| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 12/11/2001 | US6330066 Height measuring apparatus and method and testing apparatus using the height measuring apparatus |
| 12/11/2001 | US6327785 Four sensor system for wheel alignment |
| 12/06/2001 | WO2001093340A1 Position sensitive photo detector |
| 12/06/2001 | WO2001092963A1 Optical device for indicating the position of flexible web |
| 12/06/2001 | WO2001092852A1 Apparatus and method for detecting pipeline defects |
| 12/06/2001 | WO2001092843A2 Reflective strain gauge and polarization-sensitive device |
| 12/06/2001 | WO2001092838A1 Method and apparatus for wavefront sensing |
| 12/06/2001 | WO2001092824A1 Method and assembly for the photogrammetric detection of the 3-d shape of an object |
| 12/06/2001 | WO2001092820A1 Method and device for determining the thickness of transparent organic layers |
| 12/06/2001 | WO2001092819A1 Optical sensor for measuring the distance and/or inclination of a surface |
| 12/06/2001 | WO2001092818A1 Method for correcting physical errors in measuring microscopic objects |
| 12/06/2001 | US20010049709 Fringe analysis method using fourier transform |
| 12/06/2001 | US20010048754 System for measuring, substantially instantaneously, the distance and trajectory traveled by a body in flight during sports competitions |
| 12/06/2001 | US20010048528 Method of measuring thickness of cell gap of reflective type liquid crystal display |
| 12/06/2001 | US20010048520 Device and method for detecting depth and color information of an object to be surveyed |
| 12/06/2001 | US20010048073 Optical detector apparatus |
| 12/06/2001 | US20010048072 Optical sensing devices |
| 12/06/2001 | US20010048068 Probe opening forming apparatus and near-field optical microscope using the same |
| 12/06/2001 | DE10124787A1 Verfahren und System zum Erfassen eines Fehlers in vorspringenden Abschnitten eines Gegenstandes, dessen vorspringende Abschnitte mit einem vorher bestimmten Abstand entlang eines Bogens in der gleichen Gestalt ausgebildet sind Method and system for detecting an error in projecting portions of an object, the projecting portions are formed with a predetermined distance along an arc in the same shape |
| 12/06/2001 | DE10027323A1 Method for generating a 3D object from a 3D model, scans an object model with a beam of light to detect the light reflected from the object model scanned with high resolution and accuracy so as to produce an object |
| 12/06/2001 | DE10026830A1 Optischer Sensor zur Messung des Abstands und/oder der Neigung einer Fläche Optical sensor for measuring the distance and / or the inclination of a surface |
| 12/06/2001 | DE10026282A1 Verfahren zur Bestimmung der Dicke von organischen Schichten A method for determining the thickness of organic layers |
| 12/06/2001 | DE10025461A1 Measurement device, especially for measuring workpiece surface roughness and/or contour has probe with diffraction grating for +1, 0 and -1 orders |
| 12/06/2001 | DE10022619A1 Abtasteinheit für eine optische Positionsmesseinrichtung Scanning unit for an optical position measuring device |
| 12/05/2001 | EP1160878A1 Semiconductor position detector and range finder using the same |
| 12/05/2001 | EP1160629A2 Interferometric measurement of stage position |
| 12/05/2001 | EP1160611A2 Probe opening forming apparatus and near-field optical microscope using the same |
| 12/05/2001 | EP1160587A1 Optical barrier device |
| 12/05/2001 | EP1160539A1 Scanning apparatus and method |
| 12/05/2001 | EP1160538A1 Speckle-image-based optical position transducer having improved mounting and directional sensitivities |
| 12/05/2001 | EP1160537A2 Triangulationsensor |
| 12/05/2001 | EP1159596A1 Hand held probe for measuring tire tread wear |
| 12/05/2001 | EP1027590A4 Apparatus and method for viewing and inspecting a circumferential surface area of an object |
| 12/05/2001 | EP0921952B1 Device and method for optically controlling by means of a camera a mark stamped on a workpiece by means of a type wheel |
| 12/05/2001 | EP0917642B1 Improved thickness monitoring |
| 12/05/2001 | EP0695413B1 Non-contact inspection system |
| 12/05/2001 | CN2463784Y Contactless three-dimensional contour measuring instrument |
| 12/05/2001 | CN1325488A Optical senser |
| 12/05/2001 | CN1325487A Apparatus for surface image sensing and surface inspection of three-dimensionals tructures |
| 12/05/2001 | CN1325486A Device and method for alignment |
| 12/05/2001 | CN1325027A Dynamic-changeable detection method, dynamic changeable detection device and supersonic diagnosis device |
| 12/04/2001 | US6327536 Vehicle environment monitoring system |
| 12/04/2001 | US6327520 Planar normality sensor |
| 12/04/2001 | US6327380 Method for the correlation of three dimensional measurements obtained by image capturing units and system for carrying out said method |
| 12/04/2001 | US6327374 Arrangement and method for inspection of surface quality |
| 12/04/2001 | US6327193 Mixed signal method for display deflection signal generation for low cost displays |
| 12/04/2001 | US6327041 Method and device for opto-electrical acquisition of shapes by axial illumination |
| 12/04/2001 | US6327040 Reflectance method for evaluating the surface characteristics of opaque materials |
| 12/04/2001 | US6327038 Linear and angular retroreflecting interferometric alignment target |
| 12/04/2001 | US6327030 System, method, and coating for strain analysis |
| 12/04/2001 | US6326106 Overlay measuring pattern, and photomask |
| 11/29/2001 | WO2001090726A2 Optical alignment in capillary detection using capillary wall scatter |
| 11/29/2001 | WO2001090698A1 Probe with a diffraction grating for +1, 0 and -1 orders |
| 11/29/2001 | WO2001090697A1 Optical deformation sensor with operational testing by different wavelenghts, for side crashes |
| 11/29/2001 | WO2001090689A1 Method for measuring interference and apparatus for measuring interference |
| 11/29/2001 | WO2001090688A1 Method for determining the spatial co-ordinates of objects and/or the variation thereof with time |
| 11/29/2001 | WO2001090687A2 Monitoring temperature and sample characteristics using rotating compensator ellipsometer |
| 11/29/2001 | WO2001090686A1 In-situ mirror characterization |
| 11/29/2001 | WO2001090685A2 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum |
| 11/29/2001 | WO2001089863A2 Height control system and sensor therefor |
| 11/29/2001 | US20010046317 Three-dimensional measurement device and three-dimensional measurement method |
| 11/29/2001 | US20010046055 Photoelectric position measuring device |
| 11/29/2001 | US20010046054 System and method for performing selected optical measurements utilizing an optical coherence domain reflectometer |
| 11/29/2001 | US20010046053 Interferometric apparatus and method(s) for precision measurement of altitude above a surface |
| 11/29/2001 | US20010046052 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus |
| 11/29/2001 | US20010046049 Thin film optical measurement system and method with calibrating ellipsometer |
| 11/29/2001 | US20010046044 Inspection apparatus for foreign matter and pattern defect |
| 11/29/2001 | US20010045519 Method of inspectiong a substrate furnished with a phosphor layer |
| 11/29/2001 | US20010045513 Interference detecting apparatus and tomography apparatus |
| 11/29/2001 | US20010045507 Beam position detector having a photodetection unit |
| 11/29/2001 | DE10026330A1 Verformungssensor Strain sensor |
| 11/29/2001 | DE10025918A1 Aligning device for belt pulleys has mechanical or nomographic device that computes for compensation value to correct angle of rotational axes of belt pulleys using washers |
| 11/29/2001 | DE10025741A1 Verfahren zur Bestimmung der räumlichen Koordinaten von Gegenständen und/oder deren zeitlicher Änderung A method for determining the spatial coordinates of objects and / or its time change |
| 11/29/2001 | DE10023604A1 Eindimensionales Kalibriernormal One-dimensional calibration standard |
| 11/29/2001 | DE10023413A1 Optical testing device for components such as screws, nuts, has linear steel belts for transporting component to be tested, across optical axis of camera |
| 11/28/2001 | EP1158571A2 Carrier shape measurement device |
| 11/28/2001 | EP1158309A2 Method and Apparatus for position detection |
| 11/28/2001 | EP1158294A1 A method and apparatus for inspecting printed wiring boards |
| 11/28/2001 | EP1158291A1 Ellipsometric metrology method and apparatus for samples contained in a chamber or the like |
| 11/28/2001 | EP1158283A1 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus |
| 11/28/2001 | EP1158270A1 Mesuring system for sports events |
| 11/28/2001 | EP1158267A1 Method for measuring quality of bandlike body, method for suppressing camber, instrument for measuring quality of bandlike body, rolling machine, and trimming device |
| 11/28/2001 | EP1157307A1 Photoresist dispense method by compensation for substrate reflectivity |
| 11/28/2001 | EP1157288A1 Device for measuring visual range |
| 11/28/2001 | EP1157253A1 Specimen topography reconstruction |
| 11/28/2001 | EP0852696B1 Device and method for checking the geometry of a hole bored in a part |
| 11/28/2001 | EP0732564B1 Method of measuring sizes of mold and mold-associated components by laser measuring instrument |
| 11/28/2001 | CN2462416Y Laser track linear detector |
| 11/28/2001 | CN1324448A Detection of irregularitites in a convex surface, such as a tire sidewall, using band-pass filtering |
| 11/28/2001 | CN1323978A Sinusoidal light field generating method with binary coding templet |
| 11/28/2001 | CN1323571A System for defining one of several targets space poshtion and/or directions |
| 11/27/2001 | US6324489 Aircraft identification and docking guidance systems |
| 11/27/2001 | US6324298 Automated wafer defect inspection system and a process of performing such inspection |
| 11/27/2001 | US6323954 Process and device for the detection or determination of the position of edges |
| 11/27/2001 | US6323953 Method and device for measuring structures on a transparent substrate |
| 11/27/2001 | US6323952 Flatness measuring apparatus |
| 11/27/2001 | US6323951 Apparatus and method for determining the active dopant profile in a semiconductor wafer |
| 11/27/2001 | US6323949 Optical measurement method and apparatus which determine a condition based on quasi-elastic-interaction |
| 11/27/2001 | US6323945 Coma aberration automatic measuring mark and measuring method |
| 11/27/2001 | US6323942 CMOS-compatible three-dimensional image sensor IC |