| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
|---|
| 04/03/2007 | US7197931 Sensors for monitoring structural health conditions |
| 03/29/2007 | WO2007033851A1 Interferometric determination of a layer thickness |
| 03/29/2007 | US20070070357 Self referencing heterodyne reflectometer and method for implementing |
| 03/29/2007 | US20070070356 Fiber-Optic Assay Apparatus Based on Phase-Shift Interferometry |
| 03/29/2007 | US20070070354 Electro-Optic Imaging Fourier Transform Spectrometer |
| 03/29/2007 | US20070070353 Components for optical qubits in the radio frequency basis |
| 03/29/2007 | US20070070352 Device and method for the non-invasive detection and measurement of the properties of a medium |
| 03/29/2007 | US20070070347 Method and apparatus for CMOS imagers and spectroscopy |
| 03/29/2007 | DE102006016132A1 Interferometric measuring apparatus for measuring multiple layer structures using optimal selection of the input beam length |
| 03/29/2007 | DE102006016131A1 Interferometrische Messvorrichtung Interferometric measurement device |
| 03/29/2007 | DE102005045512A1 Interferometric determination apparatus e.g. for measuring layer thickness of partly transparent layers on substrates, has scanner which automatically scans layers in vertical direction |
| 03/29/2007 | DE10050749B4 Laserinterferenzeinrichtung Laser interference device |
| 03/28/2007 | CN1937458A Apparatus and method for characterizing pulsed optical signals |
| 03/28/2007 | CN1307411C Interferometer and method for compensation of dispersion or increase in spectral resolution of such an interferometer |
| 03/28/2007 | CN1307404C Interference type optical fiber gyroscope based on MZ interference principle |
| 03/27/2007 | US7196797 Differential interferometer with improved cyclic nonlinearity |
| 03/27/2007 | US7196796 Wavelength detecting apparatus, laser apparatus, and wavelength detecting method |
| 03/27/2007 | US7196780 Velocimeter, displacement meter, vibrometer and electronic device |
| 03/27/2007 | CA2336942C Combining interference fringe patterns to a moire fringe pattern |
| 03/22/2007 | WO2007008265A8 Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry |
| 03/22/2007 | WO2006077598A3 A method and apparatus for measurement of chromatic aberrations of optical systems |
| 03/22/2007 | WO2005104311A3 Duv light source optical element improvements |
| 03/22/2007 | US20070065150 Secure optical communication |
| 03/22/2007 | US20070064240 Angle interferometers |
| 03/22/2007 | US20070064239 Optical tomographic imaging apparatus |
| 03/22/2007 | US20070064238 Confocal microscope apparatus |
| 03/22/2007 | US20070064237 Optical device for studying an object |
| 03/22/2007 | US20070064236 Method and circuit for statistical estimation |
| 03/22/2007 | US20070064222 Systems and methods for testing and inspecting optical instruments |
| 03/22/2007 | DE102005030899B3 Object e.g. living cell, detection method for use in e.g. analysis of cell cultures, involves illuminating object, and imaging object by phase-shifting holographic interferometry for determination of complex-valued wave field of object |
| 03/21/2007 | EP1764655A2 Lithographic apparatus and device manufacturing method |
| 03/21/2007 | EP1608934A4 Apparatus and method for joint measurement of fields of scattered/reflected or transmitted orthogonally polarized beams by an object in interferometry |
| 03/21/2007 | EP1608933A4 Apparatus and method for measurement of fields of backscattered and forward scattered/reflected beams by an object in interferometry |
| 03/21/2007 | EP1397638A4 Apparatus and method for measuring aspherical optical surfaces and wavefronts |
| 03/21/2007 | CN2881538Y Three-dimension electron speckle interference instrument |
| 03/21/2007 | CN1932432A Light wave interferometer |
| 03/21/2007 | CN1306256C Optical characteristic measurer and optical displacement gage |
| 03/21/2007 | CN1306241C System and method of using a side-mounted interferometer to acquire position information |
| 03/20/2007 | US7193766 Differential interferometric light modulator and image display device |
| 03/20/2007 | US7193726 Optical interferometry |
| 03/20/2007 | US7193725 Method and system for optical measurement via a resonator having a non-uniform phase profile |
| 03/20/2007 | US7193724 Method for measuring thickness of thin film-like material during surface polishing, and surface polishing method and surface polishing apparatus |
| 03/20/2007 | US7193722 Lithographic apparatus with disturbance correction system and device manufacturing method |
| 03/20/2007 | US7193721 Systems using polarization-manipulating retroreflectors |
| 03/20/2007 | US7193720 Optical vibration imager |
| 03/20/2007 | US7193006 Process for continuous production of water-absorbent resin product |
| 03/15/2007 | WO2007028345A1 A method and system for measuring a high throughput length change |
| 03/15/2007 | WO2006130802A3 Apparatus, method and system for performing phase-resolved optical frequency domain imaging |
| 03/15/2007 | WO2006068875A3 Compensating for time varying phase changes in interferometric measurements |
| 03/15/2007 | US20070058173 Position-measuring device |
| 03/15/2007 | US20070058172 Position measurement unit, measurement system and lithographic apparatus comprising such position measurement unit |
| 03/15/2007 | US20070058160 Image inspection method by polarized compensation for deformation of lens |
| 03/14/2007 | EP1656536B1 Device and method for the non-invasive detection and measurement of the properties of a medium |
| 03/14/2007 | EP1631788B1 Digital holographic microscope for 3d imaging and process using it |
| 03/14/2007 | CN1930446A Optical readhead |
| 03/14/2007 | CN1928538A Device for measuring thermal conductive property |
| 03/14/2007 | CN1927914A Continuous production method of water absorbing resin product and ater absorbing resin product |
| 03/14/2007 | CN1304818C Depth of parallelism measuring method |
| 03/14/2007 | CN1304817C Multifunction tridimension displacement laser interference measuring system |
| 03/14/2007 | CN1304814C Self-mixed interference HeNe laser displacement transducer with direction recognition function |
| 03/13/2007 | US7190464 Low coherence interferometry for detecting and characterizing plaques |
| 03/13/2007 | US7190463 Method for preventing bias-errors as a result of synchronous interference in fiber-optic gyroscopes |
| 03/13/2007 | US7190443 Reticle and optical characteristic measuring method |
| 03/08/2007 | WO2007028119A2 Control system and apparatus for use with ultra-fast laser |
| 03/08/2007 | WO2007025834A1 Interferrometric measuring device |
| 03/08/2007 | WO2007025746A1 Device and method for the interferometric measurement of phase masks |
| 03/08/2007 | WO2006114764A3 Position measuring system |
| 03/08/2007 | WO2004111929A3 Improved system for fourier domain optical coherence tomography |
| 03/08/2007 | US20070055117 Low coherence interferometry utilizing phase |
| 03/08/2007 | US20070052971 Fiber-optic sensor coil and current or magnetic-field sensor |
| 03/08/2007 | US20070052970 Resonator sensor assembly |
| 03/08/2007 | US20070052948 Test pattern, inspection method, and device manufacturing method |
| 03/08/2007 | DE102005041491A1 Interferometrische Messeinrichtung Interferometric measurement device |
| 03/08/2007 | DE10153049B4 3D-Koordinationssystem 3D coordination system |
| 03/07/2007 | EP1759181A1 Miniature lamellar grating interferometer based on silicon technology |
| 03/07/2007 | EP1588119A4 Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry |
| 03/07/2007 | CN1924643A Method for incoming ray original track back based displacement and angle |
| 03/07/2007 | CN1924513A Microcosmic checking device for glass panel |
| 03/07/2007 | CN1303396C Micro-electromechanical system testing device and method based on micro-interference technique |
| 03/06/2007 | US7187453 Optical MEMS cavity having a wide scanning range for measuring a sensing interferometer |
| 03/06/2007 | US7187451 Apparatus for measuring two-dimensional displacement |
| 03/06/2007 | US7187450 Interferometric measuring device |
| 03/06/2007 | US7187449 Light-receiving/emitting composite unit, method for manufacturing the same, and displacement detection device |
| 03/06/2007 | US7187447 Fabry-perot stepped etalon with improved transmittance characteristics |
| 03/06/2007 | US7187437 Plurality of light sources for inspection apparatus and method |
| 03/06/2007 | US7187178 Method for determining the voltage sensitivity of the distance between the mirrors of a fabry-perot interferometer |
| 03/01/2007 | WO2007023300A1 Optical mapping apparatus |
| 03/01/2007 | WO2007002353A3 Projection display with internal calibration bezel for video |
| 03/01/2007 | WO2006065772A3 In-fiber whitelight interferometry using long-period fiber grating |
| 03/01/2007 | WO2004023218A2 Direct-to-digital holographic acquisition of content-based off-axis illuminated object |
| 03/01/2007 | US20070046952 Apparatus for measuring waveform of optical electric filed, optical transmission apparatus connected thereto and a method for producing the optical transmission apparatus |
| 03/01/2007 | US20070046950 Capacitance gap calibration |
| 03/01/2007 | US20070046947 Laser probing system for integrated circuits |
| 03/01/2007 | US20070046946 Microscope apparatus |
| 03/01/2007 | US20070046945 Method and apparatus for measuring small shifts in optical wavelengths |
| 03/01/2007 | US20070046929 Measurement method and apparatus, and exposure apparatus |
| 03/01/2007 | US20070046912 Interferometric measuring device and projection exposure installation comprising such measuring device |
| 03/01/2007 | DE19810980B4 Anordnung zum Messen von Abständen zwischen optischen Grenzflächen Arrangement for measuring distances between optical interfaces |
| 03/01/2007 | DE19628200B4 Vorrichtung zur Durchführung interferometrischer Messungen Device for carrying out interferometric measurements |
| 03/01/2007 | DE10260256B9 Interferometersystem und Meß-/Bearbeitungswerkzeug Interferometer and measuring / cutting tool |