Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
04/2007
04/26/2007US20070091298 Assembling and testing device for lens units and method for employing the same
04/26/2007CA2626417A1 Apparatus for interferometric sensing
04/25/2007EP1776555A2 Method and apparatus for interferometric measurement of components with large aspect ratios
04/25/2007EP1549904B1 Device for measuring an optical path length difference
04/25/2007EP1364239B1 Optical delay line
04/25/2007CN1952594A Surface profile measuring method and apparatus thereof
04/25/2007CN1312459C Device of measuring dynamic characteristics of micro electromechanical system possessing environment-loading function
04/24/2007US7209291 Optical displacement sensor
04/24/2007US7209241 Method for determining wavefront aberrations
04/24/2007US7209238 Interferometer arrangement and interferometric measuring method
04/24/2007US7209224 Lens meter
04/24/2007US7208747 Adjustment of distance between source plasma and mirrors to change partial coherence
04/24/2007US7207230 High-stability instrument mounting system for repeatable field testing of equipment
04/19/2007WO2007044786A2 Interferometry method and system including spectral decomposition
04/19/2007WO2007044612A2 Imaging systems using unpolarized light and related methods and controllers
04/19/2007WO2006052816A3 Optical connection for interferometry
04/19/2007WO2005052502A3 Pixelated phase-mask interferometer
04/19/2007WO2005047974A3 Measurement and compensation of errors in interferometers
04/19/2007US20070088219 System and method for coherent anti-stokes raman scattering endoscopy
04/19/2007US20070086019 Methods and systems for determining optical properties using low-coherence interference signals
04/19/2007US20070086018 Broadband cavity spectrometer apparatus and method for determining the path length of an optical structure
04/19/2007US20070086017 Imaging Systems Using Unpolarized Light And Related Methods And Controllers
04/19/2007US20070086016 Interferometer using integrated retarders to reduce physical volume
04/19/2007US20070086013 Interferometry method and system including spectral decomposition
04/19/2007US20070086012 Optical tomography system
04/19/2007US20070086011 Optical tomography method
04/19/2007US20070086010 Interferometric beam combination
04/19/2007DE102005049607A1 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten Method and apparatus for detecting the deformation of objects
04/19/2007DE102004053420B4 Interferometer mit einem Höhenadapter zur Vermessung einer Oberflächenkontur eines Messobjektes Interferometer with a height adapter for measuring a surface contour of an object to be measured
04/18/2007EP1775570A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775569A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775568A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775567A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775548A2 Method and device for the detection of the deformation of objects
04/18/2007EP1775545A2 Optical image measuring device, optical image measuring program, fundus observation device, and fundus observation program
04/18/2007EP1419362A4 In-situ mirror characterization
04/18/2007CN1950668A Device and method for a combined interferometry and image-based determination of geometry, especially for use in microsystems technology
04/18/2007CN1948894A Bar cutter angle measuring microscope
04/18/2007CN1948893A Automatically balancing method of interfering measuring system
04/18/2007CN1947652A Optical image measuring device, fundus observation device, storage media for optical image measuring program and and fundus observation program
04/17/2007US7206078 Non-destructive testing system using a laser beam
04/17/2007US7206076 Thickness measurement of moving webs and seal integrity system using dual interferometer
04/17/2007US7206075 Method and apparatus for reducing crosstalk interference in an inline Fabry-Perot sensor array
04/17/2007US7206074 Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness
04/17/2007US7206073 Dispersed fourier transform spectrometer
04/17/2007US7206069 Optical analyzers of polarization properties
04/17/2007US7206058 Off-axis levelling in lithographic projection apparatus
04/12/2007WO2007041412A1 Method and apparatus for method for viewing and analyzing of one or more biological samples with progressively increasing resolutions
04/12/2007WO2007041382A1 Arrangements and methods for providing multimodality microscopic imaging of one or more biological structures
04/12/2007WO2007041376A1 Method and apparatus for optical imaging via spectral encoding
04/12/2007WO2007040489A1 Multi-probe gauge for wafer characterization
04/12/2007WO2007040462A1 A method and system for obtaining n and k map for measuring fly-height
04/12/2007WO2007016081A9 Reciprocating pump with electronically monitored air valve and piston
04/12/2007WO2006091415A3 Scanning interferometer for aspheric surfaces and wavefronts
04/12/2007US20070081167 Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
04/12/2007US20070081166 Portable Optical Coherence Tomography (OCT) Devices and Related Systems
04/12/2007US20070081165 High-sensitivity fiber-compatible optical acoustic sensor
04/12/2007US20070081145 Electronic imaging apparatus and microscope apparatus using the same
04/12/2007CA2624109A1 Method and apparatus for method for viewing and analyzing of one or more biological samples with progressively increasing resolutions
04/11/2007EP1771755A1 Endoscopic imaging probe comprising dual clad fibre
04/11/2007CN1946986A Method and system for optically tracking a target using an interferometric technique
04/10/2007US7202955 Spectrally diverse spectrometer and associated methods
04/10/2007US7202938 Off-axis levelling in lithographic projection apparatus
04/10/2007CA2156897C Optical coherence tomography corneal mapping apparatus
04/05/2007WO2007038787A1 Method and apparatus for optical imaging via spectral encoding
04/05/2007WO2007038688A1 Self referencing heterodyne reflectometer and method for implementing
04/05/2007WO2007036442A1 Interferometric measuring device
04/05/2007WO2005074525A3 Entangled-photon fourier transform spectroscopy
04/05/2007US20070077595 Miniaturized spectometer using optical waveguide and integrated Raman system on-chip
04/05/2007US20070076223 Optical Mapping Apparatus with Optimized OCT Configuration
04/05/2007US20070076222 Optical tomography system
04/05/2007US20070076221 Optical tomography system
04/05/2007US20070076220 Optical tomography system
04/05/2007US20070076219 Optical tomography system
04/05/2007US20070076215 Optical tomography system
04/05/2007US20070076214 System and method for brewster angle straddle interferometry
04/05/2007US20070076213 Optical tomography system
04/05/2007US20070076212 Detecting vulnerable plaque
04/05/2007US20070076211 Optical tomography method and optical tomography system
04/05/2007US20070076210 Position-based response to light
04/05/2007US20070076209 Hydrogen sensor based upon quadrupole absorption spectroscopy
04/05/2007US20070076208 Method and instrument for collecting fourier transform (FT) Raman spectra for imaging applications
04/05/2007DE102005046605A1 Optical path difference adjusting device, has interferometric measuring device with two interferometers, where optical path length for partial beams in interferometers can be set by components, which are mechanically coupled to one another
04/05/2007DE102005045088A1 Optisches Kohärenztomographie-System Optical coherence tomography system
04/05/2007DE102005036143A1 Verfahren zur Ermittlung konfigurations- und zustandsabhängiger Mikroskopparameter Method for determining configurational and state-dependent parameters microscope
04/05/2007DE102004045807B4 Optische Messvorrichtung zur Vermessung von gekrümmten Flächen The optical measuring device for measuring curved surfaces
04/05/2007DE10131898B4 Interferometrische Messvorrichtung zur Wellenlängenkalibrierung Interferometric measuring device for wavelength calibration
04/04/2007EP1770354A2 Optical probe and optical tomography system
04/04/2007EP1770353A1 Optical tomography system
04/04/2007EP1770352A1 Optical tomography system
04/04/2007EP1770351A1 Optical tomography method and optical tomography system
04/04/2007EP1704384B1 Digital phase detector for periodically alternating signals
04/04/2007EP1475606A4 Method for studying an object and an optical interferometer for carrying out said method
04/04/2007EP1296367B1 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them
04/04/2007CN2886722Y Reflective observing screen for Michelson interferometer
04/04/2007CN1943083A Laser system using ultra-short laser pulses
04/04/2007CN1940467A Photoelectric telescope with high-acuity imaging and luminosity measurement functions
04/04/2007CN1940466A Clamp device for optical plug and interferometer comprising same
04/04/2007CN1308650C Improved interferometer using integrated image array and high density polarimeter and/or phase shift array
04/04/2007CN1308649C A method of alignment by using interferometry
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