Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
04/2008
04/08/2008US7355715 Temperature measuring apparatus, temperature measurement method, temperature measurement system, control system and control method
04/08/2008US7355714 Reconfigurable MEMS fabry-perot tunable matrix filter systems and methods
04/08/2008US7355684 Interferometric signal conditioner for measurement of the absolute length of gaps in a fiber optic Fabry-Perot interferometer
04/08/2008US7354772 laser resonating cavity containing filter which changes optical reflectance in response to reaction occurring in assay; no direct exposure of sample to laser beam
04/03/2008WO2008039660A2 In vivo structural and flow imaging
04/03/2008WO2008037439A1 Method and device for generating a synthetic wavelength
04/03/2008WO2008010996A3 Methods, systems and computer program products for removing undesired artifacts in fourier domain optical coherence tomography (fdoct) systems using continuous phase modulation and related phase modulators
04/03/2008US20080079945 Apparatus and Method to Quantify Laser Head Reference Signal Reliability
04/03/2008DE102006045838A1 Microscope for investigation of masks with different thickness, has illumination device, which has light source, and has illumination optical system that illuminates mask to be examined with illuminating radiation
04/03/2008CA2664210A1 In vivo structural and flow imaging
04/03/2008CA2663990A1 Method and device for generating a synthetic wavelength
04/02/2008EP1906137A1 Method and device for generating a synthetic wavelength
04/02/2008EP1905060A2 Control system and apparatus for use with ultra-fast laser
04/02/2008EP1399709B1 Photosensor for a transmitted light method used for detecting the direction of movement of intensity maxima and intensity minima of an optical standing wave
04/02/2008CN201043884Y Full optical fiber Fizeau interfere confocal measuring apparatus
04/01/2008US7352941 Method and apparatus for electromagnetic resonance and amplification using negative index material
04/01/2008US7352476 Device for detecting atmospheric turbulence
04/01/2008US7352475 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method
04/01/2008US7352473 Lithographic apparatus, device manufacturing method, and computer program
04/01/2008US7352472 Lithographic apparatus, device manufacturing method, and method for determining z-displacement
04/01/2008US7352470 Fourier transform spectrometry with a single-aperture interferometer
04/01/2008US7352469 Quantum resonance analytical instrument
04/01/2008US7352453 Method for process optimization and control by comparison between 2 or more measured scatterometry signals
04/01/2008US7352452 Method and apparatus for setting optical imaging properties by means of radiation treatment
04/01/2008US7352451 System method and structure for determining focus accuracy
03/2008
03/27/2008WO2008035389A2 Phase-sensitive low-coherence interferometry apparatus
03/27/2008WO2005114095A3 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry
03/27/2008US20080075404 Aligned embossed diaphragm based fiber optic sensor
03/27/2008US20080074672 High Resolution position coder
03/27/2008US20080074617 Method and Apparatus for Displaying Oct Cross Sections
03/27/2008DE102006042157A1 Verfahren und Mikroskopiersystem zum Scannen einer Probe Method and microscopy system for scanning a sample
03/25/2008US7349102 Methods and apparatus for reducing error in interferometric imaging measurements
03/25/2008US7349101 Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby
03/25/2008US7349100 Recording multiple spatially-heterodyned direct to digital holograms in one digital image
03/25/2008US7349098 Simultaneous beam-focus and coherence-gate tracking for real-time optical coherence tomography
03/25/2008US7349097 Interferometric determination of a transfer function of a device under test
03/25/2008US7349078 Characterization of lenses
03/25/2008US7349072 Lithographic apparatus and device manufacturing method
03/25/2008US7348563 Tomography imaging apparatus
03/20/2008WO2008034070A2 Improved method for biomolecular detection and system thereof
03/20/2008WO2008033218A1 Apparatus for caries detection
03/20/2008WO2008031826A1 Highly compact acquisition instrument for operation in space with one or more deployable reflectors
03/20/2008WO2007008615A3 Control system and apparatus for use with ultra-fast laser
03/20/2008US20080068615 Improved method for biomolecular detection and system thereof
03/20/2008US20080068614 Methods and systems for interferometric analysis of surfaces and related applications
03/20/2008US20080068611 Method and system for measuring patterned structures
03/20/2008US20080068595 Measurement Method, Exposure Method, and Device Manufacturing Method
03/19/2008EP1901027A2 Exposure apparatus and device manufacturing method
03/19/2008EP1899675A1 Fourier domain optical coherence tomography employing a swept multi-wavelength laser and a multi-channel receiver
03/19/2008CN100375885C High-resolution real-time non-destructive detection system and method
03/18/2008US7346261 Image display apparatus
03/18/2008US7346093 DUV light source optical element improvements
03/18/2008US7345771 Apparatus and method for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks
03/18/2008US7345769 Load dependent analyzing optical components
03/18/2008US7345768 Method and device for measuring the phase and amplitude of ultrashort light pulses
03/13/2008WO2008030580A2 Synchronous frequency-shift mechanism in fizeau interferometer
03/13/2008US20080065350 Profiling complex surface structures using scanning interferometry
03/13/2008US20080062433 Precise rotational motion sensor
03/13/2008US20080062430 Method and System for Determining the Position and Alignment of a Surface of an Object in Relation to a Laser Beam
03/13/2008US20080062428 Synchronous frequency-shift mechanism in Fizeau interferometer
03/13/2008US20080062427 Exposure apparatus and device manufacturing method
03/13/2008US20080062426 Infrared-type gas detector
03/13/2008US20080062410 Method And Apparatus For Locally Measuring Refractive Characteristics Of A Lens In One Or Several Specific Points Of Said Lens
03/13/2008US20080062409 Image Processing Device for Detecting Chromatic Difference of Magnification from Raw Data, Image Processing Program, and Electronic Camera
03/13/2008DE10341594B4 Anordnung zur hochgenauen Positionierung und Messung von auf Objekttischen angeordneten Ojekten Arrangement for high accuracy positioning and measurement of arrayed on object tables ojects
03/13/2008DE102005025414B4 Verfahren und Vorrichtung zum Prüfen einer axialen Position eines Piezoaktors in einem Gehäuse während eines Betriebs des Piezoaktors A method and apparatus for testing an axial position of a piezoelectric actuator in a housing during an operation of the piezoelectric actuator
03/12/2008EP1444758A4 System and method for measuring stimuli using vcsel
03/12/2008CN101140186A Polarization phase shifting double shearing interference wave face measuring apparatus and inspect method thereof
03/11/2008US7342665 System and method for control of paint thickness
03/11/2008US7342664 Scanning double-beam interferometer
03/06/2008WO2008028138A2 Method and apparatus for high frequency optical sensor interrogation
03/06/2008WO2007148310A3 Apparatus for optical frequency domain tomography with adjusting system
03/06/2008US20080055606 Apparatus and method for inspecting a pattern and method for manufacturing a semiconductor device
03/06/2008US20080055605 Holographic storage system using destructive interference for pixel detection
03/05/2008CN101135551A Adjustable frequency difference two-frequency laser back-feed nano measuring ruler for frequency stabilizing
03/05/2008CN100373270C Holographic phasic difference amplifying and reconfiguration unit
03/05/2008CN100373141C Double loop two dimension shearing interference detector
03/05/2008CN100373127C Lens eccentric measuring method and its system
03/04/2008US7340107 Shadow-free 3D and 2D measurement system and method
03/04/2008US7339683 Method of measuring the movement of an input device
03/04/2008US7339682 Heterodyne reflectometer for film thickness monitoring and method for implementing
03/04/2008US7339680 Temperature-stabilized sensor coil and current sensor
03/04/2008US7339679 Interferometric measuring device utilizing a slanted probe filter
03/04/2008US7339678 Method and system of using odd harmonics for phase generated carrier homodyne
03/04/2008US7339658 Device and method for measuring surface topography and wave aberration of a lens system, in particular an eye
02/2008
02/28/2008WO2008024741A2 Common path time domain optical coherence reflectometry/tomography device
02/28/2008WO2008023217A1 Photorefractive interferometer
02/28/2008WO2007027504B1 Method and apparatus for performing enrollment of 2d and 3d face biometrics
02/28/2008US20080049234 Colorimetric three-dimensional microscopy
02/28/2008US20080049232 Apparatus and methods for enhancing optical coherence tomography imaging using volumetric filtering techniques
02/28/2008US20080049231 Automatic set-up for instrument functions
02/28/2008US20080049230 Mems fiber optic microphone
02/28/2008US20080049229 Common path time domain optical coherence reflectometry/tomography device
02/28/2008US20080049228 Fabry-perot interferometer array
02/28/2008DE102006001329B4 Verfahren und Vorrichtung zur hochgenauen Messung der Oberfläche eines Prüflings Method and device for highly accurate measurement of the surface of a test specimen
02/28/2008CA2661255A1 Photorefractive interferometer
02/27/2008EP1892727A1 Measuring apparatus
02/27/2008EP1892501A2 Colorimetric three-dimensional microscopy
02/27/2008EP1892500A2 Optical-axis deflection type laser interferometer, calibration method thereof, correction method thereof, and measuring method thereof
02/27/2008EP1891395A2 Fiber-optic assay apparatus based on phase-shift interferometry
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