21/2007US7259861 Using a fixed-frequency of oscillation in an FTS system to measure scene inhomogeneity
08/21/2007US7259860 Optical feedback from mode-selective tuner
08/21/2007US7259859 Terahertz modulation spectrometer
08/21/2007US7259851 Optical measurements of properties in substances using propagation modes of light
08/21/2007US7259383 Optical transducer for detecting liquid level
08/16/2007US20070188766 Interferometric apparatus
08/16/2007US20070188765 Fourier-domain optical coherence tomography imager
08/16/2007US20070188741 Method and apparatus for analysing an optical device
08/16/2007US20070186653 Speed measurement
08/16/2007DE202007007786U1 Prüfkörper für optische Messeinrichtungen Specimens for optical measuring devices
08/15/2007EP1817543A1 High efficiency balanced detection interferometer
08/15/2007EP1817542A1 Measuring elastic moduli of dielectric thin films using an optical metrology system
08/15/2007EP0922198A4 Method and device for measuring the concentration of ions implanted in semiconductor materials
08/15/2007CN1332423C Method to predict and identify defocus wafers and system thereof
08/15/2007CN1332180C Physical quantity measuring method using brillouin optical fiber sensor
08/15/2007CN101019000A Thickness measurement technique based on interferometry surface figure
08/15/2007CN101017082A Nanometer precision real-time interferometric measurement device of object surface shape and measurement method therefor
08/14/2007US7256895 Spherical scattering-light device for simultaneous phase and intensity measurements
08/14/2007US7256894 Method and apparatus for performing second harmonic optical coherence tomography
08/14/2007US7256893 Method and apparatus for measuring bandwidth of an optical spectrum output of a very small wavelength very narrow bandwidth high power laser
08/14/2007US7256881 Systems and methods for inspection of ophthalmic lenses
08/09/2007WO2007088789A1 Surface shape measuring method and device using the same
08/09/2007WO2007059206A3 Spectral domain phase microscopy (sdpm) dual mode imaging systems and related methods
08/09/2007WO2007028119A3 Control system and apparatus for use with ultra-fast laser
08/09/2007US20070182969 Method for approximating an influence of an optical system on the state of polarization of optical radiation
08/09/2007US20070182968 Quantum cryptographic communication apparatus
08/09/2007US20070182967 Method and apparatus for precision measurement of phase shifts
08/09/2007US20070182966 Method and apparatus for conducting heterodyne frequency-comb spectroscopy
08/09/2007DE102004051962B4 Vorrichtung zur interferometrischen Messung der Raumkoordinaten eines Objektes Device for interferometric measurement of the spatial coordinates of an object
08/08/2007EP1815291A1 Differential interferometric light modulator and image display device
08/08/2007CN101013027A High-frequency error detecting apparatus and method for heavy caliber heavy relative aperture aspherical mirror
08/08/2007CN101013025A Optical fiber interference type on-line micro-displacement measuring system using fibre grating
08/08/2007CN101013024A Full optical fibre Fizeau interference confocal measuring apparatus
08/08/2007CN101013022A Method for random error elimination in optical element interference sampling data
08/07/2007US7254295 Optical fiber interferometer with relaxed loop tolerance and QKD system using the same
08/07/2007US7254291 Optical interferometer
08/07/2007US7254290 Enhanced waveguide metrology gauge collimator
08/07/2007US7253907 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method
08/07/2007US7253906 Polarization state frequency multiplexing
08/07/2007US7253905 Determination and correction for laser induced CCD camera degradation
08/02/2007WO2007087301A2 Interferometer system for monitoring an object
08/02/2007WO2007087040A2 Demodulation method and apparatus for fiber optic sensors
08/02/2007WO2006079011A8 Low coherence interferometry for detecting and characterizing plaques
08/02/2007US20070177158 Method and apparatus for the two-dimensional mapping of the electro-optical coefficient
08/02/2007US20070177157 Optical readhead
08/02/2007US20070177156 Surface profiling method and apparatus
08/02/2007US20070177153 Measuring Endoscope Apparatus
08/02/2007US20070177152 Methods and systems for monitoring and obtaining information of at least one portion of a sample using conformal laser therapy procedures, and providing electromagnetic radiation thereto
08/02/2007US20070177151 Interferometer for demodulating differential M-phase shift keying signal
08/02/2007US20070177132 Method and Apparatus for Self-Referenced Dynamic Step and Scan Intra-Field Scanning Distortion
08/02/2007DE102007003777A1 Messvorrichtung und Verfahren zur optischen Vermessung eines Objektes Measuring apparatus and method for optical measurement of an object
08/01/2007EP1813962A1 Measuring device and method for optically measuring an object
08/01/2007EP1812772A2 Miniature fourier transform spectrophotometer
08/01/2007EP1590625A4 Interferometer
08/01/2007EP1590624A4 Interferometer alignment
07/2007
07/31/2007US7251042 Lithographic apparatus, interferometer and device manufacturing method
07/31/2007US7251041 Spatial filtering in interferometry
07/31/2007US7251039 Low non-linear error displacement measuring interferometer
07/31/2007US7251038 Light source stabilisation
07/31/2007US7251037 Method to reduce background noise in a spectrum
07/26/2007WO2007084849A1 System and methods for generating data using one or more endoscopic microscopy techniques
07/26/2007WO2007084750A2 A fourier-domain optical coherence tomography imager
07/26/2007WO2007044612A3 Imaging systems using unpolarized light and related methods and controllers
07/26/2007WO2006138294A3 Fiber-optic assay apparatus based on phase-shift interferometry
07/26/2007US20070171429 Method for calculating a model spectrum
07/26/2007US20070171427 Measurement method
07/26/2007US20070171426 Low non-linear error displacement measuring interferometer
07/26/2007US20070171425 Interferometer system for monitoring an object
07/26/2007US20070171424 Spectrally diverse apparatus and associated methods
07/26/2007US20070171423 Light pulse multiprocessing unit, light pulse generator using the same, and light pulse multiprocessing method
07/26/2007US20070171422 Two-Dimensional Spectral Shearing Interferometry for Ultrafast Pulse Characterization
07/26/2007US20070170354 Light grid
07/26/2007DE102006001329A1 Device for precise measurement of surface of test specimen, has scanning device with lens positioned relative to surface of specimen such that radiation source is arranged for radiation reflected to surface of specimen
07/25/2007EP1809162A2 Optical apparatus and method for comprehensive eye diagnosis
07/25/2007EP1244381B1 Retinal tracking assisted optical coherence tomography
07/25/2007CN101004346A Quasi-common path type feedback interferometer of laser in microchip
07/24/2007US7248907 Correlation of concurrent non-invasively acquired signals
07/24/2007US7248371 Optical image measuring apparatus
07/24/2007US7248370 Method to reduce background noise in a spectrum
07/24/2007US7248349 Exposure method for correcting a focal point, and a method for manufacturing a semiconductor device
07/24/2007US7248348 Detection method and device for detecting quality of optical element
07/24/2007US7248347 Focus processing with the distance of different target wheels
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