Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
06/2007
06/27/2007CN1323417C Intelligent measuring instrument for shadow mask aperture
06/27/2007CN1323309C Reflection multilight bean confocal interference microscope having several tens nanometer lateral discriminability
06/26/2007US7236254 Exposure apparatus with interferometer
06/26/2007US7236251 Optical system and optical apparatus capable of switching between optical coherence tomography observation and optical coherence microscopy observation
06/26/2007US7236250 Dynamic light scattering measurement apparatus using phase modulation interference method
06/26/2007US7236239 Illumination system and exposure apparatus
06/21/2007WO2007070566A2 Optical fiber-delivered reference beam for interferometric imaging
06/21/2007WO2007070565A2 Off-axis paraboloid interferometer with off-axis illumination
06/21/2007WO2007070015A1 Method and tester for optical flying height measurement
06/21/2007US20070139640 Lens inspection system using phase contrast imaging
06/21/2007DE10222170B4 Quantenoptische Interferenz-Vorrichtung sowie Verfahren zum Betreiben einer solchen An optical quantum interference apparatus and method for operating such a
06/20/2007EP1393014A4 Microinterferometers with performance optimization
06/20/2007CN1985235A 相对运动传感器 Relative movement sensor
06/20/2007CN1322305C High definition projector device
06/20/2007CN1322304C Interference scanning device and method
06/19/2007US7233434 Orientation independent differential interference contrast microscopy technique and device
06/19/2007US7233402 Measurement device for optical measurement of a property of a measurement object
06/19/2007US7233399 Feedback control of an interferometer
06/14/2007WO2007065670A2 Interferometric sample measurement
06/14/2007WO2007065493A1 Interferometric sample measurement
06/14/2007WO2006079011B1 Low coherence interferometry for detecting and characterizing plaques
06/14/2007WO2005086582A3 Methods and apparatus for wavefront manipulations and improved 3-d measurements
06/14/2007US20070133008 Optical fiber delivered reference beam for interferometric imaging
06/14/2007US20070133005 Optical analyzers of polarization properties
06/14/2007US20070133004 Birefringent optical temperature sensor and method
06/14/2007US20070133002 Systems and methods for endoscopic angle-resolved low coherence interferometry
06/14/2007DE102006042007A1 Interferometer system, has measurement channel for providing signal indicating measurement along path, and another measurement channel for providing signal indicating measurement having component one direction
06/14/2007DE102005059338A1 Verfahren und Anordnung zur Untersuchung von Proben Method and apparatus for analyzing samples
06/14/2007DE102005058220A1 Interferometrische Probenmessung Interferometric measurement samples
06/13/2007EP1794572A1 Interferometric system with reference surfaces with a mirrored zone
06/13/2007EP1794540A1 Optical measuring device for measuring several surfaces of a measuring object
06/13/2007CN1981258A An optical input device and method of measuring relative movement of an object and an optical input device
06/13/2007CN1979086A Low walk-off interferometer
06/12/2007US7230763 Polarizing beamsplitter
06/12/2007US7230720 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method
06/12/2007US7230719 High sensitivity scanning probe system
06/12/2007US7230718 Simultaneous phase-shifting fizeau interferometer
06/12/2007US7230717 Pixelated phase-mask interferometer
06/12/2007US7230716 Method for measuring the absorption coefficient and the reduced scattering coefficient of a multiple scattering medium
06/12/2007US7230715 Ultrafast laser pulse shape measurement method and system
06/12/2007US7230706 Position detection method and apparatus, and exposure method and apparatus
06/12/2007US7230693 Lens meter
06/12/2007US7230692 Optical apparatus, method of determining position of optical element in optical system, and device manufacturing method
06/07/2007WO2007064928A2 Method for measuring wear in the refractory lining of a metallurgical melting vessel
06/07/2007WO2005089299A3 Interferometer having an auxiliary reference surface
06/07/2007US20070127842 Sample picture data processing method and sample inspection system and method
06/07/2007US20070127034 Method for measuring physical quantity of measurement object in substrate processing apparatus and storage medium storing program for implementing the method
06/07/2007US20070127033 Apparatus using optical coherence tomography based on spectral interference, and an ophthalmic apparatus
06/07/2007US20070127032 Sampling Spectrophotometer Comprising an Interferometer
06/07/2007US20070127031 Backlight unit, driving method of the same and liquid crystal display device having the same
06/07/2007US20070127030 High sensitivity coherent photothermal interferometric system and method for chemical detection
06/07/2007US20070127010 Lens meter
06/07/2007CA2630453A1 Method for measuring wear in the refractory lining of a metallurgical melting vessel
06/06/2007EP1792138A1 Phase-resolved measurement for frequency-shifting interferometry
06/06/2007DE102005056467A1 Surface`s translation and tilt measuring method for scanning probe microscope, involves focusing measuring beam of interferometer with optical system, and utilizing reflecting beam after beam split for measuring surface tilt
06/06/2007CN1975708A Phase developing method
06/06/2007CN1975548A Wideband light source with adjustable window
06/06/2007CN1975322A Micro-geometric sense measuring device based on nano-measuring machine and micro-tactometering head
06/06/2007CN1975321A Phase-shift interference image information processing system and processing method thereof
06/06/2007CN1320334C Surface profiling apparatus and data acquiring method, data processing device and relating equipment
06/05/2007US7228034 Interference patterning
06/05/2007US7227814 Repairable fiber optic hydrophone assembly
06/05/2007US7227646 High-speed optical delay generating method by rotation reflector in optical coherence tomography and optical coherence tomography device
06/05/2007US7227645 Method and apparatus for measuring polarization mode dispersion
06/05/2007US7227123 Physical quantity measuring method using Brillouin optical fiber sensor
05/2007
05/31/2007WO2007060441A1 Apparatus for and a method of determining surface characteristics
05/31/2007WO2007014708A3 Littrow spectrometer and a spectral domain optical coherence tomography system with a littrow spectrometer
05/31/2007WO2006093709A3 Heterodyne reflectometer for film thickness monitoring and method for implementing
05/31/2007WO2005067579A3 Multi-axis interferometers and methods and systems using multi-axis interferometers
05/31/2007WO2005033747A3 Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy
05/31/2007WO2005017495A3 Interferometric sensor for characterizing materials
05/31/2007US20070121119 Spatial Heterodyne Wide-Field Coherent Anti-Stokes Raman Spectromicroscopy
05/31/2007US20070121118 White interferometric modulators and methods for forming the same
05/31/2007US20070121115 Apparatus and method for reducing effects of coherent artifacts and compensation of effects of vibrations and environmental changes in interferometry
05/31/2007US20070121100 Device and a method of automatically detecting various characteristics of an ophthalmic lens
05/31/2007DE102006031917A1 Monolithisches Verschiebungsmessinterferometer Monolithic Verschiebungsmessinterferometer
05/31/2007DE102005056914A1 Projektionsbelichtungsystem Projection exposure system
05/30/2007EP1789832A1 Transmissive scanning delay line for oct
05/30/2007EP1535023A4 Intrinsic fabry-perot optical fiber sensors and their multiplexing
05/30/2007EP1260116B1 Folded sagnac sensor array
05/30/2007CN2906548Y Piezoelectric ceramic micro-displacement actuator and its surface interferometer
05/30/2007CN1971208A Method for measuring object deformation field by using moire interference carrier frequency modulation technology
05/30/2007CN1971207A Large-shearing carrier-frequency electronic speckle interference displacement field separating method
05/30/2007CN1971203A Variable broadband light source for stationary window
05/30/2007CN1971202A Monolithic displacement measuring interferometer
05/30/2007CN1318882C Image comparing apparatus
05/29/2007US7224469 Optical system alignment system and method with high accuracy and simple operation
05/29/2007US7224468 En-face functional imaging using multiple wavelengths
05/29/2007US7224467 System for rotation measurement with laser interferometry
05/29/2007US7224466 Compact multi-axis interferometer
05/29/2007US7224465 Fiber tip based sensor system for measurements of pressure gradient, air particle velocity and acoustic intensity
05/29/2007US7224464 Fourier-transform spectrometers
05/29/2007US7224463 Resolving quadrature fringes of interferometer signals in real time
05/29/2007CA2281627C System and method for laser ultrasonic bond integrity evaluation
05/24/2007WO2007059485A2 Polarization-sensitive common path optical coherence reflectometry/tomography device
05/24/2007WO2007059479A2 Polarization sensitive optical coherence device for obtaining birefringence information
05/24/2007WO2007059249A2 Interferometer with coherent artifact reduction plus vibration and enviromental compensation
05/24/2007WO2007059206A2 Spectral domain phase microscopy (sdpm) dual mode imaging systems and related methods
05/24/2007WO2007057701A1 Dynamic air turbulence compensation for an interferometric measurement apparatus
05/24/2007US20070115480 Multi-cavity fabry-perot interferometric thin-film sensor with built-in temperature compensation
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