Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
11/2007
11/20/2007US7298496 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry
11/20/2007US7298495 System and method for positioning an object through use of a rotating laser metrology system
11/20/2007US7298494 Methods and systems for interferometric analysis of surfaces and related applications
11/20/2007US7298493 Interferometric optical assemblies and systems including interferometric optical assemblies
11/20/2007US7298492 Method and system for on-line measurement of thickness and birefringence of thin plastic films
11/20/2007US7298490 Hydrogen sensor based upon quadrupole absorption spectroscopy
11/20/2007US7298489 Method and apparatus for characterizing the electric field of periodic and non-periodic optical signals
11/20/2007US7298462 Method for mobile on and off-line monitoring of colored and high-gloss automobile component surfaces
11/15/2007WO2007128509A1 Device for combined interferometry and image-based determination of geometry, especially for use in microsystems technology, and method for the use thereof
11/15/2007WO2007128138A1 Method of assessing bond integrity in bonded structures
11/15/2007WO2006122294A3 Techniques and devices for characterizing spatially non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects
11/15/2007US20070263226 Tissue imaging system
11/15/2007US20070263225 Counting signal processing method for fiber optic interferometric sensor
11/15/2007DE102006021965A1 Wavefront measuring device e.g. lateral shearing interferometer, calibrating method, involves making measurements with different tilting angles of optical components of measuring device relative to test specimen by measuring device
11/15/2007CA2651341A1 Method of assessing bond integrity in bonded structures
11/14/2007EP1855081A1 Means and methods for signal validation for sizing spherical objects
11/14/2007EP1854959A1 Method and apparatus for locating a plug within the well
11/14/2007EP1853952A2 Compact fiber optic geometry for a counter-chirp fmcw coherent laser radar
11/14/2007EP1853886A2 Michelson interferometer based delay line interferometers
11/14/2007EP1853875A2 Scanning interferometer for aspheric surfaces and wavefronts
11/14/2007EP1853874A1 Interferometer for determining characteristics of an object surface
11/14/2007EP1853873A2 A method and apparatus for measurement of chromatic aberrations of optical systems
11/14/2007EP0883793B1 Method and apparatus for performing optical measurements using a fiber optic imaging guidewire, catheter or endoscope
11/14/2007CN200975888Y 影像投影仪 Video Projector
11/14/2007CN200975887Y Real-time digital holographic experiment instrument
11/14/2007CN101072534A Optical apparatus and method for comprehensive eye diagnosis
11/14/2007CN101071058A Optical interference measuring device and its method
11/14/2007CN101071057A Interference measuring instrument based on multimode waveguide light field transverse mode
11/13/2007US7295327 Measuring apparatus and exposure apparatus having the same
11/13/2007US7295325 Time-resolved measurement technique using radiation pulses
11/13/2007US7295324 System and method for improving accuracy in a speckle-based image correlation displacement sensor
11/13/2007US7295321 VISAR interferometer with field elements
11/13/2007US7295315 Focus and alignment sensors and methods for use with scanning microlens-array printer
11/13/2007US7295302 Use of laser reflection pickup unit for detection of small particles on a relatively smooth and reflective surface
11/13/2007US7295293 Apparatus and method for testing a reflector coating
11/13/2007US7295292 Methods and systems for measuring an aberated wave front
11/13/2007US7295291 Apparatus and process for the determination of static lens field curvature
11/08/2007WO2007127932A1 Systems and methods for detecting changes in incident optical radiation at high frequencies
11/08/2007WO2007124930A1 Method and apparatus for recording of images and study of surfaces
11/08/2007WO2007109616A3 System and method to measure nano-scale stress and strain in materials
11/08/2007WO2006102234A3 Multi-axis interferometer with procedure and data processing for mirror mapping
11/08/2007US20070258096 On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
11/08/2007US20070258095 High-resolution retinal imaging using adaptive optics and fourier-domain optical coherence tomography
11/08/2007US20070258094 Methods, systems and computer program products for optical coherence tomography (OCT) using automatic dispersion compensation
11/07/2007EP1851504A1 Phase noise compensation for interferometric absolute distance measuring
11/07/2007CN200972385Y Interference system of displacement and angle synchronous measuring based on Faraday optical effect
11/07/2007CN101067548A Self-correcting method for optical grating based on linear phase position
11/07/2007CN101067547A Optical angle gauge test calibrator utilizing mutual orthogonal double-frequency laser interferometer
11/07/2007CN101067546A Method and apparatus for reducing heterodyne interference nonlinear error first harmonic component
11/06/2007US7292383 Contained resonant cavity and systems incorporating same
11/06/2007US7292349 Method for biomolecular sensing and system thereof
11/06/2007US7292348 Stage apparatus including a correction unit to correct a wavelength variation of measurement light based on measured displacement of a stage
11/06/2007US7292346 Triangulation methods and systems for profiling surfaces through a thin film coating
11/06/2007US7292345 Fibre-optic interferometric remote sensor
11/06/2007US7292344 Integrated spectroscopy system
11/06/2007US7292343 Gas discharge MOPA laser spectral analysis module
11/06/2007US7292342 Entangled photon fourier transform spectroscopy
11/06/2007US7292324 Spherical aberration detection
11/01/2007WO2007091991A3 Simultaneous beam-focus and coherence-gate tracking for real-time optical coherence tomography
11/01/2007WO2007045028A9 Apparatus for interferometric sensing
11/01/2007WO2006091866A3 Michelson interferometer based delay line interferometers
11/01/2007US20070253000 System and method for measuring distances, displacement and mechanical actions
11/01/2007US20070252999 Optimized reference level generation
11/01/2007US20070252975 Phase shifting grating-slit test for optical surface reconstruction
10/2007
10/31/2007EP1613922A4 Methods and systems for static multimode multiplex spectroscopy
10/31/2007EP1451524A4 Phase-shifting interferometry method and system
10/31/2007CN200969000Y 长工作距干涉显微镜 Long working distance interference microscope
10/31/2007CN101065640A System and method for optical measurement
10/30/2007US7289655 Device for inspecting illumination optical device and method for inspecting illumination optical device
10/30/2007US7289226 Characterization and compensation of errors in multi-axis interferometry systems
10/30/2007US7289225 Surface profiling using an interference pattern matching template
10/30/2007US7289224 Low coherence grazing incidence interferometry for profiling and tilt sensing
10/30/2007US7289223 Method and apparatus for spatially resolved polarimetry
10/30/2007US7289222 Interferometer apparatus and method of processing a substrate having an optical surface
10/30/2007US7289221 Mach Zehnder photonic crystal sensors and methods
10/30/2007US7289220 Broadband cavity spectrometer apparatus and method for determining the path length of an optical structure
10/30/2007US7289199 Electronic imaging apparatus and microscope apparatus using the same
10/30/2007CA2431317C Fiber optic system including digital controller for fiber optic tunable filter and associated methods
10/25/2007WO2007101026A3 Methods and systems for performing angle-resolved fourier-domain optical coherence tomography
10/25/2007WO2006108096A3 Method and apparatus for measuring and monitoring distances, physical properties, and phase changes of light reflected from a surface based on a ring-resonator
10/25/2007US20070250290 Scanning exposure technique
10/25/2007US20070247637 Interferometry Method for Ellipsometry, Reflectometry, and Scatterometry Measurements, Including Characterization of Thin Film Structures
10/25/2007US20070247635 Polarization interference microscope
10/25/2007US20070247634 Apparatus and method for monitoring trench profiles and for spectrometrologic analysis
10/25/2007US20070247633 Laminated wave plate and optical pickup device using the same
10/25/2007US20070247632 Heterodyne interferometer
10/25/2007US20070247631 Fibre Optic Sensor Method and Apparatus
10/25/2007US20070247630 Confocal Scanning Holography Microscope
10/24/2007EP1846923A1 Method and assembly for confocal, chromatic, interferometric and spectroscopic scanning of optical, multi-layer data memories
10/24/2007CN200965463Y 一种读数显微镜 One kind of reading microscope
10/24/2007CN100344934C Microscope focus height-finding method
10/23/2007US7286245 Method and apparatus for determining the influencing of the state of polarization by an optical system; and an analyser
10/23/2007US7286244 Analyzer
10/23/2007US7286243 Beam profile complex reflectance system and method for thin film and critical dimension measurements
10/23/2007US7286242 Apparatus for measuring characteristics of thin film by means of two-dimensional detector and method of measuring the same
10/23/2007US7286241 System and method for high-speed laser detection of ultrasound
10/23/2007US7286240 Compensation for geometric effects of beam misalignments in plane mirror interferometer metrology systems
10/23/2007US7286239 Laser scanner with amplitude and phase detection
10/23/2007US7286238 Feature isolation for frequency-shifting interferometry
10/23/2007US7286237 Fiber optic sensor
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