Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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02/27/2008 | EP1646841A4 Method and apparatus for multiwavelength imaging spectrometer |
02/27/2008 | EP1125095B1 Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements |
02/27/2008 | CN100371675C Detected lens holding table for interferometer apparatus |
02/26/2008 | US7336371 Apparatus and method for measuring the wavefront of an optical system |
02/26/2008 | US7336370 Optical nulling apparatus and method for testing an optical surface |
02/26/2008 | US7336368 Optical detecting module and optical detector thereof |
02/26/2008 | US7336367 Light-receiving/emitting composite unit, method for manufacturing the same, and displacement detection device |
02/26/2008 | US7336366 Methods and systems for reducing complex conjugate ambiguity in interferometric data |
02/26/2008 | US7336365 Method and apparatus for suppression of crosstalk and noise in time-division multiplexed interferometric sensor systems |
02/26/2008 | US7336363 Interferometric beam combination |
02/21/2008 | WO2007140221A9 Airway adaptor with optical pressure transducer and method of manufacturing a sensor component |
02/21/2008 | US20080043245 Methods and apparatus for measuring multiple fabry-perot gaps |
02/21/2008 | US20080043244 Optical tomography system |
02/21/2008 | US20080043243 AE/ultrasound detection system, and material monitoring apparatus and nondestructive inspection apparatus equipped the system |
02/21/2008 | US20080043242 Optical Sensors |
02/21/2008 | US20080043222 Method for biomolecular sensing and system thereof |
02/21/2008 | DE112006000197T5 Verfahren zur Erzeugung von Bildern; A process for generating images; Verfahren zum Testen elektronischer Geräte; A method for testing electronic devices; sowie Testeinrichtung; and test equipment; Testkammer und Testsystem Test chamber and test system |
02/20/2008 | EP1890105A1 Interferometer apparatus and interferometric method |
02/20/2008 | EP1889037A2 Apparatus, method and system for performing phase-resolved optical frequency domain imaging |
02/20/2008 | EP1888999A2 Method and apparatus for full phase interferometry |
02/20/2008 | EP1887926A2 System, method and arrangement which can use spectral encoding heterodyne interferometry techniques for imaging |
02/20/2008 | CN101128718A Heterodyne reflectomer for film thickness monitoring and method for implementing |
02/20/2008 | CN101128717A Phase noise compensation for interferometric absolute distance measuring |
02/20/2008 | CN101126632A Method for measuring article profile using electronic speckle interferometry and carrier-frequency modulation |
02/20/2008 | CN101126629A On-line measuring system using optical fiber grating synthetic wave for interfering step height |
02/20/2008 | CN101126627A Light wave interference detection device and light wave interference detection method |
02/19/2008 | US7333216 Apparatus for wavefront detection |
02/19/2008 | US7333215 Adaptive optics control system |
02/19/2008 | US7333213 Confocal microscopy |
02/19/2008 | US7333212 Method and apparatus for measuring the absorption coefficient and the reduced scattering coefficient of a multiple scattering medium |
02/19/2008 | US7333211 Method for determining a qualitative characteristic of an interferometric component |
02/19/2008 | US7333210 Method and apparatus for feedback control of tunable laser wavelength |
02/19/2008 | US7333208 Full width array mechanically tunable spectrophotometer |
02/19/2008 | US7333207 Confocal 4-pi microscope and method for confocal 4-pi microscopy |
02/19/2008 | US7333196 Evaluation apparatus and evaluation method |
02/19/2008 | US7332255 enables the user to measure process line shortening on an overlay tool; means for determining the misalignment, means for determining total line shortening, means for determining the equipment line shortening, and means for determining process line shortening |
02/14/2008 | US20080037367 Method And Installation For Acousto-Optic Imaging |
02/14/2008 | US20080037030 Image amplifying, servo-loop controlled, point diffraction interometer |
02/14/2008 | US20080037029 Optical apparatus, exposure apparatus, and device manufacturing method |
02/14/2008 | US20080037028 Pulsed coherent fiber array and method |
02/14/2008 | US20080037011 Method, device and system for evaluating a lens for an electronic device |
02/13/2008 | EP1887312A1 Imaging optical coherence tomography with dynamic coherent Focus |
02/13/2008 | EP1886121A1 Arrangements, systems and methods capable of providing spectral-domain optical coherence reflectometry for a sensitive detection of chemical and biological sample |
02/13/2008 | CN101122456A Transverse shearing interferometer agglutination checking method |
02/13/2008 | CN100368764C Measuring machine |
02/12/2008 | US7330277 Resonant ellipsometer and method for determining ellipsometric parameters of a surface |
02/12/2008 | US7330276 Optical interference substrate, target detecting substrate, target detecting apparatus, and target detecting process |
02/12/2008 | US7330275 Method and system for determining the position and alignment of a surface of an object in relation to a laser beam |
02/12/2008 | US7330274 Compensation for geometric effects of beam misalignments in plane mirror interferometers |
02/12/2008 | US7330273 Compact high resolution imaging apparatus |
02/12/2008 | US7330272 Discrete quarter wave plates for displacement measuring interferometers |
02/12/2008 | US7330271 Electromagnetic resonant sensor with dielectric body and variable gap cavity |
02/12/2008 | US7330268 Spectral imaging apparatus and methodology |
02/12/2008 | US7330267 Device and method for optical spectroscopy |
02/12/2008 | US7330266 Stationary fourier transform spectrometer |
02/12/2008 | US7330237 Exposure apparatus equipped with interferometer and method of using same |
02/07/2008 | WO2008016941A2 Image rotation devices and their applications |
02/07/2008 | US20080031292 Laser Beam Path Length Difference Detector, Laser Phase Controller, and Coherent Optical Coupler |
02/07/2008 | US20080030741 Optical sensor utilizing hollow-core photonic bandgap fiber with low phase thermal constant |
02/07/2008 | US20080030740 Optical Measurements of Properties in Substances Using Propagation Modes of Light |
02/07/2008 | US20080030721 Optical apparatus and methods for chemical analysis |
02/07/2008 | DE202007009529U1 Binokulartubus für ein Operationsmikroskop und damit ausgestattetes Operationsmikroskop Binocular for a surgical microscope and surgical microscope equipped therewith |
02/06/2008 | EP1883824A2 Method and apparatus of detecting an object |
02/06/2008 | EP1883783A2 Apparatus and method for in situ and ex situ measurements of optical system flare |
02/06/2008 | EP1883781A2 Analyzing low-coherence interferometry signals for thin film structures |
02/06/2008 | CN201017099Y Inverted polarizing long working distance high resolutions high temperature resistant hot stage microscope |
02/06/2008 | CN201016706Y Laser spectrometer regulating assistant |
02/06/2008 | CN201016705Y Micro-displacement high-accuracy real-time interference measuring apparatus |
02/05/2008 | US7327472 High temperature, minimally invasive optical sensing modules |
02/05/2008 | US7327471 Apparatus and method for stabilizing lasers using dual etalons |
02/05/2008 | US7327470 Spatial and spectral wavefront analysis and measurement |
02/05/2008 | US7327468 Opto-acoustic apparatus with optical heterodyning for measuring solid surfaces and thin films |
02/05/2008 | US7327467 Phase measuring method and apparatus for measuring characterization of optical thin films |
02/05/2008 | US7327465 Compensation for effects of beam misalignments in interferometer metrology systems |
02/05/2008 | US7327464 System and method for coherent optical inspection |
02/05/2008 | US7327463 Low coherence interferometry utilizing magnitude |
02/05/2008 | US7327462 Method and apparatus for direct detection of signals from a differential delay heterodyne interferometric system |
02/05/2008 | US7327452 Light beam apparatus and method for orthogonal alignment of specimen |
01/31/2008 | WO2008013705A2 High resolution interferometric optical frequency domain reflectometry ( ofdr) beyond the laser coherence length |
01/31/2008 | WO2008011866A1 Optical system for surveying a surface |
01/31/2008 | WO2007133961A3 Processes, arrangements and systems for providing frequency domain imaging of a sample |
01/31/2008 | US20080024790 Image Rotation Devices and Their Applications |
01/31/2008 | US20080024789 Fiber-optic miniature encoder for fine pitch scales |
01/31/2008 | US20080024788 Wavelength-tunable light generator and optical coherence tomography device |
01/31/2008 | US20080024785 High resolution interferometric optical frequency domain reflectometry (ofdr) beyond the laser coherence length |
01/31/2008 | US20080024781 Optical spot geometric parameter determination using calibration targets |
01/31/2008 | US20080024767 Imaging optical coherence tomography with dynamic coherent focus |
01/31/2008 | DE102006035022A1 Verfahren zum Herstellen einer optischen Komponente, Interferometeranordnung und Beugungsgitter A method of manufacturing an optical component, and diffraction grating interferometer |
01/31/2008 | DE102006034604A1 Optisches System zur Oberflächenvermessung An optical system for surface measurement |
01/31/2008 | DE102004020059B4 Messvorrichtung und Verfahren zur diskontinuierlichen Absolutmessung von Verschiebungen Measuring device and method for absolute measurement of the discontinuous displacements |
01/30/2008 | CN101113927A Phase shifting lateral direction shearing interferometer |
01/29/2008 | US7324215 Non-destructive optical imaging system for enhanced lateral resolution |
01/29/2008 | US7324212 Optical encoder having slanted optical detector elements for harmonic suppression |
01/29/2008 | US7324211 Optical tomographic image obtaining apparatus |
01/29/2008 | US7324210 Scanning interferometry for thin film thickness and surface measurements |
01/29/2008 | US7324209 Apparatus and method for ellipsometric measurements with high spatial resolution |
01/29/2008 | US7324208 Optical frequency measurement apparatus and optical frequency measurement method |
01/29/2008 | US7324207 Optical pulse correlator having an interferometer array |
01/29/2008 | US7324205 Optical accelerometer, gravitometer, and gradiometer |
01/29/2008 | US7324190 System for visualization of optical marking on an ophthalmic lens, stamp-marking device and method for orientation of lenses using such a system |