| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
|---|
| 06/17/2008 | US7388673 Heterodyne optical spectrum analyzer |
| 06/17/2008 | US7388672 High efficiency balanced detection interferometer |
| 06/17/2008 | US7388669 Method of generating interferometric information |
| 06/17/2008 | US7388668 Phase sensitive heterodyne coherent anti-Stokes Raman scattering micro-spectroscopy and microscopy |
| 06/17/2008 | CA2343780C Optical phase detector |
| 06/12/2008 | WO2008070782A2 Contact lens blister packages and methods for automated inspection of hydrated contact lenses |
| 06/12/2008 | WO2008068497A2 Multiple beam source for a multi-beam interferometer and multi-beam interferometer |
| 06/12/2008 | WO2008018909A3 Laser energy calibration based on optical measurement |
| 06/12/2008 | US20080140328 Optical tomographic imaging apparatus |
| 06/12/2008 | US20080137098 Method of multiple wavelength interferometry |
| 06/12/2008 | US20080137094 Optical tomographic imaging apparatus |
| 06/12/2008 | US20080137093 APPARATUS AND METHOD FOR GENERATING THz WAVE BY HETERODYNING OPTICAL AND ELECTRICAL WAVES |
| 06/12/2008 | US20080137092 System and method for integrated measurement using optical sensors |
| 06/12/2008 | US20080137090 Hologram and Method of Manufacturing an Optical Element Using a Hologram |
| 06/12/2008 | US20080137077 Defect correction based on "virtual" lenslets |
| 06/12/2008 | US20080137076 Contact lens blister packages and methods for automated inspection of hydrated contact lenses |
| 06/12/2008 | DE112006002170T5 Laser-Entfernungsmessgerät Laser Distance Meter |
| 06/12/2008 | DE10057539B4 Interferometrische Messvorrichtung Interferometric measurement device |
| 06/12/2008 | CA2670695A1 Multiple beam source for a multi-beam interferometer and multi-beam interferometer |
| 06/11/2008 | EP1929944A2 Ear canal hologram for hearing devices |
| 06/11/2008 | EP1929249A1 Single piece fabry-perot optical sensor and method of manufacturing the same |
| 06/11/2008 | EP1928306A1 Arrangements and methods for providing multimodality microscopic imaging of one or more biological structures |
| 06/11/2008 | EP1928305A1 Method and apparatus for optical imaging via spectral encoding |
| 06/11/2008 | EP1273903B1 Optical interference tomographic image observing apparatus |
| 06/10/2008 | US7385707 Surface profiling apparatus |
| 06/10/2008 | US7385706 Method and apparatus for determining the nonlinear properties of devices and fibers |
| 06/10/2008 | US7385705 Imaging spectroscopy based on multiple pan-chromatic images obtained from an imaging system with an adjustable point spread function |
| 06/10/2008 | US7385704 Two-dimensional spectral cameras and methods for capturing spectral information using two-dimensional spectral cameras |
| 06/05/2008 | WO2008065973A1 Method for finishing surface of preliminary polished glass substrate |
| 06/05/2008 | WO2008039660A3 In vivo structural and flow imaging |
| 06/05/2008 | WO2007011970A3 Methods and systems for ultra-precise measurement and control of object motion in six degrees of freedom by projection and measurement of interference fringes |
| 06/05/2008 | US20080130108 Endoscope assembly with a polarizing filter |
| 06/05/2008 | US20080130012 Device and method for the determination of imaging errors and microlithography projection exposure system |
| 06/05/2008 | US20080130009 Multiple tile calibration method for color sensors |
| 06/05/2008 | US20080130007 External beam expander |
| 06/05/2008 | US20080129984 Inspection of optical elements |
| 06/05/2008 | DE102006055070A1 Method for interferometric determination of deviation of actual shape of effective reflection surface of test object from reference shape of effective reflection surface, involves producing electromagnetic light radiation |
| 06/04/2008 | CN101191854A Optical multilayer reflector and fabry-perot interferometer with the same |
| 06/03/2008 | US7382470 Interferometric measuring device |
| 06/03/2008 | US7382469 Exposure apparatus for manufacturing semiconductor device, method of exposing a layer of photoresist, and method of detecting vibrations and measuring relative position of substrate during an exposure process |
| 06/03/2008 | US7382468 Interferometer system, signal processing method in interferometer system, and stage using signal processing |
| 06/03/2008 | US7382467 Interferometric measuring device |
| 06/03/2008 | US7382466 Coating for reflective optical components |
| 06/03/2008 | US7382465 Optical vibrometer |
| 06/03/2008 | US7382464 Apparatus and method for combined optical-coherence-tomographic and confocal detection |
| 06/03/2008 | US7382447 Method for determining lithographic focus and exposure |
| 06/03/2008 | US7382446 Aberration measuring method |
| 05/29/2008 | US20080123105 Segmented Grating Alignment Device |
| 05/29/2008 | US20080123104 High selectivity band-pass interferometer with tuning capabilities |
| 05/29/2008 | US20080123102 Apparatus and method for measuring spacing |
| 05/29/2008 | US20080123101 Method For Forming Images, Method For Testing Electronic Devices; And Test Apparatus, Test Chamber And Test System |
| 05/29/2008 | US20080123100 Optical multilayer mirror and fabry-perot interferometer having the same |
| 05/29/2008 | US20080123099 Photothermal conversion measuring instrument |
| 05/29/2008 | US20080123098 Method and system for device identification |
| 05/29/2008 | US20080123086 Projection Optical System, Method of Manufacturing Projection Optical System, Exposure Apparatus, and Exposure Method |
| 05/29/2008 | US20080123085 Assessing A Network |
| 05/29/2008 | DE112006001970T5 Optischer Kodierer mit geneigten optischen Detektorelementen zur Unterdrückung von Harmonischen An optical encoder with inclined optical detector elements for harmonic suppression |
| 05/29/2008 | DE102007051537A1 Optischer Mehrschichtspiegel und Fabry-Perot-Interferometer, das diesen enthält A multilayer optical mirror and Fabry-Perot interferometer, containing that |
| 05/29/2008 | DE102006057606A1 Test sample's e.g. concave test sample, optically smooth surface e.g. free form surface, laminar measurement method, involves filtering object waves, which are reflected from surface, by aperture stop in Fourier plane of imaging lens |
| 05/28/2008 | EP1925928A1 Photothermal conversion measuring instrument |
| 05/28/2008 | EP1925907A1 Ultra precision profile measuring method |
| 05/28/2008 | EP1925253A1 Optical Tomograph |
| 05/28/2008 | EP1523657B1 Delaying interferometer |
| 05/28/2008 | CN100390657C Optical object discriminating device |
| 05/27/2008 | US7379613 Optimized image processing for wavefront coded imaging systems |
| 05/27/2008 | US7379188 Phase shift interferometer |
| 05/27/2008 | US7379187 Detector configuration for interferometric distance measurement |
| 05/27/2008 | US7379186 Chirp indicator of ultrashort optical pulse |
| 05/27/2008 | US7379171 Optical object distance simulation device |
| 05/27/2008 | US7379170 Apparatus and method for characterizing an image system in lithography projection tool |
| 05/22/2008 | WO2008059487A1 Multi-phase interferometer |
| 05/22/2008 | WO2008059446A1 Self-mixing optical coherence detector without an external beamsplitter |
| 05/22/2008 | WO2008030923A3 Common path systems and methods for frequency domain and time domain optical coherency tomography |
| 05/22/2008 | US20080117439 Optical structure, optical navigation system and method of estimating motion |
| 05/22/2008 | US20080117436 Method of manufacturing an optical element |
| 05/22/2008 | US20080117435 Coherence Spectrometry Devices |
| 05/22/2008 | US20080117434 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method |
| 05/22/2008 | US20080117433 Optical air data system |
| 05/22/2008 | US20080117429 Interferometer Having a Mirror System for Measuring a Measured Object |
| 05/22/2008 | US20080117428 Multi-Axis Interferometers and Methods and Systems Using Multi-Axis Interferometers |
| 05/22/2008 | US20080117427 Optical tomograph |
| 05/22/2008 | US20080117425 Hexagonal site line scanning method and system |
| 05/22/2008 | US20080117424 Optical tomograph |
| 05/22/2008 | US20080115562 Method for eliminating error in camera having angular velocity detection system |
| 05/21/2008 | EP1922990A2 Optical tomograph |
| 05/21/2008 | CN201063081Y Scanning standard utensil for temperature compensation |
| 05/21/2008 | CN101183042A Point diffraction interferometer |
| 05/21/2008 | CN101182989A Double microscopic digital speckle strain measurement method |
| 05/20/2008 | US7375824 Interferometer for measurement of dome-like objects |
| 05/20/2008 | US7375823 Interferometry systems and methods of using interferometry systems |
| 05/20/2008 | US7375820 Interference measuring apparatus for detecting a plurality of stable phase difference signals |
| 05/20/2008 | US7375819 System and method for generating beams of light using an anisotropic acousto-optic modulator |
| 05/20/2008 | US7375818 Optical tomography system |
| 05/20/2008 | US7375817 Counting signal processing method for fiber optic interferometric sensor |
| 05/20/2008 | US7375805 Reticle and optical characteristic measuring method |
| 05/20/2008 | US7375360 Light device of arranging thin film inspection sensor array, and method and apparatus for arranging sensor array using the same |
| 05/20/2008 | CA2401983C Folded sagnac sensor array |
| 05/15/2008 | WO2007136681A3 Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system |
| 05/15/2008 | US20080111994 Autofocus methods and devices for lithography |
| 05/15/2008 | US20080111989 Transparent material inspection system |