Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
10/2007
10/23/2007US7286212 Apparatus and method for measuring eccentricity of aspherical surface
10/23/2007US7286211 Methods and devices for measuring fundamental data of lenses
10/23/2007US7285766 Optical positioning device having shaped illumination
10/18/2007WO2007118129A1 Methods, arrangements and systems for polarization-sensitive optical frequency domain imaging of a sample
10/18/2007WO2007116679A1 Optical measurement instrument and optical measurement method
10/18/2007WO2007116388A1 A method and apparatus for determining distance between two spaced apart surfaces
10/18/2007WO2007116185A1 Method and power-assisted optic-fiber measuring device and gyro
10/18/2007US20070242275 Multigas monitoring and detection system
10/18/2007DE10297689B4 Verfahren und Gerät zur Bestimmung von atherosklerotischem Belag durch Messung von optischen Gewebeeigenschaften Method and apparatus for determination of atherosclerotic plaque by measurement of tissue optical properties
10/18/2007DE102006016053A1 Optical path length determining method, involves arranging reference surface in-front of surface of object such that portion, which is reflected by reference surface, forms interference pattern with another portion
10/18/2007DE10145912B4 Faseroptischer interferometrischer Sensor, Signalverarbeitungssystem eines faseroptischen interferometrischen Sensors und Speichermedium A fiber-optic interferometric sensor signal processing system of a fiber optic interferometric sensor, and storage medium
10/18/2007CA2649067A1 Method and power-assisted optic-fiber measuring device and gyro
10/17/2007EP1845335A2 Size difference measuring method and size difference measuring apparatus
10/17/2007EP1844294A1 Device for determining the position of spaced-apart areas in transparent and/or diffuse objects
10/17/2007EP1247070B1 Apparatus and methods for surface contour measurement
10/17/2007CN101055677A Michelson interferometer reflection observing screen
10/17/2007CN101055430A Lithographic apparatus, lens interferometer and device manufacturing method
10/17/2007CN101055167A Beam-scanning interference type nano surface tri-dimensional on-line measuring system and method
10/17/2007CN100343725C Method for aligning optical system by hologram and apparatus thereof
10/16/2007WO2007140221A2 Airway adaptor with optical pressure transducer and method of manufacturing a sensor component
10/16/2007US7283692 Simultaneous interrogation of multi wavelength-modulated fiber optical sensors by modulating an arrayed waveguide grating based demultiplexer
10/16/2007US7283252 Measuring method and apparatus using interference, exposure method and apparatus using the same, and device fabrication method
10/16/2007US7283251 Black fringe wavefront sensor
10/16/2007US7283250 Measurement of object deformation with optical profiler
10/16/2007US7283248 Multi-axis interferometers and methods and systems using multi-axis interferometers
10/16/2007US7283247 Optical probe system
10/16/2007US7283216 Distributed fiber sensor based on spontaneous brilluoin scattering
10/16/2007US7282716 Digital imaging assembly and methods thereof
10/16/2007US7282698 System and method for monitoring a well
10/11/2007WO2007093748A3 Wavefront analysis method involving multilateral interferometry with frequency difference
10/11/2007WO2007065670A3 Interferometric sample measurement
10/11/2007US20070236704 Optical Displacement Sensor Comprising a Wavelength-tunable Optical Source
10/11/2007US20070236700 Methods, arrangements and systems for polarization-sensitive optical frequency domain imaging of a sample
10/11/2007US20070236699 Optical tomography method & device
10/11/2007US20070236698 Signal analysis using multi-mode, common-path interferometry
10/11/2007US20070236697 Compact, hand-held Raman spectrometer microsystem on a chip
10/11/2007US20070236684 Reflection-testing device and method for use thereof
10/11/2007US20070236683 Reflection-testing device and method for use thereof
10/11/2007US20070234786 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
10/10/2007EP1842027A2 Hologram and method of manufacturing an optical element using a hologram
10/10/2007CN200959182Y Integrated semiconductor laser Michelson interferometer
10/10/2007CN200958977Y Portable interference measuring equipment based on monocolor LED sided light source
10/10/2007CN101051107A Automatic alignment method for light cone and CCD coupling
10/10/2007CN101050942A Image pickup apparatus equipped with a microscope and size measuring apparatus
10/10/2007CN101050941A Sub nano grade double frequency laser interferometer signal subdivision system
10/10/2007CN101050940A High precision double frequency laser interferometer signal subdivision system
10/10/2007CN101049230A Ocular fundus observing device
10/10/2007CN100342400C System and method for detecting differences between complex images
10/09/2007US7280225 Stage apparatus and control method including first and second measurement systems for measuring a stage position and a switching unit for switching between the measurement systems
10/09/2007US7280224 Interferometry systems and methods of using interferometry systems
10/09/2007US7280223 Interferometry systems and methods of using interferometry systems
10/09/2007US7280222 Compact optical apparatus
10/09/2007US7280221 High efficiency low coherence interferometry
10/09/2007US7280220 Physical quantity measuring method and device therefor
10/09/2007US7280219 System for monitoring sealing wear
10/09/2007US7280217 Interferometer utilizing a rotating rigid structure
10/09/2007US7280216 Method and apparatus for determining the wavelength of an input light beam
10/09/2007US7280193 Distinguishing mirror speckle from target images in weak signal applications
10/09/2007US7280192 Lens meter
10/09/2007US7280191 Lens meter
10/09/2007US7280187 Method for resolving phase in electronic speckle interferometry
10/04/2007WO2007111812A2 High current measurement with temperature compensation
10/04/2007WO2007111508A1 Polarization nulling interferometry
10/04/2007US20070229849 Bandwidth measuring device for high pulse repetition rate pulsed laser
10/04/2007US20070229848 Measurement method and apparatus, exposure apparatus
10/04/2007US20070229845 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method
10/04/2007US20070229843 Detector for interferometric distance measurement
10/04/2007US20070229842 Optical Interferometer
10/04/2007US20070229841 Detector configuration for interferometric distance measurement
10/04/2007US20070229840 Interferometric measuring device
10/04/2007US20070229839 Sensor objective
10/04/2007US20070229838 Wavelength calibration in a fiber optic gyroscope
10/04/2007US20070229837 Lithographic apparatus and device manufacturing method using overlay measurement quality indication
10/04/2007US20070229803 Measurement method and apparatus, exposure apparatus, exposure method, and adjusting method
10/04/2007DE102006015387A1 Interferometric measuring device for e.g. measuring surface or volume of device-under-test, has object arm and reference arm formed for line-like focusing of object beam on object surface and reference e.g. mirror
10/04/2007DE102006014766A1 Interferometric measuring device for e.g. optical distance measurement in quality control, has reference and modulation interferometers, and dispersive optical component that is arranged in one of optical paths of reference interferometer
10/04/2007DE102006014765A1 Sensor objective for interferometric measuring instrument, has deflection unit with two optical units, where deflection angle of beam deflected to system longitudinal axis is adjusted by mutual shifting and/or twisting of optical units
10/04/2007CA2646687A1 Polarization nulling interferometry
10/03/2007EP1840502A1 Optical interferometer for measuring changes in thickness
10/03/2007EP1839034A1 Cross-dispersed spectrometer in a spectral domain optical coherence tomography system
10/03/2007EP1839013A2 Anodizing system with a coating thickness monitor and an anodized product
10/03/2007EP1839012A2 Methods, systems and computer program products for characterizing structures based on interferometric phase data
10/03/2007EP1838213A1 Method of motion correction in optical coherence tomography imaging
10/03/2007EP1092124B1 Method and apparatus for ultrasonic laser testing
10/03/2007CN101046370A Phase expansion method based on rotary iteration
10/02/2007US7277186 Method for the interferometric measurement of non-rotationally symmetric wavefront errors
10/02/2007US7277184 Method of characterization of liquid crystal cell
10/02/2007US7277183 Vibration resistant interferometry
10/02/2007US7277182 Apparatus for polarization-specific examination, optical imaging system, and calibration method
10/02/2007US7277181 Interferometric apparatus and method for surface profile detection
10/02/2007US7277179 Magneto-optical sensors
10/02/2007US7277178 Coherent photothermal interferometric spectroscopy system and method for chemical sensing
09/2007
09/27/2007WO2007109622A2 Clutter rejection filters for optical doppler tomography
09/27/2007WO2007109616A2 System and method to measure nano-scale stress and strain in materials
09/27/2007WO2007109336A2 Apparatus for continuous readout of fabry-perot fiber optic sensor
09/27/2007WO2007109127A2 Methods, systems, and computer program products for performng real-time quadrature projection based fourier domain optical coherence tomography
09/27/2007US20070223005 Polarising Interferometer
09/27/2007US20070223004 Optical Device for Measuring a Doppler Frequency Shift
09/27/2007US20070223003 System and method for optical sensor interrogation
09/27/2007US20070223002 High current measurement with temperature compensation
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