Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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04/08/2008 | US7355715 Temperature measuring apparatus, temperature measurement method, temperature measurement system, control system and control method |
04/08/2008 | US7355714 Reconfigurable MEMS fabry-perot tunable matrix filter systems and methods |
04/08/2008 | US7355684 Interferometric signal conditioner for measurement of the absolute length of gaps in a fiber optic Fabry-Perot interferometer |
04/08/2008 | US7354772 laser resonating cavity containing filter which changes optical reflectance in response to reaction occurring in assay; no direct exposure of sample to laser beam |
04/03/2008 | WO2008039660A2 In vivo structural and flow imaging |
04/03/2008 | WO2008037439A1 Method and device for generating a synthetic wavelength |
04/03/2008 | WO2008010996A3 Methods, systems and computer program products for removing undesired artifacts in fourier domain optical coherence tomography (fdoct) systems using continuous phase modulation and related phase modulators |
04/03/2008 | US20080079945 Apparatus and Method to Quantify Laser Head Reference Signal Reliability |
04/03/2008 | DE102006045838A1 Microscope for investigation of masks with different thickness, has illumination device, which has light source, and has illumination optical system that illuminates mask to be examined with illuminating radiation |
04/03/2008 | CA2664210A1 In vivo structural and flow imaging |
04/03/2008 | CA2663990A1 Method and device for generating a synthetic wavelength |
04/02/2008 | EP1906137A1 Method and device for generating a synthetic wavelength |
04/02/2008 | EP1905060A2 Control system and apparatus for use with ultra-fast laser |
04/02/2008 | EP1399709B1 Photosensor for a transmitted light method used for detecting the direction of movement of intensity maxima and intensity minima of an optical standing wave |
04/02/2008 | CN201043884Y Full optical fiber Fizeau interfere confocal measuring apparatus |
04/01/2008 | US7352941 Method and apparatus for electromagnetic resonance and amplification using negative index material |
04/01/2008 | US7352476 Device for detecting atmospheric turbulence |
04/01/2008 | US7352475 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method |
04/01/2008 | US7352473 Lithographic apparatus, device manufacturing method, and computer program |
04/01/2008 | US7352472 Lithographic apparatus, device manufacturing method, and method for determining z-displacement |
04/01/2008 | US7352470 Fourier transform spectrometry with a single-aperture interferometer |
04/01/2008 | US7352469 Quantum resonance analytical instrument |
04/01/2008 | US7352453 Method for process optimization and control by comparison between 2 or more measured scatterometry signals |
04/01/2008 | US7352452 Method and apparatus for setting optical imaging properties by means of radiation treatment |
04/01/2008 | US7352451 System method and structure for determining focus accuracy |
03/27/2008 | WO2008035389A2 Phase-sensitive low-coherence interferometry apparatus |
03/27/2008 | WO2005114095A3 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry |
03/27/2008 | US20080075404 Aligned embossed diaphragm based fiber optic sensor |
03/27/2008 | US20080074672 High Resolution position coder |
03/27/2008 | US20080074617 Method and Apparatus for Displaying Oct Cross Sections |
03/27/2008 | DE102006042157A1 Verfahren und Mikroskopiersystem zum Scannen einer Probe Method and microscopy system for scanning a sample |
03/25/2008 | US7349102 Methods and apparatus for reducing error in interferometric imaging measurements |
03/25/2008 | US7349101 Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby |
03/25/2008 | US7349100 Recording multiple spatially-heterodyned direct to digital holograms in one digital image |
03/25/2008 | US7349098 Simultaneous beam-focus and coherence-gate tracking for real-time optical coherence tomography |
03/25/2008 | US7349097 Interferometric determination of a transfer function of a device under test |
03/25/2008 | US7349078 Characterization of lenses |
03/25/2008 | US7349072 Lithographic apparatus and device manufacturing method |
03/25/2008 | US7348563 Tomography imaging apparatus |
03/20/2008 | WO2008034070A2 Improved method for biomolecular detection and system thereof |
03/20/2008 | WO2008033218A1 Apparatus for caries detection |
03/20/2008 | WO2008031826A1 Highly compact acquisition instrument for operation in space with one or more deployable reflectors |
03/20/2008 | WO2007008615A3 Control system and apparatus for use with ultra-fast laser |
03/20/2008 | US20080068615 Improved method for biomolecular detection and system thereof |
03/20/2008 | US20080068614 Methods and systems for interferometric analysis of surfaces and related applications |
03/20/2008 | US20080068611 Method and system for measuring patterned structures |
03/20/2008 | US20080068595 Measurement Method, Exposure Method, and Device Manufacturing Method |
03/19/2008 | EP1901027A2 Exposure apparatus and device manufacturing method |
03/19/2008 | EP1899675A1 Fourier domain optical coherence tomography employing a swept multi-wavelength laser and a multi-channel receiver |
03/19/2008 | CN100375885C High-resolution real-time non-destructive detection system and method |
03/18/2008 | US7346261 Image display apparatus |
03/18/2008 | US7346093 DUV light source optical element improvements |
03/18/2008 | US7345771 Apparatus and method for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks |
03/18/2008 | US7345769 Load dependent analyzing optical components |
03/18/2008 | US7345768 Method and device for measuring the phase and amplitude of ultrashort light pulses |
03/13/2008 | WO2008030580A2 Synchronous frequency-shift mechanism in fizeau interferometer |
03/13/2008 | US20080065350 Profiling complex surface structures using scanning interferometry |
03/13/2008 | US20080062433 Precise rotational motion sensor |
03/13/2008 | US20080062430 Method and System for Determining the Position and Alignment of a Surface of an Object in Relation to a Laser Beam |
03/13/2008 | US20080062428 Synchronous frequency-shift mechanism in Fizeau interferometer |
03/13/2008 | US20080062427 Exposure apparatus and device manufacturing method |
03/13/2008 | US20080062426 Infrared-type gas detector |
03/13/2008 | US20080062410 Method And Apparatus For Locally Measuring Refractive Characteristics Of A Lens In One Or Several Specific Points Of Said Lens |
03/13/2008 | US20080062409 Image Processing Device for Detecting Chromatic Difference of Magnification from Raw Data, Image Processing Program, and Electronic Camera |
03/13/2008 | DE10341594B4 Anordnung zur hochgenauen Positionierung und Messung von auf Objekttischen angeordneten Ojekten Arrangement for high accuracy positioning and measurement of arrayed on object tables ojects |
03/13/2008 | DE102005025414B4 Verfahren und Vorrichtung zum Prüfen einer axialen Position eines Piezoaktors in einem Gehäuse während eines Betriebs des Piezoaktors A method and apparatus for testing an axial position of a piezoelectric actuator in a housing during an operation of the piezoelectric actuator |
03/12/2008 | EP1444758A4 System and method for measuring stimuli using vcsel |
03/12/2008 | CN101140186A Polarization phase shifting double shearing interference wave face measuring apparatus and inspect method thereof |
03/11/2008 | US7342665 System and method for control of paint thickness |
03/11/2008 | US7342664 Scanning double-beam interferometer |
03/06/2008 | WO2008028138A2 Method and apparatus for high frequency optical sensor interrogation |
03/06/2008 | WO2007148310A3 Apparatus for optical frequency domain tomography with adjusting system |
03/06/2008 | US20080055606 Apparatus and method for inspecting a pattern and method for manufacturing a semiconductor device |
03/06/2008 | US20080055605 Holographic storage system using destructive interference for pixel detection |
03/05/2008 | CN101135551A Adjustable frequency difference two-frequency laser back-feed nano measuring ruler for frequency stabilizing |
03/05/2008 | CN100373270C Holographic phasic difference amplifying and reconfiguration unit |
03/05/2008 | CN100373141C Double loop two dimension shearing interference detector |
03/05/2008 | CN100373127C Lens eccentric measuring method and its system |
03/04/2008 | US7340107 Shadow-free 3D and 2D measurement system and method |
03/04/2008 | US7339683 Method of measuring the movement of an input device |
03/04/2008 | US7339682 Heterodyne reflectometer for film thickness monitoring and method for implementing |
03/04/2008 | US7339680 Temperature-stabilized sensor coil and current sensor |
03/04/2008 | US7339679 Interferometric measuring device utilizing a slanted probe filter |
03/04/2008 | US7339678 Method and system of using odd harmonics for phase generated carrier homodyne |
03/04/2008 | US7339658 Device and method for measuring surface topography and wave aberration of a lens system, in particular an eye |
02/28/2008 | WO2008024741A2 Common path time domain optical coherence reflectometry/tomography device |
02/28/2008 | WO2008023217A1 Photorefractive interferometer |
02/28/2008 | WO2007027504B1 Method and apparatus for performing enrollment of 2d and 3d face biometrics |
02/28/2008 | US20080049234 Colorimetric three-dimensional microscopy |
02/28/2008 | US20080049232 Apparatus and methods for enhancing optical coherence tomography imaging using volumetric filtering techniques |
02/28/2008 | US20080049231 Automatic set-up for instrument functions |
02/28/2008 | US20080049230 Mems fiber optic microphone |
02/28/2008 | US20080049229 Common path time domain optical coherence reflectometry/tomography device |
02/28/2008 | US20080049228 Fabry-perot interferometer array |
02/28/2008 | DE102006001329B4 Verfahren und Vorrichtung zur hochgenauen Messung der Oberfläche eines Prüflings Method and device for highly accurate measurement of the surface of a test specimen |
02/28/2008 | CA2661255A1 Photorefractive interferometer |
02/27/2008 | EP1892727A1 Measuring apparatus |
02/27/2008 | EP1892501A2 Colorimetric three-dimensional microscopy |
02/27/2008 | EP1892500A2 Optical-axis deflection type laser interferometer, calibration method thereof, correction method thereof, and measuring method thereof |
02/27/2008 | EP1891395A2 Fiber-optic assay apparatus based on phase-shift interferometry |