Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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08/23/2007 | WO2007093385A1 Optical surface sensor |
08/23/2007 | WO2007061591A3 Optical fiber interferometer with relaxed loop tolerance and qkd system using same |
08/23/2007 | US20070195329 Holographically compensated, self-referenced interferometer |
08/23/2007 | US20070195328 Wavelength measurement method based on combination of two signals in quadrature |
08/23/2007 | US20070195311 Device and method for non-contact scanning of contact lens and contact lens mold geometry |
08/23/2007 | DE102006037967B3 Michelson interferometer has beam splitter divides ray of light, coming from radiation source in two partial beam, which are guided mirror-symmetrical to straight line parallel to rotation axis |
08/23/2007 | DE102006023887B3 Transmitted-light microscopy method involves sequentially separating the pictures in light dispersion direction with poly-chromatic source of light to time point or with wavelength-variable source of light |
08/23/2007 | DE102006006302A1 Impact measuring device e.g. optical microphone, has semiconductor-laser diode that is arranged in proximity to optical lens and sends light beam, diaphragm that reflects part of light beam and photodiode that detects part of reflected beam |
08/23/2007 | CA2641943A1 Wavefront analysis method involving multilateral interferometry with frequency difference |
08/22/2007 | EP1819270A2 Polarization-sensitive optical coherence tomography |
08/22/2007 | CN101023338A Interferometric system with reference surfaces with a mirrored zone |
08/22/2007 | CN101023320A Interferometer comprising a mirror assembly for measuring an object to be measured |
08/22/2007 | CN101023319A Optical measuring device for measuring several surfaces of a measuring object |
08/22/2007 | CN101023318A Phase-resolved measurement for frequency-shifting interferometry |
08/22/2007 | CN101021408A 显微镜装置 Microscope |
08/21/2007 | US7259866 Semiconductor fabricating apparatus with function of determining etching processing state |
08/21/2007 | US7259865 Process control monitors for interferometric modulators |
08/21/2007 | US7259862 Low-coherence interferometry optical sensor using a single wedge polarization readout interferometer |
08/21/2007 | US7259861 Using a fixed-frequency of oscillation in an FTS system to measure scene inhomogeneity |
08/21/2007 | US7259860 Optical feedback from mode-selective tuner |
08/21/2007 | US7259859 Terahertz modulation spectrometer |
08/21/2007 | US7259851 Optical measurements of properties in substances using propagation modes of light |
08/21/2007 | US7259383 Optical transducer for detecting liquid level |
08/16/2007 | US20070188766 Interferometric apparatus |
08/16/2007 | US20070188765 Fourier-domain optical coherence tomography imager |
08/16/2007 | US20070188741 Method and apparatus for analysing an optical device |
08/16/2007 | US20070186653 Speed measurement |
08/16/2007 | DE202007007786U1 Prüfkörper für optische Messeinrichtungen Specimens for optical measuring devices |
08/15/2007 | EP1817543A1 High efficiency balanced detection interferometer |
08/15/2007 | EP1817542A1 Measuring elastic moduli of dielectric thin films using an optical metrology system |
08/15/2007 | EP0922198A4 Method and device for measuring the concentration of ions implanted in semiconductor materials |
08/15/2007 | CN1332423C Method to predict and identify defocus wafers and system thereof |
08/15/2007 | CN1332180C Physical quantity measuring method using brillouin optical fiber sensor |
08/15/2007 | CN101019000A Thickness measurement technique based on interferometry surface figure |
08/15/2007 | CN101017082A Nanometer precision real-time interferometric measurement device of object surface shape and measurement method therefor |
08/14/2007 | US7256895 Spherical scattering-light device for simultaneous phase and intensity measurements |
08/14/2007 | US7256894 Method and apparatus for performing second harmonic optical coherence tomography |
08/14/2007 | US7256893 Method and apparatus for measuring bandwidth of an optical spectrum output of a very small wavelength very narrow bandwidth high power laser |
08/14/2007 | US7256881 Systems and methods for inspection of ophthalmic lenses |
08/09/2007 | WO2007088789A1 Surface shape measuring method and device using the same |
08/09/2007 | WO2007059206A3 Spectral domain phase microscopy (sdpm) dual mode imaging systems and related methods |
08/09/2007 | WO2007028119A3 Control system and apparatus for use with ultra-fast laser |
08/09/2007 | US20070182969 Method for approximating an influence of an optical system on the state of polarization of optical radiation |
08/09/2007 | US20070182968 Quantum cryptographic communication apparatus |
08/09/2007 | US20070182967 Method and apparatus for precision measurement of phase shifts |
08/09/2007 | US20070182966 Method and apparatus for conducting heterodyne frequency-comb spectroscopy |
08/09/2007 | DE102004051962B4 Vorrichtung zur interferometrischen Messung der Raumkoordinaten eines Objektes Device for interferometric measurement of the spatial coordinates of an object |
08/08/2007 | EP1815291A1 Differential interferometric light modulator and image display device |
08/08/2007 | CN101013027A High-frequency error detecting apparatus and method for heavy caliber heavy relative aperture aspherical mirror |
08/08/2007 | CN101013025A Optical fiber interference type on-line micro-displacement measuring system using fibre grating |
08/08/2007 | CN101013024A Full optical fibre Fizeau interference confocal measuring apparatus |
08/08/2007 | CN101013022A Method for random error elimination in optical element interference sampling data |
08/07/2007 | US7254295 Optical fiber interferometer with relaxed loop tolerance and QKD system using the same |
08/07/2007 | US7254291 Optical interferometer |
08/07/2007 | US7254290 Enhanced waveguide metrology gauge collimator |
08/07/2007 | US7253907 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method |
08/07/2007 | US7253906 Polarization state frequency multiplexing |
08/07/2007 | US7253905 Determination and correction for laser induced CCD camera degradation |
08/02/2007 | WO2007087301A2 Interferometer system for monitoring an object |
08/02/2007 | WO2007087040A2 Demodulation method and apparatus for fiber optic sensors |
08/02/2007 | WO2006079011A8 Low coherence interferometry for detecting and characterizing plaques |
08/02/2007 | US20070177158 Method and apparatus for the two-dimensional mapping of the electro-optical coefficient |
08/02/2007 | US20070177157 Optical readhead |
08/02/2007 | US20070177156 Surface profiling method and apparatus |
08/02/2007 | US20070177153 Measuring Endoscope Apparatus |
08/02/2007 | US20070177152 Methods and systems for monitoring and obtaining information of at least one portion of a sample using conformal laser therapy procedures, and providing electromagnetic radiation thereto |
08/02/2007 | US20070177151 Interferometer for demodulating differential M-phase shift keying signal |
08/02/2007 | US20070177132 Method and Apparatus for Self-Referenced Dynamic Step and Scan Intra-Field Scanning Distortion |
08/02/2007 | DE102007003777A1 Messvorrichtung und Verfahren zur optischen Vermessung eines Objektes Measuring apparatus and method for optical measurement of an object |
08/01/2007 | EP1813962A1 Measuring device and method for optically measuring an object |
08/01/2007 | EP1812772A2 Miniature fourier transform spectrophotometer |
08/01/2007 | EP1590625A4 Interferometer |
08/01/2007 | EP1590624A4 Interferometer alignment |
07/31/2007 | US7251042 Lithographic apparatus, interferometer and device manufacturing method |
07/31/2007 | US7251041 Spatial filtering in interferometry |
07/31/2007 | US7251039 Low non-linear error displacement measuring interferometer |
07/31/2007 | US7251038 Light source stabilisation |
07/31/2007 | US7251037 Method to reduce background noise in a spectrum |
07/26/2007 | WO2007084849A1 System and methods for generating data using one or more endoscopic microscopy techniques |
07/26/2007 | WO2007084750A2 A fourier-domain optical coherence tomography imager |
07/26/2007 | WO2007044612A3 Imaging systems using unpolarized light and related methods and controllers |
07/26/2007 | WO2006138294A3 Fiber-optic assay apparatus based on phase-shift interferometry |
07/26/2007 | US20070171429 Method for calculating a model spectrum |
07/26/2007 | US20070171427 Measurement method |
07/26/2007 | US20070171426 Low non-linear error displacement measuring interferometer |
07/26/2007 | US20070171425 Interferometer system for monitoring an object |
07/26/2007 | US20070171424 Spectrally diverse apparatus and associated methods |
07/26/2007 | US20070171423 Light pulse multiprocessing unit, light pulse generator using the same, and light pulse multiprocessing method |
07/26/2007 | US20070171422 Two-Dimensional Spectral Shearing Interferometry for Ultrafast Pulse Characterization |
07/26/2007 | US20070170354 Light grid |
07/26/2007 | DE102006001329A1 Device for precise measurement of surface of test specimen, has scanning device with lens positioned relative to surface of specimen such that radiation source is arranged for radiation reflected to surface of specimen |
07/25/2007 | EP1809162A2 Optical apparatus and method for comprehensive eye diagnosis |
07/25/2007 | EP1244381B1 Retinal tracking assisted optical coherence tomography |
07/25/2007 | CN101004346A Quasi-common path type feedback interferometer of laser in microchip |
07/24/2007 | US7248907 Correlation of concurrent non-invasively acquired signals |
07/24/2007 | US7248371 Optical image measuring apparatus |
07/24/2007 | US7248370 Method to reduce background noise in a spectrum |
07/24/2007 | US7248349 Exposure method for correcting a focal point, and a method for manufacturing a semiconductor device |
07/24/2007 | US7248348 Detection method and device for detecting quality of optical element |
07/24/2007 | US7248347 Focus processing with the distance of different target wheels |