| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
|---|
| 11/08/2001 | WO2001084477A1 Method and apparatus for discriminating latent fingerprint in optical fingerprint input apparatus |
| 11/08/2001 | WO2001084215A1 Method for producing eyeglasses |
| 11/08/2001 | WO2001084083A1 Scanning unit for an optical position measuring device |
| 11/08/2001 | WO2001084076A1 Co-ordinate measuring device or machine tool |
| 11/08/2001 | WO2001084074A1 High precision laser monitor for manufacture of optical coatings and method for its use |
| 11/08/2001 | WO2001084072A1 Device for measuring an object across several axes |
| 11/08/2001 | WO2001082829A2 Prosthesis and method of making |
| 11/08/2001 | WO2001082781A2 Repetitive inspection system with intelligent tools |
| 11/08/2001 | WO2000033027A9 An apparatus and method to transport, inspect and measure objects and surface details at high speeds |
| 11/08/2001 | US20010039064 Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising same |
| 11/08/2001 | US20010038750 Camera distance measuring device |
| 11/08/2001 | US20010038714 Picture recognition apparatus and method |
| 11/08/2001 | US20010038455 Apparatus and method for measuring two opposite surfaces of a body |
| 11/08/2001 | US20010037694 Repetitive inspection system with intelligent tools |
| 11/08/2001 | DE10115080A1 Objekterkennungssystem Object recognition system |
| 11/08/2001 | DE10033817A1 Wafer support plate for supporting a wafer during the process of producing a semi-conductor identifies a wafer's position on the support plate during heat treatment while detecting the wafer's correct position on the plate. |
| 11/08/2001 | DE10021379A1 Optische Messanordnung insbesondere zur Schichtdickenmessung Optical device especially for coating thickness measurement |
| 11/08/2001 | DE10021378A1 Optische Messanordnung mit einem Ellipsometer Optical device with an ellipsometer |
| 11/08/2001 | DE10009202A1 Calibration system for injection molding machine, aligns the centers of visual image of nozzle and inlet bushing with center of screen |
| 11/08/2001 | CA2375990A1 Three-dimensional model forming apparatus |
| 11/07/2001 | EP1152236A2 Optical measuring device with an ellipsometer |
| 11/07/2001 | EP1152230A2 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus |
| 11/07/2001 | EP1152211A2 Optical measuring device in particular for measuring thickness of coating |
| 11/07/2001 | EP1152210A2 Method and apparatus to measure amount of movement using granular speck pattern generated by reflecting laser beam |
| 11/07/2001 | EP1151778A1 Real 3-d model forming device |
| 11/07/2001 | EP1151349A1 Resolution invariant panoramic imaging |
| 11/07/2001 | EP1151260A1 Device for determining the bending stress of components |
| 11/07/2001 | EP1151242A1 Sensor and method for detecting changes in distance |
| 11/07/2001 | EP1151240A1 Fiber optic sensor |
| 11/07/2001 | EP0807801B1 Apparatus for inspecting deformation of pipe |
| 11/07/2001 | CN2458591Y Multifunctional Cassegrain collimator |
| 11/07/2001 | CN1320908A Slope detector |
| 11/07/2001 | CN1074533C Apparatus fo measuring degree of inclination of objective lens for optical pickup |
| 11/06/2001 | US6314214 System and method for measuring stress during processing of an optical fiber |
| 11/06/2001 | US6314212 High precision optical metrology using frequency domain interpolation |
| 11/06/2001 | US6313948 Optical beam shaper |
| 11/06/2001 | US6313918 Single-pass and multi-pass interferometery systems having a dynamic beam-steering assembly for measuring distance, angle, and dispersion |
| 11/06/2001 | US6313915 Displacement measuring method and apparatus |
| 11/06/2001 | US6313911 Vehicle alignment sensor system |
| 11/06/2001 | US6313460 Optical encoder for detecting rotary and linear movements |
| 11/06/2001 | US6312373 Method of manufacturing an optical system |
| 11/01/2001 | WO2001082634A2 Three-dimensional image projector |
| 11/01/2001 | WO2001082335A2 Real-time evaluation of stress fields and properties in line features formed on substrates |
| 11/01/2001 | WO2001081902A1 Apparatus and methods for detecting killer particles during chemical mechanical polishing |
| 11/01/2001 | WO2001081864A1 Measuring device using electron beam |
| 11/01/2001 | WO2001081861A1 Road surface roughness measuring device |
| 11/01/2001 | WO2001081860A1 Measurement of wheel and axle alignment of motor vehicles |
| 11/01/2001 | WO2001081859A1 Combined stereovision, color 3d digitizing and motion capture system |
| 11/01/2001 | WO2001081858A1 Method for measuring a three-dimensional object, or assembly of objects |
| 11/01/2001 | WO2001055669A8 Caching of intra-layer calculations for rapid rigorous coupled-wave analyses |
| 11/01/2001 | WO2001036939A3 Method for the automatic analysis of microscope images |
| 11/01/2001 | WO2001036908A3 Shaft in dissolution testing vessel location monitor |
| 11/01/2001 | WO2001031286A3 Method and device for non-destructive inspection of objects by means of optical holographic interferometry |
| 11/01/2001 | US20010037186 Coordinate position detecting method and display apparatus using the same |
| 11/01/2001 | US20010037185 Method for determining the state variables of a moving rigid body in space |
| 11/01/2001 | US20010037184 Method and apparatus to measure amount of movement using granular speck pattern generated by reflecting laser beam |
| 11/01/2001 | US20010036805 Forming a transparent window in a polishing pad for a chemical mehcanical polishing apparatus |
| 11/01/2001 | US20010036793 Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers |
| 11/01/2001 | US20010036582 Comprising a rectangular portion, and band-shaped portions separated from opposite sides of the rectangular portion by an equal distance and parallel to the sides; overlay shift accurately obtained even when photoresist heat shrinks |
| 11/01/2001 | US20010036002 Grating based phase control optical delay line |
| 11/01/2001 | US20010035961 Shape measuring apparatus |
| 11/01/2001 | US20010035960 Method and apparatus for fly height testing using light emitting diodes |
| 11/01/2001 | US20010035959 In-situ mirror characterization |
| 11/01/2001 | US20010035951 Surface inspection apparatus and method |
| 11/01/2001 | US20010035946 Light-projecting/receiving unit and omnidirectional distance detecting apparatus |
| 11/01/2001 | US20010035535 Cutting blade detection mechanism for a cutting machine |
| 11/01/2001 | CA2404976A1 Apparatus and method for projecting a 3d image |
| 10/31/2001 | EP1150095A2 Device for the quantitative alignment assessment ot two machine parts,tools or similar |
| 10/31/2001 | EP1149332A1 Light detection apparatus |
| 10/31/2001 | EP1149270A1 Measuring device for measuring small forces and displacements |
| 10/31/2001 | EP1149269A1 Latex coat thickness measuring and control apparatus |
| 10/31/2001 | EP1110054A4 Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate |
| 10/31/2001 | EP0974128B1 Three-dimensional imaging method and device |
| 10/31/2001 | DE19829086C2 Verfahren zur optischen Bestimmung von chemischen und physikalischen Eigenschaften von ultradünnen Schichten und Vorrichtung zur Durchführung des Verfahrens A method for the optical determination of chemical and physical properties of ultra-thin layers and apparatus for performing the method |
| 10/31/2001 | DE10031412A1 Optical strain or compression sensor has Bragg grating fiber mounted on profile pieces attached to object under test |
| 10/31/2001 | DE10020842A1 Koordinatenmeßgerät oder Werkzeugmaschine Coordinate measuring machine or machine tool |
| 10/31/2001 | DE10006675A1 Codescheibe für eine optoelektronische Wegmeßeinrichtung Code disc for an opto-electronic distance measuring device |
| 10/31/2001 | CN2457567Y 智能型光电位移传感器 Intelligent Optical Displacement Sensor |
| 10/31/2001 | CN1320221A Variable coupler fiberoptic sensor and sensing apparatus using the sensor |
| 10/31/2001 | CN1074120C Interferential measuring method for thin transparent layer thickness of rotary oblique fine light beam and its apparatus |
| 10/30/2001 | US6310987 Image processor |
| 10/30/2001 | US6310964 Produce size recognition system |
| 10/30/2001 | US6310688 Method for measuring the parameter of a rough film |
| 10/30/2001 | US6310546 Stereo type vehicle monitoring apparatus with a fail-safe function |
| 10/30/2001 | US6309555 Method for determining thickness of material layer and chemical mechanical polishing endpoint |
| 10/25/2001 | WO2001079981A1 Optical position sensor and recorded medium |
| 10/25/2001 | WO2001079784A1 Device for acquiring a three-dimensional shape by optoelectronic process |
| 10/25/2001 | WO2001079783A1 Differential bending and/or subsidence detector and method for monitoring a structure |
| 10/25/2001 | WO2000047961A9 System for measuring polarimetric spectrum and other properties of a sample |
| 10/25/2001 | US20010033684 Method of sorting out defect-free workpiece |
| 10/25/2001 | US20010033386 Phase profilometry system with telecentric projector |
| 10/25/2001 | US20010033378 Apparatus for analyzing multi-layer thin film stacks on semiconductors |
| 10/25/2001 | DE10047495A1 Interferometric measuring device for rough object surface measurement has coherent light beam split into 2 partial beams with optical probe inserted in path of object beam |
| 10/25/2001 | DE10019059A1 Measuring profile deviations of an virtually flat reflecting surface involves determining profile deviation from position and measurement values obtained from interferometric separation measurement |
| 10/25/2001 | DE10018107A1 Vorrichtung und Verfahren zum dreidimensionalen Vermessen von Objekten Apparatus and method for three-dimensional measurement of objects |
| 10/25/2001 | DE10016963A1 Verfahren zur Bestimmung der Position eines Werkstücks im 3D-Raum Method for determining the position of a workpiece in 3D space |
| 10/24/2001 | EP1148390A2 Mark independent alignment sensor |
| 10/24/2001 | EP1148324A2 Patch type optical fiber sensor |
| 10/24/2001 | EP1148316A1 Information reader |
| 10/24/2001 | EP1147480A1 Objective lens system |